SG11202008510PA - A method and system for determining the location of artefacts and/or inclusions in a gemstone, mineral, or sample thereof - Google Patents
A method and system for determining the location of artefacts and/or inclusions in a gemstone, mineral, or sample thereofInfo
- Publication number
- SG11202008510PA SG11202008510PA SG11202008510PA SG11202008510PA SG11202008510PA SG 11202008510P A SG11202008510P A SG 11202008510PA SG 11202008510P A SG11202008510P A SG 11202008510PA SG 11202008510P A SG11202008510P A SG 11202008510PA SG 11202008510P A SG11202008510P A SG 11202008510PA
- Authority
- SG
- Singapore
- Prior art keywords
- gemstone
- artefacts
- inclusions
- mineral
- sample
- Prior art date
Links
- 239000010437 gem Substances 0.000 title 1
- 229910001751 gemstone Inorganic materials 0.000 title 1
- 229910052500 inorganic mineral Inorganic materials 0.000 title 1
- 239000011707 mineral Substances 0.000 title 1
- 239000000523 sample Substances 0.000 title 1
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/87—Investigating jewels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
- G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
- G01B9/0203—With imaging systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
- G01B9/02031—With non-optical systems, e.g. tactile
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
- G01B9/02087—Combining two or more images of the same region
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/389—Precious stones; Pearls
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F40/00—Handling natural language data
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
- G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
- G01N2021/8864—Mapping zones of defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
- G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3304—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts helicoidal scan
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10028—Range image; Depth image; 3D point clouds
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10072—Tomographic images
- G06T2207/10081—Computed x-ray tomography [CT]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10072—Tomographic images
- G06T2207/10101—Optical tomography; Optical coherence tomography [OCT]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Signal Processing (AREA)
- Optics & Photonics (AREA)
- Pulmonology (AREA)
- Toxicology (AREA)
- Quality & Reliability (AREA)
- Artificial Intelligence (AREA)
- Audiology, Speech & Language Pathology (AREA)
- Computational Linguistics (AREA)
- General Engineering & Computer Science (AREA)
- Electromagnetism (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2018900677A AU2018900677A0 (en) | 2018-03-02 | A method and system for determining the location of visual artefacts and/or inclusions in a gemstone, mineral or sample thereof | |
PCT/AU2019/050182 WO2019165514A1 (en) | 2018-03-02 | 2019-03-04 | A method and system for determining the location of artefacts and/or inclusions in a gemstone, mineral, or sample thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202008510PA true SG11202008510PA (en) | 2020-10-29 |
Family
ID=67804792
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202008510PA SG11202008510PA (en) | 2018-03-02 | 2019-03-04 | A method and system for determining the location of artefacts and/or inclusions in a gemstone, mineral, or sample thereof |
Country Status (9)
Country | Link |
---|---|
US (2) | US11898962B2 (ru) |
EP (1) | EP3759471B8 (ru) |
CN (1) | CN112041667B (ru) |
AU (1) | AU2019227845A1 (ru) |
CA (1) | CA3092510A1 (ru) |
IL (1) | IL277014A (ru) |
RU (1) | RU2020131464A (ru) |
SG (1) | SG11202008510PA (ru) |
WO (1) | WO2019165514A1 (ru) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107219228A (zh) * | 2017-06-29 | 2017-09-29 | 佛山科学技术学院 | 一种翡翠三维成像检测装置及其检测方法 |
EP4269004A4 (en) * | 2020-12-24 | 2024-01-24 | Sumitomo Electric Hardmetal Corp. | METHOD FOR PRODUCING DIAMOND TOOL INTERMEDIATE AND METHOD FOR EVALUATING SINGLE CRYSTAL DIAMOND |
US20240167966A1 (en) * | 2021-02-15 | 2024-05-23 | The Australian National University | A method for mapping an internal structure of a sample |
CN113607747B (zh) * | 2021-10-11 | 2021-12-10 | 常州微亿智造科技有限公司 | 基于光学相干断层扫描的覆膜产品检测***及检测方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5901198A (en) * | 1997-10-10 | 1999-05-04 | Analogic Corporation | Computed tomography scanning target detection using target surface normals |
DE60030569D1 (de) * | 2000-12-04 | 2006-10-19 | Diamcad | Verfahren und Vorrichtung zur Ortung von Einschlüssen in einem Diamantstein |
US20030223054A1 (en) * | 2002-05-29 | 2003-12-04 | Natural Crystal Information Systems | Method and apparatus for identifying gemstones |
US7042556B1 (en) | 2003-12-05 | 2006-05-09 | The United States Of America As Represented By The United States Department Of Energy | Device and nondestructive method to determine subsurface micro-structure in dense materials |
US7755072B2 (en) | 2004-09-21 | 2010-07-13 | Zvi Porat | System and method for three-dimensional location of inclusions in a gemstone |
US7800741B2 (en) * | 2005-08-22 | 2010-09-21 | Galatea Ltd. | Method for evaluation of a gemstone |
IL181484A0 (en) | 2007-02-21 | 2007-07-04 | Haim Shlezinger | A method for evaluation of a gemstone |
EP2225731B1 (en) | 2007-11-27 | 2011-03-30 | Ideal-Scope Pty. Ltd. | Method and system for improved optical modeling of gemstones |
GB0919235D0 (en) * | 2009-11-03 | 2009-12-16 | De Beers Centenary AG | Inclusion detection in polished gemstones |
JP5198515B2 (ja) | 2010-07-29 | 2013-05-15 | 京セラドキュメントソリューションズ株式会社 | 画像形成装置 |
KR101545419B1 (ko) * | 2011-02-10 | 2015-08-18 | 가부시키가이샤 히다치 하이테크놀로지즈 | 이물 검출 장치 및 이물 검출 방법 |
DE102011087460B3 (de) * | 2011-11-30 | 2013-06-06 | Intego Gmbh | Verfahren sowie Vorrichtung zur Überprüfung eines optisch transparenten Körpers auf Fehlstellen |
WO2014142571A1 (ko) | 2013-03-13 | 2014-09-18 | 엘지전자 주식회사 | 무선 통신 시스템에서 채널상태정보 보고 방법 및 장치 |
US10006868B2 (en) * | 2013-06-18 | 2018-06-26 | Arvindbhai Lavjibhai Patel | Method and device for gemstone evolution |
GB201421837D0 (en) * | 2014-12-09 | 2015-01-21 | Reishig Peter | A method of generating a fingerprint for a gemstone using X-ray imaging |
US10458921B2 (en) * | 2015-12-21 | 2019-10-29 | The Regents Of The University Of California | Method to characterize cut gemstones using optical coherence tomography |
EP3407371B1 (en) | 2016-01-19 | 2020-06-10 | Mitsubishi Electric Corporation | Gas circuit breaker |
US11464206B2 (en) | 2020-03-04 | 2022-10-11 | Ara Ohanian | Portable pet washing station |
-
2019
- 2019-03-04 WO PCT/AU2019/050182 patent/WO2019165514A1/en active Application Filing
- 2019-03-04 RU RU2020131464A patent/RU2020131464A/ru unknown
- 2019-03-04 EP EP19760951.4A patent/EP3759471B8/en active Active
- 2019-03-04 CN CN201980029347.XA patent/CN112041667B/zh active Active
- 2019-03-04 AU AU2019227845A patent/AU2019227845A1/en active Pending
- 2019-03-04 US US16/977,622 patent/US11898962B2/en active Active
- 2019-03-04 CA CA3092510A patent/CA3092510A1/en active Pending
- 2019-03-04 SG SG11202008510PA patent/SG11202008510PA/en unknown
-
2020
- 2020-08-31 IL IL277014A patent/IL277014A/en unknown
-
2024
- 2024-01-02 US US18/402,383 patent/US20240133822A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
EP3759471A4 (en) | 2021-04-28 |
US11898962B2 (en) | 2024-02-13 |
AU2019227845A1 (en) | 2020-09-24 |
EP3759471A1 (en) | 2021-01-06 |
EP3759471B1 (en) | 2024-05-15 |
US20240133822A1 (en) | 2024-04-25 |
CN112041667A (zh) | 2020-12-04 |
CN112041667B (zh) | 2024-05-31 |
IL277014A (en) | 2020-10-29 |
WO2019165514A1 (en) | 2019-09-06 |
EP3759471B8 (en) | 2024-07-03 |
RU2020131464A (ru) | 2022-04-04 |
US20210041369A1 (en) | 2021-02-11 |
CA3092510A1 (en) | 2019-09-06 |
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