SG11202004727UA - Polishing composition - Google Patents

Polishing composition

Info

Publication number
SG11202004727UA
SG11202004727UA SG11202004727UA SG11202004727UA SG11202004727UA SG 11202004727U A SG11202004727U A SG 11202004727UA SG 11202004727U A SG11202004727U A SG 11202004727UA SG 11202004727U A SG11202004727U A SG 11202004727UA SG 11202004727U A SG11202004727U A SG 11202004727UA
Authority
SG
Singapore
Prior art keywords
polishing composition
polishing
composition
Prior art date
Application number
SG11202004727UA
Other languages
English (en)
Inventor
Noriaki Sugita
Takayuki Matsushita
Original Assignee
Nitta Dupont Incorporated
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitta Dupont Incorporated filed Critical Nitta Dupont Incorporated
Publication of SG11202004727UA publication Critical patent/SG11202004727UA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
    • H01L21/0201Specific process step
    • H01L21/02024Mirror polishing
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • B24B37/044Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1409Abrasive particles per se
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1454Abrasive powders, suspensions and pastes for polishing
    • C09K3/1463Aqueous liquid suspensions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
SG11202004727UA 2017-12-27 2018-12-20 Polishing composition SG11202004727UA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017252270A JP6978933B2 (ja) 2017-12-27 2017-12-27 研磨用組成物
PCT/JP2018/047025 WO2019131448A1 (ja) 2017-12-27 2018-12-20 研磨用組成物

Publications (1)

Publication Number Publication Date
SG11202004727UA true SG11202004727UA (en) 2020-06-29

Family

ID=67067301

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202004727UA SG11202004727UA (en) 2017-12-27 2018-12-20 Polishing composition

Country Status (7)

Country Link
JP (1) JP6978933B2 (ja)
KR (1) KR20200098547A (ja)
CN (1) CN111527589A (ja)
DE (1) DE112018006626T5 (ja)
SG (1) SG11202004727UA (ja)
TW (1) TWI798325B (ja)
WO (1) WO2019131448A1 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7349309B2 (ja) * 2019-09-30 2023-09-22 株式会社フジミインコーポレーテッド シリコンウェーハ用研磨用組成物
JP7433042B2 (ja) * 2019-12-24 2024-02-19 ニッタ・デュポン株式会社 研磨用組成物
JP2021105145A (ja) * 2019-12-27 2021-07-26 ニッタ・デュポン株式会社 研磨用組成物及びシリコンウェーハの研磨方法
EP4103662A4 (en) * 2020-02-13 2023-08-16 FUJIFILM Electronic Materials U.S.A, Inc. POLISHING COMPOSITIONS AND METHODS OF USE THEREOF
EP4103663A4 (en) 2020-02-13 2023-08-23 Fujifilm Electronic Materials U.S.A., Inc. POLISHING COMPOSITIONS AND METHODS OF USE THEREOF
JP7450439B2 (ja) 2020-03-31 2024-03-15 株式会社フジミインコーポレーテッド 研磨用組成物および磁気ディスク基板の製造方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5721505B2 (ja) * 2011-04-01 2015-05-20 ニッタ・ハース株式会社 研磨用組成物
WO2012165578A1 (ja) * 2011-06-02 2012-12-06 協立化学産業株式会社 電池電極又はセパレーター用コート剤組成物
CN104245829B (zh) * 2012-04-27 2017-03-01 日本合成化学工业株式会社 树脂组合物及其用途
CN104798181B (zh) * 2012-11-30 2016-08-24 霓达哈斯股份有限公司 研磨组合物
JP2016124943A (ja) * 2014-12-26 2016-07-11 ニッタ・ハース株式会社 研磨用組成物
SG11201803362VA (en) * 2015-10-23 2018-05-30 Nitta Haas Inc Polishing composition

Also Published As

Publication number Publication date
JP2019117904A (ja) 2019-07-18
TWI798325B (zh) 2023-04-11
TW201930540A (zh) 2019-08-01
JP6978933B2 (ja) 2021-12-08
CN111527589A (zh) 2020-08-11
KR20200098547A (ko) 2020-08-20
DE112018006626T5 (de) 2020-09-10
WO2019131448A1 (ja) 2019-07-04

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