SG11201707508PA - Semiconductor x-ray detector - Google Patents
Semiconductor x-ray detectorInfo
- Publication number
- SG11201707508PA SG11201707508PA SG11201707508PA SG11201707508PA SG11201707508PA SG 11201707508P A SG11201707508P A SG 11201707508PA SG 11201707508P A SG11201707508P A SG 11201707508PA SG 11201707508P A SG11201707508P A SG 11201707508PA SG 11201707508P A SG11201707508P A SG 11201707508PA
- Authority
- SG
- Singapore
- Prior art keywords
- semiconductor
- ray detector
- ray
- detector
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G01V5/222—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/02—Devices for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computerised tomographs
- A61B6/032—Transmission computed tomography [CT]
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2015/075941 WO2016161542A1 (en) | 2015-04-07 | 2015-04-07 | Semiconductor x-ray detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG11201707508PA true SG11201707508PA (en) | 2017-10-30 |
Family
ID=57071683
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201707508PA SG11201707508PA (en) | 2015-04-07 | 2015-04-07 | Semiconductor x-ray detector |
Country Status (9)
| Country | Link |
|---|---|
| US (3) | US10007009B2 (en) |
| EP (1) | EP3281040B1 (en) |
| JP (1) | JP6554554B2 (en) |
| KR (1) | KR101941898B1 (en) |
| CN (1) | CN107533146B (en) |
| IL (1) | IL254538B (en) |
| SG (1) | SG11201707508PA (en) |
| TW (1) | TWI632391B (en) |
| WO (1) | WO2016161542A1 (en) |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016161542A1 (en) * | 2015-04-07 | 2016-10-13 | Shenzhen Xpectvision Technology Co.,Ltd. | Semiconductor x-ray detector |
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| CN108449982B (en) * | 2015-08-27 | 2020-12-15 | 深圳帧观德芯科技有限公司 | X-ray imaging with detectors capable of resolving photon energy |
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| CN109661595B (en) * | 2016-09-23 | 2023-05-30 | 深圳帧观德芯科技有限公司 | Packaging of semiconductor X-ray detector |
| WO2018076220A1 (en) * | 2016-10-27 | 2018-05-03 | Shenzhen Xpectvision Technology Co., Ltd. | Dark noise compensation in a radiation detector |
| WO2018090162A1 (en) * | 2016-11-15 | 2018-05-24 | Shenzhen Xpectvision Technology Co., Ltd. | Imaging system configured to statistically determine charge sharing |
| CN110022770A (en) * | 2016-12-05 | 2019-07-16 | 深圳帧观德芯科技有限公司 | X-ray imaging system and x-ray imaging method |
| EP3558124A4 (en) * | 2016-12-20 | 2020-08-12 | Shenzhen Xpectvision Technology Co., Ltd. | Image sensors having x-ray detectors |
| CN110291423A (en) | 2017-01-23 | 2019-09-27 | 深圳帧观德芯科技有限公司 | The method for making Semiconductor X-Ray detector |
| WO2018133087A1 (en) | 2017-01-23 | 2018-07-26 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray detectors capable of identifying and managing charge sharing |
| WO2018133088A1 (en) * | 2017-01-23 | 2018-07-26 | Shenzhen Xpectvision Technology Co., Ltd. | A radiation detector |
| US10162066B2 (en) * | 2017-02-06 | 2018-12-25 | General Electric Company | Coincidence-enabling photon-counting detector |
| CN110418981B (en) * | 2017-04-01 | 2023-09-22 | 深圳帧观德芯科技有限公司 | Portable radiation detector system |
| CN110537111B (en) * | 2017-05-03 | 2024-02-02 | 深圳帧观德芯科技有限公司 | Method for manufacturing radiation detector |
| EP3658959A4 (en) * | 2017-07-26 | 2020-12-23 | Shenzhen Xpectvision Technology Co., Ltd. | Radiation detector with built-in depolarization device |
| WO2019019040A1 (en) * | 2017-07-26 | 2019-01-31 | Shenzhen Xpectvision Technology Co., Ltd. | System with a spatially expansive x-ray source for x-ray imaging |
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| WO2019019042A1 (en) * | 2017-07-26 | 2019-01-31 | Shenzhen Xpectvision Technology Co., Ltd. | An integrated x-ray source |
| CN110892291B (en) * | 2017-07-26 | 2024-03-12 | 深圳帧观德芯科技有限公司 | X-ray detector |
| CN111226138B (en) * | 2017-10-26 | 2023-11-07 | 深圳帧观德芯科技有限公司 | Radiation detector capable of noise manipulation |
| CN111226139B (en) * | 2017-10-26 | 2023-08-01 | 深圳帧观德芯科技有限公司 | X-ray detector with cooling system |
| CN111279222B (en) * | 2017-10-30 | 2023-07-28 | 深圳源光科技有限公司 | LIDAR detector with high temporal resolution |
| WO2019084703A1 (en) | 2017-10-30 | 2019-05-09 | Shenzhen Xpectvision Technology Co., Ltd. | Radiation detector with dc-to-dc converter based on mems switches |
| WO2019144324A1 (en) * | 2018-01-24 | 2019-08-01 | Shenzhen Xpectvision Technology Co., Ltd. | Packaging of radiation detectors in an image sensor |
| CN111587388A (en) * | 2018-01-24 | 2020-08-25 | 深圳帧观德芯科技有限公司 | Method of making a radiation detector |
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Family Cites Families (65)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56103379A (en) * | 1980-01-22 | 1981-08-18 | Horiba Ltd | Semiconductor x-ray detector |
| JP3220500B2 (en) * | 1992-03-16 | 2001-10-22 | オリンパス光学工業株式会社 | Soft X-ray detector |
| US5245191A (en) | 1992-04-14 | 1993-09-14 | The Board Of Regents Of The University Of Arizona | Semiconductor sensor for gamma-ray tomographic imaging system |
| US5389792A (en) | 1993-01-04 | 1995-02-14 | Grumman Aerospace Corporation | Electron microprobe utilizing thermal detector arrays |
| EP0778983B1 (en) | 1994-07-27 | 2000-05-31 | 1294339 Ontario, Inc. | Radiation imaginging system |
| US5635718A (en) * | 1996-01-16 | 1997-06-03 | Minnesota Mining And Manufacturing Company | Multi-module radiation detecting device and fabrication method |
| JP2002217444A (en) | 2001-01-22 | 2002-08-02 | Canon Inc | Radiation detector |
| US6791091B2 (en) | 2001-06-19 | 2004-09-14 | Brian Rodricks | Wide dynamic range digital imaging system and method |
| GB2392308B (en) | 2002-08-15 | 2006-10-25 | Detection Technology Oy | Packaging structure for imaging detectors |
| JP4414646B2 (en) | 2002-11-18 | 2010-02-10 | 浜松ホトニクス株式会社 | Photodetector |
| JP4365108B2 (en) | 2003-01-08 | 2009-11-18 | 浜松ホトニクス株式会社 | Wiring board and radiation detector using the same |
| JP2004362905A (en) * | 2003-06-04 | 2004-12-24 | Nippon Telegr & Teleph Corp <Ntt> | Method of manufacturing electrolyte membrane for direct methanol fuel cell |
| US20060289777A1 (en) | 2005-06-29 | 2006-12-28 | Wen Li | Detector with electrically isolated pixels |
| US7231017B2 (en) | 2005-07-27 | 2007-06-12 | Physical Optics Corporation | Lobster eye X-ray imaging system and method of fabrication thereof |
| US7456409B2 (en) | 2005-07-28 | 2008-11-25 | Carestream Health, Inc. | Low noise image data capture for digital radiography |
| CN1947660B (en) | 2005-10-14 | 2010-09-29 | 通用电气公司 | System, method and module assembly for multi-tube core backlight lighting diode |
| WO2007049168A2 (en) | 2005-10-28 | 2007-05-03 | Koninklijke Philips Electronics, N.V. | Method and apparatus for spectral computed tomography |
| US8000434B2 (en) | 2006-07-10 | 2011-08-16 | Koninklijke Philips Electronics N.V. | Energy spectrum reconstruction |
| CN101529274B (en) * | 2006-10-25 | 2012-07-04 | 皇家飞利浦电子股份有限公司 | Apparatus, imaging device and method for detecting x-ray radiation |
| WO2008072181A2 (en) | 2006-12-13 | 2008-06-19 | Koninklijke Philips Electronics N.V. | Apparatus, imaging device and method for counting x-ray photons |
| JP4734224B2 (en) * | 2006-12-18 | 2011-07-27 | 本田技研工業株式会社 | Buffer layer thickness measurement method |
| CN101600974B (en) | 2007-02-01 | 2013-03-13 | 皇家飞利浦电子股份有限公司 | Event sharing restoration for photon counting detectors |
| US7696483B2 (en) | 2007-08-10 | 2010-04-13 | General Electric Company | High DQE photon counting detector using statistical recovery of pile-up events |
| JP5697982B2 (en) * | 2007-09-07 | 2015-04-08 | コーニンクレッカ フィリップス エヌ ヴェ | Radiation detector, X-ray detector and image forming system having a plurality of conversion layers |
| US7916836B2 (en) | 2007-09-26 | 2011-03-29 | General Electric Company | Method and apparatus for flexibly binning energy discriminating data |
| US8592773B2 (en) | 2007-09-27 | 2013-11-26 | Koninklijke Philips N.V. | Processing electronics and method for determining a count result, and detector for an X-ray imaging device |
| CN101903802B (en) | 2007-12-20 | 2013-09-11 | 皇家飞利浦电子股份有限公司 | Direct conversion detector |
| US20110036989A1 (en) | 2008-04-30 | 2011-02-17 | Koninklijke Philips Electronics N.V. | Counting detector |
| CN101644780A (en) | 2008-08-04 | 2010-02-10 | 北京大学 | Scintillation crystal array detecting device |
| CA2650066A1 (en) | 2009-01-16 | 2010-07-16 | Karim S. Karim | Photon counting and integrating pixel readout architecture with dynamic switching operation |
| JP2010237643A (en) * | 2009-03-09 | 2010-10-21 | Fuji Xerox Co Ltd | Display medium, writing device and display device |
| US8384038B2 (en) * | 2009-06-24 | 2013-02-26 | General Electric Company | Readout electronics for photon counting and energy discriminating detectors |
| DE102009055807B4 (en) | 2009-11-26 | 2016-11-24 | Siemens Healthcare Gmbh | Circuit arrangement for counting X-ray quanta of X-ray radiation by means of quantum-counting detectors as well as application-specific integrated circuit and emitter-detector system |
| CN101862200B (en) | 2010-05-12 | 2012-07-04 | 中国科学院上海应用物理研究所 | Rapid X-ray fluorescence CT method |
| KR101634250B1 (en) * | 2010-06-21 | 2016-06-28 | 삼성전자주식회사 | Large-scaled x-ray detector and method of manufacturing the same |
| JP5208186B2 (en) | 2010-11-26 | 2013-06-12 | 富士フイルム株式会社 | Radiation image detection apparatus and drive control method thereof |
| US8659148B2 (en) * | 2010-11-30 | 2014-02-25 | General Electric Company | Tileable sensor array |
| EP2490441A1 (en) | 2011-02-16 | 2012-08-22 | Paul Scherrer Institut | Single photon counting detector system having improved counter architecture |
| KR101761817B1 (en) * | 2011-03-04 | 2017-07-26 | 삼성전자주식회사 | Large-scale x-ray detector |
| JP5508340B2 (en) | 2011-05-30 | 2014-05-28 | 富士フイルム株式会社 | Radiation image detection apparatus and method for controlling radiation image detection apparatus |
| JP5875790B2 (en) | 2011-07-07 | 2016-03-02 | 株式会社東芝 | Photon counting type image detector, X-ray diagnostic apparatus, and X-ray computed tomography apparatus |
| WO2013012809A1 (en) | 2011-07-15 | 2013-01-24 | Brookhaven Science Associates, Llc | Radiation detector modules based on multi-layer cross strip semiconductor detectors |
| WO2013015350A1 (en) | 2011-07-26 | 2013-01-31 | 富士フイルム株式会社 | Radiation imaging device and control method thereof, and radiation image detection device |
| US8929507B2 (en) * | 2011-10-19 | 2015-01-06 | Kabushiki Kaisha Toshiba | Method and system for substantially reducing ring artifact based upon ring statistics |
| WO2013057803A1 (en) * | 2011-10-19 | 2013-04-25 | Oya Nagato | Radiation and ion detection device equipped with correction device and analysis display device and analysis display method |
| EP2790400A1 (en) | 2011-12-09 | 2014-10-15 | Sony Corporation | Image pickup device, electronic apparatus, optically stimulated luminescence detection scanner, and image pickup method |
| JP2013142578A (en) | 2012-01-10 | 2013-07-22 | Shimadzu Corp | Radiation detector |
| CN103296035B (en) | 2012-02-29 | 2016-06-08 | 中国科学院微电子研究所 | X-ray flat panel detector and manufacture method thereof |
| US8933412B2 (en) * | 2012-06-21 | 2015-01-13 | Honeywell International Inc. | Integrated comparative radiation sensitive circuit |
| DE102012213494A1 (en) | 2012-07-31 | 2014-02-06 | Siemens Aktiengesellschaft | Detection of X-ray and X-ray detector system |
| DE102012213404B3 (en) | 2012-07-31 | 2014-01-23 | Siemens Aktiengesellschaft | Method for temperature stabilization, X-ray detector and CT system |
| DE102012215041A1 (en) | 2012-08-23 | 2014-02-27 | Siemens Aktiengesellschaft | Method for producing a semiconductor element of a direct-converting X-ray detector |
| DE102012215818A1 (en) | 2012-09-06 | 2014-03-06 | Siemens Aktiengesellschaft | Radiation detector and method of making a radiation detector |
| JP6061129B2 (en) * | 2012-09-14 | 2017-01-18 | 株式会社島津製作所 | Manufacturing method of radiation detector |
| KR101410736B1 (en) * | 2012-11-26 | 2014-06-24 | 한국전기연구원 | Digital X-ray image detector using multi-layered structure with surface light source |
| US9024269B2 (en) * | 2012-12-27 | 2015-05-05 | General Electric Company | High yield complementary metal-oxide semiconductor X-ray detector |
| CA2898654C (en) | 2013-01-31 | 2020-02-25 | Rapiscan Systems, Inc. | Portable security inspection system |
| KR20140132098A (en) * | 2013-05-07 | 2014-11-17 | 삼성전자주식회사 | X-ray detector, x-ray imaging apparatus having the same and control method for the x-ray imaging apparatus |
| JP2015011018A (en) * | 2013-07-02 | 2015-01-19 | 株式会社東芝 | Sample analysis method, program, and sample analyzer |
| JP6214031B2 (en) * | 2013-07-19 | 2017-10-18 | 国立研究開発法人理化学研究所 | Signal data processing method, signal data processing apparatus, and radiation detection system for radiation detector |
| JP6108575B2 (en) * | 2013-09-18 | 2017-04-05 | 株式会社吉田製作所 | Image processing apparatus and X-ray imaging apparatus |
| US9520439B2 (en) | 2013-09-23 | 2016-12-13 | Omnivision Technologies, Inc. | X-ray and optical image sensor |
| CN103715214A (en) | 2013-12-02 | 2014-04-09 | 江苏龙信电子科技有限公司 | Manufacture method of high-definition digital X-ray flat panel detector |
| WO2016161542A1 (en) * | 2015-04-07 | 2016-10-13 | Shenzhen Xpectvision Technology Co.,Ltd. | Semiconductor x-ray detector |
| JP2018512599A (en) * | 2015-04-07 | 2018-05-17 | シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド | Manufacturing method of semiconductor X-ray detector |
-
2015
- 2015-04-07 WO PCT/CN2015/075941 patent/WO2016161542A1/en active Application Filing
- 2015-04-07 KR KR1020177026648A patent/KR101941898B1/en active IP Right Grant
- 2015-04-07 JP JP2017554401A patent/JP6554554B2/en active Active
- 2015-04-07 SG SG11201707508PA patent/SG11201707508PA/en unknown
- 2015-04-07 EP EP15888099.7A patent/EP3281040B1/en active Active
- 2015-04-07 CN CN201580077791.0A patent/CN107533146B/en active Active
- 2015-04-07 US US15/122,456 patent/US10007009B2/en active Active
-
2016
- 2016-04-07 TW TW105110957A patent/TWI632391B/en active
-
2017
- 2017-09-17 IL IL254538A patent/IL254538B/en unknown
-
2018
- 2018-01-10 US US15/866,928 patent/US10502843B2/en active Active
-
2019
- 2019-11-06 US US16/676,425 patent/US11009614B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN107533146B (en) | 2019-06-18 |
| IL254538A0 (en) | 2017-11-30 |
| US10007009B2 (en) | 2018-06-26 |
| EP3281040A1 (en) | 2018-02-14 |
| JP2018512596A (en) | 2018-05-17 |
| US20200072986A1 (en) | 2020-03-05 |
| EP3281040A4 (en) | 2018-07-11 |
| IL254538B (en) | 2021-08-31 |
| KR101941898B1 (en) | 2019-01-24 |
| WO2016161542A1 (en) | 2016-10-13 |
| JP6554554B2 (en) | 2019-07-31 |
| TW201643468A (en) | 2016-12-16 |
| US10502843B2 (en) | 2019-12-10 |
| EP3281040B1 (en) | 2021-11-24 |
| US11009614B2 (en) | 2021-05-18 |
| TWI632391B (en) | 2018-08-11 |
| CN107533146A (en) | 2018-01-02 |
| KR20170141196A (en) | 2017-12-22 |
| US20180017686A1 (en) | 2018-01-18 |
| US20180156927A1 (en) | 2018-06-07 |
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