SE9002665D0 - Anordning foer att oevervaka matningsspaenningen paa intgrerad krets - Google Patents
Anordning foer att oevervaka matningsspaenningen paa intgrerad kretsInfo
- Publication number
- SE9002665D0 SE9002665D0 SE9002665A SE9002665A SE9002665D0 SE 9002665 D0 SE9002665 D0 SE 9002665D0 SE 9002665 A SE9002665 A SE 9002665A SE 9002665 A SE9002665 A SE 9002665A SE 9002665 D0 SE9002665 D0 SE 9002665D0
- Authority
- SE
- Sweden
- Prior art keywords
- monitor
- supply voltage
- integrated circuit
- monitoring
- voltage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318575—Power distribution; Power saving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9002665A SE466875B (sv) | 1990-08-15 | 1990-08-15 | Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets |
DE1991609965 DE69109965T2 (de) | 1990-08-15 | 1991-07-25 | Vorrichtung zur Überwachung der Speisespannung von integrierten Kreisen. |
EP91201949A EP0471399B1 (en) | 1990-08-15 | 1991-07-25 | Device for monitoring the supply voltage on integrated circuits |
US08/185,145 US5498972A (en) | 1990-08-15 | 1994-01-24 | Device for monitoring the supply voltage on integrated circuits |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9002665A SE466875B (sv) | 1990-08-15 | 1990-08-15 | Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9002665D0 true SE9002665D0 (sv) | 1990-08-15 |
SE9002665L SE9002665L (sv) | 1992-02-16 |
SE466875B SE466875B (sv) | 1992-04-13 |
Family
ID=20380165
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9002665A SE466875B (sv) | 1990-08-15 | 1990-08-15 | Anordning foer att oevervaka matningsspaenningen lokalt paa integrerad krets |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0471399B1 (sv) |
DE (1) | DE69109965T2 (sv) |
SE (1) | SE466875B (sv) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100440366B1 (ko) * | 1995-10-20 | 2004-11-16 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 테스트가능회로및테스트방법 |
FR3020720B1 (fr) * | 2014-04-30 | 2017-09-15 | Inside Secure | Interface de communication avec adaptation automatique au niveau du signal entrant |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL8502476A (nl) * | 1985-09-11 | 1987-04-01 | Philips Nv | Werkwijze voor het testen van dragers met meerdere digitaal-werkende geintegreerde schakelingen, drager voorzien van zulke schakelingen, geintegreerde schakeling geschikt voor het aanbrengen op zo'n drager, en testinrichting voor het testen van zulke dragers. |
US4872169A (en) * | 1987-03-06 | 1989-10-03 | Texas Instruments Incorporated | Hierarchical scan selection |
US4860288A (en) * | 1987-10-23 | 1989-08-22 | Control Data Corporation | Clock monitor for use with VLSI chips |
DE68928613T2 (de) * | 1988-09-07 | 1998-09-24 | Texas Instruments Inc | Bidirektionale-Boundary-Scan-Testzelle |
US4875003A (en) * | 1989-02-21 | 1989-10-17 | Silicon Connections Corporation | Non-contact I/O signal pad scan testing of VLSI circuits |
-
1990
- 1990-08-15 SE SE9002665A patent/SE466875B/sv not_active IP Right Cessation
-
1991
- 1991-07-25 DE DE1991609965 patent/DE69109965T2/de not_active Expired - Fee Related
- 1991-07-25 EP EP91201949A patent/EP0471399B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
SE9002665L (sv) | 1992-02-16 |
DE69109965T2 (de) | 1995-09-21 |
EP0471399A1 (en) | 1992-02-19 |
DE69109965D1 (de) | 1995-06-29 |
EP0471399B1 (en) | 1995-05-24 |
SE466875B (sv) | 1992-04-13 |
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