SE8603623L - Anordning for anvendning vid miljoprovning av elektriska komponenter - Google Patents
Anordning for anvendning vid miljoprovning av elektriska komponenterInfo
- Publication number
- SE8603623L SE8603623L SE8603623A SE8603623A SE8603623L SE 8603623 L SE8603623 L SE 8603623L SE 8603623 A SE8603623 A SE 8603623A SE 8603623 A SE8603623 A SE 8603623A SE 8603623 L SE8603623 L SE 8603623L
- Authority
- SE
- Sweden
- Prior art keywords
- circuits
- printed
- leads
- electrical components
- soldered
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G01R31/02—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2817—Environmental-, stress-, or burn-in tests
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8603623A SE454388B (sv) | 1986-08-27 | 1986-08-27 | Forfarande vid miljoprovning av elektriska komponenter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8603623A SE454388B (sv) | 1986-08-27 | 1986-08-27 | Forfarande vid miljoprovning av elektriska komponenter |
Publications (3)
Publication Number | Publication Date |
---|---|
SE8603623D0 SE8603623D0 (sv) | 1986-08-27 |
SE8603623L true SE8603623L (sv) | 1988-02-28 |
SE454388B SE454388B (sv) | 1988-04-25 |
Family
ID=20365419
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE8603623A SE454388B (sv) | 1986-08-27 | 1986-08-27 | Forfarande vid miljoprovning av elektriska komponenter |
Country Status (1)
Country | Link |
---|---|
SE (1) | SE454388B (sv) |
-
1986
- 1986-08-27 SE SE8603623A patent/SE454388B/sv not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
SE454388B (sv) | 1988-04-25 |
SE8603623D0 (sv) | 1986-08-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE92191T1 (de) | Vorrichtung fuer die elektrische funktionspruefung von verdrahtungsfeldern, insbesondere von leiterplatten. | |
DE3065137D1 (en) | Electrical test probe for use in testing circuits on printed circuit boards and the like | |
ATE56280T1 (de) | Verfahren und vorrichtung zum elektrischen pruefen von leiterplatten. | |
DE69118451D1 (de) | Prüfungsanordnung für elektrische Schaltungen auf Printplatten | |
KR880700275A (ko) | 전자 장치 테스트 방법 및 테스트용 집적 회로 테스터 | |
DE3686989D1 (de) | Verminderung des rauschens waehrend des pruefens von integrierten schaltungschips. | |
HUP9901931A2 (hu) | Berendezés nyomtatott áramköri lapok áramköreinek villamos vizsgálatára | |
KR100216116B1 (ko) | 반도체 시험장치의 핀 시험회로 | |
SE8603623L (sv) | Anordning for anvendning vid miljoprovning av elektriska komponenter | |
FR2604260B1 (fr) | Testeur de circuits electroniques | |
US4443755A (en) | Test apparatus for circuit board racks | |
JPS592355B2 (ja) | 集積回路試験装置における被試験集積回路のピン接続確認方式 | |
SE8704467D0 (sv) | Apparat for provning av kretskort | |
US3792285A (en) | Electronic circuit installations | |
SE9402155D0 (sv) | Adapter för användning vid en apparat för testning av kretskort | |
ATE70639T1 (de) | Logische schaltung mit verbesserter testmoeglichkeit fuer defekte durchgangskontakte. | |
JPS6468667A (en) | Test system for printed board | |
JPS59104190U (ja) | 電子機器 | |
JPS60113165A (ja) | 半導体素子のバ−ンイン装置 | |
JPS56107175A (en) | Confirmation method for connection of check pins on integrated circuit | |
GB759322A (en) | Improvements in or relating to electrical components to be connected to printed circuits | |
JPS6423172A (en) | Inspecting method for semiconductor integrated circuit device | |
JPS6484166A (en) | Testing method for electronic circuit module | |
JPS6124672U (ja) | プリント配線基板の検査装置 | |
JPS63289890A (ja) | 印刷配線板識別方式 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |
Ref document number: 8603623-3 Effective date: 19890911 Format of ref document f/p: F |