SE8603623L - Anordning for anvendning vid miljoprovning av elektriska komponenter - Google Patents

Anordning for anvendning vid miljoprovning av elektriska komponenter

Info

Publication number
SE8603623L
SE8603623L SE8603623A SE8603623A SE8603623L SE 8603623 L SE8603623 L SE 8603623L SE 8603623 A SE8603623 A SE 8603623A SE 8603623 A SE8603623 A SE 8603623A SE 8603623 L SE8603623 L SE 8603623L
Authority
SE
Sweden
Prior art keywords
circuits
printed
leads
electrical components
soldered
Prior art date
Application number
SE8603623A
Other languages
English (en)
Other versions
SE454388B (sv
SE8603623D0 (sv
Inventor
T V Westberg
P A Ericsson
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE8603623A priority Critical patent/SE454388B/sv
Publication of SE8603623D0 publication Critical patent/SE8603623D0/sv
Publication of SE8603623L publication Critical patent/SE8603623L/sv
Publication of SE454388B publication Critical patent/SE454388B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/02—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817—Environmental-, stress-, or burn-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
SE8603623A 1986-08-27 1986-08-27 Forfarande vid miljoprovning av elektriska komponenter SE454388B (sv)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SE8603623A SE454388B (sv) 1986-08-27 1986-08-27 Forfarande vid miljoprovning av elektriska komponenter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8603623A SE454388B (sv) 1986-08-27 1986-08-27 Forfarande vid miljoprovning av elektriska komponenter

Publications (3)

Publication Number Publication Date
SE8603623D0 SE8603623D0 (sv) 1986-08-27
SE8603623L true SE8603623L (sv) 1988-02-28
SE454388B SE454388B (sv) 1988-04-25

Family

ID=20365419

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8603623A SE454388B (sv) 1986-08-27 1986-08-27 Forfarande vid miljoprovning av elektriska komponenter

Country Status (1)

Country Link
SE (1) SE454388B (sv)

Also Published As

Publication number Publication date
SE454388B (sv) 1988-04-25
SE8603623D0 (sv) 1986-08-27

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