SE7502591L - - Google Patents

Info

Publication number
SE7502591L
SE7502591L SE7502591A SE7502591A SE7502591L SE 7502591 L SE7502591 L SE 7502591L SE 7502591 A SE7502591 A SE 7502591A SE 7502591 A SE7502591 A SE 7502591A SE 7502591 L SE7502591 L SE 7502591L
Authority
SE
Sweden
Application number
SE7502591A
Other versions
SE409145B (sv
Inventor
M M Merlen
P H Nichols
Original Assignee
Intec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intec Corp filed Critical Intec Corp
Publication of SE7502591L publication Critical patent/SE7502591L/xx
Publication of SE409145B publication Critical patent/SE409145B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Mechanical Optical Scanning Systems (AREA)
SE7502591A 1974-03-08 1975-03-07 Med laseravsokning arbetande anordning for detektering av materialfel pa en materialyta SE409145B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US449247A US3900265A (en) 1974-03-08 1974-03-08 Laser scanner flaw detection system

Publications (2)

Publication Number Publication Date
SE7502591L true SE7502591L (de) 1975-09-09
SE409145B SE409145B (sv) 1979-07-30

Family

ID=23783460

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7502591A SE409145B (sv) 1974-03-08 1975-03-07 Med laseravsokning arbetande anordning for detektering av materialfel pa en materialyta

Country Status (8)

Country Link
US (1) US3900265A (de)
JP (1) JPS5534897B2 (de)
CA (1) CA1027203A (de)
DE (1) DE2428123C2 (de)
FR (1) FR2263507B1 (de)
GB (1) GB1473920A (de)
NL (1) NL7502757A (de)
SE (1) SE409145B (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3980891A (en) * 1975-05-16 1976-09-14 Intec Corporation Method and apparatus for a rotary scanner flaw detection system
US4170419A (en) * 1977-02-23 1979-10-09 Camsco, Inc. Optical web inspection system
US4237539A (en) * 1977-11-21 1980-12-02 E. I. Du Pont De Nemours And Company On-line web inspection system
US4219277A (en) * 1978-08-09 1980-08-26 Westinghouse Electric Corp. Method of detecting flaws on surfaces
US4253768A (en) * 1978-08-09 1981-03-03 Westinghouse Electric Corp. Processing system for detection and the classification of flaws on metallic surfaces
US4247204A (en) * 1979-02-26 1981-01-27 Intec Corporation Method and apparatus for a web edge tracking flaw detection system
US4265545A (en) * 1979-07-27 1981-05-05 Intec Corporation Multiple source laser scanning inspection system
US4297587A (en) * 1980-03-07 1981-10-27 Intec Corporation Absolute DC system for a laser inspection system
US4376583A (en) * 1981-05-12 1983-03-15 Aeronca Electronics, Inc. Surface inspection scanning system
US4488648A (en) * 1982-05-06 1984-12-18 Powers Manufacturing, Inc. Flaw detector
DE3325136C1 (de) * 1983-07-12 1984-11-22 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlersuchgerät für Bahnen
DE3334357C2 (de) * 1983-09-22 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät für Bahnen
US5068799A (en) * 1985-04-24 1991-11-26 Jarrett Jr Harold M System and method for detecting flaws in continuous web materials
US4719061A (en) * 1985-08-12 1988-01-12 Essex Group, Inc. System and method for in-process detection of contamination in electrical conductor insulation
US4756855A (en) * 1986-04-04 1988-07-12 Phillips Petroleum Company Automatic method for sorting plastic pellets
US4800503A (en) * 1986-09-19 1989-01-24 Burlington Industries, Inc. Method and apparatus for grading fabrics
US5092678A (en) * 1986-11-12 1992-03-03 Measurex Corporation On-line sheet formation characterizing method and device
US5243407A (en) * 1986-11-12 1993-09-07 Measurex Corporation On-line paper sheet formation characterizing method and device
US4824250A (en) * 1986-11-17 1989-04-25 Newman John W Non-destructive testing by laser scanning
US5121138A (en) * 1990-05-22 1992-06-09 General Scanning, Inc. Resonant scanner control system
US6252242B1 (en) * 1992-12-03 2001-06-26 Brown & Sharpe Surface Inspection Systems, Inc. High speed optical inspection apparatus using Gaussian distribution analysis and method therefore
US6255666B1 (en) * 1992-12-03 2001-07-03 Brown & Sharpe Surface Inspection Systems, Inc. High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor
US6294793B1 (en) * 1992-12-03 2001-09-25 Brown & Sharpe Surface Inspection Systems, Inc. High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor
US5556764A (en) * 1993-02-17 1996-09-17 Biometric Imaging, Inc. Method and apparatus for cell counting and cell classification
US5448364A (en) * 1993-03-22 1995-09-05 Estek Corporation Particle detection system with reflective line-to-spot collector
JP3577317B2 (ja) * 1994-09-02 2004-10-13 ビー・ディー・バイオサイエンシーズ・システムズ・アンド・リエイジェンツ・インコーポレイテッド 光学式スキャナの校正方法と装置
FR2796462B1 (fr) * 1999-07-15 2001-09-07 Eastman Kodak Co Procede et dispositif de detection d'un defaut dans une nappe liquide
US6831736B2 (en) * 2002-10-07 2004-12-14 Applied Materials Israel, Ltd. Method of and apparatus for line alignment to compensate for static and dynamic inaccuracies in scanning
US8057463B2 (en) * 2006-04-07 2011-11-15 Amo Development, Llc. Adaptive pattern correction for laser scanners
CA3049647A1 (en) * 2017-01-10 2018-07-19 Sunspring America, Inc. Optical method for identifying defects on tube surfaces

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LU54776A1 (de) * 1967-10-31 1969-06-27
US3781531A (en) * 1972-06-23 1973-12-25 Intec Corp Flaw detector system utilizing a laser scanner
US3958128A (en) * 1973-09-28 1976-05-18 Kawasaki Steel Corporation System for determining a transversal position of any defect in a traveling sheet material

Also Published As

Publication number Publication date
GB1473920A (en) 1977-05-18
US3900265A (en) 1975-08-19
JPS50120889A (de) 1975-09-22
CA1027203A (en) 1978-02-28
FR2263507B1 (de) 1979-09-28
JPS5534897B2 (de) 1980-09-10
FR2263507A1 (de) 1975-10-03
NL7502757A (nl) 1975-09-10
DE2428123A1 (de) 1975-09-18
SE409145B (sv) 1979-07-30
DE2428123C2 (de) 1984-10-04

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