FR2263507B1 - - Google Patents
Info
- Publication number
- FR2263507B1 FR2263507B1 FR7507259A FR7507259A FR2263507B1 FR 2263507 B1 FR2263507 B1 FR 2263507B1 FR 7507259 A FR7507259 A FR 7507259A FR 7507259 A FR7507259 A FR 7507259A FR 2263507 B1 FR2263507 B1 FR 2263507B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Mechanical Optical Scanning Systems (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US449247A US3900265A (en) | 1974-03-08 | 1974-03-08 | Laser scanner flaw detection system |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2263507A1 FR2263507A1 (fr) | 1975-10-03 |
FR2263507B1 true FR2263507B1 (fr) | 1979-09-28 |
Family
ID=23783460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7507259A Expired FR2263507B1 (fr) | 1974-03-08 | 1975-03-07 |
Country Status (8)
Country | Link |
---|---|
US (1) | US3900265A (fr) |
JP (1) | JPS5534897B2 (fr) |
CA (1) | CA1027203A (fr) |
DE (1) | DE2428123C2 (fr) |
FR (1) | FR2263507B1 (fr) |
GB (1) | GB1473920A (fr) |
NL (1) | NL7502757A (fr) |
SE (1) | SE409145B (fr) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3980891A (en) * | 1975-05-16 | 1976-09-14 | Intec Corporation | Method and apparatus for a rotary scanner flaw detection system |
US4170419A (en) * | 1977-02-23 | 1979-10-09 | Camsco, Inc. | Optical web inspection system |
US4237539A (en) * | 1977-11-21 | 1980-12-02 | E. I. Du Pont De Nemours And Company | On-line web inspection system |
US4219277A (en) * | 1978-08-09 | 1980-08-26 | Westinghouse Electric Corp. | Method of detecting flaws on surfaces |
US4253768A (en) * | 1978-08-09 | 1981-03-03 | Westinghouse Electric Corp. | Processing system for detection and the classification of flaws on metallic surfaces |
US4247204A (en) * | 1979-02-26 | 1981-01-27 | Intec Corporation | Method and apparatus for a web edge tracking flaw detection system |
US4265545A (en) * | 1979-07-27 | 1981-05-05 | Intec Corporation | Multiple source laser scanning inspection system |
US4297587A (en) * | 1980-03-07 | 1981-10-27 | Intec Corporation | Absolute DC system for a laser inspection system |
US4376583A (en) * | 1981-05-12 | 1983-03-15 | Aeronca Electronics, Inc. | Surface inspection scanning system |
US4488648A (en) * | 1982-05-06 | 1984-12-18 | Powers Manufacturing, Inc. | Flaw detector |
DE3325136C1 (de) * | 1983-07-12 | 1984-11-22 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Fehlersuchgerät für Bahnen |
DE3334357C2 (de) * | 1983-09-22 | 1986-04-10 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Optisches Fehlersuchgerät für Bahnen |
US5068799A (en) * | 1985-04-24 | 1991-11-26 | Jarrett Jr Harold M | System and method for detecting flaws in continuous web materials |
US4719061A (en) * | 1985-08-12 | 1988-01-12 | Essex Group, Inc. | System and method for in-process detection of contamination in electrical conductor insulation |
US4756855A (en) * | 1986-04-04 | 1988-07-12 | Phillips Petroleum Company | Automatic method for sorting plastic pellets |
US4800503A (en) * | 1986-09-19 | 1989-01-24 | Burlington Industries, Inc. | Method and apparatus for grading fabrics |
US5092678A (en) * | 1986-11-12 | 1992-03-03 | Measurex Corporation | On-line sheet formation characterizing method and device |
US5243407A (en) * | 1986-11-12 | 1993-09-07 | Measurex Corporation | On-line paper sheet formation characterizing method and device |
US4824250A (en) * | 1986-11-17 | 1989-04-25 | Newman John W | Non-destructive testing by laser scanning |
US5121138A (en) * | 1990-05-22 | 1992-06-09 | General Scanning, Inc. | Resonant scanner control system |
US6252242B1 (en) * | 1992-12-03 | 2001-06-26 | Brown & Sharpe Surface Inspection Systems, Inc. | High speed optical inspection apparatus using Gaussian distribution analysis and method therefore |
US6255666B1 (en) * | 1992-12-03 | 2001-07-03 | Brown & Sharpe Surface Inspection Systems, Inc. | High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor |
US6294793B1 (en) * | 1992-12-03 | 2001-09-25 | Brown & Sharpe Surface Inspection Systems, Inc. | High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor |
US5556764A (en) * | 1993-02-17 | 1996-09-17 | Biometric Imaging, Inc. | Method and apparatus for cell counting and cell classification |
US5448364A (en) * | 1993-03-22 | 1995-09-05 | Estek Corporation | Particle detection system with reflective line-to-spot collector |
JP3577317B2 (ja) * | 1994-09-02 | 2004-10-13 | ビー・ディー・バイオサイエンシーズ・システムズ・アンド・リエイジェンツ・インコーポレイテッド | 光学式スキャナの校正方法と装置 |
FR2796462B1 (fr) * | 1999-07-15 | 2001-09-07 | Eastman Kodak Co | Procede et dispositif de detection d'un defaut dans une nappe liquide |
US6831736B2 (en) * | 2002-10-07 | 2004-12-14 | Applied Materials Israel, Ltd. | Method of and apparatus for line alignment to compensate for static and dynamic inaccuracies in scanning |
US8057463B2 (en) * | 2006-04-07 | 2011-11-15 | Amo Development, Llc. | Adaptive pattern correction for laser scanners |
CA3049647A1 (fr) * | 2017-01-10 | 2018-07-19 | Sunspring America, Inc. | Methode optique pour cerner des defauts sur les surfaces de tubes |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
LU54776A1 (fr) * | 1967-10-31 | 1969-06-27 | ||
US3781531A (en) * | 1972-06-23 | 1973-12-25 | Intec Corp | Flaw detector system utilizing a laser scanner |
US3958128A (en) * | 1973-09-28 | 1976-05-18 | Kawasaki Steel Corporation | System for determining a transversal position of any defect in a traveling sheet material |
-
1974
- 1974-03-08 US US449247A patent/US3900265A/en not_active Expired - Lifetime
- 1974-05-13 GB GB2100874A patent/GB1473920A/en not_active Expired
- 1974-06-06 CA CA201,811A patent/CA1027203A/fr not_active Expired
- 1974-06-11 DE DE2428123A patent/DE2428123C2/de not_active Expired
- 1974-06-28 JP JP7423674A patent/JPS5534897B2/ja not_active Expired
-
1975
- 1975-03-07 FR FR7507259A patent/FR2263507B1/fr not_active Expired
- 1975-03-07 NL NL7502757A patent/NL7502757A/xx not_active Application Discontinuation
- 1975-03-07 SE SE7502591A patent/SE409145B/xx unknown
Also Published As
Publication number | Publication date |
---|---|
GB1473920A (en) | 1977-05-18 |
SE7502591L (fr) | 1975-09-09 |
US3900265A (en) | 1975-08-19 |
JPS50120889A (fr) | 1975-09-22 |
CA1027203A (fr) | 1978-02-28 |
JPS5534897B2 (fr) | 1980-09-10 |
FR2263507A1 (fr) | 1975-10-03 |
NL7502757A (nl) | 1975-09-10 |
DE2428123A1 (de) | 1975-09-18 |
SE409145B (sv) | 1979-07-30 |
DE2428123C2 (de) | 1984-10-04 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |