SE403847B - Forfarande for provning av minne och anordning for utforande av forfarandet - Google Patents
Forfarande for provning av minne och anordning for utforande av forfarandetInfo
- Publication number
- SE403847B SE403847B SE7514414A SE7514414A SE403847B SE 403847 B SE403847 B SE 403847B SE 7514414 A SE7514414 A SE 7514414A SE 7514414 A SE7514414 A SE 7514414A SE 403847 B SE403847 B SE 403847B
- Authority
- SE
- Sweden
- Prior art keywords
- procedure
- memory test
- test procedure
- memory
- test
- Prior art date
Links
- 238000000034 method Methods 0.000 title 1
- 238000010998 test method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL7416755A NL7416755A (nl) | 1974-12-23 | 1974-12-23 | Werkwijze en inrichting voor het testen van een digitaal geheugen. |
Publications (2)
Publication Number | Publication Date |
---|---|
SE7514414L SE7514414L (sv) | 1976-06-24 |
SE403847B true SE403847B (sv) | 1978-09-04 |
Family
ID=19822708
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE7514414A SE403847B (sv) | 1974-12-23 | 1975-12-19 | Forfarande for provning av minne och anordning for utforande av forfarandet |
Country Status (10)
Country | Link |
---|---|
US (1) | US4061908A (sv) |
JP (1) | JPS5617760B2 (sv) |
BE (1) | BE837039A (sv) |
CA (1) | CA1051556A (sv) |
DE (1) | DE2556187A1 (sv) |
FR (1) | FR2296247A1 (sv) |
GB (1) | GB1536857A (sv) |
IT (1) | IT1051535B (sv) |
NL (1) | NL7416755A (sv) |
SE (1) | SE403847B (sv) |
Families Citing this family (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54947A (en) * | 1977-06-06 | 1979-01-06 | Hitachi Ltd | Failure detection system for digital output circuit |
JPS585479B2 (ja) * | 1977-09-30 | 1983-01-31 | 株式会社日立製作所 | 磁気バブルメモリ試験方法 |
JPS5552581A (en) * | 1978-10-11 | 1980-04-17 | Advantest Corp | Pattern generator |
US4195770A (en) * | 1978-10-24 | 1980-04-01 | Burroughs Corporation | Test generator for random access memories |
DE2852985C2 (de) * | 1978-12-07 | 1983-04-14 | Siemens AG, 1000 Berlin und 8000 München | Verfahren für die Ansteuerung eines Speichers, insbesondere in Fernsprechvermittlungsanlagen |
US4271512A (en) * | 1979-03-30 | 1981-06-02 | Lyhus Arlan J | Information collection and storage system with memory test circuit |
US4243937A (en) * | 1979-04-06 | 1981-01-06 | General Instrument Corporation | Microelectronic device and method for testing same |
US4301535A (en) * | 1979-07-02 | 1981-11-17 | Mostek Corporation | Programmable read only memory integrated circuit with bit-check and deprogramming modes and methods for programming and testing said circuit |
US4495603A (en) * | 1980-07-31 | 1985-01-22 | Varshney Ramesh C | Test system for segmented memory |
US4335457A (en) * | 1980-08-08 | 1982-06-15 | Fairchild Camera & Instrument Corp. | Method for semiconductor memory testing |
WO1983002164A1 (en) * | 1981-12-17 | 1983-06-23 | Ryan, Philip, Meade | Apparatus for high speed fault mapping of large memories |
US4456995A (en) * | 1981-12-18 | 1984-06-26 | International Business Machines Corporation | Apparatus for high speed fault mapping of large memories |
FR2539887B1 (fr) * | 1983-01-20 | 1985-07-26 | Tech Europ Commutation | Procede pour assurer la securite du fonctionnement d'un automate programmable et automate pour la mise en oeuvre du procede |
JPS6048545A (ja) * | 1983-08-26 | 1985-03-16 | Nec Corp | マイクロコンピユ−タ |
US4608687A (en) * | 1983-09-13 | 1986-08-26 | International Business Machines Corporation | Bit steering apparatus and method for correcting errors in stored data, storing the address of the corrected data and using the address to maintain a correct data condition |
US4661930A (en) * | 1984-08-02 | 1987-04-28 | Texas Instruments Incorporated | High speed testing of integrated circuit |
KR900005666B1 (ko) * | 1984-08-30 | 1990-08-03 | 미쓰비시전기 주식회사 | 반도체기억장치 |
US4674090A (en) * | 1985-01-28 | 1987-06-16 | Signetics Corporation | Method of using complementary logic gates to test for faults in electronic components |
US4715034A (en) * | 1985-03-04 | 1987-12-22 | John Fluke Mfg. Co., Inc. | Method of and system for fast functional testing of random access memories |
US4669082A (en) * | 1985-05-09 | 1987-05-26 | Halliburton Company | Method of testing and addressing a magnetic core memory |
US4712213A (en) * | 1985-12-11 | 1987-12-08 | Northern Telecom Limited | Flip status line |
IT1201837B (it) * | 1986-07-22 | 1989-02-02 | Sgs Microelettronica Spa | Sistema per la verifica della funzionalita' e delle caratteristiche di dispositivi a semiconduttore di tipo eprom durante il "burn-in" |
US4872168A (en) * | 1986-10-02 | 1989-10-03 | American Telephone And Telegraph Company, At&T Bell Laboratories | Integrated circuit with memory self-test |
US4891811A (en) * | 1987-02-13 | 1990-01-02 | International Business Machines Corporation | Efficient address test for large memories |
US4801869A (en) * | 1987-04-27 | 1989-01-31 | International Business Machines Corporation | Semiconductor defect monitor for diagnosing processing-induced defects |
US4873705A (en) * | 1988-01-27 | 1989-10-10 | John Fluke Mfg. Co., Inc. | Method of and system for high-speed, high-accuracy functional testing of memories in microprocessor-based units |
US4876684A (en) * | 1988-02-11 | 1989-10-24 | John Fluke Mfg. Co., Inc. | Method of and apparatus for diagnosing failures in read only memory systems and the like |
US5023874A (en) * | 1989-02-23 | 1991-06-11 | Texas Instruments Incorporated | Screening logic circuits for preferred states |
JPH0317760A (ja) * | 1989-06-14 | 1991-01-25 | Mitsubishi Electric Corp | データ書込み確認方式 |
US5070502A (en) * | 1989-06-23 | 1991-12-03 | Digital Equipment Corporation | Defect tolerant set associative cache |
AU660011B2 (en) * | 1991-04-26 | 1995-06-08 | Nec Corporation | Method and system for fault coverage testing memory |
US5422852A (en) * | 1992-02-27 | 1995-06-06 | Texas Instruments Incorporated | Method and system for screening logic circuits |
US5381419A (en) * | 1993-03-01 | 1995-01-10 | At&T Corp. | Method and apparatus for detecting retention faults in memories |
DE4402122A1 (de) * | 1994-01-21 | 1995-07-27 | Siemens Ag | Verfahren zum Test von digitalen Speichereinrichtungen |
US5689466A (en) * | 1995-04-07 | 1997-11-18 | National Semiconductor Corporation | Built in self test (BIST) for multiple RAMs |
US6041426A (en) * | 1995-04-07 | 2000-03-21 | National Semiconductor Corporation | Built in self test BIST for RAMS using a Johnson counter as a source of data |
US5588046A (en) * | 1995-10-23 | 1996-12-24 | Casio Phonemate, Inc. | Digital telephone answering device and method of testing message storage memory therein |
US5996106A (en) | 1997-02-04 | 1999-11-30 | Micron Technology, Inc. | Multi bank test mode for memory devices |
US5913928A (en) | 1997-05-09 | 1999-06-22 | Micron Technology, Inc. | Data compression test mode independent of redundancy |
KR100305679B1 (ko) * | 1999-02-24 | 2001-09-26 | 윤종용 | 반도체 메모리 장치의 테스터의 테스터 방법 및 그 장치 |
JP2001067899A (ja) * | 1999-08-31 | 2001-03-16 | Toshiba Corp | 半導体記憶装置 |
US6421794B1 (en) | 2000-03-09 | 2002-07-16 | John T. Chen | Method and apparatus for diagnosing memory using self-testing circuits |
US6701472B2 (en) * | 2001-02-09 | 2004-03-02 | Adc Telecommunications Israel, Ltd. | Methods for tracing faults in memory components |
DE10133689C2 (de) * | 2001-07-11 | 2003-12-18 | Infineon Technologies Ag | Testverfahren und Testvorrichtung für elektronische Speicher |
US6968479B2 (en) * | 2002-03-06 | 2005-11-22 | Hewlett-Packard Development Company, L.P. | Verifying data in a data storage device |
CN100337285C (zh) * | 2004-07-13 | 2007-09-12 | 海信集团有限公司 | 一种对NAND flash存储器进行物理损坏模拟的***及其方法 |
WO2017058111A1 (en) * | 2015-09-28 | 2017-04-06 | Agency For Science, Technology And Research | Method of error detection in a toggle electric field magnetic random access memory (tef-ram) device and tef-ram device |
CN112102875B (zh) * | 2020-09-23 | 2023-04-11 | 深圳佰维存储科技股份有限公司 | Lpddr测试方法、装置、可读存储介质及电子设备 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2242279C3 (de) * | 1972-08-28 | 1979-11-15 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Schaltungsanordnung zur Ermittlung von Fehlern in einer Speichereinheit eines programmgesteuerten Datenvermittlungssystems |
-
1974
- 1974-12-23 NL NL7416755A patent/NL7416755A/xx not_active Application Discontinuation
-
1975
- 1975-12-13 DE DE19752556187 patent/DE2556187A1/de not_active Withdrawn
- 1975-12-19 SE SE7514414A patent/SE403847B/sv unknown
- 1975-12-19 IT IT30581/75A patent/IT1051535B/it active
- 1975-12-19 GB GB52041/75A patent/GB1536857A/en not_active Expired
- 1975-12-22 CA CA242,285A patent/CA1051556A/en not_active Expired
- 1975-12-23 JP JP15295675A patent/JPS5617760B2/ja not_active Expired
- 1975-12-23 US US05/643,622 patent/US4061908A/en not_active Expired - Lifetime
- 1975-12-23 FR FR7539470A patent/FR2296247A1/fr active Granted
- 1975-12-23 BE BE163084A patent/BE837039A/xx unknown
Also Published As
Publication number | Publication date |
---|---|
SE7514414L (sv) | 1976-06-24 |
US4061908A (en) | 1977-12-06 |
FR2296247B1 (sv) | 1982-01-15 |
GB1536857A (en) | 1978-12-20 |
JPS5189354A (sv) | 1976-08-05 |
IT1051535B (it) | 1981-05-20 |
JPS5617760B2 (sv) | 1981-04-24 |
FR2296247A1 (fr) | 1976-07-23 |
CA1051556A (en) | 1979-03-27 |
NL7416755A (nl) | 1976-06-25 |
BE837039A (fr) | 1976-06-23 |
DE2556187A1 (de) | 1976-07-01 |
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