PL3987358T3 - Projekcyjny układ optyczny do mikrolitografii i sposób wytwarzania komponentu strukturalnego - Google Patents

Projekcyjny układ optyczny do mikrolitografii i sposób wytwarzania komponentu strukturalnego

Info

Publication number
PL3987358T3
PL3987358T3 PL20737364.8T PL20737364T PL3987358T3 PL 3987358 T3 PL3987358 T3 PL 3987358T3 PL 20737364 T PL20737364 T PL 20737364T PL 3987358 T3 PL3987358 T3 PL 3987358T3
Authority
PL
Poland
Prior art keywords
microlithography
producing
projection optical
optical unit
structured component
Prior art date
Application number
PL20737364.8T
Other languages
English (en)
Inventor
Hans Jürgen ROSTALSKI
Holger Muenz
Christoph Menke
Original Assignee
Carl Zeiss Smt Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Smt Gmbh filed Critical Carl Zeiss Smt Gmbh
Publication of PL3987358T3 publication Critical patent/PL3987358T3/pl

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70233Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/7055Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
    • G03F7/70566Polarisation control
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0626Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using three curved mirrors
    • G02B17/0642Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using three curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0647Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
    • G02B17/0663Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/7015Details of optical elements
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/7025Size or form of projection system aperture, e.g. aperture stops, diaphragms or pupil obscuration; Control thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Lenses (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
PL20737364.8T 2019-06-19 2020-06-18 Projekcyjny układ optyczny do mikrolitografii i sposób wytwarzania komponentu strukturalnego PL3987358T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102019208961.5A DE102019208961A1 (de) 2019-06-19 2019-06-19 Projektionsoptik und Projektionsbelichtungsanlage mit einer solchen Projektionsoptik
PCT/EP2020/066866 WO2020254461A1 (en) 2019-06-19 2020-06-18 Projection optical unit for microlithography and method for producing a structured component

Publications (1)

Publication Number Publication Date
PL3987358T3 true PL3987358T3 (pl) 2024-02-26

Family

ID=71527743

Family Applications (1)

Application Number Title Priority Date Filing Date
PL20737364.8T PL3987358T3 (pl) 2019-06-19 2020-06-18 Projekcyjny układ optyczny do mikrolitografii i sposób wytwarzania komponentu strukturalnego

Country Status (10)

Country Link
US (1) US11650510B2 (pl)
EP (1) EP3987358B1 (pl)
JP (1) JP2022537365A (pl)
KR (1) KR20220024099A (pl)
CN (1) CN114008532A (pl)
DE (1) DE102019208961A1 (pl)
ES (1) ES2955806T3 (pl)
PL (1) PL3987358T3 (pl)
TW (1) TW202105077A (pl)
WO (1) WO2020254461A1 (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102021205774A1 (de) 2021-06-08 2022-12-08 Carl Zeiss Smt Gmbh Abbildende Optik
DE102021205775A1 (de) * 2021-06-08 2022-12-08 Carl Zeiss Smt Gmbh Abbildende Optik
DE102021213959B4 (de) 2021-12-08 2024-01-25 Carl Zeiss Smt Gmbh EUV-Lichtquelle sowie Analyse- und/oder Produktionssystem mit einer derartigen EUV-Lichtquelle
DE102022206112A1 (de) * 2022-06-20 2023-12-21 Carl Zeiss Smt Gmbh Abbildende EUV-Optik zur Abbildung eines Objektfeldes in ein Bildfeld

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007012564A1 (de) * 2007-03-13 2008-09-25 Carl Zeiss Smt Ag Projektionsobjektiv einer mikrolithographischen Projektionsbelichtungsanlage
WO2009152867A1 (en) 2008-06-20 2009-12-23 Carl Zeiss Smt Ag Optical system of a microlithographic projection exposure apparatus and microlithographic exposure method
DE102008033340B3 (de) * 2008-07-16 2010-04-08 Carl Zeiss Smt Ag Abbildende Optik
WO2011095209A1 (de) 2010-02-03 2011-08-11 Carl Zeiss Smt Gmbh Mikrolithographische projektionsbelichtungsanlage
DE102010040811A1 (de) 2010-09-15 2012-03-15 Carl Zeiss Smt Gmbh Abbildende Optik
WO2013013947A2 (en) 2011-07-26 2013-01-31 Carl Zeiss Smt Gmbh Optical system of a microlithographic projection exposure apparatus, and microlithographic exposure method
DE102012217769A1 (de) 2012-09-28 2014-04-03 Carl Zeiss Smt Gmbh Optisches System für eine mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren
DE102014208770A1 (de) * 2013-07-29 2015-01-29 Carl Zeiss Smt Gmbh Projektionsoptik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Projektionsbelichtungsanlage mit einer derartigen Projektionsoptik
WO2016078819A1 (en) * 2014-11-18 2016-05-26 Carl Zeiss Smt Gmbh Illumination optical unit for euv projection lithography
KR20180014740A (ko) * 2015-05-28 2018-02-09 칼 짜이스 에스엠테 게엠베하 대물 필드를 이미지 필드 내로 이미징하기 위한 이미징 광학 유닛, 및 이러한 이미징 광학 유닛을 포함하는 투영 노광 장치
DE102015221984A1 (de) * 2015-11-09 2017-05-11 Carl Zeiss Smt Gmbh Abbildende Optik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Projektionsbelichtungsanlage mit einer derartigen abbildenden Optik
DE102015221983A1 (de) * 2015-11-09 2017-05-11 Carl Zeiss Smt Gmbh Abbildende Optik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Projektionsbelichtungsanlage mit einer derartigen abbildenden Optik
DE102016212578A1 (de) * 2016-07-11 2018-01-11 Carl Zeiss Smt Gmbh Projektionsoptik für die EUV-Projektionslithographie
DE102017209162A1 (de) * 2017-05-31 2018-06-07 Carl Zeiss Smt Gmbh Retardierungselement, sowie optisches System
DE102017216893A1 (de) 2017-09-25 2019-03-28 Carl Zeiss Smt Gmbh Abbildende Optik zur Abbildung eines Objektfeldes in ein Bildfeld
DE102019202759A1 (de) * 2019-02-28 2019-04-18 Carl Zeiss Smt Gmbh Abbildende Optik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Projek-tionsbelichtungsanlage mit einer derartigen abbildenden Optik

Also Published As

Publication number Publication date
EP3987358C0 (en) 2023-06-07
WO2020254461A1 (en) 2020-12-24
EP3987358A1 (en) 2022-04-27
ES2955806T3 (es) 2023-12-07
CN114008532A (zh) 2022-02-01
TW202105077A (zh) 2021-02-01
EP3987358B1 (en) 2023-06-07
DE102019208961A1 (de) 2020-12-24
US11650510B2 (en) 2023-05-16
US20220107570A1 (en) 2022-04-07
JP2022537365A (ja) 2022-08-25
KR20220024099A (ko) 2022-03-03

Similar Documents

Publication Publication Date Title
PL3987358T3 (pl) Projekcyjny układ optyczny do mikrolitografii i sposób wytwarzania komponentu strukturalnego
TWI800974B (zh) 一種用於製造光導光學元件的方法
IL289618A (en) Cartridge system and method for producing a cartridge system
IL290148A (en) Cartridge system and method for producing a cartridge system
IL267091A (en) A method for producing transmission optics
EP4021712C0 (de) Verfahren zur herstellung eines brillenglases sowie ein erzeugnis umfassend ein brillenglas
EP3822674A4 (en) LIGHT PROJECTION PROCESS AND APPARATUS
IL289185A (en) Light source and method for use in metrology applications
GB201901025D0 (en) A method for a holographic projector
IL276835A (en) Diffractive optics for holographic projection
GB2580298B (en) A spatial light modulator for holographic projection
EP3822672A4 (en) METHOD AND DEVICE FOR LIGHT PROJECTION
EP3910408A4 (en) OPTICAL PROJECTION SYSTEM AND METHOD
SG11202006968PA (en) Structured light projection for specular surfaces
EP3919964A4 (en) LIGHT PROJECTION METHOD AND LIGHT PROJECTION DEVICE
HK1231655A1 (zh) 種投影圖像調整方法及投影儀
PL3792549T3 (pl) Urządzenie optyczne do modyfikacji rozkładu światła
IL278217A (en) Apparatus and method for adjusting optical lenses
IL278023A (en) A photosensitive composition for EUV light, a method for patterning and a method for producing an electronic device
SG11202108875UA (en) Method for producing coated contact lenses
EP4049088C0 (en) TOGETHER IN AN OPTICAL SYSTEM, IN PARTICULAR A MICROLITHOGRAPHIC PROJECTION EXPOSURE DEVICE
GB202208968D0 (en) Micro-optic device for producing a magnified image
IL285875A (en) A method for controlling a lithographic system
SG11202111128WA (en) Anti-glare film, method for producing anti-glare film, optical member, and image display device
EP4018409A4 (en) SYSTEM AND METHOD FOR POSITIONING A LASER PROJECTION SYSTEM