PL2991095T3 - Zespół przepustowy wysokiego napięcia, urządzenie do dyfrakcji elektronów i sposób manipulowania urządzeniem elektrodowym w środowisku próżni - Google Patents

Zespół przepustowy wysokiego napięcia, urządzenie do dyfrakcji elektronów i sposób manipulowania urządzeniem elektrodowym w środowisku próżni

Info

Publication number
PL2991095T3
PL2991095T3 PL14002942T PL14002942T PL2991095T3 PL 2991095 T3 PL2991095 T3 PL 2991095T3 PL 14002942 T PL14002942 T PL 14002942T PL 14002942 T PL14002942 T PL 14002942T PL 2991095 T3 PL2991095 T3 PL 2991095T3
Authority
PL
Poland
Prior art keywords
high voltage
vacuum environment
electron diffraction
diffraction apparatus
feedthrough assembly
Prior art date
Application number
PL14002942T
Other languages
English (en)
Inventor
Julian Hirscht
Original Assignee
MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. filed Critical MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V.
Publication of PL2991095T3 publication Critical patent/PL2991095T3/pl

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/023Means for mechanically adjusting components not otherwise provided for
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/065Construction of guns or parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/248Components associated with high voltage supply
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/261Details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/295Electron or ion diffraction tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/063Electron sources
    • H01J2237/06325Cold-cathode sources
    • H01J2237/06333Photo emission
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/063Electron sources
    • H01J2237/06325Cold-cathode sources
    • H01J2237/06341Field emission
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/16Vessels

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Particle Accelerators (AREA)
PL14002942T 2014-08-25 2014-08-25 Zespół przepustowy wysokiego napięcia, urządzenie do dyfrakcji elektronów i sposób manipulowania urządzeniem elektrodowym w środowisku próżni PL2991095T3 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP14002942.2A EP2991095B1 (en) 2014-08-25 2014-08-25 High voltage feedthrough assembly, electron diffraction apparatus and method of electrode manipulation in a vacuum environment

Publications (1)

Publication Number Publication Date
PL2991095T3 true PL2991095T3 (pl) 2018-07-31

Family

ID=51421794

Family Applications (2)

Application Number Title Priority Date Filing Date
PL14002942T PL2991095T3 (pl) 2014-08-25 2014-08-25 Zespół przepustowy wysokiego napięcia, urządzenie do dyfrakcji elektronów i sposób manipulowania urządzeniem elektrodowym w środowisku próżni
PL15778205T PL3186818T3 (pl) 2014-08-25 2015-08-14 Zespół przepustowy wysokiego napięcia, elektronowy mikroskop transmisyjny z rozdzielczością czasową i sposób manipulowania elektrodą w środowisku próżniowym

Family Applications After (1)

Application Number Title Priority Date Filing Date
PL15778205T PL3186818T3 (pl) 2014-08-25 2015-08-14 Zespół przepustowy wysokiego napięcia, elektronowy mikroskop transmisyjny z rozdzielczością czasową i sposób manipulowania elektrodą w środowisku próżniowym

Country Status (5)

Country Link
US (1) US10366861B2 (pl)
EP (2) EP2991095B1 (pl)
JP (1) JP6727193B2 (pl)
PL (2) PL2991095T3 (pl)
WO (1) WO2016030004A2 (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107449792B (zh) * 2017-08-30 2023-05-26 中国科学院西安光学精密机械研究所 一种超紧凑型飞秒电子衍射装置
CN111487453B (zh) * 2020-04-21 2023-04-07 中国科学院电工研究所 一种高压电气信号真空馈通装置及电位计
ES2899769B2 (es) * 2020-09-14 2022-10-28 Consorcio Para La Construccion Equipamiento Y Explotacion Del Laboratorio De Luz De Sincrotron Dispositivo de conexion extraible para la excitacion de muestras con senales electricas de alta frecuencia a alto voltaje en microscopios de electrones
CN114137371B (zh) * 2021-11-30 2023-08-25 江西高强电瓷集团有限公司 一种高压绝缘子检测装置

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1281927B (de) 1966-08-23 1968-10-31 Paul Gerhard Klar Dr Ing Vorrichtung zum Etikettieren von Verpackungs-beuteln, vorzugsweise Teebeuteln mit Haltefaden
CH528404A (de) 1970-06-03 1972-09-30 Klar Paul Gerhard Ing Dr Maschine zum Umpacken von mit Haltefaden und Etikett versehenen Aufgussbeuteln, insbesondere Teebeuteln
JPS5184567A (ja) * 1975-01-22 1976-07-23 Hitachi Ltd Denkaidenshihoshagatadenshiju
US4008413A (en) 1975-03-03 1977-02-15 Hughes Aircraft Company Compact high voltage feedthrough for gas discharge devices
US3978363A (en) 1975-07-22 1976-08-31 Hughes Aircraft Company High-voltage mechanical support for gas discharge device
JPS55148357A (en) * 1979-05-09 1980-11-18 Hitachi Ltd Electric field emission type electrode gun
FR2527383A1 (fr) * 1982-05-24 1983-11-25 Univ Reims Champagne Ardenne Canon a electrons avec cathode a emission de champ et lentille magnetique
JPS61131058A (ja) * 1984-11-29 1986-06-18 Fujitsu Ltd デ−タ転送制御方式
JPH057725Y2 (pl) * 1985-02-05 1993-02-26
JPH0254853A (ja) * 1988-08-19 1990-02-23 Jeol Ltd 荷電粒子線装置
EP0383988B1 (de) 1989-02-20 1993-08-11 Siemens Aktiengesellschaft Hochspannungsdurchführung für ölgekühlte elektrische Geräte
IL104608A0 (en) * 1992-02-13 1993-06-10 Hughes Aircraft Co Apparatus for programmed plasma etching tool motion to modify solid layer thickness profiles
JP3324275B2 (ja) * 1994-04-11 2002-09-17 日新ハイボルテージ株式会社 電子線照射装置
US5929373A (en) 1997-06-23 1999-07-27 Applied Materials, Inc. High voltage feed through
IT1299331B1 (it) 1998-01-30 2000-03-16 Ima Spa Sacchetto - filtro di tipo bi-lobo per prodotti da infusione.
JP2001143648A (ja) * 1999-11-17 2001-05-25 Hitachi Ltd 光励起電子線源および電子線応用装置
US7085351B2 (en) 2000-10-06 2006-08-01 University Of North Carolina At Chapel Hill Method and apparatus for controlling electron beam current
JP3720711B2 (ja) * 2001-01-22 2005-11-30 株式会社日立製作所 電子線光軸補正方法
US6570962B1 (en) * 2002-01-30 2003-05-27 Koninklijke Philips Electronics N.V. X-ray tube envelope with integral corona shield
DE10227703B3 (de) 2002-06-21 2004-02-12 Forschungszentrum Karlsruhe Gmbh Durchführung für elektrische Hochspannung durch eine Wand, die einen Umgebungsbereich von einem Prozessbereich trennt
JP2007531876A (ja) * 2004-04-02 2007-11-08 カリフォルニア インスティテュート オブ テクノロジー 超高速光電子顕微鏡のための方法およびシステム
JP5007034B2 (ja) * 2005-09-14 2012-08-22 公益財団法人高輝度光科学研究センター 光電変換素子及びそれを用いた電子線発生装置
JP4385048B2 (ja) * 2006-12-12 2009-12-16 株式会社日立ハイテクノロジーズ 荷電ビーム銃
JP5099756B2 (ja) * 2007-06-18 2012-12-19 Jfeエンジニアリング株式会社 電子線発生装置およびその制御方法
US8779380B2 (en) * 2008-06-05 2014-07-15 Hitachi High-Technologies Corporation Ion beam device
JP5394763B2 (ja) 2009-02-04 2014-01-22 日本電子株式会社 冷陰極電子銃の自動入射軸合わせ方法
US20120217391A1 (en) * 2009-11-06 2012-08-30 Hiroyasu Shichi Charged particle microscope
WO2011132767A1 (ja) * 2010-04-22 2011-10-27 株式会社日立ハイテクノロジーズ ガス電解電離イオン源、及びイオンビーム装置
JP5462958B2 (ja) * 2010-12-22 2014-04-02 株式会社日立ハイテクノロジーズ 荷電粒子放出銃及び荷電粒子線装置
FR2987165B1 (fr) 2012-02-16 2014-02-28 Centre Nat Rech Scient Dispositif et procede d'emission d'electrons et dispositif comportant un tel systeme d'emission d'electrons
JP2016027525A (ja) * 2012-10-16 2016-02-18 株式会社日立ハイテクノロジーズ 荷電粒子線源の冷却機構を具備する荷電粒子線装置及び荷電粒子線源
US9159517B2 (en) * 2012-11-30 2015-10-13 Far-Tech, Inc. Photocathode enhancement system
US9269527B2 (en) * 2012-12-17 2016-02-23 Lawrence Livermore National Security, Llc High-speed multi-frame dynamic transmission electron microscope image acquisition system with arbitrary timing
DE102012223569B4 (de) * 2012-12-18 2014-08-14 Siemens Aktiengesellschaft Röntgenröhre
JP2014160547A (ja) * 2013-02-19 2014-09-04 Canon Inc 放射線発生管及びそれを用いた放射線撮影システム

Also Published As

Publication number Publication date
US20170229276A1 (en) 2017-08-10
EP3186818B1 (en) 2018-01-31
JP2017529661A (ja) 2017-10-05
EP2991095B1 (en) 2018-01-31
PL3186818T3 (pl) 2018-07-31
WO2016030004A3 (en) 2016-04-21
WO2016030004A2 (en) 2016-03-03
JP6727193B2 (ja) 2020-07-22
EP3186818A2 (en) 2017-07-05
US10366861B2 (en) 2019-07-30
EP2991095A1 (en) 2016-03-02

Similar Documents

Publication Publication Date Title
IL261620B (en) Devices and methods for high voltage and solar applications
EP3203551A4 (en) Positive electrode active material and method for manufacturing same
EP3156367A4 (en) Negative electrode active material and method for preparing same
EP3242349A4 (en) Silicon-based anode active material and method for manufacturing same
EP3427319A4 (en) GRAPHENE DISPERSION, METHOD FOR PRODUCING ELECTRODE PULP, AND METHOD FOR PRODUCING ELECTRODE
EP3168910A4 (en) Positive electrode and method for manufacturing same
PL3172283T3 (pl) Współdyspersje grafenowych cząstek węgla i sposoby ich wykonania
EP3158599A4 (en) Porous silicon electrode and method
EP3125342A4 (en) Gas diffusion electrode and method for manufacturing same
EP3136530A4 (en) Voltage stability-monitoring device and method
EP3324466A4 (en) Negative electrode and method for manufacturing same
EP3229000A4 (en) Spectrometry device and spectrometry method
EP3336951A4 (en) ELECTRODE ASSEMBLY AND METHOD OF MANUFACTURING
EP3197245A4 (en) Plasma gas irradiation device
EP3500072A4 (en) PLASMA GENERATION DEVICE AND PLASMA IRRADIATION METHOD
ZA201701142B (en) Electrode for electrochlorination processes and method of manufacturing thereof
EP3340347A4 (en) Electrode manufacturing apparatus and method
EP3241231A4 (en) Electron induced dissociation devices and methods
EP3146579A4 (en) Battery electrode and method
EP3242317A4 (en) Electrode ring used for ion mobility spectrometer, ion migration tube and ion mobility spectrometer
IL252167B (en) Implantable electrode device and method for its manufacture
EP3301743A4 (en) Negative electrode manufacturing method and negative electrode
EP3211695A4 (en) Method and apparatus for manufacturing electrode for secondary battery, electrode for secondary battery, and secondary battery
EP3098829A4 (en) Electrode material and method for producing electrode material
EP3399579A4 (en) PROCESS FOR PREPARING POSITIVE ELECTRODE ACTIVE MATERIAL AND POSITIVE ELECTRODE ACTIVE MATERIAL PRODUCED THEREFOR