NL7811716A - Elektronenmicroscoop. - Google Patents

Elektronenmicroscoop.

Info

Publication number
NL7811716A
NL7811716A NL7811716A NL7811716A NL7811716A NL 7811716 A NL7811716 A NL 7811716A NL 7811716 A NL7811716 A NL 7811716A NL 7811716 A NL7811716 A NL 7811716A NL 7811716 A NL7811716 A NL 7811716A
Authority
NL
Netherlands
Prior art keywords
electron microscope
microscope
electron
Prior art date
Application number
NL7811716A
Other languages
English (en)
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of NL7811716A publication Critical patent/NL7811716A/nl

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/22—Optical or photographic arrangements associated with the tube
    • H01J37/224—Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor, e.g. cameras, TV-cameras, photographic equipment, exposure control; Optical subsystems specially adapted therefor, e.g. microscopes for observing image on luminescent screen
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
NL7811716A 1977-12-01 1978-11-29 Elektronenmicroscoop. NL7811716A (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14332477A JPS5477060A (en) 1977-12-01 1977-12-01 Electron microscope

Publications (1)

Publication Number Publication Date
NL7811716A true NL7811716A (nl) 1979-06-06

Family

ID=15336129

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7811716A NL7811716A (nl) 1977-12-01 1978-11-29 Elektronenmicroscoop.

Country Status (4)

Country Link
US (1) US4206349A (nl)
JP (1) JPS5477060A (nl)
DE (1) DE2851640C2 (nl)
NL (1) NL7811716A (nl)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5851664B2 (ja) * 1979-03-28 1983-11-17 株式会社日立製作所 試料像表示装置
USRE32388E (en) * 1980-01-09 1987-03-31 Burroughs Corporation Apparatus for analyzing semiconductor memories
JPS56147351A (en) * 1980-04-18 1981-11-16 Jeol Ltd Image photographying device for transmission type electron microscope
DE8105611U1 (de) * 1981-02-27 1981-11-19 Fa. Carl Zeiss, 7920 Heidenheim Auswertevorrichtung fuer elektronenoptische bilder
JPS57145262U (nl) * 1981-03-09 1982-09-11
US4468560A (en) * 1982-02-11 1984-08-28 Hitachi, Ltd. Electron microscope equipped with measuring facility
JPS60101371U (ja) * 1983-12-16 1985-07-10 日本電子株式会社 像撮影装置
JPS60109259U (ja) * 1983-12-26 1985-07-24 日本電子株式会社 電子顕微鏡におけるスル−フオ−カス撮影装置
JPH0425803Y2 (nl) * 1984-10-05 1992-06-22
US4651220A (en) * 1984-10-12 1987-03-17 Fuji Photo Film Co., Ltd. Method of recording and reproducing images produced by an electron microscope
JPS6196643A (ja) * 1984-10-18 1986-05-15 Fuji Photo Film Co Ltd 透過型電子顕微鏡
US4942300A (en) * 1984-11-16 1990-07-17 Fuji Photo Film Co., Ltd. Electron beam image recording using stimulable phosphor sheet of reduced thickness and/or with no protective layer
JPS61163549A (ja) * 1985-01-16 1986-07-24 Fuji Photo Film Co Ltd 電子顕微鏡像記録再生方法
JPH0616399B2 (ja) * 1985-04-11 1994-03-02 富士写真フイルム株式会社 電子顕微鏡像記録装置
US4739399A (en) * 1987-08-06 1988-04-19 Gatan Inc. TV system for transmission electron microscopes
JP2818981B2 (ja) * 1991-04-26 1998-10-30 株式会社日立製作所 電子顕微鏡
JP3153277B2 (ja) * 1991-08-30 2001-04-03 株式会社日立製作所 透過形電子顕微鏡
CH690384A5 (de) * 1995-03-24 2000-08-15 Zeiss Carl Fa Computerunterstütztes Video-Mikroskop.
DE29507225U1 (de) * 1995-04-29 1995-07-13 Grünewald, Wolfgang, Dr.rer.nat., 09122 Chemnitz Ionenstrahlpräparationsvorrichtung für die Elektronenmikroskopie
US6573502B2 (en) * 2001-03-12 2003-06-03 Jeol Ltd. Combined electron microscope
JP5086567B2 (ja) * 2006-06-23 2012-11-28 オリンパス株式会社 照明装置及び照明方法
US7745786B2 (en) * 2008-03-19 2010-06-29 Fama Leo A Method and apparatus allowing simultaneous direct observation and electronic capture of scintillation images in an electron microscope
CN104091745B (zh) * 2014-07-18 2016-06-01 镇江乐华电子科技有限公司 一种集成tem荧光屏和stem探测器的一体化结构
CN105742145B (zh) * 2014-07-18 2017-10-13 镇江乐华电子科技有限公司 一种集成tem荧光屏和stem探测器的一体化结构

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL278232A (nl) * 1961-05-12
DE1439433A1 (de) * 1964-08-17 1969-02-06 Siemens Ag Korpuskularstrahlmikroskop,insbesondere Elektronenmikroskop,mit einer Einrichtung zur Fernsehuebertragung des Leuchtschirmbildes
DE2204654C3 (de) * 1972-01-28 1974-10-10 Siemens Ag, 1000 Berlin Und 8000 Muenchen Korpuskularstrahlgerät mit einem Leuchtschirm und einer Fernsehkamera
NL7203932A (nl) * 1972-03-24 1973-09-26

Also Published As

Publication number Publication date
US4206349A (en) 1980-06-03
DE2851640A1 (de) 1979-06-07
DE2851640C2 (de) 1983-04-28
JPS5477060A (en) 1979-06-20

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Legal Events

Date Code Title Description
A1A A request for search or an international-type search has been filed
BB A search report has been drawn up
BV The patent application has lapsed