NL7507837A - Controlesysteem voor digitale schakelingsmo- dulen. - Google Patents
Controlesysteem voor digitale schakelingsmo- dulen.Info
- Publication number
- NL7507837A NL7507837A NL7507837A NL7507837A NL7507837A NL 7507837 A NL7507837 A NL 7507837A NL 7507837 A NL7507837 A NL 7507837A NL 7507837 A NL7507837 A NL 7507837A NL 7507837 A NL7507837 A NL 7507837A
- Authority
- NL
- Netherlands
- Prior art keywords
- control system
- digital circuit
- circuit modules
- modules
- digital
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/484,473 US4000460A (en) | 1974-07-01 | 1974-07-01 | Digital circuit module test system |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7507837A true NL7507837A (nl) | 1976-01-05 |
Family
ID=23924293
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7507837A NL7507837A (nl) | 1974-07-01 | 1975-07-01 | Controlesysteem voor digitale schakelingsmo- dulen. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4000460A (nl) |
CA (1) | CA1027639A (nl) |
GB (1) | GB1498125A (nl) |
NL (1) | NL7507837A (nl) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4066882A (en) * | 1976-08-16 | 1978-01-03 | Grumman Aerospace Corporation | Digital stimulus generating and response measuring means |
US4070565A (en) * | 1976-08-18 | 1978-01-24 | Zehntel, Inc. | Programmable tester method and apparatus |
US4108358A (en) * | 1977-03-22 | 1978-08-22 | The Bendix Corporation | Portable circuit tester |
SU802970A1 (ru) * | 1977-04-08 | 1981-02-07 | Предприятие П/Я В-8495 | Устройство дл функционального конт-РОл бОльшиХ иНТЕгРАльНыХ CXEM |
US4168796A (en) * | 1978-04-13 | 1979-09-25 | Ncr Corporation | Tester with driver/sensor circuit having programmable termination devices |
US4174805A (en) * | 1978-04-13 | 1979-11-20 | Ncr Corporation | Method and apparatus for transmitting data to a predefined destination bus |
US4216539A (en) * | 1978-05-05 | 1980-08-05 | Zehntel, Inc. | In-circuit digital tester |
USRE31828E (en) * | 1978-05-05 | 1985-02-05 | Zehntel, Inc. | In-circuit digital tester |
US4459695A (en) * | 1979-11-07 | 1984-07-10 | Davy Mcgee (Sheffield) Limited | Fault finding in an industrial installation by means of a computer |
US4379259A (en) * | 1980-03-12 | 1983-04-05 | National Semiconductor Corporation | Process of performing burn-in and parallel functional testing of integrated circuit memories in an environmental chamber |
US4316259A (en) * | 1980-03-18 | 1982-02-16 | Grumman Aerospace Corporation | Programmable function generator |
SE8305262L (sv) * | 1982-12-14 | 1984-06-15 | Gen Electric | Universellt logikkort |
US4553049A (en) * | 1983-10-07 | 1985-11-12 | International Business Machines Corporation | Oscillation prevention during testing of integrated circuit logic chips |
US4656632A (en) * | 1983-11-25 | 1987-04-07 | Giordano Associates, Inc. | System for automatic testing of circuits and systems |
US4937827A (en) * | 1985-03-01 | 1990-06-26 | Mentor Graphics Corporation | Circuit verification accessory |
DE3543699A1 (de) * | 1985-12-11 | 1987-06-19 | Rohde & Schwarz | Verfahren zum pruefen der einzelnen bauelemente einer leiterplatte (in-circuit-test) |
US4744084A (en) * | 1986-02-27 | 1988-05-10 | Mentor Graphics Corporation | Hardware modeling system and method for simulating portions of electrical circuits |
US6539497B2 (en) * | 1987-06-02 | 2003-03-25 | Texas Instruments Incorporated | IC with selectively applied functional and test clocks |
US5291495A (en) * | 1991-07-12 | 1994-03-01 | Ncr Corporation | Method for designing a scan path for a logic circuit and testing of the same |
US5369604A (en) * | 1993-02-05 | 1994-11-29 | Texas Instruments Incorporated | Test plan generation for analog integrated circuits |
US5554827A (en) * | 1993-02-22 | 1996-09-10 | Wacom Co., Ltd. | Method of and apparatus for determining whether a digitizer coordinate detecting tablet is properly operating and/or writing adjustment data into a memory associated with the tablet |
US6393385B1 (en) * | 1995-02-07 | 2002-05-21 | Texas Instruments Incorporated | Knowledge driven simulation time and data reduction technique |
US6185709B1 (en) * | 1998-06-30 | 2001-02-06 | International Business Machines Corporation | Device for indicating the fixability of a logic circuit |
US6385739B1 (en) | 1999-07-19 | 2002-05-07 | Tivo Inc. | Self-test electronic assembly and test system |
US6526841B1 (en) * | 1999-08-02 | 2003-03-04 | Pemstar, Inc. | Environmental test chamber and a carrier for use therein |
DE10110050A1 (de) * | 2001-03-02 | 2002-09-05 | Bosch Gmbh Robert | Verfahren zur Absicherung sicherheitskritischer Programmteile vor versehentlicher Ausführung und eine Speichereinrichtung zur Durchführung dieses Verfahrens |
US7672452B2 (en) * | 2002-05-03 | 2010-03-02 | General Instrument Corporation | Secure scan |
JP2003332443A (ja) * | 2002-05-08 | 2003-11-21 | Toshiba Corp | 半導体集積回路とその設計支援装置およびテスト方法 |
US7231573B2 (en) * | 2002-12-20 | 2007-06-12 | Verigy Pte. Ltd. | Delay management system |
JP3828502B2 (ja) * | 2003-03-26 | 2006-10-04 | 株式会社東芝 | 集積回路 |
US7145977B2 (en) * | 2003-07-30 | 2006-12-05 | International Business Machines Corporation | Diagnostic method and apparatus for non-destructively observing latch data |
US7232101B2 (en) * | 2003-11-26 | 2007-06-19 | Pemstar, Inc. | Hard drive test fixture |
US20050225338A1 (en) * | 2004-03-31 | 2005-10-13 | Sands Richard L | Hard drive test fixture |
US20050240845A1 (en) * | 2004-04-23 | 2005-10-27 | Texas Instruments Incorporated | Reducing Number of Pins Required to Test Integrated Circuits |
KR101851945B1 (ko) * | 2011-06-29 | 2018-04-26 | 삼성전자주식회사 | 반도체 모듈 및 이를 포함하는 테스트 시스템 |
US11221378B2 (en) * | 2020-02-05 | 2022-01-11 | General Electric Company | Systems, methods, and program products for testing electrical loops included in control circuits of electrical power systems |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3219927A (en) * | 1958-09-15 | 1965-11-23 | North American Aviation Inc | Automatic functional test equipment utilizing digital programmed storage means |
US3581074A (en) * | 1968-02-19 | 1971-05-25 | Burroughs Corp | Automatic checkout apparatus |
US3621387A (en) * | 1969-08-21 | 1971-11-16 | Gen Instrument Corp | Computer-controlled tester for integrated circuit devices |
US3651315A (en) * | 1970-05-14 | 1972-03-21 | Collins Radio Co | Digital products inspection system |
US3673397A (en) * | 1970-10-02 | 1972-06-27 | Singer Co | Circuit tester |
DE2121330C3 (de) * | 1971-04-30 | 1974-10-17 | Ludwig 6369 Dortelweil Illian | Verfahren und Schaltungsanordnung zum Prüfen digital arbeitender elektronischer Geräte und ihrer Bauteile |
-
1974
- 1974-07-01 US US05/484,473 patent/US4000460A/en not_active Expired - Lifetime
-
1975
- 1975-05-12 GB GB19870/75A patent/GB1498125A/en not_active Expired
- 1975-06-20 CA CA229,807A patent/CA1027639A/en not_active Expired
- 1975-07-01 NL NL7507837A patent/NL7507837A/nl unknown
Also Published As
Publication number | Publication date |
---|---|
GB1498125A (en) | 1978-01-18 |
US4000460A (en) | 1976-12-28 |
CA1027639A (en) | 1978-03-07 |
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