NL1036321A1 - Device control method and apparatus. - Google Patents

Device control method and apparatus. Download PDF

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Publication number
NL1036321A1
NL1036321A1 NL1036321A NL1036321A NL1036321A1 NL 1036321 A1 NL1036321 A1 NL 1036321A1 NL 1036321 A NL1036321 A NL 1036321A NL 1036321 A NL1036321 A NL 1036321A NL 1036321 A1 NL1036321 A1 NL 1036321A1
Authority
NL
Netherlands
Prior art keywords
control method
device control
control
Prior art date
Application number
NL1036321A
Other languages
English (en)
Inventor
Patricius Aloysius Jacobus Tinnemans
Heine Melle Mulder
Marius Ravensbergen
Wilfred Edward Endendijk
Jozef Ferdinand Dymphna Verbeeck
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of NL1036321A1 publication Critical patent/NL1036321A1/nl

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70283Mask effects on the imaging process
    • G03F7/70291Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70491Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
    • G03F7/70508Data handling in all parts of the microlithographic apparatus, e.g. handling pattern data for addressable masks or data transfer to or from different components within the exposure apparatus
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0833Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
    • G02B26/0841Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting element being moved or deformed by electrostatic means
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/3433Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using light modulating elements actuated by an electric field and being other than liquid crystal devices and electrochromic devices
    • G09G3/346Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using light modulating elements actuated by an electric field and being other than liquid crystal devices and electrochromic devices based on modulation of the reflection angle, e.g. micromirrors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
NL1036321A 2007-12-20 2008-12-17 Device control method and apparatus. NL1036321A1 (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US829307P 2007-12-20 2007-12-20

Publications (1)

Publication Number Publication Date
NL1036321A1 true NL1036321A1 (nl) 2009-06-29

Family

ID=40898927

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1036321A NL1036321A1 (nl) 2007-12-20 2008-12-17 Device control method and apparatus.

Country Status (3)

Country Link
US (1) US8089672B2 (nl)
JP (1) JP2009152607A (nl)
NL (1) NL1036321A1 (nl)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5146696B2 (ja) * 2010-03-03 2013-02-20 Tdk株式会社 磁気センサ
NL2006625A (en) 2010-05-26 2011-11-29 Asml Netherlands Bv Illumination system and lithographic apparatus.
US9175957B2 (en) * 2012-09-24 2015-11-03 Alces Technology, Inc. Grayscale patterns from binary spatial light modulators
US9335544B2 (en) * 2013-03-15 2016-05-10 Rit Wireless Ltd. Electrostatically steerable actuator
DE102014203041A1 (de) 2014-02-19 2015-08-20 Carl Zeiss Smt Gmbh Beleuchtungssystem einer mikrolithographischen Projektionsbelichtungsanlage und Verfahren zum Betreiben eines solchen
US10451890B2 (en) 2017-01-16 2019-10-22 Cymer, Llc Reducing speckle in an excimer light source

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US5523193A (en) 1988-05-31 1996-06-04 Texas Instruments Incorporated Method and apparatus for patterning and imaging member
EP0527166B1 (de) 1990-05-02 1995-06-14 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. Belichtungsvorrichtung
US5229872A (en) 1992-01-21 1993-07-20 Hughes Aircraft Company Exposure device including an electrically aligned electronic mask for micropatterning
JPH06283404A (ja) * 1993-03-26 1994-10-07 Nec Corp 縮小投影露光装置用のアパーチャ
JPH09319008A (ja) * 1996-05-29 1997-12-12 Fuji Photo Film Co Ltd 画像形成装置
ATE216091T1 (de) 1997-01-29 2002-04-15 Micronic Laser Systems Ab Verfahren und gerät zur erzeugung eines musters auf einem mit fotoresist beschichteten substrat mittels fokusiertem laserstrahl
SE509062C2 (sv) 1997-02-28 1998-11-30 Micronic Laser Systems Ab Dataomvandlingsmetod för en laserskrivare med flera strålar för mycket komplexa mikrokolitografiska mönster
JPH113849A (ja) * 1997-06-12 1999-01-06 Sony Corp 可変変形照明フィルタ及び半導体露光装置
JPH11194749A (ja) * 1998-01-05 1999-07-21 Matsushita Electric Ind Co Ltd 液晶表示装置とその駆動方法
JPH11218694A (ja) * 1998-01-29 1999-08-10 Nikon Corp 露光光源装置及び露光光源制御方法
JPH11327516A (ja) * 1998-05-13 1999-11-26 Digital Electronics Corp 表示装置
EP1046941B1 (en) * 1999-04-21 2005-06-29 Fuji Photo Film Co., Ltd. Correcting method of light beam position in a scanning apparatus
JP2001249649A (ja) * 2000-03-08 2001-09-14 Matsushita Electric Ind Co Ltd 液晶表示装置の駆動方法
US7283112B2 (en) * 2002-03-01 2007-10-16 Microsoft Corporation Reflective microelectrical mechanical structure (MEMS) optical modulator and optical display system
JP2003302947A (ja) * 2002-04-10 2003-10-24 Seiko Epson Corp 電気光学装置及びその駆動方法
US6666561B1 (en) * 2002-10-28 2003-12-23 Hewlett-Packard Development Company, L.P. Continuously variable analog micro-mirror device
JP2005091539A (ja) * 2003-09-16 2005-04-07 Fuji Photo Film Co Ltd 画像記録方法および装置
US7446919B2 (en) * 2004-04-30 2008-11-04 Symbol Technologies, Inc. Piezoelectric actuated scanning mirror
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US7289256B2 (en) * 2004-09-27 2007-10-30 Idc, Llc Electrical characterization of interferometric modulators
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JP2006253487A (ja) * 2005-03-11 2006-09-21 Nikon Corp 照明装置、投影露光方法、投影露光装置、及びマイクロデバイスの製造方法
US7283291B2 (en) * 2005-04-08 2007-10-16 The Boeing Company High speed beam steering/field of view adjustment
US7321416B2 (en) * 2005-06-15 2008-01-22 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, device manufactured thereby, and controllable patterning device utilizing a spatial light modulator with distributed digital to analog conversion
JP2007047638A (ja) * 2005-08-12 2007-02-22 Seiko Epson Corp 画像表示装置及び光源装置
JP2007133006A (ja) * 2005-11-08 2007-05-31 Shinko Electric Ind Co Ltd 露光機の故障検出装置
US7626181B2 (en) * 2005-12-09 2009-12-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8052289B2 (en) * 2006-06-07 2011-11-08 Asml Netherlands B.V. Mirror array for lithography
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JP5374860B2 (ja) * 2007-11-08 2013-12-25 株式会社ニコン マイクロアクチュエータ及びその製造方法、マイクロアクチュエータアレー、マイクロアクチュエータ装置、光学デバイス、表示装置、露光装置、並びにデバイス製造方法
JP5172364B2 (ja) * 2008-01-16 2013-03-27 スタンレー電気株式会社 光偏向器

Also Published As

Publication number Publication date
JP2009152607A (ja) 2009-07-09
US8089672B2 (en) 2012-01-03
US20090190197A1 (en) 2009-07-30

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