MX364011B - Aparato y metodo de medicion de soldadura. - Google Patents

Aparato y metodo de medicion de soldadura.

Info

Publication number
MX364011B
MX364011B MX2016014380A MX2016014380A MX364011B MX 364011 B MX364011 B MX 364011B MX 2016014380 A MX2016014380 A MX 2016014380A MX 2016014380 A MX2016014380 A MX 2016014380A MX 364011 B MX364011 B MX 364011B
Authority
MX
Mexico
Prior art keywords
artifacts
measuring
framework
methods
specimen
Prior art date
Application number
MX2016014380A
Other languages
English (en)
Other versions
MX2016014380A (es
Inventor
Wei Huang
J Spinella Donald
Globig Michael
Rao Vemuri K
Original Assignee
Arconic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arconic Inc filed Critical Arconic Inc
Publication of MX2016014380A publication Critical patent/MX2016014380A/es
Publication of MX364011B publication Critical patent/MX364011B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0037—Measuring of dimensions of welds
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/51—Housings
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/90—Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0296—Welds
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Geometry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Un aparato y método de medición de artefactos de soldadura rota por puntos tiene una estructura que soporta una lámpara y una pluralidad de cámaras para la obtención de imágenes controladas de una muestra con una distorsión y paralelaje mínimos. La estructura sostiene la muestra plana y en una posición reproducible, controlando el movimiento mientras se forma la imagen. Los datos de imagen son recibidos en una computadora programada con un software de procesamiento de imágenes que aísla y mide los artefactos. Un estándar de calibración se utiliza para corregir los errores o aberraciones.
MX2016014380A 2014-05-05 2015-05-01 Aparato y metodo de medicion de soldadura. MX364011B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201461988641P 2014-05-05 2014-05-05
PCT/US2015/028855 WO2015171459A1 (en) 2014-05-05 2015-05-01 Apparatus and methods for weld measurement

Publications (2)

Publication Number Publication Date
MX2016014380A MX2016014380A (es) 2017-05-23
MX364011B true MX364011B (es) 2019-04-11

Family

ID=54355592

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016014380A MX364011B (es) 2014-05-05 2015-05-01 Aparato y metodo de medicion de soldadura.

Country Status (8)

Country Link
US (1) US9927367B2 (es)
EP (1) EP3140639A4 (es)
JP (1) JP6267366B2 (es)
KR (1) KR101886947B1 (es)
CN (2) CN204944428U (es)
CA (1) CA2947720C (es)
MX (1) MX364011B (es)
WO (1) WO2015171459A1 (es)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3013512B1 (en) 2013-06-26 2020-07-29 Howmet Aerospace Inc. Resistance welding fastener, apparatus and methods
KR101936486B1 (ko) 2014-02-03 2019-01-08 아르코닉 인코포레이티드 저항 용접 체결구, 장치 및 방법
EP3140639A4 (en) * 2014-05-05 2018-01-31 Arconic Inc. Apparatus and methods for weld measurement
EP3143377A4 (en) * 2014-05-16 2018-01-24 Arconic Inc. Peeling apparatus and method for separating welded layers
WO2016100179A1 (en) 2014-12-15 2016-06-23 Alcoa Inc. Resistance welding fastener, apparatus and methods for joining similar and dissimilar materials
KR102319841B1 (ko) 2015-09-16 2021-10-29 하우매트 에어로스페이스 인코포레이티드 리벳 공급 장치
WO2017130700A1 (ja) 2016-01-26 2017-08-03 富士フイルム株式会社 撮影支援装置及び撮影支援方法
US10593034B2 (en) 2016-03-25 2020-03-17 Arconic Inc. Resistance welding fasteners, apparatus and methods for joining dissimilar materials and assessing joints made thereby
WO2018188062A1 (zh) * 2017-04-14 2018-10-18 深圳市方鹏科技有限公司 一种基于虚拟现实技术的机械人成像***
CN108226178A (zh) * 2017-12-26 2018-06-29 广东美的智能机器人有限公司 设备外观检测***
DE102018100500A1 (de) 2018-01-11 2019-07-11 Hauni Maschinenbau Gmbh Vorrichtung und Verfahren zum Prüfen von stabförmigen Artikeln der Tabak verarbeitenden Industrie
JP7262927B2 (ja) * 2018-03-30 2023-04-24 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
CN109352216A (zh) * 2018-10-22 2019-02-19 秦家燕 一种新式可自诊断的工业机器人及其使用方法
TWI684818B (zh) * 2019-02-01 2020-02-11 銓發科技股份有限公司 攝影裝置
RU2727049C1 (ru) * 2020-01-10 2020-07-17 федеральное государственное бюджетное образовательное учреждение высшего образования "Алтайский государственный технический университет им. И.И. Ползунова" (АлтГТУ) Комплекс для измерительного контроля сварных стыковых соединений
KR102506492B1 (ko) * 2020-10-27 2023-03-07 선문대학교 산학협력단 무빙 타입 비전 검사 장치 및 검사 방법
KR102439941B1 (ko) * 2020-10-27 2022-09-06 선문대학교 산학협력단 복수의 카메라부가 구비된 비전 검사 장치
CN113414482B (zh) * 2021-06-15 2023-05-16 中国第一汽车股份有限公司 一种检测机器人点焊电极位置补偿功能的装置和方法
CN114554090B (zh) * 2022-02-21 2023-11-07 天津大学 基于电信号监测的可控自触发图像采集***和方法
CN115598061A (zh) * 2022-09-29 2023-01-13 苏州天准科技股份有限公司（Cn） 用于3c产品边缘溢胶的检测装置

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2656760A (en) * 1950-07-08 1953-10-27 Bausch & Lomb Slide clamping mechanism for mechanical stages for microscopes
JPS61293657A (ja) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd 半田付け外観検査方法
CA2064250C (en) * 1989-08-15 2002-04-30 Don W. Cochran Engineered video inspection lighting array
US5060065A (en) * 1990-02-23 1991-10-22 Cimflex Teknowledge Corporation Apparatus and method for illuminating a printed circuit board for inspection
US5245421A (en) * 1990-09-19 1993-09-14 Control Automation, Incorporated Apparatus for inspecting printed circuit boards with surface mounted components
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
JP2725582B2 (ja) * 1993-12-27 1998-03-11 日本鋼管株式会社 スポット溶接のナゲット径測定方法
FI97646C (fi) * 1994-10-19 1997-01-27 Kvaerner Masa Yards Oy Laitteisto hitsattujen levykokonaisuuksien tarkastamiseksi
JP2976869B2 (ja) * 1995-12-28 1999-11-10 日産自動車株式会社 表面欠陥検査装置
TW402856B (en) * 1996-12-26 2000-08-21 Palite Corp LED illuminator
US5862973A (en) * 1997-01-30 1999-01-26 Teradyne, Inc. Method for inspecting solder paste in printed circuit board manufacture
US6078021A (en) * 1997-08-29 2000-06-20 Chang; Dale U. Apparatus and method of laser welding inside bellows joints and spacer for manufacturing bellows
AU4219699A (en) * 1998-05-29 1999-12-13 Northeast Robotics Llc Miniature inspection system
US6273338B1 (en) * 1998-09-22 2001-08-14 Timothy White Low cost color-programmable focusing ring light
US6563575B1 (en) * 1999-08-10 2003-05-13 Automated Technology Services, Inc. Optical sensing system for detecting welds and defects in metal
WO2001050116A1 (en) * 2000-01-06 2001-07-12 Thermal Wave Imaging, Inc. Automated non-destructive weld evaluation method and apparatus
US7075565B1 (en) * 2000-06-14 2006-07-11 Landrex Technologies Co., Ltd. Optical inspection system
US6414261B1 (en) * 2000-11-16 2002-07-02 Siemens Aktiengesellschaft Analysis of weld image to determine weld quality
US7132617B2 (en) * 2002-02-20 2006-11-07 Daimlerchrysler Corporation Method and system for assessing quality of spot welds
JP4051568B2 (ja) * 2004-02-09 2008-02-27 ソニー株式会社 部品実装基板検査装置
TWI302756B (en) 2004-04-19 2008-11-01 Phoseon Technology Inc Imaging semiconductor structures using solid state illumination
EP1612569A3 (en) * 2004-06-30 2006-02-08 Omron Corporation Method and apparatus for substrate surface inspection using multi-color light emission system
JP2006038784A (ja) * 2004-07-30 2006-02-09 Suncall Corp 磁気ヘッドサスペンションの溶接位置測定方法及び装置
US7808644B2 (en) * 2005-03-24 2010-10-05 Obe Ohnmacht & Baumgartner Gmbh & Co. Kg Device for optically measuring the shapes of objects and surfaces
AT503559B1 (de) * 2006-06-02 2007-11-15 Fronius Int Gmbh Vorrichtung zum auswerten von abbildern von schweisspunkten auf einem trägermaterial
JP5181321B2 (ja) * 2006-10-20 2013-04-10 シーシーエス株式会社 光照射装置
JP2009031228A (ja) * 2007-07-30 2009-02-12 Omron Corp 曲面状態検査方法および基板外観検査装置
JP2009168615A (ja) * 2008-01-16 2009-07-30 Denso Corp 外観検査装置及び外観検査方法
WO2009100114A1 (en) * 2008-02-04 2009-08-13 Diamond Systems, Inc. Vision system with software control for detecting dirt and other imperfections on egg surfaces
KR100902170B1 (ko) * 2008-05-19 2009-06-10 (주)펨트론 표면형상 측정장치
JP2010025615A (ja) * 2008-07-16 2010-02-04 Central Motor Co Ltd 自動スポット溶接検査システム
CN102439708B (zh) * 2009-02-06 2016-03-02 新加坡科技研究局 检查基板的接合结构的方法和接合结构检验设备
US8717578B2 (en) * 2009-04-10 2014-05-06 Omron Corporation Profilometer, measuring apparatus, and observing apparatus
US20100259746A1 (en) * 2009-04-10 2010-10-14 Omron Corporation Profilometer
US8388204B2 (en) * 2009-09-22 2013-03-05 Cyberoptics Corporation High speed, high resolution, three dimensional solar cell inspection system
CN102498387A (zh) 2009-09-22 2012-06-13 赛博光学公司 高速、高解析度、三维太阳能电池检查***
JP5555608B2 (ja) * 2010-11-11 2014-07-23 日立Ｇｅニュークリア・エナジー株式会社 スポット溶接検査方法および装置
JP2012103217A (ja) * 2010-11-12 2012-05-31 Toyota Motor Corp 表面欠陥の検査装置
JP2013015389A (ja) * 2011-07-04 2013-01-24 Hitachi-Ge Nuclear Energy Ltd 溶接位置の検査方法及びその装置
FI125320B (en) * 2012-01-05 2015-08-31 Helmee Imaging Oy ORGANIZATION AND SIMILAR METHOD FOR OPTICAL MEASUREMENTS
US8875579B2 (en) * 2012-03-26 2014-11-04 GM Global Technology Operations LLC Method and apparatus for non-destructive weld testing
JP5874508B2 (ja) * 2012-04-17 2016-03-02 オムロン株式会社 はんだの濡れ上がり状態の検査方法およびこの方法を用いた自動外観検査装置ならびに基板検査システム
CN103076330A (zh) 2013-01-05 2013-05-01 王锦峰 多面阵相机aoi设备及其拍摄图像方法
WO2014167566A1 (en) * 2013-04-08 2014-10-16 Vibe Technologies Apparatus for inspection and quality assurance of material samples
JP6287360B2 (ja) * 2014-03-06 2018-03-07 オムロン株式会社 検査装置
EP3140639A4 (en) 2014-05-05 2018-01-31 Arconic Inc. Apparatus and methods for weld measurement

Also Published As

Publication number Publication date
JP2017516095A (ja) 2017-06-15
MX2016014380A (es) 2017-05-23
US20150317786A1 (en) 2015-11-05
CN105222704B (zh) 2018-09-14
CN204944428U (zh) 2016-01-06
EP3140639A4 (en) 2018-01-31
KR20170005828A (ko) 2017-01-16
US9927367B2 (en) 2018-03-27
JP6267366B2 (ja) 2018-01-24
EP3140639A1 (en) 2017-03-15
WO2015171459A1 (en) 2015-11-12
CN105222704A (zh) 2016-01-06
CA2947720A1 (en) 2015-11-12
CA2947720C (en) 2019-09-10
KR101886947B1 (ko) 2018-08-08

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