MX338117B - Sistema y metodo para controlar la calidad de un objeto. - Google Patents

Sistema y metodo para controlar la calidad de un objeto.

Info

Publication number
MX338117B
MX338117B MX2014004569A MX2014004569A MX338117B MX 338117 B MX338117 B MX 338117B MX 2014004569 A MX2014004569 A MX 2014004569A MX 2014004569 A MX2014004569 A MX 2014004569A MX 338117 B MX338117 B MX 338117B
Authority
MX
Mexico
Prior art keywords
inspection zone
chamber
inspected
rays
quality
Prior art date
Application number
MX2014004569A
Other languages
English (en)
Other versions
MX2014004569A (es
Inventor
Hubert Voillaume
Original Assignee
Eads Europ Aeronautic Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eads Europ Aeronautic Defence filed Critical Eads Europ Aeronautic Defence
Publication of MX2014004569A publication Critical patent/MX2014004569A/es
Publication of MX338117B publication Critical patent/MX338117B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G19/00—Weighing apparatus or methods adapted for special purposes not provided for in the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B15/00—Systems controlled by a computer
    • G05B15/02—Systems controlled by a computer electric
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

La invención se refiere a un sistema para controlar la calidad de un objeto que deja una instalación de producción. De acuerdo con la invención, el sistema comprende: una cámara que incluye un puerto de entrada a través del cual se inserta el objeto que se va a inspeccionar en la cámara y al menos un puerto de salida, dicha cámara tiene una zona de inspección (5); un dispositivo de transporte para llevar el objeto que se va a inspeccionar a la zona de inspección (5) y para liberar el mismo a través de al menos un puerto de salida; un aparato de pesaje (7) para pesar el objeto en la zona de inspección (5); un ensamble para la medición dimensional libre de contacto del objeto en la zona de inspección (5); y un ensamble para analizar la estructura del objeto en la zona de inspección (5) por medio de rayos láser y/o rayos X. La cámara antes mencionada está hecha de un material que es opaco para las longitudes de onda de los rayos láser durante la operación y los rayos X, con el fin de prevenir cualquier fuga de radiación.
MX2014004569A 2011-10-17 2012-10-16 Sistema y metodo para controlar la calidad de un objeto. MX338117B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1159357A FR2981450B1 (fr) 2011-10-17 2011-10-17 Systeme et procede de controle de la qualite d'un objet
PCT/EP2012/070510 WO2013057115A1 (fr) 2011-10-17 2012-10-16 Système et procédé de contrôle de la qualité d'un objet

Publications (2)

Publication Number Publication Date
MX2014004569A MX2014004569A (es) 2014-11-25
MX338117B true MX338117B (es) 2016-04-01

Family

ID=47049154

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2014004569A MX338117B (es) 2011-10-17 2012-10-16 Sistema y metodo para controlar la calidad de un objeto.

Country Status (10)

Country Link
US (1) US20140249663A1 (es)
EP (1) EP2769196A1 (es)
CN (1) CN104114992B (es)
BR (1) BR112014009088A2 (es)
CA (1) CA2852791A1 (es)
FR (1) FR2981450B1 (es)
MX (1) MX338117B (es)
RU (1) RU2620868C2 (es)
SG (1) SG11201400932PA (es)
WO (1) WO2013057115A1 (es)

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CN106290416B (zh) * 2016-08-26 2020-01-10 合肥泰禾光电科技股份有限公司 一种x射线食品异物检测***
FR3073043B1 (fr) * 2017-10-27 2019-11-15 Tiama Procede et installation de controle dimensionnel en ligne d'objets manufactures
CN108088407B (zh) * 2017-12-15 2020-11-10 成都光明光电股份有限公司 光学玻璃制品形貌偏差校正方法及***
ES2910779T3 (es) * 2017-12-20 2022-05-13 Fundacion Tecnalia Res & Innovation Métodos y sistemas para inspección visual
EP3553508A3 (en) * 2018-04-13 2019-12-04 Malvern Panalytical B.V. X-ray analysis apparatus and method
CN112203779B (zh) * 2018-06-07 2023-08-18 威尔科股份公司 检查过程
US10408606B1 (en) 2018-09-24 2019-09-10 Faro Technologies, Inc. Quality inspection system and method of operation
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US11354466B1 (en) 2018-11-02 2022-06-07 Inkbit, LLC Machine learning for additive manufacturing
EP3856494A1 (en) 2018-11-02 2021-08-04 Inkbit, LLC Intelligent additive manufacturing
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WO2020106944A1 (en) * 2018-11-21 2020-05-28 Aaron Weber High speed pharmaceutical quality control metrology
US10974460B2 (en) 2019-01-08 2021-04-13 Inkbit, LLC Reconstruction of surfaces for additive manufacturing
JP2022523453A (ja) 2019-01-08 2022-04-25 インクビット， エルエルシー 積層造形における深度再構築
EP3709006A1 (fr) * 2019-03-15 2020-09-16 Primetals Technologies France SAS Système de contrôle visuel pour un produit étendu
US11712837B2 (en) 2019-11-01 2023-08-01 Inkbit, LLC Optical scanning for industrial metrology
US10994477B1 (en) 2019-11-01 2021-05-04 Inkbit, LLC Optical scanning for industrial metrology
US10926473B1 (en) 2020-02-20 2021-02-23 Inkbit, LLC Multi-material scanning for additive fabrication
CN111288902B (zh) * 2020-02-21 2021-09-10 苏州大学 一种双视场光相干断层扫描成像***及材料厚度检测法
CN115867788A (zh) * 2020-07-01 2023-03-28 浜松光子学株式会社 用于高速检查的倾斜型光干涉断层摄影成像
US10994490B1 (en) 2020-07-31 2021-05-04 Inkbit, LLC Calibration for additive manufacturing by compensating for geometric misalignments and distortions between components of a 3D printer
CN112880787B (zh) * 2021-01-08 2023-03-31 重庆开谨科技有限公司 一种用于车辆称重传感器的波形处理方法
CN114923935A (zh) * 2022-04-02 2022-08-19 上海奕瑞光电子科技股份有限公司 在线3d扫描***及在线3d扫描方法
DE102022111511A1 (de) 2022-05-09 2023-11-09 Wipotec Gmbh Inspektionsvorrichtung mit darin integrierter Röntgen- und Wägevorrichtung

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Also Published As

Publication number Publication date
CN104114992A (zh) 2014-10-22
WO2013057115A1 (fr) 2013-04-25
FR2981450B1 (fr) 2014-06-06
FR2981450A1 (fr) 2013-04-19
CA2852791A1 (fr) 2013-04-25
RU2620868C2 (ru) 2017-05-30
MX2014004569A (es) 2014-11-25
BR112014009088A2 (pt) 2017-04-18
US20140249663A1 (en) 2014-09-04
RU2014119933A (ru) 2015-11-27
SG11201400932PA (en) 2014-09-26
CN104114992B (zh) 2019-02-05
EP2769196A1 (fr) 2014-08-27

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