MX2010009713A - Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado. - Google Patents

Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado.

Info

Publication number
MX2010009713A
MX2010009713A MX2010009713A MX2010009713A MX2010009713A MX 2010009713 A MX2010009713 A MX 2010009713A MX 2010009713 A MX2010009713 A MX 2010009713A MX 2010009713 A MX2010009713 A MX 2010009713A MX 2010009713 A MX2010009713 A MX 2010009713A
Authority
MX
Mexico
Prior art keywords
ray
energy
diverging
spot
excitation energy
Prior art date
Application number
MX2010009713A
Other languages
English (en)
Inventor
bailey Adam
Chen Zewu
M Gibson David
m gibson Walter
H Burdett John Jr
Scott Semken R
Xin Kai
Original Assignee
X Ray Optical Sys Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by X Ray Optical Sys Inc filed Critical X Ray Optical Sys Inc
Publication of MX2010009713A publication Critical patent/MX2010009713A/es

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • H05G1/04—Mounting the X-ray tube within a closed housing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/1003—Different kinds of radiation or particles monochromatic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/315—Accessories, mechanical or electrical features monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/423—Imaging multispectral imaging-multiple energy imaging
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Un aparato de análisis de rayos-X para iluminar un punto de muestra con un haz de rayos-X. Un tubo de rayos-X es proporcionado teniendo un punto de fuente desde el cual es producido un haz de rayos-X divergente teniendo una primer energía característica, y una energía de radiación de frenado, un primer óptico de rayos-X recibe el haz de rayos-X divergente y dirige el haz hacia el punto de muestra, mientras que monocromatiza el haz; y un segundo óptico de rayos-X recibe el haz de rayos-X divergente y dirige el haz hacia el punto de muestra, mientras que monocramatiza el haz a una segunda energía. El primer óptico de rayos-X puede monocromatizar la energía característica desde el punto de fuente y el segundo óptico de rayos-X puede monocromatizar la energía de radiación de frenado desde el punto de fuente. Los ópticos de rayos-X pueden ser ópticos de difracción arqueados, para recibir el haz de rayos-X divergente desde el tubo de rayos-X y enfocar el haz en el punto de muestra. La detección también es proporcionada para detectar y medir varias toxinas en, por ejemplo, los productos fabricados incluyendo los juguetes y los electrónicos.
MX2010009713A 2008-03-05 2009-03-03 Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado. MX2010009713A (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US3389908P 2008-03-05 2008-03-05
US3922008P 2008-03-25 2008-03-25
US4297408P 2008-04-07 2008-04-07
PCT/US2009/035847 WO2009111454A1 (en) 2008-03-05 2009-03-03 Xrf system having multiple excitation energy bands in highly aligned package

Publications (1)

Publication Number Publication Date
MX2010009713A true MX2010009713A (es) 2011-03-29

Family

ID=41056347

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2010009713A MX2010009713A (es) 2008-03-05 2009-03-03 Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado.

Country Status (8)

Country Link
US (4) US8559597B2 (es)
EP (1) EP2260501B1 (es)
JP (1) JP5539906B2 (es)
CN (2) CN105044139B (es)
CA (1) CA2753990C (es)
HK (1) HK1153848A1 (es)
MX (1) MX2010009713A (es)
WO (1) WO2009111454A1 (es)

Families Citing this family (52)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2260501B1 (en) 2008-03-05 2021-08-25 X-ray Optical Systems, INC. Xrf system having multiple excitation energy bands in highly aligned package
US8331534B2 (en) 2009-04-16 2012-12-11 Silver Eric H Monochromatic X-ray methods and apparatus
US9383326B2 (en) * 2011-06-20 2016-07-05 X-Ray Optical Systems, Inc. Online monitoring of contaminants in crude and heavy fuels, and refinery applications thereof
WO2013025682A2 (en) 2011-08-15 2013-02-21 X-Ray Optical Systems, Inc. Sample viscosity and flow control for heavy samples, and x-ray analysis applications thereof
US9335280B2 (en) 2011-10-06 2016-05-10 X-Ray Optical Systems, Inc. Mobile transport and shielding apparatus for removable x-ray analyzer
US20140294157A1 (en) * 2011-10-26 2014-10-02 X-Ray Optical Systems, Inc. Support structure and highly aligned monochromating x-ray optics for x-ray analysis engines and analyzers
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
EP2820666A4 (en) * 2012-02-28 2016-02-17 X Ray Optical Sys Inc DEVICE FOR ANALYSIS BY X-RAYS WITH MULTIPLE EXTRACTION ENERGY TAPES, PRODUCED BY X-RAY TUBE ANODES MADE OF SEVERAL MATERIALS AND MONOCHROMATIC OPTICS
GB2515468A (en) * 2013-05-24 2014-12-31 Torr Scient Ltd X-ray source
US9883793B2 (en) 2013-08-23 2018-02-06 The Schepens Eye Research Institute, Inc. Spatial modeling of visual fields
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US9390881B2 (en) 2013-09-19 2016-07-12 Sigray, Inc. X-ray sources using linear accumulation
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
US9448190B2 (en) 2014-06-06 2016-09-20 Sigray, Inc. High brightness X-ray absorption spectroscopy system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
WO2015200551A1 (en) * 2014-06-24 2015-12-30 Silver Eric H Methods and apparatus for determining information regarding chemical composition using x-ray radiation
DE102014015974B4 (de) * 2014-10-31 2021-11-11 Baker Hughes Digital Solutions Gmbh Anschlusskabel zur Verminderung von überschlagsbedingten transienten elektrischen Signalen zwischen der Beschleunigungsstrecke einer Röntgenröhre sowie einer Hochspannungsquelle
JP6069609B2 (ja) * 2015-03-26 2017-02-01 株式会社リガク 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US9966161B2 (en) * 2015-09-21 2018-05-08 Uchicago Argonne, Llc Mechanical design of thin-film diamond crystal mounting apparatus with optimized thermal contact and crystal strain for coherence preservation x-ray optics
US10677744B1 (en) * 2016-06-03 2020-06-09 U.S. Department Of Energy Multi-cone x-ray imaging Bragg crystal spectrometer
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
PL3364421T3 (pl) * 2017-02-17 2019-08-30 Rigaku Corporation Rentgenowskie urządzenie optyczne
JP6937380B2 (ja) 2017-03-22 2021-09-22 シグレイ、インコーポレイテッド Ｘ線分光を実施するための方法およびｘ線吸収分光システム
AU2018269056B2 (en) 2017-05-19 2024-01-25 Imagine Scientific, Inc. Monochromatic x-ray imaging systems and methods
JP7299226B2 (ja) 2018-02-09 2023-06-27 イマジン サイエンティフィック，インコーポレイテッド 単色ｘ線撮像システム及び方法
US10818467B2 (en) 2018-02-09 2020-10-27 Imagine Scientific, Inc. Monochromatic x-ray imaging systems and methods
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
JP7195341B2 (ja) 2018-06-04 2022-12-23 シグレイ、インコーポレイテッド 波長分散型ｘ線分光計
US10658145B2 (en) 2018-07-26 2020-05-19 Sigray, Inc. High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
WO2020056281A1 (en) 2018-09-14 2020-03-19 Imagine Scientific, Inc. Monochromatic x-ray component systems and methods
DE112020004169T5 (de) 2019-09-03 2022-05-25 Sigray, Inc. System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung
US12007226B2 (en) 2019-12-13 2024-06-11 Schlumberger Technology Corporation Measurement of thickness of scale or corrosion
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
WO2021162947A1 (en) 2020-02-10 2021-08-19 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal / hyperbolic surface profiles
DE112021002841T5 (de) 2020-05-18 2023-03-23 Sigray, Inc. System und Verfahren für Röntgenabsorptionsspektroskopie unter Verwendung eines Kristallanalysators und mehrerer Detektorelemente
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
KR20230109735A (ko) 2020-12-07 2023-07-20 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
WO2023177981A1 (en) 2022-03-15 2023-09-21 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
US11885755B2 (en) 2022-05-02 2024-01-30 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer
CN118050387B (zh) * 2024-04-16 2024-07-12 安徽吸收谱仪器设备有限公司 一种多波段同步扫描的x射线吸收谱装置及实验方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH441200A (de) * 1963-12-27 1967-08-15 Schloemann Ag Formgerüst zur Herstellung von Schraubennahtrohren
JPH0769477B2 (ja) * 1990-09-05 1995-07-31 理学電機工業株式会社 Ｘ線分光装置
JP2699134B2 (ja) * 1992-12-03 1998-01-19 花王株式会社 蛍光ｘ線分析方法及びその装置
JP3843601B2 (ja) * 1997-04-30 2006-11-08 株式会社島津製作所 蛍光ｘ線分析装置
US6023496A (en) * 1997-04-30 2000-02-08 Shimadzu Corporation X-ray fluorescence analyzing apparatus
JP3059402B2 (ja) * 1997-07-09 2000-07-04 理学電機工業株式会社 円筒結晶型分光装置とその製造方法
US6014423A (en) * 1998-02-19 2000-01-11 Osmic, Inc. Multiple corner Kirkpatrick-Baez beam conditioning optic assembly
JP2001194325A (ja) * 2000-01-06 2001-07-19 Ours Tex Kk Ｘ線分析装置および方法
JP3498689B2 (ja) * 2000-07-31 2004-02-16 株式会社島津製作所 モノクロ線源励起用モノクロメータ及び蛍光ｘ線分析装置
US6493421B2 (en) 2000-10-16 2002-12-10 Advanced X-Ray Technology, Inc. Apparatus and method for generating a high intensity X-ray beam with a selectable shape and wavelength
JP2002195963A (ja) * 2000-12-25 2002-07-10 Ours Tex Kk Ｘ線分光装置およびｘ線分析装置
CN1246858C (zh) * 2001-06-19 2006-03-22 X射线光学***公司 X射线荧光(xrf)光谱测定***和方法
AU2002363962A1 (en) * 2001-12-04 2003-06-17 X-Ray Optical Systems, Inc. X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
JP2004184314A (ja) * 2002-12-05 2004-07-02 Mitsubishi Electric Corp 蛍光ｘ線分析装置
US7317784B2 (en) 2006-01-19 2008-01-08 Broker Axs, Inc. Multiple wavelength X-ray source
EP2260501B1 (en) 2008-03-05 2021-08-25 X-ray Optical Systems, INC. Xrf system having multiple excitation energy bands in highly aligned package
US7738630B2 (en) * 2008-03-05 2010-06-15 X-Ray Optical Systems, Inc. Highly aligned x-ray optic and source assembly for precision x-ray analysis applications

Also Published As

Publication number Publication date
CA2753990A1 (en) 2009-09-11
JP5539906B2 (ja) 2014-07-02
CN105044139B (zh) 2019-04-23
US20160260514A1 (en) 2016-09-08
US9343193B2 (en) 2016-05-17
JP2011513751A (ja) 2011-04-28
CN105044139A (zh) 2015-11-11
EP2260501A4 (en) 2014-03-19
CN101981651B (zh) 2015-07-08
CN101981651A (zh) 2011-02-23
EP2260501B1 (en) 2021-08-25
EP2260501A1 (en) 2010-12-15
HK1153848A1 (en) 2012-04-05
CA2753990C (en) 2017-11-21
WO2009111454A1 (en) 2009-09-11
US20150262722A1 (en) 2015-09-17
US20110170666A1 (en) 2011-07-14
US9048001B2 (en) 2015-06-02
US20140105363A1 (en) 2014-04-17
US8559597B2 (en) 2013-10-15

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