KR980005414U - Counting device for measuring the threshold of patterns - Google Patents

Counting device for measuring the threshold of patterns

Info

Publication number
KR980005414U
KR980005414U KR2019960017210U KR19960017210U KR980005414U KR 980005414 U KR980005414 U KR 980005414U KR 2019960017210 U KR2019960017210 U KR 2019960017210U KR 19960017210 U KR19960017210 U KR 19960017210U KR 980005414 U KR980005414 U KR 980005414U
Authority
KR
South Korea
Prior art keywords
patterns
threshold
measuring
counting device
counting
Prior art date
Application number
KR2019960017210U
Other languages
Korean (ko)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019960017210U priority Critical patent/KR980005414U/en
Publication of KR980005414U publication Critical patent/KR980005414U/en

Links

KR2019960017210U 1996-06-24 1996-06-24 Counting device for measuring the threshold of patterns KR980005414U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019960017210U KR980005414U (en) 1996-06-24 1996-06-24 Counting device for measuring the threshold of patterns

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019960017210U KR980005414U (en) 1996-06-24 1996-06-24 Counting device for measuring the threshold of patterns

Publications (1)

Publication Number Publication Date
KR980005414U true KR980005414U (en) 1998-03-30

Family

ID=60924598

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019960017210U KR980005414U (en) 1996-06-24 1996-06-24 Counting device for measuring the threshold of patterns

Country Status (1)

Country Link
KR (1) KR980005414U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010065639A (en) * 1999-12-30 2001-07-11 박종섭 Test method for defect contact/via in semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010065639A (en) * 1999-12-30 2001-07-11 박종섭 Test method for defect contact/via in semiconductor device

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