KR970051831A - Continuous process progress system for semiconductor device manufacturing - Google Patents

Continuous process progress system for semiconductor device manufacturing Download PDF

Info

Publication number
KR970051831A
KR970051831A KR1019950069588A KR19950069588A KR970051831A KR 970051831 A KR970051831 A KR 970051831A KR 1019950069588 A KR1019950069588 A KR 1019950069588A KR 19950069588 A KR19950069588 A KR 19950069588A KR 970051831 A KR970051831 A KR 970051831A
Authority
KR
South Korea
Prior art keywords
chamber
tube
cassette
semiconductor device
wafer
Prior art date
Application number
KR1019950069588A
Other languages
Korean (ko)
Other versions
KR100365423B1 (en
Inventor
권창헌
Original Assignee
김주용
현대전자산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김주용, 현대전자산업 주식회사 filed Critical 김주용
Priority to KR1019950069588A priority Critical patent/KR100365423B1/en
Publication of KR970051831A publication Critical patent/KR970051831A/en
Application granted granted Critical
Publication of KR100365423B1 publication Critical patent/KR100365423B1/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/34Nitrides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/52Controlling or regulating the coating process

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)

Abstract

본 발명은 반도체 소자 제조 공정 두 개 이상의 공정을 지연 시간 없이(No Time Delay) 연속으로 진행하여야 하는 연속 공정, 예를 들면 화학 증착 공정의 일종인 패드 옥시데이션 공정이 끝나는 즉시 나이트라이드 디포지션 공정을 진행하여야 하는 연속 공정에 유리하게 적용할 수 있는 반도체 소자 제조를 위한 연속 공정 진행 시스템에 관한 것이다. 이러한 본 발명은 요구하는 연속 공정을 만족하기 위한 적어도 두 개 이상의 제1공정 튜브와 제2공정 튜브가 열완충 튜브를 사이에 두고 배치되어 하나의 공정 챔버를 구성하는 한편, 상기 공정챔버의 하부에 외부와는 밀폐되며 내부는 각각의 공정 튜브에 해당하는 제1실, 제2실 및 제3실로 구획된 로드락 챔버를 설치하여 구성하고, 상기 로드락 챔버에 관련하여 외부로부터 카세트를 인입하고 또 반출하는 메인도어가 구비된 카세트 챔버와, 상기 로드락 챔버의 각 실을 막아 밀폐함과 동시에 선택적으로 개폐하는 제1도어, 제2도어 및 제3도어와, 상기 카세트 챔버와 관련하여 카세트에 위치한 웨이퍼를 로드락 챔버의 각 실에 구비된 튜브 이송 페디스탈에 탑재되어 있는 웨이퍼 보트에 옮겨 주는 웨이퍼 트랜스퍼장치를 갖춘 구조로 되어 있다.The present invention provides a nitride deposition process in which two or more processes of a semiconductor device manufacturing process must be performed continuously with no time delay, such as a pad oxidization process, which is a kind of chemical vapor deposition process. The present invention relates to a continuous process progress system for manufacturing a semiconductor device that can be advantageously applied to a continuous process to be progressed. In the present invention, at least two or more first process tubes and second process tubes for satisfying the required continuous process are arranged with a heat buffer tube interposed therebetween to form a process chamber, and at the bottom of the process chamber. It is sealed with the outside and the inside is configured by installing a load lock chamber divided into a first chamber, a second chamber and a third chamber corresponding to each process tube, and draws a cassette from the outside in relation to the load lock chamber. A cassette chamber having a main door to be carried out, a first door, a second door, and a third door to close and seal the chamber of the load lock chamber and to selectively open and close the chamber, and to locate the cassette in relation to the cassette chamber. A wafer transfer device for transferring a wafer to a wafer boat mounted on a tube transfer pedestal provided in each chamber of the load lock chamber is provided.

이와 같은 본 발명에 의하면, 연속 공정시 웨이퍼가 대기중에 노출되지 않으므로 무시기(無時機) 연속 화학 증착 공정의 품질 향상을 기할 수 있고, 열공정에서 튜브 내부와 외부 온도의 격심한 차이가 반도체에 가해지는 열 쇼크를 줄임으로써 웨이퍼의 휨(bent)과 일그러짐(warpage) 문제를 해결할 수 있다.According to the present invention, since the wafer is not exposed to the air during the continuous process, the quality of the non-stop continuous chemical vapor deposition process can be improved, and in the thermal process, a drastic difference between the inside and the outside temperature of the tube is applied to the semiconductor. Reducing the thermal shock can solve the wafer bent and warpage problems.

Description

반도체 소자 제조를 위한 연속 공정 진행 시스템Continuous process progress system for semiconductor device manufacturing

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 종래 패드 옥사이드 공정과 나이트라이드 디포지션 공정을 연속하여 진행하고 있는 예를 보인 도면.FIG. 1 is a view showing an example in which a conventional pad oxide process and a nitride deposition process are continuously performed.

Claims (5)

요구하는 연속 공정을 만족하기 위한 적어도 두 개 이상의 제1공정 튜브와 제2공정 튜브가 열완충 튜브를 사이에 두고 배치되어 하나의 공정 챔버를 구성하는 한편, 상기 공정 챔버의 하부에 외부와는 밀폐되며 내부는 각각의 공정 튜브에 해당하는 제1실, 제2실 및 제3실로 구획된 로드락 챔버를 설치하여 구성하고, 상기 로드락 챔버에 관련하여 외부로부터 카세트를 인입하고 또 반출하는 메인 도어가 구비된 카세트 챔버와, 상기 로드락 챔버의 각 실을 막아 밀폐함과 동시에 선택적으로 개폐하는 제1도어, 제2도어 및 제3도어와, 상기 카세트 챔버와 관련하여 카세트에 위치한 웨이퍼를 로드락 챔버의 각 실에 구비된 튜브 이송 패디스탈에 탑재되어 있는 웨이퍼 보트에 옮겨 주는 웨이퍼 트랜스퍼장치를 갖춘 것을 특징으로 하는 반도체 소자 제조를 위한 연속 공정 진행 시스템.At least two or more first process tubes and second process tubes for satisfying the required continuous process are arranged with a heat buffer tube interposed therebetween to form a process chamber, while being sealed to the outside under the process chamber. The interior is configured by installing a load lock chamber divided into a first chamber, a second chamber and a third chamber corresponding to each process tube, and the main door for retracting the cassette from the outside in relation to the load lock chamber And a first chamber, a second door, and a third door to close and seal the chamber of the load lock chamber, and to selectively open and close the chamber, and to load the wafer located in the cassette in relation to the cassette chamber. For the semiconductor device manufacturing, characterized in that the wafer transfer device for transferring to the wafer boat mounted on the tube transfer pedestal provided in each chamber of the chamber One continuous process progress system. 제1항에 있어서, 상기 제1공정 튜브는 패드 옥시데이션 공정용 튜브로 구성되고, 상기 제2공정 튜브는 나이트라이드 디포지션 공정용 튜브로 구성되어 연속 화학 증착 공정을 진행하도록 된 것을 특징으로 하는 반도체 소자 제조를 위한 연속 공정 진행 시스템.The method according to claim 1, wherein the first process tube is composed of a pad oxidization process tube, and the second process tube is composed of a nitride deposition process tube to perform a continuous chemical vapor deposition process. Continuous process progress system for semiconductor device manufacturing. 제2항에 있어서, 중간의 카세트 챔버를 중심으로 이 카세트 챔버의 3면에 패드 옥시데이션 공정용 튜브와 나이트라이트 디포지션 공정을 튜브와 열완충 튜브가 각각 배치되는 레이 아웃을 갖는 것을 특징으로 하는 반도체 소자 제조를 위한 연속 공정 진행 시스템.3. The pad oxidization process tube and the night light deposition process on the three sides of the cassette chamber centered on the intermediate cassette chamber have a layout in which the tube and the heat buffer tube are disposed, respectively. Continuous process progress system for semiconductor device manufacturing. 제1항 내지 제3항 중 어느 한 항에 있어서, 상기 열완충 튜브의 외부에는 쿨러가 설치되어 구성되고, 상기 튜브에 불화성 가스를 주입하기 위한 가스 인레트가 설치된 것을 특징으로 하는 반도체 소자 제조를 위한 연속 공정 진행 시스템.The semiconductor device manufacturing according to any one of claims 1 to 3, wherein a cooler is provided outside the heat buffer tube, and a gas inlet for injecting fluorinated gas is provided in the tube. Continuous process progression system. 제4항에 있어서, 상기 열완충 튜브로 주입되는 불활성 가스의 온도 컨트롤이 가능하도록하여 열완충 정도를 제어할 수 있도록 구성한 것을 특징으로 하는 반도체 소자 제조를 위한 연속 공정 진행 시스템.The system of claim 4, wherein the temperature of the inert gas injected into the heat buffer tube is controlled to control the degree of thermal shock. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950069588A 1995-12-30 1995-12-30 Consecutive processing system for manufacturing semiconductor device KR100365423B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950069588A KR100365423B1 (en) 1995-12-30 1995-12-30 Consecutive processing system for manufacturing semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950069588A KR100365423B1 (en) 1995-12-30 1995-12-30 Consecutive processing system for manufacturing semiconductor device

Publications (2)

Publication Number Publication Date
KR970051831A true KR970051831A (en) 1997-07-29
KR100365423B1 KR100365423B1 (en) 2003-03-06

Family

ID=37491037

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950069588A KR100365423B1 (en) 1995-12-30 1995-12-30 Consecutive processing system for manufacturing semiconductor device

Country Status (1)

Country Link
KR (1) KR100365423B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100303918B1 (en) * 1997-12-08 2001-11-30 윤종용 Equipment for manufacturing capacitor of semiconductor device and method for fabricating capacitor using thereof
KR100835105B1 (en) * 2006-11-08 2008-06-03 주식회사 포스코 Apparatus and method for correcting of molten steel temperature

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100487577B1 (en) * 2002-11-25 2005-05-06 주식회사 피에스티 Semiconductor manufacturing system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0210578B1 (en) * 1985-07-29 1992-05-20 Energy Conversion Devices, Inc. System and method for depositing an electrical insulator in a continuous process

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100303918B1 (en) * 1997-12-08 2001-11-30 윤종용 Equipment for manufacturing capacitor of semiconductor device and method for fabricating capacitor using thereof
KR100835105B1 (en) * 2006-11-08 2008-06-03 주식회사 포스코 Apparatus and method for correcting of molten steel temperature

Also Published As

Publication number Publication date
KR100365423B1 (en) 2003-03-06

Similar Documents

Publication Publication Date Title
US4794220A (en) Rotary barrel type induction vapor-phase growing apparatus
EP0818807A3 (en) Dual vertical thermal processing furnace
KR950012625A (en) Substrate processing apparatus and method and method for manufacturing thin film semiconductor device
KR890008919A (en) Meteorological growth apparatus
JPH04504929A (en) Method for depositing layers on a substrate and processing system for this purpose
US5567152A (en) Heat processing apparatus
US3842794A (en) Apparatus for high temperature semiconductor processing
KR970051831A (en) Continuous process progress system for semiconductor device manufacturing
KR930006823A (en) Manufacturing Method of Semiconductor Device
WO2001004377A8 (en) Seal means and its application in deposition reactor
JPS63283124A (en) Reaction furnace
US3943015A (en) Method for high temperature semiconductor processing
KR970015757A (en) High Vacuum Sintering and Heat Treatment Equipment
US4938458A (en) Continuous ion-carburizing and quenching system
US5669768A (en) Apparatus for adjusting a gas injector of furnace
KR950001931A (en) Heat treatment method of semiconductor substrate
KR900003970A (en) Chemical Vapor Deposition Process Using Disilane
JPH04162712A (en) Low pressure cvd apparatus
JP4509439B2 (en) Substrate processing apparatus and substrate processing method
KR980005862A (en) Residual heat prevention type of semiconductor manufacturing process
JPH10197155A (en) Retort furnace
JPH06338473A (en) Longitudinal furnace of semiconductor manufacturing apparatus
KR200187480Y1 (en) Chemical vapor deposition apparatus
JPH0369117A (en) Manufacturing apparatus of semiconductor device
JPH07161655A (en) Soaking tube for heat-treating device

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20101125

Year of fee payment: 9

LAPS Lapse due to unpaid annual fee