KR970051831A - Continuous process progress system for semiconductor device manufacturing - Google Patents
Continuous process progress system for semiconductor device manufacturing Download PDFInfo
- Publication number
- KR970051831A KR970051831A KR1019950069588A KR19950069588A KR970051831A KR 970051831 A KR970051831 A KR 970051831A KR 1019950069588 A KR1019950069588 A KR 1019950069588A KR 19950069588 A KR19950069588 A KR 19950069588A KR 970051831 A KR970051831 A KR 970051831A
- Authority
- KR
- South Korea
- Prior art keywords
- chamber
- tube
- cassette
- semiconductor device
- wafer
- Prior art date
Links
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
Abstract
본 발명은 반도체 소자 제조 공정 두 개 이상의 공정을 지연 시간 없이(No Time Delay) 연속으로 진행하여야 하는 연속 공정, 예를 들면 화학 증착 공정의 일종인 패드 옥시데이션 공정이 끝나는 즉시 나이트라이드 디포지션 공정을 진행하여야 하는 연속 공정에 유리하게 적용할 수 있는 반도체 소자 제조를 위한 연속 공정 진행 시스템에 관한 것이다. 이러한 본 발명은 요구하는 연속 공정을 만족하기 위한 적어도 두 개 이상의 제1공정 튜브와 제2공정 튜브가 열완충 튜브를 사이에 두고 배치되어 하나의 공정 챔버를 구성하는 한편, 상기 공정챔버의 하부에 외부와는 밀폐되며 내부는 각각의 공정 튜브에 해당하는 제1실, 제2실 및 제3실로 구획된 로드락 챔버를 설치하여 구성하고, 상기 로드락 챔버에 관련하여 외부로부터 카세트를 인입하고 또 반출하는 메인도어가 구비된 카세트 챔버와, 상기 로드락 챔버의 각 실을 막아 밀폐함과 동시에 선택적으로 개폐하는 제1도어, 제2도어 및 제3도어와, 상기 카세트 챔버와 관련하여 카세트에 위치한 웨이퍼를 로드락 챔버의 각 실에 구비된 튜브 이송 페디스탈에 탑재되어 있는 웨이퍼 보트에 옮겨 주는 웨이퍼 트랜스퍼장치를 갖춘 구조로 되어 있다.The present invention provides a nitride deposition process in which two or more processes of a semiconductor device manufacturing process must be performed continuously with no time delay, such as a pad oxidization process, which is a kind of chemical vapor deposition process. The present invention relates to a continuous process progress system for manufacturing a semiconductor device that can be advantageously applied to a continuous process to be progressed. In the present invention, at least two or more first process tubes and second process tubes for satisfying the required continuous process are arranged with a heat buffer tube interposed therebetween to form a process chamber, and at the bottom of the process chamber. It is sealed with the outside and the inside is configured by installing a load lock chamber divided into a first chamber, a second chamber and a third chamber corresponding to each process tube, and draws a cassette from the outside in relation to the load lock chamber. A cassette chamber having a main door to be carried out, a first door, a second door, and a third door to close and seal the chamber of the load lock chamber and to selectively open and close the chamber, and to locate the cassette in relation to the cassette chamber. A wafer transfer device for transferring a wafer to a wafer boat mounted on a tube transfer pedestal provided in each chamber of the load lock chamber is provided.
이와 같은 본 발명에 의하면, 연속 공정시 웨이퍼가 대기중에 노출되지 않으므로 무시기(無時機) 연속 화학 증착 공정의 품질 향상을 기할 수 있고, 열공정에서 튜브 내부와 외부 온도의 격심한 차이가 반도체에 가해지는 열 쇼크를 줄임으로써 웨이퍼의 휨(bent)과 일그러짐(warpage) 문제를 해결할 수 있다.According to the present invention, since the wafer is not exposed to the air during the continuous process, the quality of the non-stop continuous chemical vapor deposition process can be improved, and in the thermal process, a drastic difference between the inside and the outside temperature of the tube is applied to the semiconductor. Reducing the thermal shock can solve the wafer bent and warpage problems.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제1도는 종래 패드 옥사이드 공정과 나이트라이드 디포지션 공정을 연속하여 진행하고 있는 예를 보인 도면.FIG. 1 is a view showing an example in which a conventional pad oxide process and a nitride deposition process are continuously performed.
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950069588A KR100365423B1 (en) | 1995-12-30 | 1995-12-30 | Consecutive processing system for manufacturing semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950069588A KR100365423B1 (en) | 1995-12-30 | 1995-12-30 | Consecutive processing system for manufacturing semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970051831A true KR970051831A (en) | 1997-07-29 |
KR100365423B1 KR100365423B1 (en) | 2003-03-06 |
Family
ID=37491037
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950069588A KR100365423B1 (en) | 1995-12-30 | 1995-12-30 | Consecutive processing system for manufacturing semiconductor device |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100365423B1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100303918B1 (en) * | 1997-12-08 | 2001-11-30 | 윤종용 | Equipment for manufacturing capacitor of semiconductor device and method for fabricating capacitor using thereof |
KR100835105B1 (en) * | 2006-11-08 | 2008-06-03 | 주식회사 포스코 | Apparatus and method for correcting of molten steel temperature |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100487577B1 (en) * | 2002-11-25 | 2005-05-06 | 주식회사 피에스티 | Semiconductor manufacturing system |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0210578B1 (en) * | 1985-07-29 | 1992-05-20 | Energy Conversion Devices, Inc. | System and method for depositing an electrical insulator in a continuous process |
-
1995
- 1995-12-30 KR KR1019950069588A patent/KR100365423B1/en not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100303918B1 (en) * | 1997-12-08 | 2001-11-30 | 윤종용 | Equipment for manufacturing capacitor of semiconductor device and method for fabricating capacitor using thereof |
KR100835105B1 (en) * | 2006-11-08 | 2008-06-03 | 주식회사 포스코 | Apparatus and method for correcting of molten steel temperature |
Also Published As
Publication number | Publication date |
---|---|
KR100365423B1 (en) | 2003-03-06 |
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