KR970023485A - Ferrite core inspection device for electronic parts - Google Patents

Ferrite core inspection device for electronic parts Download PDF

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Publication number
KR970023485A
KR970023485A KR1019950038626A KR19950038626A KR970023485A KR 970023485 A KR970023485 A KR 970023485A KR 1019950038626 A KR1019950038626 A KR 1019950038626A KR 19950038626 A KR19950038626 A KR 19950038626A KR 970023485 A KR970023485 A KR 970023485A
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KR
South Korea
Prior art keywords
ferrite core
index table
core
support
support plate
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Application number
KR1019950038626A
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Korean (ko)
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KR0158393B1 (en
Inventor
최병희
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배순훈
대우전자 주식회사
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Priority to KR1019950038626A priority Critical patent/KR0158393B1/en
Publication of KR970023485A publication Critical patent/KR970023485A/en
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Publication of KR0158393B1 publication Critical patent/KR0158393B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
    • H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
    • H01F1/03—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
    • H01F1/0302—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity characterised by unspecified or heterogeneous hardness or specially adapted for magnetic hardness transitions
    • H01F1/0311—Compounds
    • H01F1/0313—Oxidic compounds
    • H01F1/0315—Ferrites
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F27/00—Details of transformers or inductances, in general
    • H01F27/24—Magnetic cores
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F38/00—Adaptations of transformers or inductances for specific applications or functions
    • H01F38/14—Inductive couplings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N2021/8924—Dents; Relief flaws

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

본 발명은 TV 세트내에 조립되는 플라이 백 트랜스 포머 등과 같은 전자 제품에 사용되는 페라이트 코아의 파손 및 내부 크랙 검사등을 자동적으로 수행할 수 있는 전자부품용 페라이트 코아 검사장치에 관한 것으로 그 기술적인 구성은, 페라이트 코아(2)가 이송되는 컨베이어 벨트(3)의 일측단부에 입설되는 지지 플레이트(4)상에 상하이송 실린더(5)와 연설되는 흡착노즐(6)이 설치되어 코아를 흡착 지지토록 하며, 상기 지지 플레이트(4)에는 볼스크류(7)가 횡설되어 흡착노즐(6)과 일체로 페라이트 코아(2)를 인덱스 테이블(9)상에 이송토록 하며, 상기 컨베이어 벨트(3)의 일측으로 회전축(11)과 연설된 인덱스 테이블(9)이 설치되며, 상기 인덱스 테이블(9)의 주연에는 다수의 코아 파레트(12)가 착설되어 페라이트 코아(2)를 지지토록 하고, 인덱스 테이블(9)의 외측 주연에는 CCD카메라(13)가 위치되어 페라이트 코아(2)의 검사작업을 수행토록 하고, 상기 인덱스 테이블(9)의 하측 일측단부에 입설되는 지지 플레이트(4′)상에 상하이송 실린더(5′)와 연설되는 흡착노즐(6′)이 설치되어 코아를 흡착 지지토록 하며, 상기 지지 플레이트(4′)에는 볼스크류(7′)가 횡설되어 흡착노즐(6′)과 일체로 페라이트 코아(2)를 배출 컨베이어 벨트(14)로 이송토록 하는 것이다.The present invention relates to a ferrite core inspection apparatus for electronic components that can automatically perform damage and internal crack inspection of ferrite cores used in electronic products such as flyback transformers assembled in a TV set. On the support plate (4) placed on one side end of the conveyor belt (3) to which the ferrite core (2) is transferred, an adsorption nozzle (6) which is extended to the shanghai transport cylinder (5) is installed to support the core adsorption. Ball screw 7 is rolled on the support plate 4 to transfer the ferrite core 2 integrally with the suction nozzle 6 onto the index table 9 and to one side of the conveyor belt 3. An index table 9 is provided with the rotating shaft 11, and a plurality of core pallets 12 are installed at the periphery of the index table 9 to support the ferrite core 2 and the index table 9. Of At the outer periphery, the CCD camera 13 is positioned to perform the inspection operation of the ferrite core 2, and the shanghai cylinder 5 is mounted on the support plate 4 'which is placed at one lower end of the index table 9. And a suction nozzle 6 'which is extended to ′) to adsorb and support the core, and a ball screw 7' is rolled out on the support plate 4 'so that the ferrite core is integrated with the suction nozzle 6'. 2) to be transferred to the discharge conveyor belt (14).

이에 따라서, 전자부품으로 사용되는 페라이트 코아를 인덱스 테이블에 위치시켜 이를 회전시키면서 검사작업을 자동적으로 수행토록 함은 물론, 페라이트 코아의 내부 파손 및 크랙 검사등을 용이하게 수행 하여 불량제품을 사전에 체크 및 제거토록 하며, 이에 따라 페라이트 코아 이송 및 검사 작업의 작업성 및 생산성을 가일층 향상 시킬 수 있는 것이다.Accordingly, the ferrite core used as an electronic component is placed on the index table to automatically perform inspection work while rotating it, as well as to easily inspect the internal brokenness and cracks of the ferrite core to check for defective products in advance. And to remove, thereby further improving the workability and productivity of ferrite core transfer and inspection work.

Description

전자부품용 페라이트 코아 검사장치Ferrite core inspection device for electronic parts

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제2도는 본 발명에 따른 전자부품용 페라이트 코아 검사장치의 평면 구성도,2 is a plan view of the ferrite core inspection device for electronic components according to the present invention,

제3도는 본 발명인 페라이트 코아 이송부의 정단면 구조도.Figure 3 is a front cross-sectional view of the ferrite core transfer unit of the present invention.

Claims (3)

페라이트 코아(2)가 이송되는 컨베이어 벨트(3)의 일측단부에 입설되는 지지 플레이트(4)상에 상하이송 실린더(5)와 연설되는 흡착노즐(6)이 설치되어 코아를 흡착 지지토록 하며, 상기 지지 플레이트(4)에는 볼스크류(7)가 횡설되어 흡착노즐(6)과 일체로 페라이트 코아(2)를 인덱스 테이블(9)상에 이송토록 설치되는 코아 이송부(1)와, 상기 컨베이어 벨트(3)의 일측으로 회전축(11)과 연설된 인덱스 테이블(9)이 설치되며, 상기 인덱스 테이블(9)의 주연에는 다수의 코아 파레트(12)가 착설되어 페라이트 코아(2)를 지지토록 하고, 인덱스 테이블(9)의 외측 주연에는 CCD카메라(13)가 위치되어 페라이트 코아(2)의 검사작업을 수행토록 설치되는 코아 검사부(10)와, 상기 인덱스 테이블(9)의 하측 일측단부에 입설되는 지지 플레이트(4′)상에 상하이송 실린더(5′)와 연설되는 흡착노즐(6′)이 설치되어 코아를 흡착 지지토록 하며, 상기 지지 플레이트(4′)에는 볼스크류(7′)가 횡설되어 흡착노즐(6′)과 일체로 페라이트 코아(2)를 배출 컨베이어 벨트(14)로 이송토록 하는 코아 배출부(15)를 포함하여 구성됨을 특징으로 하는 전자부품용 페라이트 코아 검사장치.An adsorption nozzle 6 which is extended to the shanghai transport cylinder 5 is installed on the support plate 4 installed at one end of the conveyor belt 3 to which the ferrite core 2 is transported to support the core adsorption. A ball screw 7 is rolled on the support plate 4 so that the core conveying part 1 is installed so as to transfer the ferrite core 2 on the index table 9 integrally with the suction nozzle 6, and the conveyor belt. On one side of the (3), the rotating shaft 11 and the index table (9) protruded are installed, and a plurality of core pallets (12) are installed at the periphery of the index table (9) to support the ferrite core (2). In the outer periphery of the index table 9, a CCD camera 13 is positioned to install a ferrite core 2 to inspect the ferrite core 2, and a lower end of the index table 9 is placed at one end of the index table 9. With the Shanghai Song cylinder (5 ') on the supporting plate (4') Adsorption nozzle (6 ') is installed to support the core adsorption, ball screw (7') is rolled out to the support plate (4 ') to discharge the ferrite core (2) integrally with the suction nozzle (6'). Ferrite core inspection apparatus for an electronic component, characterized in that it comprises a core discharge portion 15 to be transferred to the conveyor belt (14). 제1항에 있어서, 상기 페라이트 코아(2)를 흡착하는 흡착노즐(6)의 저부에는 반구형 흡착판(8)이 설치되어 페라이트 코아(2)의 상면과 면접촉토록 함을 특징으로 하는 전자부품용 페라이트 코아 검사장치.The electronic component according to claim 1, wherein a hemispherical suction plate (8) is provided at the bottom of the suction nozzle (6) for absorbing the ferrite core (2) to make surface contact with the upper surface of the ferrite core (2). Ferrite core inspection device. 제1항에 있어서, 상기 인덱스 테이블(9)의 외측 주연에 위치되는 CCD카메라(13)는, 상기 페라이트 코아(2)를 용이하고 정확하게 검사토록 일정간격으로 조정되어 위치됨을 특징으로 하는 전자부품용 페라이트 코아 검사장치.The electronic component according to claim 1, wherein the CCD camera (13) located at the outer periphery of the index table (9) is positioned at an interval so as to inspect the ferrite core (2) easily and accurately. Ferrite core inspection device. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950038626A 1995-10-31 1995-10-31 Ferrite core inspector KR0158393B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950038626A KR0158393B1 (en) 1995-10-31 1995-10-31 Ferrite core inspector

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Application Number Priority Date Filing Date Title
KR1019950038626A KR0158393B1 (en) 1995-10-31 1995-10-31 Ferrite core inspector

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KR970023485A true KR970023485A (en) 1997-05-30
KR0158393B1 KR0158393B1 (en) 1998-12-15

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100606235B1 (en) * 2002-03-25 2006-07-28 유에이치티 가부시키가이샤 Apparatus for manufacturing laminated member
KR100661521B1 (en) * 2004-02-23 2006-12-27 (주) 나인원 Inspecting method and its machine using multiple optical cameras for mechanical part

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100606235B1 (en) * 2002-03-25 2006-07-28 유에이치티 가부시키가이샤 Apparatus for manufacturing laminated member
KR100661521B1 (en) * 2004-02-23 2006-12-27 (주) 나인원 Inspecting method and its machine using multiple optical cameras for mechanical part

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Publication number Publication date
KR0158393B1 (en) 1998-12-15

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