KR970016625A - Pcb 검사장치 - Google Patents

Pcb 검사장치 Download PDF

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Publication number
KR970016625A
KR970016625A KR1019970002901A KR19970002901A KR970016625A KR 970016625 A KR970016625 A KR 970016625A KR 1019970002901 A KR1019970002901 A KR 1019970002901A KR 19970002901 A KR19970002901 A KR 19970002901A KR 970016625 A KR970016625 A KR 970016625A
Authority
KR
South Korea
Prior art keywords
pcb
probe
base
fixing means
inspection apparatus
Prior art date
Application number
KR1019970002901A
Other languages
English (en)
Other versions
KR100257625B1 (ko
Inventor
강정근
Original Assignee
강정근
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 강정근 filed Critical 강정근
Priority to KR1019970002901A priority Critical patent/KR100257625B1/ko
Publication of KR970016625A publication Critical patent/KR970016625A/ko
Priority to JP10003609A priority patent/JPH10253720A/ja
Priority to EP98100738A priority patent/EP0856740A1/en
Priority to US09/014,287 priority patent/US6118288A/en
Application granted granted Critical
Publication of KR100257625B1 publication Critical patent/KR100257625B1/ko

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

본 발명은 PCB 검사장치에 관한 것으로서, 더욱 상세히는 다양한 종류의 PCB를 호환성 있게 검사할 수 있는 신규한 구성의 PCB 검사장치를 제공코자 하는 것이다.
즉 다양한 종류의 PCB(3)를 단일의 검사장치로 호환성 있게 검사할 수 있도록 하기 위해 PCB의 측정점과 접촉되는 프로브(2)를 베이스(4) 상에서 임의로 이동 재배치할 수 있는 가변고정수단(A)이 부착된 독립형으로 구성한 것이다.
[대표도] 제1,2도

Description

PCB 검사장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 바람직한 일실시예를 보인 개략적인 사시도,
제2도는 본 발명의 핵심구성요소인 프로브를 발췌한 일부절개 상태의 정면도.

Claims (5)

  1. 각종 모델의 PCB를 검사하는 PCB 검사장치(1)에 있어서 ; PCB의 측정점과 접촉하는 프로브핀(5)을 갖는 프로브(2)는 베이스(4)와 독립구성되고, 상기 프로브(2)의 하단에는 베이스(4)의 일정 위치에 고정 및 이동 재배치될 수 잇는 가변고정수단(A)이 부착되어 PCB의 모델 변경시 로봇핸드(8a)에 의해 설정된 좌표로 이동 재배치될 수 있도록 한 것을 특징으로 하는 PCB 검사장치.
  2. 제1항에 있어서 ; 상기 프로브(2)의 하단에 부착되는 가변고정수단(A)은 자성체인 것을 특징으로 하는 PCB 검사장치.
  3. 제1항에 있어서 ; 상기 프로브(2)의 하단에 부착되는 가변고정수단(A)은 진공패드인 것을 특징으로 하는 PCB 검사장치.
  4. 제1항에 있어서, 상기 베이스(4)는 자성체인 것을 특징으로 하는 PCB 검사장치.
  5. 제1항에 있어서, 상기 베이스(4)는 다공판으로 이루어지고 진공흡착기와 연결되어 진공패드로 이루어진 가변고정수단(A)을 가변고정할 수 있도록 한 것을 특징으로 하는 PCB 검사장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019970002901A 1997-01-27 1997-01-27 Pcb 검사장치 KR100257625B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1019970002901A KR100257625B1 (ko) 1997-01-27 1997-01-27 Pcb 검사장치
JP10003609A JPH10253720A (ja) 1997-01-27 1998-01-12 Ｐｃｂ検査装置
EP98100738A EP0856740A1 (en) 1997-01-27 1998-01-16 PCB testing system
US09/014,287 US6118288A (en) 1997-01-27 1998-01-27 Adaptive PCB testing system employing rearrangable test probes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019970002901A KR100257625B1 (ko) 1997-01-27 1997-01-27 Pcb 검사장치

Publications (2)

Publication Number Publication Date
KR970016625A true KR970016625A (ko) 1997-04-28
KR100257625B1 KR100257625B1 (ko) 2000-06-01

Family

ID=19496044

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019970002901A KR100257625B1 (ko) 1997-01-27 1997-01-27 Pcb 검사장치

Country Status (4)

Country Link
US (1) US6118288A (ko)
EP (1) EP0856740A1 (ko)
JP (1) JPH10253720A (ko)
KR (1) KR100257625B1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115383838A (zh) * 2022-09-22 2022-11-25 广东成德电子科技股份有限公司 一种pcb板切割方法

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6437587B1 (en) * 1999-11-04 2002-08-20 Agilent Technologies, Inc. ICT test fixture for fine pitch testing
AU2001272733A1 (en) 2000-07-19 2002-02-05 Orbotech Ltd. Apparatus and method for electrical testing of electrical circuits
US6999888B2 (en) * 2002-09-30 2006-02-14 Intel Corporation Automated circuit board test actuator system
US7154257B2 (en) * 2002-09-30 2006-12-26 Intel Corporation Universal automated circuit board tester
US6984997B2 (en) * 2003-11-13 2006-01-10 International Business Machines Corporation Method and system for testing multi-chip integrated circuit modules
US7161306B2 (en) * 2005-03-31 2007-01-09 Osram Sylvania, Inc. Multi-phase input ballast with dimming and method therefor
JP2012524361A (ja) * 2009-04-17 2012-10-11 テラダイン、 インコーポレイテッド 格納装置テスト
US8482307B2 (en) * 2009-06-05 2013-07-09 Hubbell Incorporated Method and apparatus for the prevention of untested or improperly tested printed circuit boards from being used in a fire pump control system
US8558567B2 (en) 2010-05-14 2013-10-15 International Business Machines Corporation Identifying a signal on a printed circuit board under test
US8901946B2 (en) 2010-05-24 2014-12-02 International Business Machines Corporation Identifying a signal on a printed circuit board under test
US9652077B2 (en) * 2010-12-09 2017-05-16 T-Mobile Usa, Inc. Touch screen testing platform having components for providing conductivity to a tip
US10120474B2 (en) 2010-12-09 2018-11-06 T-Mobile Usa, Inc. Touch screen testing platform for engaging a dynamically positioned target feature
KR101118906B1 (ko) * 2011-08-10 2012-03-09 최준열 휴대폰피씨비 전원공급장치 캘빈핀
CN102507989A (zh) * 2011-11-02 2012-06-20 昆山迈致治具科技有限公司 Ict测试治具底盒结构
CN102944829B (zh) * 2012-10-30 2015-04-15 江苏斯菲尔电气股份有限公司 一种多功能的线路板测试机台及其使用方法
CN112474425A (zh) * 2020-11-27 2021-03-12 苏州康代智能科技股份有限公司 一种电路板多位置取放控制及运送***、控制及运送方法
KR102451715B1 (ko) * 2022-07-05 2022-10-07 (주)승진전자 Atm용 pcb 기능검사장치

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3584300A (en) * 1968-07-31 1971-06-08 Bendix Corp Platen-patch board assembly with spring biased electrical contact means to effect electrical test on an electrical circuit card
JPS5418218Y2 (ko) * 1973-08-07 1979-07-10
DE2559004C2 (de) * 1975-12-29 1978-09-28 Ibm Deutschland Gmbh, 7000 Stuttgart Anordnung zur Prüfung von elektrischen Prüflingen mit einer Vielzahl von Prüfkontakten
DE2628428C3 (de) * 1976-06-24 1979-02-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung
US4443756A (en) * 1980-11-25 1984-04-17 Lightbody James D Apparatus and method for testing circuit boards
US4481467A (en) * 1981-07-30 1984-11-06 At&T Technologies, Inc. Break-away test probe
US4527119A (en) * 1982-05-17 1985-07-02 Testamatic, Incorporated High speed, low mass, movable probe and/or instrument positioner, tool and like items suitable for use in a controlled environment chamber
US4616971A (en) * 1983-10-11 1986-10-14 Fairchild Camera And Instrument Corp. Robotic hand and method for manipulating printed circuit boards
JP2897438B2 (ja) * 1991-02-20 1999-05-31 富士通株式会社 ウエハープローバ
FR2673672B1 (fr) * 1991-03-08 1993-06-04 Inst Francais Du Petrole Methode et dispositif de mise en place de sondes contre la paroi d'un puits cuvele.
US5396186A (en) * 1993-08-09 1995-03-07 Landers Plastics Inc. Vacuum actuated multiple level printed circuit board test fixture

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115383838A (zh) * 2022-09-22 2022-11-25 广东成德电子科技股份有限公司 一种pcb板切割方法
CN115383838B (zh) * 2022-09-22 2023-06-27 广东成德电子科技股份有限公司 一种pcb板切割方法

Also Published As

Publication number Publication date
US6118288A (en) 2000-09-12
EP0856740A1 (en) 1998-08-05
JPH10253720A (ja) 1998-09-25
KR100257625B1 (ko) 2000-06-01

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