KR20210035210A - 마킹 장치, 마킹 방법, 편광판의 제조 방법 및 편광판 - Google Patents

마킹 장치, 마킹 방법, 편광판의 제조 방법 및 편광판 Download PDF

Info

Publication number
KR20210035210A
KR20210035210A KR1020217004117A KR20217004117A KR20210035210A KR 20210035210 A KR20210035210 A KR 20210035210A KR 1020217004117 A KR1020217004117 A KR 1020217004117A KR 20217004117 A KR20217004117 A KR 20217004117A KR 20210035210 A KR20210035210 A KR 20210035210A
Authority
KR
South Korea
Prior art keywords
polarizing plate
polarizing
laser
marking
film
Prior art date
Application number
KR1020217004117A
Other languages
English (en)
Korean (ko)
Inventor
마사노리 시모코시
류타 츠카다
Original Assignee
닛뽄 가야쿠 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 닛뽄 가야쿠 가부시키가이샤 filed Critical 닛뽄 가야쿠 가부시키가이샤
Publication of KR20210035210A publication Critical patent/KR20210035210A/ko

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/04—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of organic materials, e.g. plastics
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Polarising Elements (AREA)
  • Laser Beam Processing (AREA)
  • Ink Jet (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020217004117A 2018-07-30 2019-07-19 마킹 장치, 마킹 방법, 편광판의 제조 방법 및 편광판 KR20210035210A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2018-142365 2018-07-30
JP2018142365 2018-07-30
PCT/JP2019/028397 WO2020026843A1 (ja) 2018-07-30 2019-07-19 マーキング装置、マーキング方法、偏光板の製造方法および偏光板

Publications (1)

Publication Number Publication Date
KR20210035210A true KR20210035210A (ko) 2021-03-31

Family

ID=69231767

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020217004117A KR20210035210A (ko) 2018-07-30 2019-07-19 마킹 장치, 마킹 방법, 편광판의 제조 방법 및 편광판

Country Status (5)

Country Link
JP (1) JP7299219B2 (ja)
KR (1) KR20210035210A (ja)
CN (1) CN112740083B (ja)
TW (1) TWI816846B (ja)
WO (1) WO2020026843A1 (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011257343A (ja) 2010-06-11 2011-12-22 Asahi Kasei E-Materials Corp フィルム用欠陥マーキング装置及び欠陥マーキング方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003177239A (ja) * 2001-12-11 2003-06-27 Hitachi Metals Ltd 多層膜光学フィルターおよび光合分波器
JP2003344301A (ja) * 2002-05-31 2003-12-03 Sumitomo Chem Co Ltd 偏光フィルムの検査方法および検査装置
JP2003344302A (ja) * 2002-05-31 2003-12-03 Sumitomo Chem Co Ltd 偏光フィルムの検査法および検査装置
JP2004045930A (ja) * 2002-07-15 2004-02-12 Masatoshi Kita マーキング方法
US7719646B2 (en) * 2002-11-15 2010-05-18 Sharp Kabushiki Kaisha Liquid crystal display device
US20050277710A1 (en) * 2004-06-14 2005-12-15 Joyce Richard P Tagged resin, method of making a tagged resin, and articles made therefrom
JP2008175940A (ja) * 2007-01-17 2008-07-31 Sekisui Chem Co Ltd 光学フィルムの欠陥のマーキング方法
JP4539664B2 (ja) * 2007-02-28 2010-09-08 株式会社日立製作所 情報再生方法
JP2009244064A (ja) * 2008-03-31 2009-10-22 Sumitomo Chemical Co Ltd 偏光フィルムの検査方法
KR100981306B1 (ko) * 2008-12-02 2010-09-10 참엔지니어링(주) 편광을 이용한 액정표시패널의 리페어 방법
JP2010262265A (ja) * 2009-04-10 2010-11-18 Nitto Denko Corp 光学フィルムロール原反、およびそれを用いた画像表示装置の製造方法
JP5474869B2 (ja) * 2010-09-03 2014-04-16 日東電工株式会社 偏光膜を有する積層体ストリップロールの製造方法
JP5579574B2 (ja) * 2010-11-01 2014-08-27 株式会社日立ハイテクノロジーズ 欠陥検査方法およびその装置
US9454241B2 (en) * 2010-11-12 2016-09-27 3M Innovative Properties Company Interactive polarization-preserving projection display
CN103885231B (zh) * 2014-03-11 2016-04-20 京东方科技集团股份有限公司 显示面板标记装置和显示面板标记方法
CN107933137B (zh) * 2014-03-26 2020-06-05 凸版印刷株式会社 防伪介质
JP6749894B2 (ja) * 2015-04-09 2020-09-02 住友化学株式会社 積層光学フィルムの欠陥検査方法、光学フィルムの欠陥検査方法及び積層光学フィルムの製造方法
WO2016194874A1 (ja) * 2015-06-05 2016-12-08 住友化学株式会社 光透過性フィルムの欠陥検査方法、直線偏光子フィルムの製造方法及び偏光板の製造方法
JP6784540B2 (ja) * 2015-09-30 2020-11-11 日東電工株式会社 偏光板の検査方法および検査装置
KR102033697B1 (ko) * 2016-04-01 2019-10-17 주식회사 엘지화학 광학 필름 마킹 시스템 및 광학 필름 마킹 방법
US10082470B2 (en) * 2016-09-27 2018-09-25 Kla-Tencor Corporation Defect marking for semiconductor wafer inspection

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011257343A (ja) 2010-06-11 2011-12-22 Asahi Kasei E-Materials Corp フィルム用欠陥マーキング装置及び欠陥マーキング方法

Also Published As

Publication number Publication date
CN112740083B (zh) 2023-03-14
CN112740083A (zh) 2021-04-30
JP7299219B2 (ja) 2023-06-27
TW202014739A (zh) 2020-04-16
JPWO2020026843A1 (ja) 2021-08-05
TWI816846B (zh) 2023-10-01
WO2020026843A1 (ja) 2020-02-06

Similar Documents

Publication Publication Date Title
EP2325007B1 (en) Method and system for continuously manufacturing liquid-crystal display element
WO2009123002A1 (ja) 偏光フィルムの検査方法
JP6749321B2 (ja) 光透過性フィルムの欠陥検査方法、直線偏光子フィルムの製造方法及び偏光板の製造方法
JP2009244064A5 (ja)
EP2385399B1 (en) Optical film raw roll
KR20240085234A (ko) 편광자의 검사 방법 및 편광판의 제조 방법
JP4776739B2 (ja) 光学フィルムロール原反を用いた画像表示装置の製造方法
TW201610419A (zh) 積層偏光膜的缺陷檢查方法、製造方法以及製造裝置
CN108535273A (zh) 缺陷检查***、膜制造装置及方法、印刷装置及方法
KR20200047266A (ko) 광학 필름의 결함 검사 방법 및 장치
JP7299219B2 (ja) マーキング装置、マーキング方法、偏光板の製造方法および偏光板
JP6604805B2 (ja) 偏光子の検査方法および偏光板の製造方法
WO2021117671A1 (ja) 機能フィルムの検査方法、検査システム及び原反ロール
JP6898492B2 (ja) 偏光子の検査方法および偏光板の製造方法
WO2021117273A1 (ja) 長尺光学積層体の検査方法及び検査システム
JP7288989B1 (ja) 長尺光学フィルムの検査方法
WO2022149299A1 (ja) 光学積層フィルムの検査方法及びフィルム製品の製造方法