KR20210035210A - 마킹 장치, 마킹 방법, 편광판의 제조 방법 및 편광판 - Google Patents
마킹 장치, 마킹 방법, 편광판의 제조 방법 및 편광판 Download PDFInfo
- Publication number
- KR20210035210A KR20210035210A KR1020217004117A KR20217004117A KR20210035210A KR 20210035210 A KR20210035210 A KR 20210035210A KR 1020217004117 A KR1020217004117 A KR 1020217004117A KR 20217004117 A KR20217004117 A KR 20217004117A KR 20210035210 A KR20210035210 A KR 20210035210A
- Authority
- KR
- South Korea
- Prior art keywords
- polarizing plate
- polarizing
- laser
- marking
- film
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/04—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of organic materials, e.g. plastics
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
- G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Textile Engineering (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Polarising Elements (AREA)
- Laser Beam Processing (AREA)
- Ink Jet (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2018-142365 | 2018-07-30 | ||
JP2018142365 | 2018-07-30 | ||
PCT/JP2019/028397 WO2020026843A1 (ja) | 2018-07-30 | 2019-07-19 | マーキング装置、マーキング方法、偏光板の製造方法および偏光板 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20210035210A true KR20210035210A (ko) | 2021-03-31 |
Family
ID=69231767
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020217004117A KR20210035210A (ko) | 2018-07-30 | 2019-07-19 | 마킹 장치, 마킹 방법, 편광판의 제조 방법 및 편광판 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7299219B2 (ja) |
KR (1) | KR20210035210A (ja) |
CN (1) | CN112740083B (ja) |
TW (1) | TWI816846B (ja) |
WO (1) | WO2020026843A1 (ja) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011257343A (ja) | 2010-06-11 | 2011-12-22 | Asahi Kasei E-Materials Corp | フィルム用欠陥マーキング装置及び欠陥マーキング方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003177239A (ja) * | 2001-12-11 | 2003-06-27 | Hitachi Metals Ltd | 多層膜光学フィルターおよび光合分波器 |
JP2003344301A (ja) * | 2002-05-31 | 2003-12-03 | Sumitomo Chem Co Ltd | 偏光フィルムの検査方法および検査装置 |
JP2003344302A (ja) * | 2002-05-31 | 2003-12-03 | Sumitomo Chem Co Ltd | 偏光フィルムの検査法および検査装置 |
JP2004045930A (ja) * | 2002-07-15 | 2004-02-12 | Masatoshi Kita | マーキング方法 |
US7719646B2 (en) * | 2002-11-15 | 2010-05-18 | Sharp Kabushiki Kaisha | Liquid crystal display device |
US20050277710A1 (en) * | 2004-06-14 | 2005-12-15 | Joyce Richard P | Tagged resin, method of making a tagged resin, and articles made therefrom |
JP2008175940A (ja) * | 2007-01-17 | 2008-07-31 | Sekisui Chem Co Ltd | 光学フィルムの欠陥のマーキング方法 |
JP4539664B2 (ja) * | 2007-02-28 | 2010-09-08 | 株式会社日立製作所 | 情報再生方法 |
JP2009244064A (ja) * | 2008-03-31 | 2009-10-22 | Sumitomo Chemical Co Ltd | 偏光フィルムの検査方法 |
KR100981306B1 (ko) * | 2008-12-02 | 2010-09-10 | 참엔지니어링(주) | 편광을 이용한 액정표시패널의 리페어 방법 |
JP2010262265A (ja) * | 2009-04-10 | 2010-11-18 | Nitto Denko Corp | 光学フィルムロール原反、およびそれを用いた画像表示装置の製造方法 |
JP5474869B2 (ja) * | 2010-09-03 | 2014-04-16 | 日東電工株式会社 | 偏光膜を有する積層体ストリップロールの製造方法 |
JP5579574B2 (ja) * | 2010-11-01 | 2014-08-27 | 株式会社日立ハイテクノロジーズ | 欠陥検査方法およびその装置 |
US9454241B2 (en) * | 2010-11-12 | 2016-09-27 | 3M Innovative Properties Company | Interactive polarization-preserving projection display |
CN103885231B (zh) * | 2014-03-11 | 2016-04-20 | 京东方科技集团股份有限公司 | 显示面板标记装置和显示面板标记方法 |
CN107933137B (zh) * | 2014-03-26 | 2020-06-05 | 凸版印刷株式会社 | 防伪介质 |
JP6749894B2 (ja) * | 2015-04-09 | 2020-09-02 | 住友化学株式会社 | 積層光学フィルムの欠陥検査方法、光学フィルムの欠陥検査方法及び積層光学フィルムの製造方法 |
WO2016194874A1 (ja) * | 2015-06-05 | 2016-12-08 | 住友化学株式会社 | 光透過性フィルムの欠陥検査方法、直線偏光子フィルムの製造方法及び偏光板の製造方法 |
JP6784540B2 (ja) * | 2015-09-30 | 2020-11-11 | 日東電工株式会社 | 偏光板の検査方法および検査装置 |
KR102033697B1 (ko) * | 2016-04-01 | 2019-10-17 | 주식회사 엘지화학 | 광학 필름 마킹 시스템 및 광학 필름 마킹 방법 |
US10082470B2 (en) * | 2016-09-27 | 2018-09-25 | Kla-Tencor Corporation | Defect marking for semiconductor wafer inspection |
-
2019
- 2019-07-19 WO PCT/JP2019/028397 patent/WO2020026843A1/ja active Application Filing
- 2019-07-19 CN CN201980049227.6A patent/CN112740083B/zh active Active
- 2019-07-19 JP JP2020533422A patent/JP7299219B2/ja active Active
- 2019-07-19 KR KR1020217004117A patent/KR20210035210A/ko unknown
- 2019-07-29 TW TW108126703A patent/TWI816846B/zh active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011257343A (ja) | 2010-06-11 | 2011-12-22 | Asahi Kasei E-Materials Corp | フィルム用欠陥マーキング装置及び欠陥マーキング方法 |
Also Published As
Publication number | Publication date |
---|---|
CN112740083B (zh) | 2023-03-14 |
CN112740083A (zh) | 2021-04-30 |
JP7299219B2 (ja) | 2023-06-27 |
TW202014739A (zh) | 2020-04-16 |
JPWO2020026843A1 (ja) | 2021-08-05 |
TWI816846B (zh) | 2023-10-01 |
WO2020026843A1 (ja) | 2020-02-06 |
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