KR101339556B1 - Led 패턴이 구비된 기판의 가공 방법 - Google Patents

Led 패턴이 구비된 기판의 가공 방법 Download PDF

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Publication number
KR101339556B1
KR101339556B1 KR1020120082603A KR20120082603A KR101339556B1 KR 101339556 B1 KR101339556 B1 KR 101339556B1 KR 1020120082603 A KR1020120082603 A KR 1020120082603A KR 20120082603 A KR20120082603 A KR 20120082603A KR 101339556 B1 KR101339556 B1 KR 101339556B1
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South Korea
Prior art keywords
substrate
processing
led pattern
region
led
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KR1020120082603A
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English (en)
Korean (ko)
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KR20130024754A (ko
Inventor
노리유끼 곤도
쇼헤이 나가또모
이꾸요시 나까따니
Original Assignee
미쓰보시 다이야몬도 고교 가부시키가이샤
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Publication of KR20130024754A publication Critical patent/KR20130024754A/ko
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Publication of KR101339556B1 publication Critical patent/KR101339556B1/ko

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/483Containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/075Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
    • H01L25/0753Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Dicing (AREA)
  • Laser Beam Processing (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)
KR1020120082603A 2011-08-30 2012-07-27 Led 패턴이 구비된 기판의 가공 방법 KR101339556B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2011-187175 2011-08-30
JP2011187175A JP5494592B2 (ja) 2011-08-30 2011-08-30 Ledパターン付き基板の加工方法

Publications (2)

Publication Number Publication Date
KR20130024754A KR20130024754A (ko) 2013-03-08
KR101339556B1 true KR101339556B1 (ko) 2013-12-10

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KR1020120082603A KR101339556B1 (ko) 2011-08-30 2012-07-27 Led 패턴이 구비된 기판의 가공 방법

Country Status (4)

Country Link
JP (1) JP5494592B2 (zh)
KR (1) KR101339556B1 (zh)
CN (1) CN102969408A (zh)
TW (1) TWI502764B (zh)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58101508A (ja) * 1981-12-14 1983-06-16 Nippon Telegr & Teleph Corp <Ntt> アンテナ装置
JP6210415B2 (ja) * 2013-07-05 2017-10-11 パナソニックIpマネジメント株式会社 紫外線発光素子の製造方法
JP6223801B2 (ja) * 2013-12-05 2017-11-01 株式会社ディスコ 光デバイスウェーハの加工方法
JP6298658B2 (ja) * 2014-03-06 2018-03-20 旭化成株式会社 窒化物半導体素子、窒化物半導体素子の製造方法、およびレーザ加工深さの検査方法
JP6301726B2 (ja) * 2014-05-07 2018-03-28 株式会社ディスコ 光デバイスの加工方法
JP2016082159A (ja) * 2014-10-21 2016-05-16 旭化成株式会社 窒化物半導体素子
JP2016111119A (ja) * 2014-12-04 2016-06-20 株式会社ディスコ 光デバイスの加工方法
CN104465360A (zh) * 2014-12-25 2015-03-25 安徽安芯电子科技有限公司 晶圆及其刻蚀方法
CN110418996A (zh) * 2017-01-20 2019-11-05 株式会社Nsc 液晶面板制造方法
JP6998703B2 (ja) * 2017-08-29 2022-02-04 古河電気工業株式会社 透明導電膜付基板の製造方法、透明導電膜付基板及び太陽電池
CN108422101B (zh) * 2018-04-12 2020-04-14 无锡奥夫特光学技术有限公司 一种蓝宝石光学窗口的切割方法
JP6578533B1 (ja) * 2018-06-13 2019-09-25 株式会社Nsc 液晶パネル製造方法
JP7258416B2 (ja) * 2018-12-06 2023-04-17 株式会社ディスコ 被加工物の加工方法、デバイスチップの製造方法
JP7217623B2 (ja) * 2018-12-07 2023-02-03 株式会社ディスコ デバイスチップの製造方法
JP6819897B2 (ja) * 2019-08-28 2021-01-27 日亜化学工業株式会社 発光素子の製造方法
DE102020215554A1 (de) * 2020-12-09 2022-06-09 Robert Bosch Gesellschaft mit beschränkter Haftung Substratscheibe, Verfahren zum Herstellen einer Substratscheibe und Verfahren zum Herstellen einer Mehrzahl von Bauelementen

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040087674A (ko) * 2003-04-07 2004-10-15 삼성전기주식회사 레이저 스크라이빙공정를 이용한 반도체 웨이퍼 절단방법
KR20080027555A (ko) * 2006-09-25 2008-03-28 엘지이노텍 주식회사 질화물 반도체 발광소자 및 질화물 반도체 발광소자의 제조방법
KR20090073934A (ko) * 2007-12-31 2009-07-03 주식회사 에피밸리 3족 질화물 반도체 발광소자 및 그 제조방법
KR20110047131A (ko) * 2009-10-29 2011-05-06 미쓰보시 다이야몬도 고교 가부시키가이샤 레이저 가공 방법, 피가공물의 분할 방법 및 레이저 가공 장치

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5643611B2 (zh) * 1973-03-22 1981-10-14
JPS5034167A (zh) * 1973-07-27 1975-04-02
JP2004228290A (ja) * 2003-01-22 2004-08-12 Toyoda Gosei Co Ltd 半導体発光素子及びその製造方法
JP2004165227A (ja) * 2002-11-08 2004-06-10 Toyoda Gosei Co Ltd Iii族窒化物系化合物半導体素子の製造方法
JP2004179556A (ja) * 2002-11-28 2004-06-24 Kyocera Corp セラミック基板とその溝部形成方法及びこれに用いるレーザー加工装置
EP1756857B1 (en) * 2004-06-11 2013-08-14 Showa Denko K.K. Production method of compound semiconductor device wafer
WO2006062017A1 (ja) * 2004-12-08 2006-06-15 Laser Solutions Co., Ltd. 被分割体における分割起点形成方法、被分割体の分割方法、およびパルスレーザー光による被加工物の加工方法
JP4774928B2 (ja) * 2005-11-07 2011-09-21 日亜化学工業株式会社 半導体素子の製造方法
JP2010274328A (ja) * 2009-04-30 2010-12-09 Mitsuboshi Diamond Industrial Co Ltd レーザ加工方法及びレーザ加工装置
CN101552312A (zh) * 2009-05-12 2009-10-07 上海蓝光科技有限公司 一种发光二极管芯片制作方法
JP2011097024A (ja) * 2009-09-29 2011-05-12 Jsr Corp 光半導体素子の製造方法、及び、光半導体素子保護層形成用組成物

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040087674A (ko) * 2003-04-07 2004-10-15 삼성전기주식회사 레이저 스크라이빙공정를 이용한 반도체 웨이퍼 절단방법
KR20080027555A (ko) * 2006-09-25 2008-03-28 엘지이노텍 주식회사 질화물 반도체 발광소자 및 질화물 반도체 발광소자의 제조방법
KR20090073934A (ko) * 2007-12-31 2009-07-03 주식회사 에피밸리 3족 질화물 반도체 발광소자 및 그 제조방법
KR20110047131A (ko) * 2009-10-29 2011-05-06 미쓰보시 다이야몬도 고교 가부시키가이샤 레이저 가공 방법, 피가공물의 분할 방법 및 레이저 가공 장치

Also Published As

Publication number Publication date
JP2013051246A (ja) 2013-03-14
TW201310693A (zh) 2013-03-01
JP5494592B2 (ja) 2014-05-14
CN102969408A (zh) 2013-03-13
TWI502764B (zh) 2015-10-01
KR20130024754A (ko) 2013-03-08

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