KR100784656B1 - 열가소성 폴리우레탄 발포체, 이의 제조방법 및 이로부터제조된 연마 패드 - Google Patents
열가소성 폴리우레탄 발포체, 이의 제조방법 및 이로부터제조된 연마 패드 Download PDFInfo
- Publication number
- KR100784656B1 KR100784656B1 KR1020037007606A KR20037007606A KR100784656B1 KR 100784656 B1 KR100784656 B1 KR 100784656B1 KR 1020037007606 A KR1020037007606 A KR 1020037007606A KR 20037007606 A KR20037007606 A KR 20037007606A KR 100784656 B1 KR100784656 B1 KR 100784656B1
- Authority
- KR
- South Korea
- Prior art keywords
- foam
- thermoplastic polyurethane
- polyurethane
- reactive gas
- pressure
- Prior art date
Links
- 239000004433 Thermoplastic polyurethane Substances 0.000 title claims abstract description 103
- 229920002803 thermoplastic polyurethane Polymers 0.000 title claims abstract description 103
- 239000006260 foam Substances 0.000 title claims abstract description 92
- 238000005498 polishing Methods 0.000 title claims abstract description 68
- 238000004519 manufacturing process Methods 0.000 title claims description 34
- 238000000034 method Methods 0.000 title claims description 31
- 230000008569 process Effects 0.000 title description 8
- 229920005830 Polyurethane Foam Polymers 0.000 claims abstract description 55
- 239000011496 polyurethane foam Substances 0.000 claims abstract description 55
- 125000005442 diisocyanate group Chemical group 0.000 claims abstract description 16
- 125000004433 nitrogen atom Chemical group N* 0.000 claims abstract description 16
- 239000004970 Chain extender Substances 0.000 claims abstract description 15
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 8
- 239000007789 gas Substances 0.000 claims description 91
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 claims description 40
- 229920002635 polyurethane Polymers 0.000 claims description 40
- 239000004814 polyurethane Substances 0.000 claims description 40
- 150000002009 diols Chemical class 0.000 claims description 36
- 238000005187 foaming Methods 0.000 claims description 33
- 239000001569 carbon dioxide Substances 0.000 claims description 20
- 229910002092 carbon dioxide Inorganic materials 0.000 claims description 20
- 229920000642 polymer Polymers 0.000 claims description 19
- 238000001746 injection moulding Methods 0.000 claims description 13
- 238000010438 heat treatment Methods 0.000 claims description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 8
- 239000000126 substance Substances 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 abstract description 6
- 230000006872 improvement Effects 0.000 abstract description 5
- 238000006243 chemical reaction Methods 0.000 abstract description 4
- 229920005862 polyol Polymers 0.000 abstract description 2
- 150000003077 polyols Chemical class 0.000 abstract description 2
- 238000004090 dissolution Methods 0.000 description 22
- 238000002347 injection Methods 0.000 description 20
- 239000007924 injection Substances 0.000 description 20
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 19
- 238000001125 extrusion Methods 0.000 description 18
- UPMLOUAZCHDJJD-UHFFFAOYSA-N 4,4'-Diphenylmethane Diisocyanate Chemical compound C1=CC(N=C=O)=CC=C1CC1=CC=C(N=C=O)C=C1 UPMLOUAZCHDJJD-UHFFFAOYSA-N 0.000 description 14
- 239000002002 slurry Substances 0.000 description 10
- 238000002844 melting Methods 0.000 description 9
- 230000008018 melting Effects 0.000 description 9
- 238000001816 cooling Methods 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 7
- -1 3,7-dimethyldecanedicarboxylic acid Aliphatic dicarboxylic acids Chemical class 0.000 description 6
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 6
- 229920002545 silicone oil Polymers 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 238000004898 kneading Methods 0.000 description 5
- 229920000728 polyester Polymers 0.000 description 5
- 239000004721 Polyphenylene oxide Substances 0.000 description 4
- 239000000155 melt Substances 0.000 description 4
- 238000000465 moulding Methods 0.000 description 4
- 239000004745 nonwoven fabric Substances 0.000 description 4
- 229920000570 polyether Polymers 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 229920006395 saturated elastomer Polymers 0.000 description 4
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 238000005299 abrasion Methods 0.000 description 3
- 239000002585 base Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- DKTUZYVVPZKWAS-UHFFFAOYSA-N hexanedioic acid;3-methylpentane-1,1-diol Chemical compound CCC(C)CC(O)O.OC(=O)CCCCC(O)=O DKTUZYVVPZKWAS-UHFFFAOYSA-N 0.000 description 3
- 239000004417 polycarbonate Substances 0.000 description 3
- 229920000515 polycarbonate Polymers 0.000 description 3
- 238000006116 polymerization reaction Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- BJZYYSAMLOBSDY-QMMMGPOBSA-N (2s)-2-butoxybutan-1-ol Chemical compound CCCCO[C@@H](CC)CO BJZYYSAMLOBSDY-QMMMGPOBSA-N 0.000 description 2
- ALVZNPYWJMLXKV-UHFFFAOYSA-N 1,9-Nonanediol Chemical compound OCCCCCCCCCO ALVZNPYWJMLXKV-UHFFFAOYSA-N 0.000 description 2
- WXUAQHNMJWJLTG-UHFFFAOYSA-N 2-methylbutanedioic acid Chemical compound OC(=O)C(C)CC(O)=O WXUAQHNMJWJLTG-UHFFFAOYSA-N 0.000 description 2
- SXFJDZNJHVPHPH-UHFFFAOYSA-N 3-methylpentane-1,5-diol Chemical compound OCCC(C)CCO SXFJDZNJHVPHPH-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 2
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 2
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical compound OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000011049 filling Methods 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- XXMIOPMDWAUFGU-UHFFFAOYSA-N hexane-1,6-diol Chemical compound OCCCCCCO XXMIOPMDWAUFGU-UHFFFAOYSA-N 0.000 description 2
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 2
- QQVIHTHCMHWDBS-UHFFFAOYSA-N isophthalic acid Chemical compound OC(=O)C1=CC=CC(C(O)=O)=C1 QQVIHTHCMHWDBS-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- BDJRBEYXGGNYIS-UHFFFAOYSA-N nonanedioic acid Chemical compound OC(=O)CCCCCCCC(O)=O BDJRBEYXGGNYIS-UHFFFAOYSA-N 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- WLJVNTCWHIRURA-UHFFFAOYSA-N pimelic acid Chemical compound OC(=O)CCCCCC(O)=O WLJVNTCWHIRURA-UHFFFAOYSA-N 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- CXMXRPHRNRROMY-UHFFFAOYSA-N sebacic acid Chemical compound OC(=O)CCCCCCCCC(O)=O CXMXRPHRNRROMY-UHFFFAOYSA-N 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- DNIAPMSPPWPWGF-VKHMYHEASA-N (+)-propylene glycol Chemical compound C[C@H](O)CO DNIAPMSPPWPWGF-VKHMYHEASA-N 0.000 description 1
- VEPOHXYIFQMVHW-PVJVQHJQSA-N (2r,3r)-2,3-dihydroxybutanedioic acid;(2s,3s)-3,4-dimethyl-2-phenylmorpholine Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O.O1CCN(C)[C@@H](C)[C@@H]1C1=CC=CC=C1 VEPOHXYIFQMVHW-PVJVQHJQSA-N 0.000 description 1
- MTZUIIAIAKMWLI-UHFFFAOYSA-N 1,2-diisocyanatobenzene Chemical compound O=C=NC1=CC=CC=C1N=C=O MTZUIIAIAKMWLI-UHFFFAOYSA-N 0.000 description 1
- YPFDHNVEDLHUCE-UHFFFAOYSA-N 1,3-propanediol Substances OCCCO YPFDHNVEDLHUCE-UHFFFAOYSA-N 0.000 description 1
- SBJCUZQNHOLYMD-UHFFFAOYSA-N 1,5-Naphthalene diisocyanate Chemical compound C1=CC=C2C(N=C=O)=CC=CC2=C1N=C=O SBJCUZQNHOLYMD-UHFFFAOYSA-N 0.000 description 1
- 229940043375 1,5-pentanediol Drugs 0.000 description 1
- RTBFRGCFXZNCOE-UHFFFAOYSA-N 1-methylsulfonylpiperidin-4-one Chemical compound CS(=O)(=O)N1CCC(=O)CC1 RTBFRGCFXZNCOE-UHFFFAOYSA-N 0.000 description 1
- FEQGQQZPSMVQKP-UHFFFAOYSA-N 2-(2,7-dimethylnonyl)propanedioic acid Chemical compound CCC(C)CCCCC(C)CC(C(O)=O)C(O)=O FEQGQQZPSMVQKP-UHFFFAOYSA-N 0.000 description 1
- KRUQSJKOWIRXGZ-UHFFFAOYSA-N 2-(2-methylbutyl)propanedioic acid Chemical compound CCC(C)CC(C(O)=O)C(O)=O KRUQSJKOWIRXGZ-UHFFFAOYSA-N 0.000 description 1
- WTPYFJNYAMXZJG-UHFFFAOYSA-N 2-[4-(2-hydroxyethoxy)phenoxy]ethanol Chemical compound OCCOC1=CC=C(OCCO)C=C1 WTPYFJNYAMXZJG-UHFFFAOYSA-N 0.000 description 1
- SDQROPCSKIYYAV-UHFFFAOYSA-N 2-methyloctane-1,8-diol Chemical compound OCC(C)CCCCCCO SDQROPCSKIYYAV-UHFFFAOYSA-N 0.000 description 1
- QWGRWMMWNDWRQN-UHFFFAOYSA-N 2-methylpropane-1,3-diol Chemical compound OCC(C)CO QWGRWMMWNDWRQN-UHFFFAOYSA-N 0.000 description 1
- JHDZAYOBNXRTKA-UHFFFAOYSA-N 2-octan-2-ylpropanedioic acid Chemical compound CCCCCCC(C)C(C(O)=O)C(O)=O JHDZAYOBNXRTKA-UHFFFAOYSA-N 0.000 description 1
- WMRCTEPOPAZMMN-UHFFFAOYSA-N 2-undecylpropanedioic acid Chemical compound CCCCCCCCCCCC(C(O)=O)C(O)=O WMRCTEPOPAZMMN-UHFFFAOYSA-N 0.000 description 1
- WDBZEBXYXWWDPJ-UHFFFAOYSA-N 3-(2-methylphenoxy)propanoic acid Chemical compound CC1=CC=CC=C1OCCC(O)=O WDBZEBXYXWWDPJ-UHFFFAOYSA-N 0.000 description 1
- GAYWCADKXYCKCG-UHFFFAOYSA-N 5-pyridin-3-yl-1,2-dihydro-1,2,4-triazole-3-thione Chemical compound N1NC(=S)N=C1C1=CC=CN=C1 GAYWCADKXYCKCG-UHFFFAOYSA-N 0.000 description 1
- 239000004604 Blowing Agent Substances 0.000 description 1
- OIFBSDVPJOWBCH-UHFFFAOYSA-N Diethyl carbonate Chemical compound CCOC(=O)OCC OIFBSDVPJOWBCH-UHFFFAOYSA-N 0.000 description 1
- KMTRUDSVKNLOMY-UHFFFAOYSA-N Ethylene carbonate Chemical compound O=C1OCCO1 KMTRUDSVKNLOMY-UHFFFAOYSA-N 0.000 description 1
- 239000005057 Hexamethylene diisocyanate Substances 0.000 description 1
- ALQSHHUCVQOPAS-UHFFFAOYSA-N Pentane-1,5-diol Chemical compound OCCCCCO ALQSHHUCVQOPAS-UHFFFAOYSA-N 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- KDYFGRWQOYBRFD-UHFFFAOYSA-N Succinic acid Natural products OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 description 1
- 239000003082 abrasive agent Substances 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000001361 adipic acid Substances 0.000 description 1
- 235000011037 adipic acid Nutrition 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- JFCQEDHGNNZCLN-UHFFFAOYSA-N anhydrous glutaric acid Natural products OC(=O)CCCC(O)=O JFCQEDHGNNZCLN-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- SYEOWUNSTUDKGM-UHFFFAOYSA-N beta-methyladipic acid Natural products OC(=O)CC(C)CCC(O)=O SYEOWUNSTUDKGM-UHFFFAOYSA-N 0.000 description 1
- KDYFGRWQOYBRFD-NUQCWPJISA-N butanedioic acid Chemical compound O[14C](=O)CC[14C](O)=O KDYFGRWQOYBRFD-NUQCWPJISA-N 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
- PMMYEEVYMWASQN-IMJSIDKUSA-N cis-4-Hydroxy-L-proline Chemical compound O[C@@H]1CN[C@H](C(O)=O)C1 PMMYEEVYMWASQN-IMJSIDKUSA-N 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000013317 conjugated microporous polymer Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- PDXRQENMIVHKPI-UHFFFAOYSA-N cyclohexane-1,1-diol Chemical compound OC1(O)CCCCC1 PDXRQENMIVHKPI-UHFFFAOYSA-N 0.000 description 1
- VEIOBOXBGYWJIT-UHFFFAOYSA-N cyclohexane;methanol Chemical compound OC.OC.C1CCCCC1 VEIOBOXBGYWJIT-UHFFFAOYSA-N 0.000 description 1
- 150000001991 dicarboxylic acids Chemical class 0.000 description 1
- IEJIGPNLZYLLBP-UHFFFAOYSA-N dimethyl carbonate Chemical compound COC(=O)OC IEJIGPNLZYLLBP-UHFFFAOYSA-N 0.000 description 1
- 230000003670 easy-to-clean Effects 0.000 description 1
- 230000032050 esterification Effects 0.000 description 1
- 238000005886 esterification reaction Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000010687 lubricating oil Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- SLCVBVWXLSEKPL-UHFFFAOYSA-N neopentyl glycol Chemical compound OCC(C)(C)CO SLCVBVWXLSEKPL-UHFFFAOYSA-N 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- OEIJHBUUFURJLI-UHFFFAOYSA-N octane-1,8-diol Chemical compound OCCCCCCCCO OEIJHBUUFURJLI-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- GLOBUAZSRIOKLN-UHFFFAOYSA-N pentane-1,4-diol Chemical compound CC(O)CCCO GLOBUAZSRIOKLN-UHFFFAOYSA-N 0.000 description 1
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 229920000166 polytrimethylene carbonate Polymers 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 150000003384 small molecules Chemical class 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- KKEYFWRCBNTPAC-UHFFFAOYSA-L terephthalate(2-) Chemical compound [O-]C(=O)C1=CC=C(C([O-])=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-L 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- 238000005809 transesterification reaction Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C44/00—Shaping by internal pressure generated in the material, e.g. swelling or foaming ; Producing porous or cellular expanded plastics articles
- B29C44/34—Auxiliary operations
- B29C44/3469—Cell or pore nucleation
- B29C44/348—Cell or pore nucleation by regulating the temperature and/or the pressure, e.g. suppression of foaming until the pressure is rapidly decreased
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/08—Processes
- C08G18/0895—Manufacture of polymers by continuous processes
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
- C08G18/40—High-molecular-weight compounds
- C08G18/42—Polycondensates having carboxylic or carbonic ester groups in the main chain
- C08G18/4236—Polycondensates having carboxylic or carbonic ester groups in the main chain containing only aliphatic groups
- C08G18/4238—Polycondensates having carboxylic or carbonic ester groups in the main chain containing only aliphatic groups derived from dicarboxylic acids and dialcohols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
- C08G18/65—Low-molecular-weight compounds having active hydrogen with high-molecular-weight compounds having active hydrogen
- C08G18/66—Compounds of groups C08G18/42, C08G18/48, or C08G18/52
- C08G18/6603—Compounds of groups C08G18/42, C08G18/48, or C08G18/52 with compounds of group C08G18/32 or polyamines of C08G18/38
- C08G18/6607—Compounds of groups C08G18/42, C08G18/48, or C08G18/52 with compounds of group C08G18/32 or polyamines of C08G18/38 with compounds of group C08G18/3203
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J9/00—Working-up of macromolecular substances to porous or cellular articles or materials; After-treatment thereof
- C08J9/04—Working-up of macromolecular substances to porous or cellular articles or materials; After-treatment thereof using blowing gases generated by a previously added blowing agent
- C08J9/12—Working-up of macromolecular substances to porous or cellular articles or materials; After-treatment thereof using blowing gases generated by a previously added blowing agent by a physical blowing agent
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G2110/00—Foam properties
- C08G2110/0041—Foam properties having specified density
- C08G2110/0066—≥ 150kg/m3
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Organic Chemistry (AREA)
- Polymers & Plastics (AREA)
- Medicinal Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Manufacture Of Porous Articles, And Recovery And Treatment Of Waste Products (AREA)
- Polyurethanes Or Polyureas (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Description
Claims (18)
- 삭제
- 수 평균 분자량이 400 내지 2000인 고분자 디올, 유기 디이소시아네이트 및 연쇄연장제를 반응시켜 수득되며 이소시아네이트 그룹으로부터 유도된 질소 원자의 함량이 6중량% 내지 8.2중량%이고 50℃에서의 동적 점탄성율 E′50가 5 ×109dyn/㎠ 이상인 열가소성 폴리우레탄에 비반응성 가스를 가압 조건하에서 용해시킨 후, 압력을 개방하고, 당해 폴리우레탄을 연화온도 이상의 온도에서 발포시켜 수득한, 밀도가 0.5 내지 1.0g/㎤이고 기포 크기가 5 내지 200㎛인 폴리우레탄 발포체.
- 제2항에 있어서, 비반응성 가스를 용해시키는 열가소성 폴리우레탄이 용융 상태의 열가소성 폴리우레탄인 발포체.
- 제2항 또는 제3항에 있어서, 비반응성 가스가 이산화탄소 또는 질소인 발포체.
- 삭제
- 삭제
- 제2항 또는 제3항에 따르는 발포체로 이루어진 연마 패드.
- 제2항 또는 제3항에 따르는 발포체를 사용하는 화학적 기계적 연마방법.
- 수 평균 분자량이 400 내지 2000인 고분자 디올, 유기 디이소시아네이트 및 연쇄연장제를 반응시켜 수득되며 이소시아네이트 그룹으로부터 유도된 질소 원자의 함량이 6중량% 내지 8.2중량%이고 50℃에서의 동적 점탄성율 E′50가 5 ×109dyn/㎠ 이상인 열가소성 폴리우레탄으로 이루어진 성형체에 내압 용기에서 압력이 3 내지 15MPa이고 온도가 50 내지 160℃인 조건하에서 비반응성 가스를 용해시키는 단계,당해 열가소성 폴리우레탄의 연화온도보다 낮은 온도에서 내압 용기의 압력을 개방하는 단계 및열가소성 폴리우레탄의 연화온도를 T℃로 할 때, (T + 10)℃ 내지 (T + 40)℃로 가열하여 비반응성 가스가 용해되어 있는 성형체를 발포시키는 단계를 포함하는, 폴리우레탄 발포체의 제조방법.
- 수 평균 분자량이 400 내지 2000인 고분자 디올, 유기 디이소시아네이트 및 연쇄연장제를 반응시켜 수득되며 이소시아네이트 그룹으로부터 유도된 질소 원자의 함량이 6중량% 내지 8.2중량%이고 50℃에서의 동적 점탄성율 E′50가 5 ×109dyn/㎠ 이상인 열가소성 폴리우레탄으로 이루어진 성형체에 내압 용기에서 압력이 3 내지 15MPa이고 온도가 160 내지 200℃인 조건하에서 비반응성 가스를 용해시키는 단계 및내압 용기의 압력을 개방하여 비반응성 가스가 용해되어 있는 성형체를 발포시키는 단계를 포함하는, 폴리우레탄 발포체의 제조방법.
- 수 평균 분자량이 400 내지 2000인 고분자 디올, 유기 디이소시아네이트 및 연쇄연장제를 반응시켜 수득되며 이소시아네이트 그룹으로부터 유도된 질소 원자의 함량이 6중량% 내지 8.2중량%이고 50℃에서의 동적 점탄성율 E′50가 5 ×109dyn/㎠ 이상인 용융 상태의 열가소성 폴리우레탄에 비반응성 가스를 가압 조건하에서 용해시키는 단계 및비반응성 가스가 용해되어 있는 열가소성 폴리우레탄을 발포 가능한 압력하에서 압출성형 또는 사출성형하여 발포 성형체를 수득하는 단계를 포함하는, 밀도가 0.5 내지 1.0g/㎤이고 기포 크기가 5 내지 200㎛인 폴리우레탄 발포체의 제조방법.
- 수 평균 분자량이 400 내지 2000인 고분자 디올, 유기 디이소시아네이트 및 연쇄연장제를 반응시켜 수득되며 이소시아네이트 그룹으로부터 유도된 질소 원자의 함량이 6중량% 내지 8.2중량%이고 50℃에서의 동적 점탄성율 E′50가 5 ×109dyn/㎠ 이상인 용융 상태의 열가소성 폴리우레탄에 비반응성 가스를 가압 조건하에서 용해시키는 단계,비반응성 가스가 용해되어 있는 열가소성 폴리우레탄을 발포가 발생하지 않는 압력이 유지되는 속도로 사출성형하여 미발포 성형체를 수득하는 단계 및당해 미발포 성형체를 150 내지 180℃로 가열하여 발포시키는 단계를 포함하는, 밀도가 0.5 내지 1.0g/㎤이고 기포 크기가 5 내지 200㎛인 폴리우레탄 발포체의 제조방법.
- 수 평균 분자량이 400 내지 2000인 고분자 디올, 유기 디이소시아네이트 및 연쇄연장제를 반응시켜 수득되며 이소시아네이트 그룹으로부터 유도된 질소 원자의 함량이 6중량% 내지 8.2중량%이고 50℃에서의 동적 점탄성율 E′50가 5 ×109dyn/㎠ 이상인 용융 상태의 열가소성 폴리우레탄에 비반응성 가스를 가압 조건하에서 용해시키는 단계 및비반응성 가스가 용해되어 있는 열가소성 폴리우레탄을 발포가 발생하지 않는 압력이 유지되는 속도로 금형 속으로 사출한 후, 당해 금형 속의 용적을 증가시킴으로써 발포 성형체를 수득하는 단계를 포함하는, 밀도가 0.5 내지 1.0g/㎤이고 기포 크기가 5 내지 200㎛인 폴리우레탄 발포체의 제조방법.
- 삭제
- 삭제
- 제9항 내지 제13항 중의 어느 한 항에 있어서, 비반응성 가스가 이산화탄소 또는 질소인 폴리우레탄 발포체의 제조방법.
- 제9항 내지 제13항 중의 어느 한 항에 따르는 제조방법으로 제조한 폴리우레탄 발포체로 이루어진 연마 패드.
- 제9항 내지 제13항 중의 어느 한 항에 따르는 제조방법으로 수득한 폴리우레탄 발포체를 사용하는 화학적 기계적 연마방법.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2000-00374134 | 2000-12-08 | ||
JP2000374134 | 2000-12-08 | ||
JPJP-P-2001-00113465 | 2001-04-12 | ||
JP2001113465 | 2001-04-12 | ||
PCT/JP2001/010613 WO2002046283A1 (fr) | 2000-12-08 | 2001-12-05 | Mousse de polyurethane thermoplastique, son procede de fabrication et tampons de polissage a base de cette mousse |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030059324A KR20030059324A (ko) | 2003-07-07 |
KR100784656B1 true KR100784656B1 (ko) | 2007-12-12 |
Family
ID=26605490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020037007606A KR100784656B1 (ko) | 2000-12-08 | 2001-12-05 | 열가소성 폴리우레탄 발포체, 이의 제조방법 및 이로부터제조된 연마 패드 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6979701B2 (ko) |
EP (1) | EP1354913B1 (ko) |
KR (1) | KR100784656B1 (ko) |
CN (1) | CN1217981C (ko) |
TW (1) | TW528657B (ko) |
WO (1) | WO2002046283A1 (ko) |
Families Citing this family (44)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003062748A (ja) * | 2001-08-24 | 2003-03-05 | Inoac Corp | 研磨用パッド |
JP2004098458A (ja) * | 2002-09-09 | 2004-04-02 | Canon Inc | 射出成形品 |
WO2004054779A1 (ja) * | 2002-11-25 | 2004-07-01 | Sumitomo Bakelite Company Limited | 研磨用独立発泡体の製造方法、研磨用発泡シート、研磨用積層体と研磨方法、研磨用積層体の製造方法、および溝付き研磨パッド |
CN1314517C (zh) * | 2002-12-04 | 2007-05-09 | 智胜科技股份有限公司 | 一体成型pu研磨垫的制造方法 |
US6984709B2 (en) * | 2002-12-20 | 2006-01-10 | Noveon Ip Holdings Corp. | Organometallic-free polyurethanes having low extractables |
US7074115B2 (en) | 2003-10-09 | 2006-07-11 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad |
US20050171224A1 (en) | 2004-02-03 | 2005-08-04 | Kulp Mary J. | Polyurethane polishing pad |
DE602005007125D1 (de) | 2004-09-17 | 2008-07-10 | Jsr Corp | Chemisch-mechanisches Polierkissen und chemisch-mechanisches Polierverfahren |
JP4475404B2 (ja) * | 2004-10-14 | 2010-06-09 | Jsr株式会社 | 研磨パッド |
US7579068B2 (en) * | 2005-04-05 | 2009-08-25 | Dow Global Technologies, Inc. | Rigid polyurethane-isocyanurate reinforcing foams |
JP5193415B2 (ja) * | 2005-04-27 | 2013-05-08 | ベバスト ジャパン株式会社 | 車両用ルーフパネル |
KR101134432B1 (ko) * | 2005-05-17 | 2012-04-10 | 도요 고무 고교 가부시키가이샤 | 연마 패드 |
JP4884725B2 (ja) * | 2005-08-30 | 2012-02-29 | 東洋ゴム工業株式会社 | 研磨パッド |
CN101268111B (zh) | 2005-09-22 | 2012-07-18 | 可乐丽股份有限公司 | 高分子材料、由其得到的发泡体以及使用它们的研磨垫 |
TW200732017A (en) * | 2006-02-17 | 2007-09-01 | Long Way Entpr Co Ltd | Method for manufacturing rub-resistant ball slices |
CN102672630B (zh) | 2006-04-19 | 2015-03-18 | 东洋橡胶工业株式会社 | 抛光垫的制造方法 |
TWI287486B (en) | 2006-05-04 | 2007-10-01 | Iv Technologies Co Ltd | Polishing pad and method thereof |
WO2008026451A1 (en) * | 2006-08-28 | 2008-03-06 | Toyo Tire & Rubber Co., Ltd. | Polishing pad |
JP5008927B2 (ja) | 2006-08-31 | 2012-08-22 | 東洋ゴム工業株式会社 | 研磨パッド |
EP2135707A4 (en) * | 2007-03-20 | 2013-10-09 | Kuraray Co | CUSHION FOR POLISHING DISC AND CUSHIONING POLISHING DISC |
JP4954762B2 (ja) * | 2007-03-27 | 2012-06-20 | 東洋ゴム工業株式会社 | ポリウレタン発泡体の製造方法 |
JP5078000B2 (ja) | 2007-03-28 | 2012-11-21 | 東洋ゴム工業株式会社 | 研磨パッド |
JP2008307631A (ja) * | 2007-06-13 | 2008-12-25 | Asahi Glass Co Ltd | ガラス基板研磨方法 |
KR101144305B1 (ko) * | 2008-12-15 | 2012-05-11 | 주식회사 엘지화학 | 폴리우레탄 발포체의 제조방법 및 이로부터 제조된 다공성 연마 패드 |
WO2011024599A1 (ja) * | 2009-08-31 | 2011-03-03 | Hoya株式会社 | 偏光素子及び偏光レンズの製造方法 |
WO2011133508A1 (en) * | 2010-04-21 | 2011-10-27 | The Procter & Gamble Company | Liquid cleaning and/or cleansing composition |
JP5661130B2 (ja) * | 2013-01-31 | 2015-01-28 | 東洋ゴム工業株式会社 | 研磨パッド |
TWI656153B (zh) | 2013-10-11 | 2019-04-11 | 巴斯夫歐洲公司 | 膨脹熱塑性彈性體珠粒之製造 |
TWI667285B (zh) | 2013-10-18 | 2019-08-01 | 德商巴斯夫歐洲公司 | 膨脹熱塑性彈性體之製造 |
JP6280349B2 (ja) * | 2013-11-18 | 2018-02-14 | Hoya株式会社 | 磁気ディスク用ガラス基板の製造方法、磁気ディスクの製造方法、及び磁気ディスク用基板の製造方法 |
WO2015075546A1 (en) * | 2013-11-20 | 2015-05-28 | Basf Se | Self sealable thermoplastic polyurethane foamed articles and method for forming same |
EP3071648B1 (en) * | 2013-11-20 | 2019-01-09 | Basf Se | Thermoplastic polyurethane foamed articles comprising a thermoplastic polyurethane composition and an epoxy, functional styrene acrylic copolymer |
US20170174818A1 (en) * | 2014-03-26 | 2017-06-22 | Lubrizol Advanced Materials, Inc. | Polyurethane foams and method for producing same |
US9649741B2 (en) * | 2014-07-07 | 2017-05-16 | Jh Rhodes Company, Inc. | Polishing material for polishing hard surfaces, media including the material, and methods of forming and using same |
JP6518680B2 (ja) * | 2014-10-31 | 2019-05-22 | 株式会社クラレ | 研磨層用非多孔性成形体,研磨パッド及び研磨方法 |
KR102398128B1 (ko) * | 2014-11-28 | 2022-05-13 | 주식회사 쿠라레 | 연마층용 성형체 및 연마 패드 |
WO2016194737A1 (ja) | 2015-06-01 | 2016-12-08 | 株式会社ジェイエスピー | 熱可塑性ポリウレタン発泡粒子及び熱可塑性ポリウレタン発泡粒子成形体 |
US9776300B2 (en) * | 2015-06-26 | 2017-10-03 | Rohm And Haas Electronic Materials Cmp Holdings Inc. | Chemical mechanical polishing pad and method of making same |
US20170120497A1 (en) * | 2015-10-28 | 2017-05-04 | Dingzing Advanced Materials Inc. | Method for producing a thermoplastic polyurethane ball texture |
WO2020072221A1 (en) * | 2018-10-03 | 2020-04-09 | Dow Global Technologies Llc | Methods for producing polyurethane foams |
WO2020095832A1 (ja) * | 2018-11-09 | 2020-05-14 | 株式会社クラレ | 研磨層用ポリウレタン、研磨層、研磨パッド及び研磨層の改質方法 |
US10793767B2 (en) | 2018-11-29 | 2020-10-06 | Saudi Arabian Oil Company | Stabilized foams with tailored water chemistry for mobility control in gas injection processes |
TWI761921B (zh) * | 2019-10-30 | 2022-04-21 | 南韓商Skc索密思股份有限公司 | 研磨墊、製造該研磨墊之方法及使用該研磨墊以製造半導體裝置之方法 |
CN117020935B (zh) * | 2023-09-06 | 2024-04-26 | 中山大学 | 一种聚氨酯抛光垫及其制备方法与应用 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11349680A (ja) | 1998-06-11 | 1999-12-21 | Mitsui Chem Inc | ポリオール及びその製造方法、並びにそれを用いたポリウレタン樹脂の製造方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3100844B2 (ja) * | 1994-10-18 | 2000-10-23 | 積水化成品工業株式会社 | 熱可塑性ポリウレタン発泡成形体及びその製造方法 |
JP2000344902A (ja) * | 1999-06-04 | 2000-12-12 | Fuji Spinning Co Ltd | 研磨パッド用ウレタン成形物の製造法及び研磨パッド用ウレタン成形物 |
JP3649385B2 (ja) | 2000-01-12 | 2005-05-18 | 東洋ゴム工業株式会社 | 熱可塑性エラストマー微孔質発泡体、その製造方法および研磨シート |
WO2001096434A1 (fr) * | 2000-06-13 | 2001-12-20 | Toyo Tire & Rubber Co., Ltd. | Procede de production de mousse de polyurethanne, mousse de polyurethanne et feuille abrasive |
-
2001
- 2001-12-05 CN CN018223923A patent/CN1217981C/zh not_active Expired - Lifetime
- 2001-12-05 EP EP01999602.4A patent/EP1354913B1/en not_active Expired - Lifetime
- 2001-12-05 KR KR1020037007606A patent/KR100784656B1/ko active IP Right Grant
- 2001-12-05 US US10/432,629 patent/US6979701B2/en not_active Expired - Lifetime
- 2001-12-05 WO PCT/JP2001/010613 patent/WO2002046283A1/ja active Application Filing
- 2001-12-07 TW TW090130338A patent/TW528657B/zh not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11349680A (ja) | 1998-06-11 | 1999-12-21 | Mitsui Chem Inc | ポリオール及びその製造方法、並びにそれを用いたポリウレタン樹脂の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US6979701B2 (en) | 2005-12-27 |
KR20030059324A (ko) | 2003-07-07 |
US20040054023A1 (en) | 2004-03-18 |
WO2002046283A1 (fr) | 2002-06-13 |
EP1354913A1 (en) | 2003-10-22 |
CN1487965A (zh) | 2004-04-07 |
EP1354913A4 (en) | 2009-09-16 |
TW528657B (en) | 2003-04-21 |
CN1217981C (zh) | 2005-09-07 |
EP1354913B1 (en) | 2016-10-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100784656B1 (ko) | 열가소성 폴리우레탄 발포체, 이의 제조방법 및 이로부터제조된 연마 패드 | |
EP1927605B1 (en) | Polymer material, foam obtained from same, and polishing pad using those | |
CN109478507B (zh) | 抛光垫及使用了该抛光垫的抛光方法 | |
CN107000157B (zh) | 抛光层用成型体及抛光垫 | |
KR101084808B1 (ko) | 금속 막 연마용 패드 및 그것을 이용하는 금속 막의 연마 방법 | |
JP3649385B2 (ja) | 熱可塑性エラストマー微孔質発泡体、その製造方法および研磨シート | |
JP3983610B2 (ja) | 熱可塑性ポリウレタン発泡体およびそれからなる研磨パッド | |
JP4115124B2 (ja) | 熱可塑性ポリウレタン発泡体およびその製造方法並びに該発泡体からなる研磨パッド | |
JP4994894B2 (ja) | 樹脂発泡体およびそれからなる研磨パッド | |
JP4994807B2 (ja) | 発泡体の製造方法 | |
JP4950564B2 (ja) | 高分子材料、それから得られる発泡体およびこれらを用いた研磨パッド | |
JP4474208B2 (ja) | 樹脂発泡体およびそれからなる研磨パッド | |
JP2007091898A (ja) | 樹脂発泡体及びこれを用いた研磨パッド | |
JP2004123975A (ja) | ポリウレタン発泡体およびそれからなる研磨パッド | |
CN1314517C (zh) | 一体成型pu研磨垫的制造方法 | |
TW593453B (en) | Method for manufacturing auxiliary gas-adding polyurethane/polyurethane-urea polishing pad | |
JP2020049640A (ja) | 研磨パッド |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20121123 Year of fee payment: 6 |
|
FPAY | Annual fee payment |
Payment date: 20131101 Year of fee payment: 7 |
|
FPAY | Annual fee payment |
Payment date: 20141031 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20151030 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20161028 Year of fee payment: 10 |
|
FPAY | Annual fee payment |
Payment date: 20171027 Year of fee payment: 11 |
|
FPAY | Annual fee payment |
Payment date: 20181115 Year of fee payment: 12 |