KR100718879B1 - 2-트랜지스터 구조를 갖는 이미지 센서의 단위화소 - Google Patents
2-트랜지스터 구조를 갖는 이미지 센서의 단위화소 Download PDFInfo
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- KR100718879B1 KR100718879B1 KR1020050056037A KR20050056037A KR100718879B1 KR 100718879 B1 KR100718879 B1 KR 100718879B1 KR 1020050056037 A KR1020050056037 A KR 1020050056037A KR 20050056037 A KR20050056037 A KR 20050056037A KR 100718879 B1 KR100718879 B1 KR 100718879B1
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- South Korea
- Prior art keywords
- photodiode
- terminal
- transistor
- image sensor
- pixel
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- 230000004044 response Effects 0.000 claims abstract description 3
- 238000000034 method Methods 0.000 claims description 3
- 238000009792 diffusion process Methods 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 abstract description 8
- 230000009467 reduction Effects 0.000 abstract description 2
- 230000007423 decrease Effects 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 206010017577 Gait disturbance Diseases 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/766—Addressed sensors, e.g. MOS or CMOS sensors comprising control or output lines used for a plurality of functions, e.g. for pixel output, driving, reset or power
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Signal Processing (AREA)
- Multimedia (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (3)
- 일 단자가 접지전압에 연결된 포토다이오드;일 단자가 상기 포토다이오드의 다른 일 단자에 연결되고 다른 일 단자가 선택신호에 연결되며 게이트에 인가되는 리셋신호에 응답하여 상기 포토다이오드의 다른 일 단자를 초기화시키는 리셋트랜지스터; 및일 단자가 상기 선택신호에 연결되며, 게이트에 인가되는 상기 포토다이오드의 다른 일 단자에 축적된 전하에 대응되는 변환전압을 생성하여 다른 일 단자를 통해 출력하는 선택을 겸한 리드아웃 기능의 트랜지스터를 구비하는 것을 특징으로 하는 2-T 구조를 갖는 이미지 센서의 단위화소.
- 제1항에 있어서,상기 선택신호의 전압준위는 공급전원전압과 접지전압 사이인 것을 특징으로 하는 2-T 구조를 갖는 이미지 센서의 단위화소.
- 제1항에 있어서,상기 선택신호가 인가되는 상기 리셋트랜지스터의 다른 일 단자 및 상기 선택을 겸한 리드아웃 기능의 트랜지스터의 일 단자는 하나의 공통 확산영역을 공유하는 것을 특징으로 하는 2-T 구조를 갖는 이미지 센서의 단위화소.
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050056037A KR100718879B1 (ko) | 2005-06-28 | 2005-06-28 | 2-트랜지스터 구조를 갖는 이미지 센서의 단위화소 |
US11/993,124 US20100182467A1 (en) | 2005-06-28 | 2006-06-21 | Unit pixel having 2-transistor structure for image sensor and manufacturing method thereof |
CNA2006800235763A CN101213670A (zh) | 2005-06-28 | 2006-06-21 | 图像传感器的具有2晶体管结构的单位像素及其制造方法 |
EP06768965A EP1900030A1 (en) | 2005-06-28 | 2006-06-21 | Unit pixel having 2-transistor structure for image sensor and manufacturing method thereof |
PCT/KR2006/002379 WO2007001131A1 (en) | 2005-06-28 | 2006-06-21 | Unit pixel having 2-transistor structure for image sensor and manufacturing method thereof |
JP2008519166A JP2008544570A (ja) | 2005-06-28 | 2006-06-21 | 2−トランジスタ構造を持つイメージセンサの単位画素及びその製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050056037A KR100718879B1 (ko) | 2005-06-28 | 2005-06-28 | 2-트랜지스터 구조를 갖는 이미지 센서의 단위화소 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20070000579A KR20070000579A (ko) | 2007-01-03 |
KR100718879B1 true KR100718879B1 (ko) | 2007-05-17 |
Family
ID=37595347
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020050056037A KR100718879B1 (ko) | 2005-06-28 | 2005-06-28 | 2-트랜지스터 구조를 갖는 이미지 센서의 단위화소 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20100182467A1 (ko) |
EP (1) | EP1900030A1 (ko) |
JP (1) | JP2008544570A (ko) |
KR (1) | KR100718879B1 (ko) |
CN (1) | CN101213670A (ko) |
WO (1) | WO2007001131A1 (ko) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI436137B (zh) | 2010-06-15 | 2014-05-01 | Ind Tech Res Inst | 主動式光感測畫素、主動式光感測陣列以及光感測方法 |
DE102013110695A1 (de) | 2012-10-02 | 2014-04-03 | Samsung Electronics Co., Ltd. | Bildsensor, Verfahren zum Betreiben desselben und Bildverarbeitungssystem mit demselben |
KR20140047494A (ko) | 2012-10-12 | 2014-04-22 | 삼성전자주식회사 | 서브픽셀, 이를 포함하는 이미지 센서, 및 이미지 센싱 시스템 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6313455B1 (en) | 1999-08-16 | 2001-11-06 | Intel Corporation | CMOS pixel cell for image display systems |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5625210A (en) * | 1995-04-13 | 1997-04-29 | Eastman Kodak Company | Active pixel sensor integrated with a pinned photodiode |
US5892540A (en) * | 1996-06-13 | 1999-04-06 | Rockwell International Corporation | Low noise amplifier for passive pixel CMOS imager |
US6697111B1 (en) * | 1998-04-08 | 2004-02-24 | Ess Technology, Inc. | Compact low-noise active pixel sensor with progressive row reset |
JP2001036059A (ja) * | 1999-07-22 | 2001-02-09 | Minolta Co Ltd | 固体撮像装置 |
KR100448986B1 (ko) * | 2002-02-01 | 2004-09-18 | 주식회사 맥퀸트전자 | 단일 트랜지스터형 이미지 셀 |
US6744084B2 (en) * | 2002-08-29 | 2004-06-01 | Micro Technology, Inc. | Two-transistor pixel with buried reset channel and method of formation |
-
2005
- 2005-06-28 KR KR1020050056037A patent/KR100718879B1/ko active IP Right Grant
-
2006
- 2006-06-21 US US11/993,124 patent/US20100182467A1/en not_active Abandoned
- 2006-06-21 EP EP06768965A patent/EP1900030A1/en not_active Withdrawn
- 2006-06-21 CN CNA2006800235763A patent/CN101213670A/zh active Pending
- 2006-06-21 WO PCT/KR2006/002379 patent/WO2007001131A1/en active Application Filing
- 2006-06-21 JP JP2008519166A patent/JP2008544570A/ja not_active Withdrawn
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6313455B1 (en) | 1999-08-16 | 2001-11-06 | Intel Corporation | CMOS pixel cell for image display systems |
Also Published As
Publication number | Publication date |
---|---|
WO2007001131A1 (en) | 2007-01-04 |
JP2008544570A (ja) | 2008-12-04 |
CN101213670A (zh) | 2008-07-02 |
EP1900030A1 (en) | 2008-03-19 |
KR20070000579A (ko) | 2007-01-03 |
US20100182467A1 (en) | 2010-07-22 |
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