KR100612932B1 - 3차원 형상 측정장치 및 방법 - Google Patents

3차원 형상 측정장치 및 방법 Download PDF

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Publication number
KR100612932B1
KR100612932B1 KR1020050123409A KR20050123409A KR100612932B1 KR 100612932 B1 KR100612932 B1 KR 100612932B1 KR 1020050123409 A KR1020050123409 A KR 1020050123409A KR 20050123409 A KR20050123409 A KR 20050123409A KR 100612932 B1 KR100612932 B1 KR 100612932B1
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KR
South Korea
Prior art keywords
illumination
filter
control unit
imaging
unit
Prior art date
Application number
KR1020050123409A
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English (en)
Korean (ko)
Inventor
고광일
성은형
전문영
김민영
이승준
Original Assignee
주식회사 고영테크놀러지
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 주식회사 고영테크놀러지 filed Critical 주식회사 고영테크놀러지
Priority to KR1020050123409A priority Critical patent/KR100612932B1/ko
Application granted granted Critical
Publication of KR100612932B1 publication Critical patent/KR100612932B1/ko
Priority to US11/637,040 priority patent/US7830528B2/en
Priority to JP2006336691A priority patent/JP2007163498A/ja
Priority to CN2008101776052A priority patent/CN101514893B/zh
Priority to DE102006059132A priority patent/DE102006059132B4/de
Priority to CNB2006101678120A priority patent/CN100520286C/zh
Priority to JP2010007230A priority patent/JP2010078619A/ja
Priority to US12/878,866 priority patent/US8319977B2/en
Priority to JP2013178888A priority patent/JP5932734B2/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G06T7/586—Depth or shape recovery from multiple images from multiple light sources, e.g. photometric stereo

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020050123409A 2005-12-14 2005-12-14 3차원 형상 측정장치 및 방법 KR100612932B1 (ko)

Priority Applications (9)

Application Number Priority Date Filing Date Title
KR1020050123409A KR100612932B1 (ko) 2005-12-14 2005-12-14 3차원 형상 측정장치 및 방법
US11/637,040 US7830528B2 (en) 2005-12-14 2006-12-12 3D image measuring apparatus and method thereof
JP2006336691A JP2007163498A (ja) 2005-12-14 2006-12-14 ３次元形状測定装置及び方法
CN2008101776052A CN101514893B (zh) 2005-12-14 2006-12-14 三维形状测量装置及方法
DE102006059132A DE102006059132B4 (de) 2005-12-14 2006-12-14 Dreidimensionales Bildmessverfahren
CNB2006101678120A CN100520286C (zh) 2005-12-14 2006-12-14 三维形状测量装置及方法
JP2010007230A JP2010078619A (ja) 2005-12-14 2010-01-15 ３次元形状測定装置及び方法
US12/878,866 US8319977B2 (en) 2005-12-14 2010-09-09 3D image measuring apparatus and method thereof
JP2013178888A JP5932734B2 (ja) 2005-12-14 2013-08-30 ３次元形状測定装置及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050123409A KR100612932B1 (ko) 2005-12-14 2005-12-14 3차원 형상 측정장치 및 방법

Publications (1)

Publication Number Publication Date
KR100612932B1 true KR100612932B1 (ko) 2006-08-14

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050123409A KR100612932B1 (ko) 2005-12-14 2005-12-14 3차원 형상 측정장치 및 방법

Country Status (2)

Country Link
KR (1) KR100612932B1 (zh)
CN (2) CN100520286C (zh)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100903346B1 (ko) 2006-12-28 2009-06-22 (주) 인텍플러스 광학식 입체 형상 검사 방법
KR100943405B1 (ko) * 2007-07-23 2010-02-19 주식회사 나노시스템 래터럴 스캔을 이용한 3차원 형상 측정 시스템
KR100943407B1 (ko) * 2007-07-23 2010-02-19 주식회사 나노시스템 전사 방식의 3차원 형상 측정 시스템
KR101158892B1 (ko) 2009-05-15 2012-06-25 선문대학교 산학협력단 칼라필터를 적용한 임의형상 측정방법
KR20180043891A (ko) * 2016-10-20 2018-05-02 한국원자력연구원 표면 프로파일의 평탄도 측정장치

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010064593A1 (de) * 2009-05-21 2015-07-30 Koh Young Technology Inc. Formmessgerät und -verfahren
DE202010018585U1 (de) * 2009-05-27 2017-11-28 Koh Young Technology Inc. Vorrichtung zur Messung einer dreidimensionalen Form
KR101078781B1 (ko) * 2010-02-01 2011-11-01 주식회사 고영테크놀러지 3차원 형상 검사방법
CN103575234B (zh) * 2012-07-20 2016-08-24 德律科技股份有限公司 三维影像测量装置
KR101622628B1 (ko) * 2014-12-16 2016-05-20 주식회사 고영테크놀러지 부품이 실장된 기판 검사방법 및 검사장치
JP2017083234A (ja) * 2015-10-26 2017-05-18 オムロン株式会社 三次元形状計測装置、三次元形状計測システム、プログラム、コンピュータ読み取り可能な記録媒体、および三次元形状計測方法
CN106123807B (zh) * 2016-06-30 2018-09-07 苏州图锐智能科技有限公司 一种产品3d检测***及相应检测方法
TWI595445B (zh) * 2016-08-31 2017-08-11 致茂電子股份有限公司 抗雜訊之立體掃描系統
JP7212240B2 (ja) * 2018-06-11 2023-01-25 オムロン株式会社 計測システムおよび計測方法
JP7135495B2 (ja) * 2018-06-26 2022-09-13 セイコーエプソン株式会社 三次元計測装置、制御装置およびロボットシステム
WO2020263056A1 (ko) * 2019-06-28 2020-12-30 주식회사 고영테크놀러지 대상체의 3차원 형상을 결정하기 위한 장치 및 방법
CN115362469A (zh) * 2020-02-10 2022-11-18 康耐视公司 复合三维blob工具及其操作方法
CN115421349A (zh) * 2022-11-02 2022-12-02 四川川大智胜软件股份有限公司 非数字光机结构光投射模组、采集装置及三维测量***

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002048523A (ja) 2000-08-02 2002-02-15 Ckd Corp 三次元計測装置
KR20020039583A (ko) * 2000-11-22 2002-05-27 임쌍근 모아레무늬 발생기를 적용한 위상천이 영사식 모아레방법및 장치
JP2002162215A (ja) 2000-11-27 2002-06-07 Matsushita Electric Works Ltd ３次元形状計測方法およびそのシステム
KR20040071593A (ko) * 2003-02-06 2004-08-12 주식회사 고영테크놀러지 3차원형상 측정장치
KR20040071532A (ko) * 2003-02-06 2004-08-12 주식회사 고영테크놀러지 3차원형상 측정장치

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DE4007500A1 (de) * 1990-03-09 1991-09-12 Zeiss Carl Fa Verfahren und vorrichtung zur beruehrungslosen vermessung von objektoberflaechen
DE4027328B4 (de) * 1990-08-29 2004-07-22 Sirona Dental Systems Gmbh 3D-Kamera zur Erfassung von Oberflächenstrukturen, insbesondere für zahnmedizinische Zwecke
DE19919584A1 (de) * 1999-04-29 2000-11-02 Klaus Koerner Verfahren und Anordnung zur 3D-Aufnahme
JP4077754B2 (ja) * 2003-04-04 2008-04-23 オリンパス株式会社 ３次元形状測定装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002048523A (ja) 2000-08-02 2002-02-15 Ckd Corp 三次元計測装置
KR20020039583A (ko) * 2000-11-22 2002-05-27 임쌍근 모아레무늬 발생기를 적용한 위상천이 영사식 모아레방법및 장치
JP2002162215A (ja) 2000-11-27 2002-06-07 Matsushita Electric Works Ltd ３次元形状計測方法およびそのシステム
KR20040071593A (ko) * 2003-02-06 2004-08-12 주식회사 고영테크놀러지 3차원형상 측정장치
KR20040071532A (ko) * 2003-02-06 2004-08-12 주식회사 고영테크놀러지 3차원형상 측정장치

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100903346B1 (ko) 2006-12-28 2009-06-22 (주) 인텍플러스 광학식 입체 형상 검사 방법
KR100943405B1 (ko) * 2007-07-23 2010-02-19 주식회사 나노시스템 래터럴 스캔을 이용한 3차원 형상 측정 시스템
KR100943407B1 (ko) * 2007-07-23 2010-02-19 주식회사 나노시스템 전사 방식의 3차원 형상 측정 시스템
KR101158892B1 (ko) 2009-05-15 2012-06-25 선문대학교 산학협력단 칼라필터를 적용한 임의형상 측정방법
KR20180043891A (ko) * 2016-10-20 2018-05-02 한국원자력연구원 표면 프로파일의 평탄도 측정장치
KR101890330B1 (ko) 2016-10-20 2018-08-23 한국원자력연구원 표면 프로파일의 평탄도 측정장치

Also Published As

Publication number Publication date
CN101514893A (zh) 2009-08-26
CN1982841A (zh) 2007-06-20
CN100520286C (zh) 2009-07-29
CN101514893B (zh) 2012-08-08

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