KR0132929Y1 - Integrated element's pin comfirmation device - Google Patents

Integrated element's pin comfirmation device Download PDF

Info

Publication number
KR0132929Y1
KR0132929Y1 KR2019960000286U KR19960000286U KR0132929Y1 KR 0132929 Y1 KR0132929 Y1 KR 0132929Y1 KR 2019960000286 U KR2019960000286 U KR 2019960000286U KR 19960000286 U KR19960000286 U KR 19960000286U KR 0132929 Y1 KR0132929 Y1 KR 0132929Y1
Authority
KR
South Korea
Prior art keywords
pin
integrated device
integrated
reflector
state
Prior art date
Application number
KR2019960000286U
Other languages
Korean (ko)
Other versions
KR970050520U (en
Inventor
남상덕
김주환
박성열
Original Assignee
남영식
주식회사비스텍
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 남영식, 주식회사비스텍 filed Critical 남영식
Priority to KR2019960000286U priority Critical patent/KR0132929Y1/en
Publication of KR970050520U publication Critical patent/KR970050520U/en
Application granted granted Critical
Publication of KR0132929Y1 publication Critical patent/KR0132929Y1/en

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0812Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features

Landscapes

  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

본 고안은 집적소자의 주연부에 설치된 다수의 핀이 절곡 상태를 간단히 확인할 수 있도록 하는 것이다.The present invention allows a plurality of pins installed at the periphery of the integrated device to easily check the bending state.

본 고안은 본체(10)의 내측에, 반사경(23)이 경사지게 설치되는 반사경 조립체(20)를 설치하고, 반사경 조립체(20)의 내측에는 반투명체로 되어 광을 반투과시키는 지지부(30)를 설치하며, 지지부(30)의 중앙에는 집적소자(40)를 안착시킬 안착부(33)를 설치하여 지지부(30)의 안착부(33)에 집적소자(40)를 안착시킨 상태에서 반사경(23)이 상부로 반사시키는 집적소자(40)의 핀(41)을 CCD 카메라(50) 등으로 촬영하고 이를 모니터에 확대 표시하여 작업자가 모니터를 보고, 집적소자(40)의 핀(41)의 상태를 간단하고, 정확하게 확인할 수 있다.In the present invention, the reflector assembly 20 in which the reflector 23 is installed to be inclined is installed inside the main body 10, and the support part 30 that is semi-transparent is provided inside the reflector assembly 20 to semi-transmissive light. The reflector 23 is installed at the center of the support part 30 in a state in which a seating part 33 for mounting the integrated device 40 is installed, and the integrated device 40 is seated on the seating part 33 of the support part 30. The pin 41 of the integrated element 40 reflecting to the upper part is taken by the CCD camera 50 or the like, and the magnified display is displayed on the monitor, so that the operator sees the monitor and checks the state of the pin 41 of the integrated element 40. Simple and accurate.

Description

접속소자의 핀 확인장치Pin check device of connecting element

제1도는 본 고안의 핀 확인장치의 전체 구성을 보인 분해 사시도.1 is an exploded perspective view showing the overall configuration of the pin identification device of the present invention.

제2도는 본 고안의 핀 확인장치를 결합하여 보인 종단면도.Figure 2 is a longitudinal cross-sectional view showing a combination of the pin check device of the present invention.

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

10 : 본체 11,21,32 : 삽입구멍10: main body 11, 21, 32: insertion hole

22 : 경사면 23 : 반사경22: slope 23: reflector

20 : 반사경 조립체 30 : 지지부20 reflector assembly 30 support

31 : 돌출부 33 : 안착부31: protrusion 33: seating portion

40 : 집적소자 41 : 핀40: integrated device 41: pin

50 : 카메라50: camera

본 고안은 집적소자의 주연부에 설치된 다수의 핀의 절곡 상태를 간단히 확인할 수 있는 집적소자의 핀 확인장치에 관한 것이다.The present invention relates to an integrated device pin identification device that can easily check the bending state of a plurality of pins installed in the peripheral portion of the integrated device.

자동화 기술의 발전과 더불어 전자 산업계에서는 자동 삽입기 또는 자동 장착기 등의 기계를 사용하여 인쇄 회로 기판에 집적소자를 비롯한 각종 부품을 자동으로 장착하고, 생산성을 향상시키고 있다.With the development of automation technology, the electronic industry uses machines such as automatic inserters or automatic mounters to automatically mount various components including integrated devices on printed circuit boards and improve productivity.

인쇄 회로 기판에 자동으로 소정의 부품을 정착하기 위해서는 각각의 부품에 부착되어 있는 핀을 정확히 절곡시켜야 된다.In order to automatically fix a predetermined part on a printed circuit board, the pins attached to each part must be precisely bent.

특히 집적소자는 점차 고집적화되고, 고집적화에 따른 핀이 크기가 보다 세밀화됨은 물론 핀들이 간격이 매우 좁으므로 인쇄 회로 기판에 자동으로 장착할 경우에 집적소자의 핀이 잘못 부착되고, 이로 인하여 조립 완료된 인쇄 회로 기판의 불량 발생률이 매우 높게 된다.In particular, integrated devices are increasingly integrated, pins are more compact in size, and pins are very narrow, so that pins of integrated devices are incorrectly attached when automatically mounted on a printed circuit board. The defective occurrence rate of a circuit board becomes very high.

그러므로 집적소자를 생산할 경우에 먼저 집적소자의 외주연부에 구비되어 있는 다수의 핀이 정확하게 절곡되어 있는 지를 확인하고 있다.Therefore, when manufacturing an integrated device, it is first checked whether a plurality of pins provided at the outer periphery of the integrated device are bent correctly.

이를 위하여 종래에는 집적소자의 제조 공정중 포밍(forming) 공정에서 작업자가 일일이 집적소자를 손으로 잡고, 핀이 절곡상태를 눈으로 보면서 직접 확인하였다.To this end, in the prior art, during the forming process of an integrated device, an operator manually grasps the integrated device by hand and directly checks the state of the bent pin.

그러므로 작업자가 집적소자의 핀의 절곡 상태를 잘못 확인하는 경우가 많고, 이로 인하여 조립된 인쇄 회로 기판의 불량률이 매우 높았으며, 작업자가 쉽게 피로함은 물론 이로 인하여 제품의 생산성이 낮고, 생산 원가가 상승하게 되는 등의 여러 가지 문제점이 있었다.Therefore, the operator frequently checks the bending state of the pin of the integrated device, and thus, the defective rate of the assembled printed circuit board is very high, and the worker is easily fatigued and, as a result, the productivity of the product is low and the production cost is increased. There were various problems such as being done.

따라서 본 고안의 목적은 작업자가 간단하고, 정확하게 집적소자이 핀의 절곡 상태를 확인할 수 있도록 하는 집적소자의 핀 확인장치를 제공하는 데 있다.Accordingly, an object of the present invention is to provide a pin identification device for an integrated device, which enables the operator to simply and accurately check the bending state of the integrated device.

이러한 목적을 달성하기 위한 본 고안의 집적소자이 핀 확인장치는 본체의 내측에, 반사경이 경사지게 설치되는 반사경 조립체를 설치하고, 반사경 조립체의 내측에는 반투명체로 되어 광을 반투과시키는 지지부를 설치하며, 지지비의 중앙에는 집적소자를 안착시킬 안착부를 설치하여 지지뷔이 안착부에 집적소자를 안착시킨 상태에서 반사경이 비취는 집적소자이 핀을 CCD(Charge Coupled Device) 카메라 등으로 촬영하고 이를 모니터에 확대 표시하여 작업자가 모니터를 보고, 집적소자의 핀의 상태를 간단하고, 정확하게 확인할 수 있도록 하는 것을 특징으로 한다.The integrated device pin check device of the present invention for achieving this purpose is installed on the inside of the main body, the reflector assembly in which the reflector is inclined inclined, and inside the reflector assembly is provided with a support for semi-transparent light to transmit, In the center of the rain, a mounting part for mounting the integrated device is installed, and the integrated device that reflects the light while the integrated device is seated in the support buoy seating part captures the pin with a CCD (Charge Coupled Device) camera and displays it on the monitor. The operator can look at the monitor and check the status of the pins of the integrated device simply and accurately.

이하, 첨부된 도면을 참조하여 본 고안이 집적소자의 핀 확인장치를 상세히 설명한다.Hereinafter, with reference to the accompanying drawings will be described in detail the pin identification device of the present invention integrated device.

제1도는 본 고안의 핀 확인장치의 전체 구성을 보인 분해 사시도이고, 제2도는 본 고안의 핀 확인장치를 결합하여 보인 종단면도이다. 여기서, 부호 10은 본체이고, 부호 20은 상기 본체(10)의 중앙에 설치되어 집적소자(40)의 핀(41)을 작업자가 확인할 수 있도록 하는 반사경 조립체이며, 부호 30은 핀(41)의 상태를 확인할 집적소자(40)를 안착시키는 지지부이다.1 is an exploded perspective view showing the overall configuration of the pin check device of the present invention, Figure 2 is a longitudinal cross-sectional view showing a combination of the pin check device of the present invention. Here, reference numeral 10 denotes a main body, reference numeral 20 denotes a reflector assembly installed at the center of the main body 10 so that an operator can check the pin 41 of the integrated element 40, and reference numeral 30 denotes a pin 41 of the pin 41. It is a support for mounting the integrated device 40 to check the state.

본체(10)는 대략 정사각형을 이루고, 중앙에는 장방형의 삽입 구멍(11)이 형성된다.The main body 10 has a substantially square shape, and a rectangular insertion hole 11 is formed in the center thereof.

반사경 조립체(20)는, 외주연이 상기 본체(10)이 삽입 구멍(11)에 끼워지고, 중앙에는 장방형의 삽입 구멍(21)이 형성되며, 삽입 구멍(21)의 상단이 네 모서리부에는 경사면(22)이 형성됨과 아울러 경사면(22)에 반사경(23)이 부착된다.The reflector assembly 20, the outer periphery of the main body 10 is inserted into the insertion hole 11, a rectangular insertion hole 21 is formed in the center, the upper end of the insertion hole 21 is formed at four corners The inclined surface 22 is formed and the reflector 23 is attached to the inclined surface 22.

지지부(30)는, 반투명체이 아크릴 등으로 되어 광원이 반투과되고, 상면에는 돌출부(31)가 형성되어 상기 반사겨 조립체(20)이 삽입 구멍(21)에 끼워짐과 아울러 돌출부(31)의 중앙에 삽입 구멍(32)이 형성되며, 삽입 구멍(32)에는 집적소자(40)를 안착시키는 안착부(33)가 끼워지게 하였다.As for the support part 30, the translucent body becomes acryl etc., the light source is transflected, the protrusion part 31 is formed in the upper surface, and the said reflector assembly 20 is fitted into the insertion hole 21, and the center of the protrusion part 31 is carried out. An insertion hole 32 is formed in the insertion hole 32, and a seating portion 33 for mounting the integrated device 40 is fitted into the insertion hole 32.

이와 같이 구성된 본 고안이 집적소자이 핀 확인장치는 본체(10), 반사경 조립체(20) 및 지지부(30)를 순차적으로 조립한 후 별도의 고정 나사(도면에 도시되지 않았음) 등으로 고정시켜 분리되지 않도록 한다.The present invention configured as described above, the pin check device is integrated by separating the main body 10, the reflector assembly 20 and the support 30 in sequence and then fixed by a separate fixing screw (not shown), etc. Do not

이와 같이 핀 확인장치가 조립된 상태에서 집적소자(40)의 핀(41)의 상태를 확인할 경우에 조립된 본체(10), 반사경 조립체(20) 및 지지부(30)를 광원이 상부에 안착시킨 후 지지부(30)의 안착부(33)의 상부에 집적소자(40)를 안착시키고, 카메라(50)가 반사경(23)을 촬영하게 한다.As such, when the state of the pin 41 of the integrated device 40 is checked in the state where the pin checking device is assembled, the light source is mounted on the assembled main body 10, the reflector assembly 20, and the support part 30. Then, the integrated device 40 is seated on an upper portion of the seating part 33 of the support part 30, and the camera 50 is photographed by the reflector 23.

그러면, 광원이 반투명체이 아크릴 등으로 된 지지부(30)를 반투과하여 집적소자(40)의 핀(41) 부위를 조명하게 된다.Then, the light source semi-transparent the support 30 made of a translucent body acrylic or the like to illuminate the pin 41 portion of the integrated device 40.

그리고 카메라(50)는 광원이 조명하는 집적소자(40)의 핀(41) 부위를 촬영하고, 촬영한 영상은 컴퓨터 시스템이나 영상 처리부 등을 통해 모니터(도면에 도시되지 않았음)에 확대하여 표시하게 된다,Then, the camera 50 photographs the pin 41 portion of the integrated device 40 illuminated by the light source, and the captured image is enlarged and displayed on a monitor (not shown) through a computer system or an image processing unit. Done,

그러므로 작업자는 모니터를 보면서 집적소자(40)의 핀(41)의 상태를 확인하여 불량품을 검출하고, 확인이 완료되면, 안착부(33)에서 집적소자(40)를 제거하고, 다른 집적소자(40)를 안착시키면서 하나씩 확인하면 된다.Therefore, the operator checks the state of the pin 41 of the integrated device 40 while looking at the monitor and detects a defective product. When the checking is completed, the worker removes the integrated device 40 from the seating part 33, and the other integrated device ( You can check them one by one while seating 40).

여기서, 본 고안은 카메라(50)가 집적소자(40)의 핀(41)을 정확하게 촬영할 수 있는 각도로 반사경(23)을 설치 예를 들면, 45°로 설치하는 것이 바람직하다.Here, in the present invention, it is preferable that the reflector 23 is installed at, for example, 45 ° at an angle at which the camera 50 can accurately photograph the pin 41 of the integrated device 40.

이상에서와 같이 본 고안은 집적소자의 외주연부에 부착되어 있는 다수의 핀을 반사경을 통해 카메라로 촬영하고, 이를 모니터의 화면상에 확대 표시하여 확인하는 것으로서 핀의 상태를 간단하고, 정확하게 판별하고, 이로 인하여 생상된 제품의 불량률을 최소로 할 수 있을 뿐만 아니라 제품의 생산성이 향상되는 등의 효과가 있다.As described above, the present invention captures a large number of pins attached to the outer periphery of the integrated device with a camera through a reflector, and displays them on the screen of the monitor to confirm them. As a result, the defective rate of the produced product can be minimized, and the productivity of the product can be improved.

Claims (1)

광원의 상부에 설치되는 본체(10)와, 중앙에 안착부(33)가 설치되어 핀(41)이 상태를 확인할 집적소자(40)가 안착되고 상기 광원을 반투과시키게 빈투명체로 된 지지부(30)와, 상기 본체(10)의 중앙에 설치하고 상기 지지부(30)의 안착부(33)에 안착된 집적소자(40)의 핀(41)을 반사경(23)을 통해 상부로 반사시키는 반사경 조립체(20)와, 상기 반사경(23)을 통해 반사되는 집적소자(40)의 핀(41)을 촬영하여 모니터의 화면상에 표시하는 카메라(50)로 구성됨을 특징으로 하는 집적소자의 핀 확인장치.The main body 10 is installed on the upper part of the light source, and the seating portion 33 is installed in the center of the integrated element 40 to check the state of the pin 41 is seated and the support portion made of a hollow transparent body to transflect the light source ( 30 and a reflecting mirror installed at the center of the main body 10 and reflecting the pin 41 of the integrated device 40 mounted on the seating portion 33 of the support part 30 upwardly through the reflecting mirror 23. Pin assembly of the integrated device, characterized in that composed of a camera (50) for photographing the pin 41 of the integrated device 40 reflected through the reflector 23 and displayed on the screen of the monitor Device.
KR2019960000286U 1996-01-11 1996-01-11 Integrated element's pin comfirmation device KR0132929Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019960000286U KR0132929Y1 (en) 1996-01-11 1996-01-11 Integrated element's pin comfirmation device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019960000286U KR0132929Y1 (en) 1996-01-11 1996-01-11 Integrated element's pin comfirmation device

Publications (2)

Publication Number Publication Date
KR970050520U KR970050520U (en) 1997-08-12
KR0132929Y1 true KR0132929Y1 (en) 1999-04-15

Family

ID=19449176

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019960000286U KR0132929Y1 (en) 1996-01-11 1996-01-11 Integrated element's pin comfirmation device

Country Status (1)

Country Link
KR (1) KR0132929Y1 (en)

Also Published As

Publication number Publication date
KR970050520U (en) 1997-08-12

Similar Documents

Publication Publication Date Title
EP0649030B1 (en) Connecting element inspecting method and connecting element inspecting device
US4867569A (en) Apparatus for detecting a position of an electronic part
US4677531A (en) Inspection illumination device
JPH0310041B2 (en)
KR0132929Y1 (en) Integrated element's pin comfirmation device
KR100353905B1 (en) Lighting system used in apparatus for inspecting surface mounted chip
US20100208370A1 (en) Camera lens assembly
JP2009110862A (en) External connection connector holder of electronic device
JP2801060B2 (en) Inspection device for connection of electrical conductor to connector and automatic connection device equipped with the connection inspection device
AU1574595A (en) Device for imaging a three-dimensional object
KR101475683B1 (en) Digital photographing apparatus
US5432456A (en) Connector installation GO/NO-GO test fixture
JPS58135941A (en) Inspecting device for mounting of chip parts
GB2208759A (en) A pin register device
JP2775411B2 (en) Lighting equipment for printed wiring board inspection equipment
JP2012038692A (en) Connector defect inspection device
KR20040062558A (en) Automatic filter changer for use on surface mounter inspection camera
KR20030018265A (en) Inspecting equipment of liquid crystal display panel
KR920005935B1 (en) Lighting method for electronics parts assembly state testing
CN220273773U (en) Image pickup apparatus
CN109323745B (en) Electronic scale display structure and projection electronic scale with drawer type receiving panel
KR19990046434A (en) Condenser inspector
CN208353462U (en) Sighting device
JPS62220921A (en) Optical system fitting structure for image processor
KR20000025332A (en) Apparatus for checking ball of semiconductor ball grid array material

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20030930

Year of fee payment: 6

LAPS Lapse due to unpaid annual fee