JPWO2023127315A1 - - Google Patents
Info
- Publication number
- JPWO2023127315A1 JPWO2023127315A1 JP2023570715A JP2023570715A JPWO2023127315A1 JP WO2023127315 A1 JPWO2023127315 A1 JP WO2023127315A1 JP 2023570715 A JP2023570715 A JP 2023570715A JP 2023570715 A JP2023570715 A JP 2023570715A JP WO2023127315 A1 JPWO2023127315 A1 JP WO2023127315A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
- B65G47/74—Feeding, transfer, or discharging devices of particular kinds or types
- B65G47/80—Turntables carrying articles or materials to be transferred, e.g. combined with ploughs or scrapers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Mechanical Engineering (AREA)
- Engineering & Computer Science (AREA)
- Feeding Of Articles To Conveyors (AREA)
- Specific Conveyance Elements (AREA)
- Sorting Of Articles (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021211964 | 2021-12-27 | ||
PCT/JP2022/041501 WO2023127315A1 (en) | 2021-12-27 | 2022-11-08 | Component sorting device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2023127315A1 true JPWO2023127315A1 (en) | 2023-07-06 |
Family
ID=86998714
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023570715A Pending JPWO2023127315A1 (en) | 2021-12-27 | 2022-11-08 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2023127315A1 (en) |
CN (1) | CN118103697A (en) |
WO (1) | WO2023127315A1 (en) |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5598912B2 (en) * | 2009-11-27 | 2014-10-01 | 株式会社 東京ウエルズ | Work appearance inspection apparatus and work appearance inspection method |
JP6009167B2 (en) * | 2012-01-17 | 2016-10-19 | 株式会社 東京ウエルズ | Work appearance inspection apparatus and work appearance inspection method |
CN102590224A (en) * | 2012-01-18 | 2012-07-18 | 肇庆市宏华电子科技有限公司 | Chip type electronic element appearance inspection machine |
JP5868801B2 (en) * | 2012-07-19 | 2016-02-24 | 株式会社 東京ウエルズ | Appearance inspection apparatus and appearance inspection method |
JP6075663B1 (en) * | 2015-12-11 | 2017-02-08 | 上野精機株式会社 | Relay device, transport device and inspection device |
JP6648681B2 (en) * | 2016-12-16 | 2020-02-14 | 株式会社村田製作所 | Chip parts transfer device |
JP2019060756A (en) * | 2017-09-27 | 2019-04-18 | 株式会社ランプハウス | Image inspection control system for inspected object |
JP7159942B2 (en) * | 2019-03-28 | 2022-10-25 | 株式会社村田製作所 | Appearance inspection device |
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2022
- 2022-11-08 WO PCT/JP2022/041501 patent/WO2023127315A1/en active Application Filing
- 2022-11-08 JP JP2023570715A patent/JPWO2023127315A1/ja active Pending
- 2022-11-08 CN CN202280069514.5A patent/CN118103697A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2023127315A1 (en) | 2023-07-06 |
TW202340065A (en) | 2023-10-16 |
CN118103697A (en) | 2024-05-28 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20240307 |