JPWO2022201242A1 - - Google Patents
Info
- Publication number
- JPWO2022201242A1 JPWO2022201242A1 JP2023508163A JP2023508163A JPWO2022201242A1 JP WO2022201242 A1 JPWO2022201242 A1 JP WO2022201242A1 JP 2023508163 A JP2023508163 A JP 2023508163A JP 2023508163 A JP2023508163 A JP 2023508163A JP WO2022201242 A1 JPWO2022201242 A1 JP WO2022201242A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32541—Shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32568—Relative arrangement or disposition of electrodes; moving means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
- H01J37/32724—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2021/011702 WO2022201242A1 (ja) | 2021-03-22 | 2021-03-22 | 電極、基板処理装置、半導体装置の製造方法およびプログラム |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2022201242A1 true JPWO2022201242A1 (ja) | 2022-09-29 |
Family
ID=83395312
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023508163A Pending JPWO2022201242A1 (ja) | 2021-03-22 | 2021-03-22 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20240006164A1 (ja) |
JP (1) | JPWO2022201242A1 (ja) |
KR (1) | KR20230160257A (ja) |
CN (1) | CN116982411A (ja) |
TW (1) | TW202238723A (ja) |
WO (1) | WO2022201242A1 (ja) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003068659A (ja) * | 2001-08-29 | 2003-03-07 | Sharp Corp | プラズマ処理装置及びプラズマ処理方法、それらを用いて作製した薄膜、基板、半導体装置 |
JP2004143525A (ja) * | 2002-10-24 | 2004-05-20 | Konica Minolta Holdings Inc | 薄膜形成方法、薄膜、透明導電膜及び大気圧プラズマ処理装置 |
JP2006202661A (ja) * | 2005-01-24 | 2006-08-03 | Sekisui Chem Co Ltd | プラズマ処理装置 |
JP4794360B2 (ja) | 2006-06-02 | 2011-10-19 | 株式会社日立国際電気 | 基板処理装置 |
JP2013089285A (ja) * | 2011-10-13 | 2013-05-13 | Hitachi Ltd | プラズマ処理装置およびプラズマ処理方法 |
JP7159694B2 (ja) * | 2018-08-28 | 2022-10-25 | 日本電産株式会社 | プラズマ処理装置 |
JP6966402B2 (ja) * | 2018-09-11 | 2021-11-17 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法および基板処理装置の電極 |
-
2021
- 2021-03-22 KR KR1020237031481A patent/KR20230160257A/ko active Search and Examination
- 2021-03-22 WO PCT/JP2021/011702 patent/WO2022201242A1/ja active Application Filing
- 2021-03-22 CN CN202180094758.4A patent/CN116982411A/zh active Pending
- 2021-03-22 JP JP2023508163A patent/JPWO2022201242A1/ja active Pending
-
2022
- 2022-01-24 TW TW111102821A patent/TW202238723A/zh unknown
-
2023
- 2023-09-18 US US18/468,825 patent/US20240006164A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US20240006164A1 (en) | 2024-01-04 |
CN116982411A (zh) | 2023-10-31 |
TW202238723A (zh) | 2022-10-01 |
WO2022201242A1 (ja) | 2022-09-29 |
KR20230160257A (ko) | 2023-11-23 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230605 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240416 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20240613 |