JPWO2021026110A5 - - Google Patents

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Publication number
JPWO2021026110A5
JPWO2021026110A5 JP2022507321A JP2022507321A JPWO2021026110A5 JP WO2021026110 A5 JPWO2021026110 A5 JP WO2021026110A5 JP 2022507321 A JP2022507321 A JP 2022507321A JP 2022507321 A JP2022507321 A JP 2022507321A JP WO2021026110 A5 JPWO2021026110 A5 JP WO2021026110A5
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JP
Japan
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Pending
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JP2022507321A
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English (en)
Japanese (ja)
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JP2022544102A (ja
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Application filed filed Critical
Priority claimed from PCT/US2020/044816 external-priority patent/WO2021026110A1/en
Priority to JP2022064247A priority Critical patent/JP2022163709A/ja
Publication of JP2022544102A publication Critical patent/JP2022544102A/ja
Publication of JPWO2021026110A5 publication Critical patent/JPWO2021026110A5/ja
Pending legal-status Critical Current

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JP2022507321A 2019-08-05 2020-08-04 基板処理システム用の静電容量の変動が低減された可動エッジリング Pending JP2022544102A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022064247A JP2022163709A (ja) 2019-08-05 2022-04-08 基板処理システム用の静電容量の変動が低減された可動エッジリング

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201962882890P 2019-08-05 2019-08-05
US62/882,890 2019-08-05
US202062976088P 2020-02-13 2020-02-13
US62/976,088 2020-02-13
PCT/US2020/044816 WO2021026110A1 (en) 2019-08-05 2020-08-04 Moveable edge rings with reduced capacitance variation for substrate processing systems

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2022064247A Division JP2022163709A (ja) 2019-08-05 2022-04-08 基板処理システム用の静電容量の変動が低減された可動エッジリング

Publications (2)

Publication Number Publication Date
JP2022544102A JP2022544102A (ja) 2022-10-17
JPWO2021026110A5 true JPWO2021026110A5 (zh) 2022-10-25

Family

ID=74094202

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2022507321A Pending JP2022544102A (ja) 2019-08-05 2020-08-04 基板処理システム用の静電容量の変動が低減された可動エッジリング
JP2022064247A Pending JP2022163709A (ja) 2019-08-05 2022-04-08 基板処理システム用の静電容量の変動が低減された可動エッジリング

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2022064247A Pending JP2022163709A (ja) 2019-08-05 2022-04-08 基板処理システム用の静電容量の変動が低減された可動エッジリング

Country Status (7)

Country Link
US (2) US20220254612A1 (zh)
EP (2) EP4010918A4 (zh)
JP (2) JP2022544102A (zh)
KR (5) KR102646633B1 (zh)
CN (3) CN212874424U (zh)
TW (2) TWM602283U (zh)
WO (1) WO2021026110A1 (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10658222B2 (en) 2015-01-16 2020-05-19 Lam Research Corporation Moveable edge coupling ring for edge process control during semiconductor wafer processing
US11935728B2 (en) * 2020-01-31 2024-03-19 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus and method of manufacturing a semiconductor device
KR20220100339A (ko) * 2021-01-08 2022-07-15 삼성전자주식회사 플라즈마 처리 장치 및 이를 이용한 반도체 소자 제조방법
CN113097038B (zh) * 2021-02-25 2022-07-15 长江存储科技有限责任公司 刻蚀装置
WO2023078628A1 (en) * 2021-11-02 2023-05-11 Asml Netherlands B.V. Wafer edge inspection of charged particle inspection system
US20230197495A1 (en) * 2021-12-16 2023-06-22 Applied Materials, Inc. Substrate support gap pumping to prevent glow discharge and light-up
JP2023130163A (ja) * 2022-03-07 2023-09-20 キオクシア株式会社 クリーニング方法、半導体装置の製造方法、プラズマ処理装置、及び外周リングセット

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US5942039A (en) * 1997-05-01 1999-08-24 Applied Materials, Inc. Self-cleaning focus ring
US7311784B2 (en) * 2002-11-26 2007-12-25 Tokyo Electron Limited Plasma processing device
US7718559B2 (en) * 2007-04-20 2010-05-18 Applied Materials, Inc. Erosion resistance enhanced quartz used in plasma etch chamber
US8409355B2 (en) * 2008-04-24 2013-04-02 Applied Materials, Inc. Low profile process kit
US8287650B2 (en) * 2008-09-10 2012-10-16 Applied Materials, Inc. Low sloped edge ring for plasma processing chamber
US8979087B2 (en) * 2011-07-29 2015-03-17 Applied Materials, Inc. Substrate supporting edge ring with coating for improved soak performance
CN104862660B (zh) * 2014-02-24 2017-10-13 北京北方华创微电子装备有限公司 承载装置及等离子体加工设备
US10658222B2 (en) * 2015-01-16 2020-05-19 Lam Research Corporation Moveable edge coupling ring for edge process control during semiconductor wafer processing
CN108369922B (zh) * 2016-01-26 2023-03-21 应用材料公司 晶片边缘环升降解决方案
US10704147B2 (en) * 2016-12-03 2020-07-07 Applied Materials, Inc. Process kit design for in-chamber heater and wafer rotating mechanism
JP6812224B2 (ja) * 2016-12-08 2021-01-13 東京エレクトロン株式会社 基板処理装置及び載置台
US10553404B2 (en) * 2017-02-01 2020-02-04 Applied Materials, Inc. Adjustable extended electrode for edge uniformity control
US11404249B2 (en) * 2017-03-22 2022-08-02 Tokyo Electron Limited Substrate processing apparatus
KR101927936B1 (ko) * 2017-06-09 2018-12-11 세메스 주식회사 기판 처리 장치
EP3580777B1 (en) * 2017-07-24 2021-04-14 LAM Research Corporation Moveable edge ring designs
KR102143290B1 (ko) * 2017-11-21 2020-08-11 램 리써치 코포레이션 하단 링 및 중간 에지 링
KR102134391B1 (ko) * 2018-10-18 2020-07-15 세메스 주식회사 기판 처리 장치
US20200234928A1 (en) * 2019-01-17 2020-07-23 Applied Materials, Inc. Semiconductor plasma processing equipment with wafer edge plasma sheath tuning ability

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