JPS6480885A - Lsi testing circuit - Google Patents
Lsi testing circuitInfo
- Publication number
- JPS6480885A JPS6480885A JP62240036A JP24003687A JPS6480885A JP S6480885 A JPS6480885 A JP S6480885A JP 62240036 A JP62240036 A JP 62240036A JP 24003687 A JP24003687 A JP 24003687A JP S6480885 A JPS6480885 A JP S6480885A
- Authority
- JP
- Japan
- Prior art keywords
- test
- basic clock
- combination circuit
- operates
- testing circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To compose a shift register of all FFs at the time of a test and to conduct the test by providing an FF for observation in front of an FF which operates asynchronously with basic clock pulses. CONSTITUTION:The output of the combination circuit 107 of the LSI consisting of the combination circuit 100, the FF 106 which operates in synchronism with the basic clock, the combination circuit 107 which generates a clock asynchronous with the basic clock, and an FF 108 which operates according to it is connected to the FF 109 for observation. The when the test is conducted, the output terminal of the precedent FF 106 is connected to this FF 109, whose output is connected to the FF 108. Consequently, the scan path incorporation circuit wherein the FFs 106, 109, and 108 form one shift register is constituted at the time of the test and all circuits are tested simultaneously.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62240036A JPS6480885A (en) | 1987-09-24 | 1987-09-24 | Lsi testing circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62240036A JPS6480885A (en) | 1987-09-24 | 1987-09-24 | Lsi testing circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6480885A true JPS6480885A (en) | 1989-03-27 |
Family
ID=17053514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62240036A Pending JPS6480885A (en) | 1987-09-24 | 1987-09-24 | Lsi testing circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6480885A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7082559B2 (en) | 2001-03-07 | 2006-07-25 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit device and test method thereof |
-
1987
- 1987-09-24 JP JP62240036A patent/JPS6480885A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7082559B2 (en) | 2001-03-07 | 2006-07-25 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit device and test method thereof |
US7139956B2 (en) | 2001-03-07 | 2006-11-21 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit device and test method thereof |
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