JPS55134367A - Device for testing digital ic - Google Patents
Device for testing digital icInfo
- Publication number
- JPS55134367A JPS55134367A JP4178579A JP4178579A JPS55134367A JP S55134367 A JPS55134367 A JP S55134367A JP 4178579 A JP4178579 A JP 4178579A JP 4178579 A JP4178579 A JP 4178579A JP S55134367 A JPS55134367 A JP S55134367A
- Authority
- JP
- Japan
- Prior art keywords
- timing
- signal
- trailing edge
- polyphase
- standard
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To simplify the test operation of a digital IC and reduce the number of patterns in the IC by synchronizing the varying point of an expected pattern with either of standard or clock signals.
CONSTITUTION: A timing selector circuit 14 receives a standard signal T0 from a timing generator 3 and a polyphase timing signal including a polyphase clock signal from an IC to be tested to select the leading or trailing edge of the timing signal at each of pins, and produces it to a latch circuit 12. Thus, the selector circuit selects the standard signal T0 and the leading or trailing edge of the respective polyphase timing signals as a timing signal for latching the data from a memory 10. When the trailing edge of the timing signal used for a clock signal 16 is employed, for example, as the varying point of an expected pattern 20, the output 17 of the IC to be tested is synchronized with the trailing edge of the clock signal 16 and outputted with a delay Td2.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4178579A JPS55134367A (en) | 1979-04-06 | 1979-04-06 | Device for testing digital ic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4178579A JPS55134367A (en) | 1979-04-06 | 1979-04-06 | Device for testing digital ic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55134367A true JPS55134367A (en) | 1980-10-20 |
Family
ID=12617998
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4178579A Pending JPS55134367A (en) | 1979-04-06 | 1979-04-06 | Device for testing digital ic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55134367A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57114867A (en) * | 1981-01-08 | 1982-07-16 | Nec Corp | Tester for logic circuit |
-
1979
- 1979-04-06 JP JP4178579A patent/JPS55134367A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57114867A (en) * | 1981-01-08 | 1982-07-16 | Nec Corp | Tester for logic circuit |
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