JPS6413770A - Mos type transistor - Google Patents

Mos type transistor

Info

Publication number
JPS6413770A
JPS6413770A JP17036787A JP17036787A JPS6413770A JP S6413770 A JPS6413770 A JP S6413770A JP 17036787 A JP17036787 A JP 17036787A JP 17036787 A JP17036787 A JP 17036787A JP S6413770 A JPS6413770 A JP S6413770A
Authority
JP
Japan
Prior art keywords
semiconductor layer
semiconductor
type transistor
oxide film
mos type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17036787A
Other languages
Japanese (ja)
Inventor
Koji Mori
Hirobumi Watanabe
Shuya Abe
Reiko Nabeshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Research Institute of General Electronics Co Ltd
Ricoh Co Ltd
Original Assignee
Ricoh Research Institute of General Electronics Co Ltd
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Research Institute of General Electronics Co Ltd, Ricoh Co Ltd filed Critical Ricoh Research Institute of General Electronics Co Ltd
Priority to JP17036787A priority Critical patent/JPS6413770A/en
Publication of JPS6413770A publication Critical patent/JPS6413770A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a MOS type transistor having excellent switching characteris tics by giving high mobility by forming a second semiconductor layer having a band gap equal to or wider than that of a first semiconductor layer on the interface between the first semiconductor layer and a thermal oxide film. CONSTITUTION:A second semiconductor layer 12 different from a semiconductor substrate is shaped between the semiconductor substrate and a gate oxide film in a MOS type transistor, and a gate oxide film 13 and a gate electrode 14 are formed onto the semiconductor layer 12 in succession. A material having a band gap equal to or larger than that of a first semiconductor layer 11 is used by reason of the increase of the lifetime of inversion layer carrier as the semiconductor layer 12. SiC (a P type), SiN (an N type, where it means a semiconductor such as SiN:H, not an insulator such as Si3N4), etc., can be employed as a concrete material. It is preferable that the film thickness of the semiconductor layer 12 is kept within the range of 100-5000Angstrom in order to ensure an effective electric field for shaping an inversion layer.
JP17036787A 1987-07-07 1987-07-07 Mos type transistor Pending JPS6413770A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17036787A JPS6413770A (en) 1987-07-07 1987-07-07 Mos type transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17036787A JPS6413770A (en) 1987-07-07 1987-07-07 Mos type transistor

Publications (1)

Publication Number Publication Date
JPS6413770A true JPS6413770A (en) 1989-01-18

Family

ID=15903621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17036787A Pending JPS6413770A (en) 1987-07-07 1987-07-07 Mos type transistor

Country Status (1)

Country Link
JP (1) JPS6413770A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5597153A (en) * 1993-02-22 1997-01-28 Canon Kabushiki Kaisha Automatic original feed apparatus
US9581518B2 (en) 2014-03-26 2017-02-28 Nagano Keiki Co., Ltd. Physical quantity measuring device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5597153A (en) * 1993-02-22 1997-01-28 Canon Kabushiki Kaisha Automatic original feed apparatus
US9581518B2 (en) 2014-03-26 2017-02-28 Nagano Keiki Co., Ltd. Physical quantity measuring device

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