JPS6412724A - Digital/analog converter - Google Patents

Digital/analog converter

Info

Publication number
JPS6412724A
JPS6412724A JP17003887A JP17003887A JPS6412724A JP S6412724 A JPS6412724 A JP S6412724A JP 17003887 A JP17003887 A JP 17003887A JP 17003887 A JP17003887 A JP 17003887A JP S6412724 A JPS6412724 A JP S6412724A
Authority
JP
Japan
Prior art keywords
resistor
supplying source
flows
bias supplying
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17003887A
Other languages
Japanese (ja)
Other versions
JPH056375B2 (en
Inventor
Naoya Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP17003887A priority Critical patent/JPS6412724A/en
Publication of JPS6412724A publication Critical patent/JPS6412724A/en
Publication of JPH056375B2 publication Critical patent/JPH056375B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analogue/Digital Conversion (AREA)

Abstract

PURPOSE:To perform the test of an operation by only one pin for measurement, by separating the bias supplying source of a resistor connected to the output terminal of a ladder-type D/A converter whose resistance value is R-2R, and detecting the change of a current that flows on the resistor. CONSTITUTION:A second bias supplying source 2 is constituted of an amplifier 7, a transistor Q1, and a constant current source 9, and the amplifier 7 and the transistor Q1 constitute a voltage follower circuit. A first bias supplying source 1 is formed also in the same constitution as that of the second bias supplying source 2. On the resistor R7 with the resistance value 2R connected to the output terminal V00, the current corresponding to an output voltage V0 flows. Therefore, the operating test of the D/A converter 3 is performed by changing input signal patterns (D0, D1, D2, D3) from (0, 0, 0, 0) to (1, 1, 1, 1) in order and measuring the change of the current that flows on the resistor R7 at that time by an ammeter 6.
JP17003887A 1987-07-07 1987-07-07 Digital/analog converter Granted JPS6412724A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17003887A JPS6412724A (en) 1987-07-07 1987-07-07 Digital/analog converter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17003887A JPS6412724A (en) 1987-07-07 1987-07-07 Digital/analog converter

Publications (2)

Publication Number Publication Date
JPS6412724A true JPS6412724A (en) 1989-01-17
JPH056375B2 JPH056375B2 (en) 1993-01-26

Family

ID=15897458

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17003887A Granted JPS6412724A (en) 1987-07-07 1987-07-07 Digital/analog converter

Country Status (1)

Country Link
JP (1) JPS6412724A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0939493A2 (en) * 1998-02-26 1999-09-01 Nec Corporation Digital-to-analog converter accurately testable without complicated circuit configuration and testing method for the same
KR100335033B1 (en) * 1997-10-09 2002-09-27 가부시끼가이샤 도시바 Semiconductor integrated circuit and semiconductor memory

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100335033B1 (en) * 1997-10-09 2002-09-27 가부시끼가이샤 도시바 Semiconductor integrated circuit and semiconductor memory
EP0939493A2 (en) * 1998-02-26 1999-09-01 Nec Corporation Digital-to-analog converter accurately testable without complicated circuit configuration and testing method for the same
EP0939493A3 (en) * 1998-02-26 2002-11-13 Nec Corporation Digital-to-analog converter accurately testable without complicated circuit configuration and testing method for the same

Also Published As

Publication number Publication date
JPH056375B2 (en) 1993-01-26

Similar Documents

Publication Publication Date Title
EP0939493A3 (en) Digital-to-analog converter accurately testable without complicated circuit configuration and testing method for the same
GB1600853A (en) Analogue to digital converters
JPS6412724A (en) Digital/analog converter
US4374362A (en) Instrument zeroing circuit
GB944385A (en) Improvements in and relating to apparatus and methods for testing transistors
JPS6442924A (en) Digital/analog converter
DE3571698D1 (en) Control circuit for detecting the passage of given level limits
US4968890A (en) Charged particle beam-dosimeter
DE3462951D1 (en) Measuring device to detect a temperature difference
GB939686A (en) Improvements in or relating to gas chromatograph apparatus
SU1084709A1 (en) Device for measuring transistor dissipation parameters
ATE18099T1 (en) MONITORING DEVICE FOR A MEASUREMENT AMPLIFIER LINE.
SU437978A1 (en) Ohmmeter
JPS57207870A (en) Resistance measuring method
JPS575406A (en) Current limiting circuit
SU427291A1 (en) THE CONVERTER OF THE PARALLEL 1 OF THE COMPLEX COMPLEX RESISTANCE OF THE STAR-SHAPED ELECTRIC CHAINS OF THE AVAILABLE MEDIUM POINT ELECTRIC SIGNALS
JPS5635030A (en) Temperature measuring apparatus
JPS5739358A (en) Electric current measuring device
SU1298842A1 (en) Synchronous detector
JPS6421375A (en) In-circuit testing apparatus
SU1679397A1 (en) A c digital automatic bridge
SU1691762A2 (en) Instrument to meter the consumption current
SU447619A1 (en) Method for measuring low DC voltages
JPS57154936A (en) Converting circuit
JPS5738011A (en) Power amplifier