JPS634075A - 無電解メツキ用シ−ドの形成方法 - Google Patents

無電解メツキ用シ−ドの形成方法

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Publication number
JPS634075A
JPS634075A JP62110909A JP11090987A JPS634075A JP S634075 A JPS634075 A JP S634075A JP 62110909 A JP62110909 A JP 62110909A JP 11090987 A JP11090987 A JP 11090987A JP S634075 A JPS634075 A JP S634075A
Authority
JP
Japan
Prior art keywords
substrate
palladium
noble metal
polymer
resist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62110909A
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English (en)
Other versions
JPH022949B2 (ja
Inventor
ロバート・ロイド・ジヤクソン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
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International Business Machines Corp
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Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS634075A publication Critical patent/JPS634075A/ja
Publication of JPH022949B2 publication Critical patent/JPH022949B2/ja
Granted legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【発明の詳細な説明】 A、産業上の利用分野 この発明は、基板に無電解メッキ法により金属メッキが
できるように、基板上に貴金属のシートを付着させる方
法に関するものである。
B、従来技術 米国特許第451.7254号明細書には、ポリイミド
の接着メタライゼーションの方法が開示されている。こ
れには、ポリエチレンイミンは、ポリイミドの前処理の
ために、水酸化アルカリの水溶液として用いられる多数
の窒素化合物のうちの1つであることが示されている。
C1発明が解決しようとする問題点 この発明の目的は、基板上に貴金属シートを付着させ、
強固に結合させる方法を提供することにある。
D4問題点を解決するための手段 この発明によれば、貴金属化合物と錯体を生成する能力
のある重合体の薄Mで基板をコーティングする。この薄
層は厚みが1ミクロン未満であることが好ましい。適当
な重合体には、ポリアミン、ポリ酸、およびポリ酸の塩
が含まれる。錯体を生成する重合体層は、好ましくは、
溶液によるデイツプ・コーティング、スプレィ・コーテ
ィング、またはスピン・コーティング、もしくはプラズ
マ付着等の非溶液法によりコーティングする。シーディ
ングは、重合体と、無電解メッキの触媒作用を有する、
またはこのような触媒に変換されることのできる貴金属
化合物との錯体を形成することにより行う。重合体は、
貴金属化合物を基板に強固に結合させる作用を有する。
好ましい貴金属化合物には、塩化パラジウム(■)、硫
酸パラジウム(II)等の水溶性の塩、酢酸パラジウム
(II)等の有機溶媒溶性の化合物、パラジウムアセチ
ルアセトネート等の揮発性錯体が含まれる。銅、ニッケ
ル、金、プラチナ、銀等の他の金属も使用できる。貴金
属化合物と、錯体生成重合体との錯体は、貴金属化合物
を重合体の溶液に添加して、この溶液を基板に塗布する
か、重合体を基板表面に塗布した後、別工程として貴金
属化合物を塗布するかの方法により形成させることがで
きる。貴金属化合物を別に塗布するには、好ましくは貴
金属化合物の溶液を、デイツプ・コーティング、スプレ
ィ・コーティング、またはスピン・コーティングにより
、もしくは化合物の蒸気に基板を露出させることにより
行う、過剰の貴金属化合物は、水または溶剤で洗浄する
ことにより、または揮発性貴金属化合物の場合は排気に
より除去することができる。次に、必要があれば、貴金
属化合物は、露光、加熱、プラズマへの露出、または還
元剤処理等、多くの方法で活性化させることができる。
場合により、活性化は不必要である。基板のメタライゼ
ーションは、基板を銅およびニッケル・メッキに用いる
コモン・バス等の無電解メッキ浴中に浸漬して行う。
基板の選択的メタライゼーションは、フォトレジストを
使用して行う、これは、薄い錯体生成重合体の層で基板
をコーティングした後、フォトレジストで基板をコーテ
ィングし、これをパターンに従って露光し、現像して、
メタライズされる区域を画定する。錯体生成重合体は、
露光および現像により露出されるが、侵食されることは
ない。
次に基板全体を貴金属化合物でコーティングする。
化合物はレジストの現像により露出された錯体生成重合
体と結合するが、フォトレジストとは結合しない。した
がって化合物は水または溶剤で洗浄することにより、ま
たは揮発性貴金属化合物の場合は排気により、レジスト
から除去することができる。代替方法として、貴金属化
合物と、錯体生成重合体との錯体を、フォトレジストの
塗布の前に、貴金属化合物と錯体生成重合体との単一溶
液を塗布するか、これらを別個に塗布するかにより形成
させることができる。このように、錯体生成重合体層は
、貴金属化合物と基板を結合させるだけでなく、電気解
メッキによりメタライズする基板の選択した区域を画定
する作用を有する。次に、必要があれば貴金属化合物を
活性化させ、基板を無電解メッキ浴中でメタライズする
この発明の方法は特に電子パッケージング基板、特に永
久レジスト、すなわち回路ラインを画定するだけでなく
、誘電体の一部として基板上に残るレジストをコーティ
ングした回路板に適用される。
現在、永久レジストを用いて製造した印刷回路板の、パ
ターン化した無電解メッキは、通常の方法では行うこと
ができない。通常、パラジウム等の貴金属の粒子からな
るシーブをレジストの下に付着させる。レジストを露出
して回路のチャネルを画定し、基板を無電解メッキに浸
漬して回路を形成する。メッキおよびレジストはく難役
、浴から過剰のシーブを除去する。レジストが回路板の
一部として残ると、これらの金属粒子も回路板中に残り
、短絡の通路の作用をする。この発明は、レジストを露
出、現像した後、回路チャネルの下面のみにシートを付
着させる事により、永久レジストを使用して基板に回路
を形成する方法を与える。
下記の例は、この発明を実施するための好ましい方法を
説明するものである。
E、実施例 ■上 清浄な回路板の基板を、分子量が100000Oのポリ
アクリル酸の0.05重合%溶液でデイツプ・コーティ
ングした。基板を室温および最終的に100℃で乾燥し
た後、永久レジストでコーティングし、露出して、1.
1.1−トリクロロエタンでスプレィ現像を行った。こ
の後、基板を水酸化ナトリウムの1重量%水溶液に浸漬
し、脱イオン水で清浄し、硫酸パラジウム(II) %
2重量%水溶液に浸漬した後、再び脱イオン水で洗浄し
た。次にパラジウム(II)を金属パラジウムに予め還
元せずに、銅の無電解メッキを行った。メッキは、銅2
.5g/Q、EDTA40g/Q、ホルムアルデヒド0
.5g/uを含む(定常状態の)無電解銅メッキ浴で、
pH11,7、温度70〜75℃で操作して行った。銅
が所要の部分に、選択的に均一に付着した。
匠l 清浄な回路板の基板を、分子量が325000のポリア
クリル酸ナトリウムの2.6重量%溶液でデイツプ・コ
ーティングした。この基板を室温および量的的に100
℃で乾燥した後、重版の乾燥皮膜回路板レジストでコー
ティングし、露出して、1.1.1−トリクロロエタン
でスプレィ現像した。次に基板をPdCQ22重量%、
NaCQl、3重量%を含有する水溶液に浸漬した。過
剰のPd(12□/ N a CQをすすぎ流した後、
パラジウム(II)を金属パラジウムに予め還元せずに
、例1で述べた無電解銅メッキ浴で、無電解メッキを行
った。銅は所要の部分に、選択的に均一に付着した。銅
の付着が完了した後、レジストをジクロロメタンで除去
し、基板を高温の脱イオン水で洗浄し、過剰のポリアク
リル酸ナトリウムを除去した。
亘ユ 清浄なセラミックのパッケージング基板を、分子量が3
25000のポリアクリル酸ナトリウムを2.0重量%
、Pd5O,を2重量%含有する水溶液でスピン・コー
ティングした。この基板を100℃で乾燥した。乾燥し
た基板にレジストをコーティングし、露出、現像した。
次にパラジウム(II)を金属パラジウムに予め還元せ
ずに、例1で述べた無電解銅メッキ浴で、基板に銅の無
電解メッキを行った。付着の選択性および均一性は良好
であった。銅の付着が完了した後、レジストを除去し、
基板を高温の脱イオン水で洗浄し、過剰のポリアクリル
酸ナトリウムとPdSO4を除去した。
■± 清浄な回路板の基板を、分子量12.00のポリエチレ
ンイミンの2重量%水溶液でデイツプ・コーティングし
た。次にこの基板を、永久レジストでコーティング、露
出した後、1.1.1−トリクロロエタンでスプレィ現
像した。次に、塩化パラジウム(II)およびHCQを
含有する水溶液に基板を浸漬した。これには液化パラジ
ウム(II)の2.5重量%溶液を使用した。活性の強
い無電解銅メッキ浴を使用した場合は、わずか0.3重
量%の塩化パラジウム(II)溶液で十分であった。
いずれの場合も、水溶液中のHCQのモル濃度は、塩化
パラジウム(II)のモル濃度の約2倍とした。
水洗により結合しない塩化パラジウl、(lを除去した
後、基板をpH12,8で、0.2Mのホルムアルデヒ
ド水溶液に浸漬して、パラジウム(II)を金属パラジ
ウムに還元した。次に基板に無電解鋼メッキを行った。
高濃度の塩化パラジウム(II)浴でシーディングした
基板は、例1で述べた無電解銅メッキ浴でメッキした。
低濃度の塩化パラジウム(II)浴でシーディングした
基板は、銅2.5g/Qおよびホルムアルデヒド5.5
g/2を含有する水性無電解銅メッキ浴で、pH12,
8、温度23℃でメッキを行った。いずれの無電解銅付
着浴でも、この方法により良好な選択性が得られた。銅
は、レジストを除去した部分に均一に付着したが、レジ
ストの表面には付着しなかった。
例1〜3で示したように、場合によっては還元工程は不
要である。これは、はとんどのメッキ浴で、 Pd (
II)が無電解銅付着の活性開始剤であるためである。
これは、これらの浴に含有される塩基性のホルムアルデ
ヒドが、パラジウム(II)を急速に還元して金属パラ
ジウムとするためである。
F0発明の効果 この方法は、特に永久レジストを用いて製造する回路板
の場合、通常のシーディング法に比較して多くの利点を
有する。この方法によれば、金属も電解質も誘電体内に
取り込まれることはない。
これは、レジストの下には重合体材料しかないためであ
る。重合体は、誘合体層どうし、および誘電体層と銅の
ラインとの接着を高めるためのものを選択することがで
き、これにより、回路板全体の品質が改善される。この
方法はアスペクト比の高い孔のメッキにも応用すること
ができる。これは、重合体のコーティングが、孔の表面
にも基板の表面にも行うことができるためである。
この発明は、従来の貴金属粒子のシーズと比較しても利
点を有する。従来のシーズはコロイドとして付着させ、
したがって粒子の大きな固まりを形成することがあり、
これが量的のメッキされたコーティングに欠陥を生ずる
原因となった。また、コロイド状のシーズは、再現が困
難であることがある。この明細書に述べる方法では、貴
金属シープは、単相溶液、または蒸気として付着させる
ため、コロイド状シーダの塗布または調製に固有の問題
が除かれる。従来のシーズはまた、無電解金属メッキの
直前に、金属粒子の表面から酸化物を除去する促進工程
を必要とする。促進の後、酸化物が再び形成する前に、
基板をメッキしなければならない。この明細書に述べる
方法では、シーズは酸化物のコーティングで覆われるこ
とがないため、促進剤は不要である。この結果、シーデ
ィングした基板は、再活性化、または促進させることな
く、メッキ前にいつまでも放置することができる。
出願人  インターナショナル・ビジネス・マシーンズ
・コーポレーション 代理人  弁理士  山  本  仁  朗(外1名)

Claims (5)

    【特許請求の範囲】
  1. (1)(a)基板を、貴金属化合物と錯体を形成し得る
    重合体の層で被覆し、 (b)上記重合体の層を、該重合体と形成し得る貴金属
    化合物と接触させる工程を有する、 無電解メッキ用シートの形成方法。
  2. (2)上記重合体の層の厚さが1μm以下である特許請
    求の範囲第(1)項記載の方法。
  3. (3)上記重合体がポリアミンである特許請求の範囲第
    (1)項記載の方法。
  4. (4)上記重合体がポリ酸またはポリ酸塩である特許請
    求の範囲第(1)項記載の方法。
  5. (5)上記貴金属化合物が、塩化パラジウム(II)、硫
    酸パラジウム(II)またはパラジウム・アセチルアセト
    ネートである特許請求の範囲第(1)項記載の方法。
JP62110909A 1986-06-16 1987-05-08 無電解メツキ用シ−ドの形成方法 Granted JPS634075A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US874976 1978-02-03
US06/874,976 US4701351A (en) 1986-06-16 1986-06-16 Seeding process for electroless metal deposition

Publications (2)

Publication Number Publication Date
JPS634075A true JPS634075A (ja) 1988-01-09
JPH022949B2 JPH022949B2 (ja) 1990-01-19

Family

ID=25364999

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (3)

Country Link
US (1) US4701351A (ja)
EP (1) EP0250867A1 (ja)
JP (1) JPS634075A (ja)

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JPH06279602A (ja) * 1993-03-26 1994-10-04 Idemitsu Petrochem Co Ltd 無電解めっき可能なポリオレフィン樹脂成形体
JP2006518103A (ja) * 2003-02-17 2006-08-03 アルシメール・エス・アー 表面被覆方法、及び該方法を使用するマイクロエレクトロニクス相互接続の作製、並びに集積回路
JP2007112112A (ja) * 2005-09-20 2007-05-10 Dainippon Ink & Chem Inc 金属積層板及び金属積層板の製造方法
WO2008012984A1 (fr) * 2006-07-27 2008-01-31 Ebara-Udylite Co., Ltd. Procédé de métallisation de surfaces en plastique
JP2010171045A (ja) * 2009-01-20 2010-08-05 Konica Minolta Ij Technologies Inc インクジェットインク及び金属パターン形成方法
JP2013525606A (ja) * 2010-04-19 2013-06-20 ペガステク 銅層を用いた非金属材料からなる基板の表面を被覆する方法

Also Published As

Publication number Publication date
EP0250867A1 (en) 1988-01-07
JPH022949B2 (ja) 1990-01-19
US4701351A (en) 1987-10-20

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