JPS63179520A - Microwave plasma treatment apparatus with magnetic field - Google Patents

Microwave plasma treatment apparatus with magnetic field

Info

Publication number
JPS63179520A
JPS63179520A JP984587A JP984587A JPS63179520A JP S63179520 A JPS63179520 A JP S63179520A JP 984587 A JP984587 A JP 984587A JP 984587 A JP984587 A JP 984587A JP S63179520 A JPS63179520 A JP S63179520A
Authority
JP
Japan
Prior art keywords
sample
microwave
waveguide
plasma
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP984587A
Other languages
Japanese (ja)
Inventor
Masaharu Saikai
西海 正治
Hitoaki Sato
佐藤 仁昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP984587A priority Critical patent/JPS63179520A/en
Publication of JPS63179520A publication Critical patent/JPS63179520A/en
Pending legal-status Critical Current

Links

Landscapes

  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To make the treatment of a sample uniform, by changing the direction of a microwave to the surface of the sample to be treated, and turning a propagating means in a plane, which is in parallel with the surface of the sample to be treated when the sample undergoes plasma treating, and correcting the deflection of the plasma. CONSTITUTION:A microwave is emitted from a magnetron 1 and propagated to a bell jar 5, a processing chamber formed of insulating material, through a rectangular waveguide 2, a perpendicular-direction changing waveguide 3 and a circular waveguide 4. Plasma is formed by the mutual action between the electric field formed from the microwave and the magnetic field formed from an air-core coil 6. A sample 8 on a sample stage 7 undergoes plasma treatment. A rotary mechanism 9 is provided at a coupling part of the perpendicular-direction changing waveguide 3 and the circular waveguide 4. The rectangular waveguide 2 with the magnetron 1 and the perpendicular- direction changing waveguide 3 are turned as a unitary body in a plane, which is in parallel with the treating surface of the sample 8 to be treated. The amount of radiation of the microwave on the sample 8 is made uniform. Thus the plasma treatment of the sample is made uniform.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、有磁場マイクロ波プラズマ処理装置に係り、
特に半導体素子基板等の試料に好適な有磁場マイクロ波
プラズマ処理g装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a magnetic field microwave plasma processing apparatus,
The present invention particularly relates to a magnetic field microwave plasma processing apparatus suitable for samples such as semiconductor element substrates.

〔従来の技術〕[Conventional technology]

半導体素子基板等の試料をプラズマ処理する有磁場マイ
クロ波プラズマ処理装置としては、例えば、特公昭56
−37311号公報に記載のようなものが知られている
As a magnetic field microwave plasma processing apparatus for plasma processing samples such as semiconductor element substrates, for example,
The one described in Japanese Patent No.-37311 is known.

このような有磁場マイクロ波プラズマ処理装置では、処
理室内でプラズマ処理される試料に対してマイクロ波発
振源は上方に配置され、直角方向にマイクロ波を変換す
る■管により試料へ放射されている。
In such magnetic field microwave plasma processing equipment, the microwave oscillation source is placed above the sample being plasma-treated in the processing chamber, and the microwave is radiated to the sample through a tube that converts microwaves in a perpendicular direction. .

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記従来技術では、直角方向にマイクロ波を変換する導
波管によるマイクロ波の偏りが生じ、マイクロ波の電界
と磁場との相互作用によるプラズマの偏りが生じるため
、試料の処理が不均一になるといった問題がある。
In the above conventional technology, the waveguide that converts the microwave in the orthogonal direction causes the microwave to be biased, and the interaction between the microwave's electric field and the magnetic field causes plasma to be biased, resulting in non-uniform sample processing. There are problems like this.

本発明の目的は、プラズマの偏りを補正することで、試
料の処理を均一化できる有磁場マイクロ波プラズマ処理
装置を提供することにある。
An object of the present invention is to provide a magnetic field microwave plasma processing apparatus that can uniformize sample processing by correcting plasma bias.

〔問題点を解決するための手段〕[Means for solving problems]

上記目的は、マイクロ波を処理室内でプラズマ処理され
る試料の被処理面に回って方向を変換すると共に伝播す
る伝播手段を有する有磁場マイクロ波プラズマ処理装置
で、前記伝播手段を、前記試料の被処理面内と平行な面
内で回転可能に設けたものとすることにより、達成され
る。
The above object is a magnetic field microwave plasma processing apparatus having a propagation means for transmitting microwaves to a surface of a sample to be plasma treated in a processing chamber, changing the direction and propagating the microwaves, This is achieved by providing the device rotatably in a plane parallel to the surface to be treated.

〔作  用〕[For production]

マイクロ波を試料の被処理面に向って方向変換すると共
に伝播する伝播手段を、試料のプラズマ処理時に該試料
の被処理面と平行な面内で回転させる。該回転により試
料に対するマイクロ波の放射量は均一に補正され、これ
によりマイクロ波の電界と磁場との相互作用によるプラ
ズマの偏りが補正される。
A propagating means for changing the direction of microwaves and propagating them toward a surface to be processed of a sample is rotated in a plane parallel to the surface to be processed of the sample during plasma processing of the sample. By this rotation, the amount of microwave radiation to the sample is corrected to be uniform, and thereby the bias of the plasma due to the interaction between the electric field and the magnetic field of the microwave is corrected.

〔実 施 例〕〔Example〕

以下、本発明の一実施例を第1図により説明する。マイ
クロ波はマグネトロンlより放射され矩形導波管2.面
角変換導波管39円形導波管4により、絶縁材で成形さ
れた処理室であるペルジャー5に伝播される。このマイ
クロ波による電界と空芯コイル6の磁界との相互作用に
よりプラズマが形成され、試料台7上の試料8にプラズ
マ処理が施こされる。1を角変良導波管3と円形導波管
4との結合部に回転機構9を設け、駆動装置10により
、試料8の被処理面と平行な面内でマグネトロン1を取
付けた矩形導波管2と直角変換導波管3を一体として回
転させ、試料8に対するマイクロ波の放射量を均一化す
る。このとき1回転周期は試料8をプラズマ処理するの
に要する時間より充分小さいことが必要である。なお、
直角変換導波管3と円形導波管4との結合部はマイクロ
波漏洩を抑制する機能を有し、また、回転機構は、歯車
や磁力を利用し起ものである。
An embodiment of the present invention will be described below with reference to FIG. Microwaves are emitted from a magnetron 1 and passed through a rectangular waveguide 2. The beam is propagated through the plane angle conversion waveguide 39 and the circular waveguide 4 to the Pelger 5, which is a processing chamber formed of an insulating material. Plasma is formed by the interaction between the electric field generated by the microwave and the magnetic field of the air-core coil 6, and the sample 8 on the sample stage 7 is subjected to plasma treatment. A rotating mechanism 9 is provided at the joint between the square waveguide 3 and the circular waveguide 4, and the drive device 10 rotates the rectangular guide with the magnetron 1 attached in a plane parallel to the surface to be processed of the sample 8. The wave tube 2 and the orthogonal conversion waveguide 3 are rotated as a unit to equalize the amount of microwave radiation to the sample 8. At this time, it is necessary that one rotation period is sufficiently smaller than the time required to plasma-process the sample 8. In addition,
The joint between the orthogonal conversion waveguide 3 and the circular waveguide 4 has a function of suppressing microwave leakage, and the rotation mechanism uses gears and magnetic force.

本実施例によれば試料のプラズマ処理の均一化が図れる
効果がある。
According to this embodiment, there is an effect that the plasma treatment of the sample can be made uniform.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、試料に対する744口波の偏りを補正
できるので、マイクロ波の電界と磁場との相互作用4こ
よるプラズマの偏りを補正でき試料の処理を均一化でき
るという効果がある。
According to the present invention, since it is possible to correct the deviation of the 744 mouth wave with respect to the sample, it is possible to correct the deviation of the plasma caused by the interaction between the electric field and the magnetic field of the microwave, thereby making it possible to uniformize the processing of the sample.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の有磁場マイクロ波プラズマ
処理1WLの縦断面図である。 l・・・・・・マグネトロン、2・・・・・・矩形導波
管、3・・・直角変換導波管、4・・・・・・円形導波
管、5・・・・・・ベル纂ム イ1図
FIG. 1 is a longitudinal sectional view of a magnetic field microwave plasma treatment 1WL according to an embodiment of the present invention. 1... Magnetron, 2... Rectangular waveguide, 3... Right angle conversion waveguide, 4... Circular waveguide, 5... Bell string mui 1

Claims (1)

【特許請求の範囲】[Claims] 1、マイクロ波を処理室内でプラズマ処理される試料の
被処理面に向って方向を変換すると共に伝播する伝播手
段を有する有磁場マイクロ波プラズマ処理装置において
、前記伝播手段を、前記試料の被処理面と平行な面内で
回転可能に設けたことを特徴とする有磁場マイクロ波プ
ラズマ処理装置。
1. In a magnetic field microwave plasma processing apparatus having a propagation means for changing the direction of microwaves and propagating them toward a surface to be processed of a sample to be plasma processed in a processing chamber, the propagation means is connected to a surface to be processed of the sample. A magnetic field microwave plasma processing apparatus characterized in that it is rotatable in a plane parallel to the plane.
JP984587A 1987-01-21 1987-01-21 Microwave plasma treatment apparatus with magnetic field Pending JPS63179520A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP984587A JPS63179520A (en) 1987-01-21 1987-01-21 Microwave plasma treatment apparatus with magnetic field

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP984587A JPS63179520A (en) 1987-01-21 1987-01-21 Microwave plasma treatment apparatus with magnetic field

Publications (1)

Publication Number Publication Date
JPS63179520A true JPS63179520A (en) 1988-07-23

Family

ID=11731464

Family Applications (1)

Application Number Title Priority Date Filing Date
JP984587A Pending JPS63179520A (en) 1987-01-21 1987-01-21 Microwave plasma treatment apparatus with magnetic field

Country Status (1)

Country Link
JP (1) JPS63179520A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6352133B1 (en) 1999-04-21 2002-03-05 Hitachi Construction Machinery Co., Ltd. Construction machinery

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6352133B1 (en) 1999-04-21 2002-03-05 Hitachi Construction Machinery Co., Ltd. Construction machinery

Similar Documents

Publication Publication Date Title
JP3217274B2 (en) Surface wave plasma processing equipment
TWI548311B (en) Surface wave plasma generation antenna and surface wave plasma processing device
JP3056772B2 (en) Plasma control method, plasma processing method and apparatus therefor
TWI384086B (en) Film forming apparatus and thin film forming method
BR0010064B1 (en) device for surface treatment of a vessel with the aid of a low pressure plasma.
US5237152A (en) Apparatus for thin-coating processes for treating substrates of great surface area
KR900014639A (en) Microwave Plasma Etching Method and Apparatus
JPS63179520A (en) Microwave plasma treatment apparatus with magnetic field
JPH03191074A (en) Microwave plasma treating device
JPH07169740A (en) Microwave plasma treating device
JPH065386A (en) Electronic cyclotron resonance device
JPH0917598A (en) Ecr plasma working device and ecr plasma generating method
JP3156492B2 (en) Plasma processing apparatus and plasma processing method
JP2515885B2 (en) Plasma processing device
JP2511433B2 (en) Microwave plasma processing equipment
JPH01107537A (en) Microwave plasma processor
JP2000012290A (en) Plasma treatment device
KR940002736B1 (en) Treating apparatus using microwave plasma
JPH0390577A (en) Microwave plasma treating device
JPH04132215A (en) Microwave plasma treatment apparatus and its operating method
JP3157638B2 (en) Plasma processing equipment
JPH02168540A (en) Plasma processing device
JPH06196412A (en) Plasma treatment device
JP2639292B2 (en) ECR plasma processing equipment
JP2004014831A (en) Plasma treatment apparatus