JPS6188656U - - Google Patents

Info

Publication number
JPS6188656U
JPS6188656U JP17312184U JP17312184U JPS6188656U JP S6188656 U JPS6188656 U JP S6188656U JP 17312184 U JP17312184 U JP 17312184U JP 17312184 U JP17312184 U JP 17312184U JP S6188656 U JPS6188656 U JP S6188656U
Authority
JP
Japan
Prior art keywords
sample
conductor
collecting electrode
electron beam
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17312184U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17312184U priority Critical patent/JPS6188656U/ja
Publication of JPS6188656U publication Critical patent/JPS6188656U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は通常の走査形電子顕微鏡装置の説明図
、第2図は従来形の収集電極の配置説明図、第3
図は本考案の一実施例図である。 5…対物レガズ、7…試料、9…検出器、10
…増巾器、15…電子ビーム、20…収集電極、
21…熱電子制御グリツド、22…電子ビーム入
射孔。
Fig. 1 is an explanatory diagram of a conventional scanning electron microscope device, Fig. 2 is an explanatory diagram of the arrangement of a conventional collecting electrode, and Fig. 3 is an explanatory diagram of a conventional scanning electron microscope device.
The figure shows an embodiment of the present invention. 5...Objective regaz, 7...Sample, 9...Detector, 10
...amplifier, 15...electron beam, 20...collecting electrode,
21... Thermionic control grid, 22... Electron beam entrance hole.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料の大きさに応じた最小の寸法をもつ導電体
で試料を囲み、その頂部に電子線の入射孔を有す
ることを特徴とする収集電極をもつ走査形電子顕
微鏡。
A scanning electron microscope having a collecting electrode characterized by surrounding a sample with a conductor having minimum dimensions corresponding to the size of the sample and having an electron beam entrance hole at the top of the conductor.
JP17312184U 1984-11-16 1984-11-16 Pending JPS6188656U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17312184U JPS6188656U (en) 1984-11-16 1984-11-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17312184U JPS6188656U (en) 1984-11-16 1984-11-16

Publications (1)

Publication Number Publication Date
JPS6188656U true JPS6188656U (en) 1986-06-10

Family

ID=30730781

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17312184U Pending JPS6188656U (en) 1984-11-16 1984-11-16

Country Status (1)

Country Link
JP (1) JPS6188656U (en)

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