JPS6136931Y2 - - Google Patents
Info
- Publication number
- JPS6136931Y2 JPS6136931Y2 JP10075878U JP10075878U JPS6136931Y2 JP S6136931 Y2 JPS6136931 Y2 JP S6136931Y2 JP 10075878 U JP10075878 U JP 10075878U JP 10075878 U JP10075878 U JP 10075878U JP S6136931 Y2 JPS6136931 Y2 JP S6136931Y2
- Authority
- JP
- Japan
- Prior art keywords
- defect
- scale
- screen
- index
- ray tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007547 defect Effects 0.000 claims description 13
- 230000005540 biological transmission Effects 0.000 claims description 4
- 230000002950 deficient Effects 0.000 claims description 3
- 230000000630 rising effect Effects 0.000 claims description 2
- 239000000523 sample Substances 0.000 description 15
- 238000005259 measurement Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
Landscapes
- Indicating Measured Values (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
【考案の詳細な説明】
超音波探傷器は一般にＡスコープ法によつて、
表面から欠陥までの距離、あるいは更に測定点か
ら欠陥までの距離を測定することが多い。すなわ
ちブラウン管オツシロスコープの横軸を時間軸と
し縦軸に送信パルスおよび欠陥エコーパルス等を
加えて送信基準時点からエコーパルスまでの時間
を測定するものである。この場合試料の厚みその
他の条件によつて時間軸の測定範囲が切換えられ
るから、従来はスクリーンの目盛によつて送信基
準位置とエコーパルスとの間隔を読取つて上記測
定範囲等によつて定まる係数を掛ける等の演算を
必要とした。更に斜角探触子を用いる場合は、そ
の探触子特有の屈折角の三角関数を掛ける等の煩
雑な演算を行わなければならなかつた。本考案は
このような欠点を除去し、演算を必要とすること
なく欠陥の位置を直接指示し得るようにしたもの
で、このため計算誤りによる誤測定を防止し、か
つ迅速に観測を行うことができる。[Detailed explanation of the invention] Ultrasonic flaw detectors generally use the A-scope method.
The distance from the surface to the defect, or even from the measurement point to the defect, is often measured. That is, the horizontal axis of the cathode ray tube oscilloscope is the time axis, and the vertical axis is a transmission pulse, a defective echo pulse, etc., and the time from the transmission reference time to the echo pulse is measured. In this case, the measurement range on the time axis is changed depending on the thickness of the sample and other conditions, so in the past, the interval between the transmission reference position and the echo pulse was read from the scale of the screen, and the coefficient was determined based on the measurement range, etc. Required calculations such as multiplication. Furthermore, when using an oblique angle probe, it is necessary to perform complicated calculations such as multiplying the angle of refraction by a trigonometric function specific to the probe. The present invention eliminates these drawbacks and makes it possible to directly indicate the position of a defect without the need for calculations.This prevents erroneous measurements due to calculation errors and enables rapid observation. Can be done.
図面は本考案の一実施例で、第１図は正面図、
第２図は第１図のＡ−Ａ断面図、第３図は同じく
Ｂ−Ｂ断面図、第４図は同じくＣ−Ｃ断面図また
第５図は目盛板を拡大した図である。このように
筐体１の前面にブラウン管のスクリーン２を配置
し、その上部に長いねじ棒３を水平、従つて上記
ブラウン管の横軸と平行に配置して回転自在に保
持してある。上記ねじ棒３に駆動リング４を取付
けると共に摺動子５を螺合し、この摺動子に透明
なアクリル樹脂で形成した帯状板よりなる指標６
を取付けて該指標に縦軸と平行な目指線７を設け
てある。なお目指線７は必要に応じて指標６の表
裏両面に異なる色をもつて形成し、その２本の目
指線が重合する方向から観測することによつて視
差を防止するようにしてある。またスクリーン２
の下部には目盛板８を着脱自在に取付けて、その
目盛を指標６で指示するようにしてある。すなわ
ちこの目盛板８は板ばね９，１０で筐体１に押し
付けられると共に板ばね１１によつて一方の縁１
２を校正板１３に押し付けられたもので、ねじ１
４の回転によつて上記校正板の位置を調整するこ
とができる。また目盛板８は第５図に示したよう
に、上記縁１２と目盛の起点との間の距離ｌが正
確に一定の値となるように作られている。従つて
予め校正板１３の位置を調整しておくことによ
り、目盛板８を挿入するだけで、スクリーン２に
おける横軸の起点と目盛の起点とを正確に一致さ
せることができる。この目盛板８には例えば斜角
探触子を用いて直射法（0.5スキツプ）で測定す
る場合における測定範囲を示した目盛Ｗ、および
探触子固有の屈折角が例えば70.5度の場合におけ
る探触子から欠陥までの試料表面と平行な距離ｙ
および直角な距離ｄを表わした目盛を設けてあ
る。 The drawings show one embodiment of the present invention, and Figure 1 is a front view;
2 is a sectional view taken along the line AA in FIG. 1, FIG. 3 is a sectional view taken along the line BB, FIG. 4 is a sectional view taken along the line C-C, and FIG. 5 is an enlarged view of the scale plate. As described above, a cathode ray tube screen 2 is arranged on the front surface of the casing 1, and a long threaded rod 3 is arranged above the screen 2 horizontally, that is, parallel to the transverse axis of the cathode ray tube, and is rotatably held therein. A drive ring 4 is attached to the threaded rod 3 and a slider 5 is screwed onto the slider, and an index 6 made of a band-shaped plate made of transparent acrylic resin is attached to the slider.
A pointing line 7 parallel to the vertical axis is provided on the indicator. Note that the aiming lines 7 are formed in different colors on both the front and back sides of the index 6 as necessary, and parallax is prevented by observing from the direction in which the two aiming lines overlap. Also screen 2
A scale plate 8 is removably attached to the lower part of the scale, and the scale is indicated by an index 6. That is, this scale plate 8 is pressed against the housing 1 by leaf springs 9 and 10, and is pressed against one edge 1 by a leaf spring 11.
2 is pressed against the calibration plate 13, and the screw 1
The position of the calibration plate can be adjusted by turning 4. Further, as shown in FIG. 5, the scale plate 8 is made so that the distance l between the edge 12 and the starting point of the scale is an accurately constant value. Therefore, by adjusting the position of the calibration plate 13 in advance, the starting point of the horizontal axis on the screen 2 can be accurately aligned with the starting point of the scale simply by inserting the scale plate 8. This scale plate 8 has a scale W indicating the measurement range when measuring by the direct method (0.5 skip) using an angle probe, and a scale W indicating the measurement range when the refraction angle unique to the probe is, for example, 70.5 degrees. Distance y parallel to the sample surface from the probe to the defect
and a scale representing the perpendicular distance d.
上述の装置において、ブラウン管の横軸には鋸
歯状波の時間軸入力が加えられ、また縦軸には探
触子から試料中へ発射される超音波の送信パルス
および試料中の欠陥等で反射したエコーパルスが
加えられる。かつ上記探触子の種類、屈折角およ
び時間軸の測定範囲等に応じて各種の目盛板８を
用意してある。すなわち測定に際しては使用探触
子並びに時間軸の測定範囲等に応じて選定された
目盛板８をスクリーン２の下部に取付ける。この
状態で測定を行うと、例えば斜角探触子をを用い
た場合にもし試料中に欠陥があると、第１図に示
したようにその欠陥エコーパルスＦが横軸上の任
意の位置に現れる。かつ駆動リング４を回転する
と、摺動子５がねじ棒３に沿つて移動し、これに
伴つて指標６が横軸の方向へ移動する。その指標
の目指線７を欠陥エコーパルスＦの立上り点に合
せて、該指標で指示される目盛板８上の目盛Ｗ，
ｙ，ｄ等を読取ることにより、欠陥の位置を直読
することができる。 In the above device, the horizontal axis of the cathode ray tube is a time-domain input of a sawtooth wave, and the vertical axis is a pulse of ultrasonic waves emitted from the probe into the sample and reflected by defects in the sample. echo pulses are added. Various scale plates 8 are prepared depending on the type of the probe, the refraction angle, the measurement range on the time axis, etc. That is, during measurement, a scale plate 8 selected according to the probe used, the measurement range on the time axis, etc. is attached to the lower part of the screen 2. If measurement is performed in this state, for example when using an oblique probe, if there is a defect in the sample, the defect echo pulse F will be located at an arbitrary position on the horizontal axis as shown in Figure 1. appears in When the drive ring 4 is rotated, the slider 5 moves along the threaded rod 3, and the indicator 6 moves in the direction of the horizontal axis. Align the aiming line 7 of the index with the rising point of the defective echo pulse F, and set the scale W on the scale plate 8 indicated by the index,
By reading y, d, etc., the position of the defect can be directly read.
このように本考案の装置は簡単な機構と操作と
によつて演算を必要とすることなく欠陥の位置を
直読することができる。従つて計算誤りによる誤
観測のおそれがなく、かつ迅速で容易に測定を行
い得るものである。また探傷器のゲートを設定す
ることにより、欠陥エコーがゲートの検出レベル
を越すまで探触子を中心として走査し得る。 As described above, the device of the present invention can directly read the position of a defect without requiring calculations by using a simple mechanism and operation. Therefore, there is no risk of erroneous observations due to calculation errors, and measurements can be made quickly and easily. Furthermore, by setting the gate of the flaw detector, it is possible to scan around the probe until the defect echo exceeds the detection level of the gate.
第１図は本考案実施例の正面図、第２図第３図
第４図はそれぞれ第１図のＡ−Ａ，Ｂ−Ｂ，Ｃ−
Ｃ断面図、また第５図は目盛板の一例を示した拡
大正面図である。
なお図において１は筐体、２はブラウン管のス
クリーン、３はねじ棒、４は駆動リング、５は摺
動子、６は指標、７は目指線、８は目盛板であ
る。
Fig. 1 is a front view of the embodiment of the present invention, and Fig. 2, Fig. 3, and Fig. 4 are A-A, B-B, and C- of Fig. 1, respectively.
C sectional view and FIG. 5 are enlarged front views showing an example of a scale plate. In the figure, 1 is a housing, 2 is a screen of a cathode ray tube, 3 is a threaded rod, 4 is a drive ring, 5 is a slider, 6 is an indicator, 7 is a aiming line, and 8 is a scale plate.
Claims (1)
エコーパルスを加えられるブラウン管のスクリー
ンの前面に横軸方向へ移動する可動指標を設ける
と共に前記時間軸の測定範囲その他の測定条件に
応じて試料中の欠陥の位置を直接表示する目盛を
有し前記可動指標をブラウン管のスクリーンに現
れた欠陥エコーパルスの立上り位置に合せたとき
該指標によつて欠陥の位置が指示される目盛板を
上記スクリーンの側部に着脱自在に取付けた超音
波探傷器。 A movable index that moves in the horizontal direction is provided in front of the screen of the cathode ray tube to which the horizontal axis is the time axis and the vertical axis is the transmission pulse and defective echo pulse. A scale plate is provided on the screen, which has a scale that directly indicates the position of the defect, and the position of the defect is indicated by the index when the movable index is aligned with the rising position of the defect echo pulse appearing on the screen of the cathode ray tube. Ultrasonic flaw detector detachably attached to the side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10075878U JPS6136931Y2 (en) | 1978-07-24 | 1978-07-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10075878U JPS6136931Y2 (en) | 1978-07-24 | 1978-07-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5518146U JPS5518146U (en) | 1980-02-05 |
| JPS6136931Y2 true JPS6136931Y2 (en) | 1986-10-25 |
Family
ID=29038775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10075878U Expired JPS6136931Y2 (en) | 1978-07-24 | 1978-07-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6136931Y2 (en) |
-
1978
- 1978-07-24 JP JP10075878U patent/JPS6136931Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5518146U (en) | 1980-02-05 |
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