JPS61222021A - Magnetic recording medium - Google Patents

Magnetic recording medium

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Publication number
JPS61222021A
JPS61222021A JP6194285A JP6194285A JPS61222021A JP S61222021 A JPS61222021 A JP S61222021A JP 6194285 A JP6194285 A JP 6194285A JP 6194285 A JP6194285 A JP 6194285A JP S61222021 A JPS61222021 A JP S61222021A
Authority
JP
Japan
Prior art keywords
film
magnetic
layer
thin
magnetic recording
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6194285A
Other languages
Japanese (ja)
Other versions
JPH0323967B2 (en
Inventor
Takao Matsudaira
松平 他家夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoya Corp
Original Assignee
Hoya Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoya Corp filed Critical Hoya Corp
Priority to JP6194285A priority Critical patent/JPS61222021A/en
Publication of JPS61222021A publication Critical patent/JPS61222021A/en
Publication of JPH0323967B2 publication Critical patent/JPH0323967B2/ja
Granted legal-status Critical Current

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Abstract

PURPOSE:To form a thin chromium film to the extent of obviating the generation of a film crack, etc. and to obtain an excellent magnetic characteristic by forming the side where an underlying layer contacts with a substrate of a film consisting essentially of zirconium oxide, etc. and forming the side where said layer contacts with a magnetic layer of the chromium film. CONSTITUTION:The non-magnetic underlying layer 2 consisting of a ZrO2 layer, the 2nd underlying layer 3 consisting of the Cr film, a thin magnetic metallic layer 4 consisting of a Co-Ni film and a protective layer 5 consisting of a thin carbon film are successively formed on a non-magnetic soda lime glass substrate 1. The film consisting essentially of the zirconium oxide, etc. is formed between the non-magnetic substrate 1 and the chromium film 2 as the underlying layer and therefore the thickness of the chromium film is made as small as 1000 Angstrom at which the crack of the film, etc. are not generated. The excellent magnetic characteristic is thus obtd.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、磁気的記憶装置に用いられる磁気記録媒体に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a magnetic recording medium used in a magnetic storage device.

〔従来の技術〕[Conventional technology]

近年、磁気記録媒体の高記録密度化の要請によυ、金属
磁性薄膜を磁性層とする連続薄膜形の磁気記録媒体が注
目を集めている。このような金属−・・パ−14−醋−
1+rl+1− 町、Z、・7 J 11 ・ノブ体温
により形成したCoまたはCo−Ni 、Co−N1−
P、Co−Pなどの合金系の金属薄膜が知られているが
、その磁気特性を改善するために、非磁性支持体と上記
磁性層との間に下地層としてCr膜を介在させることが
知られている(アイ・イー・イー・イー・トランザクシ
ョンズ・オン・マグネティックス、MAG、 15巻3
号1135頁(IEEE Transactionso
n Magnettcs 、 V()19MAG、 1
5.N13 、p、 1135 。
In recent years, due to the demand for higher recording densities in magnetic recording media, continuous thin film magnetic recording media having a magnetic layer made of a metal magnetic thin film have attracted attention. Such metal...par 14-
1+rl+1- Machi, Z, ・7 J 11 ・Co or Co-Ni formed by knob body temperature, Co-N1-
Metal thin films based on alloys such as P and Co-P are known, but in order to improve their magnetic properties, it is possible to interpose a Cr film as an underlayer between the non-magnetic support and the magnetic layer. Known (IEE Transactions on Magnetics, MAG, Volume 15, Volume 3)
No. 1135 page (IEEE Transactions
n Magnettcs, V()19MAG, 1
5. N13, p, 1135.

1979 ) )。1979)).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかし、このようなCr膜を用いて高密度磁気配置に適
した十分に高い保磁力を得ようとすると、下地層として
のCr膜を厚くしなければならない。
However, in order to obtain a sufficiently high coercive force suitable for a high-density magnetic arrangement using such a Cr film, the Cr film as an underlayer must be thick.

ところが、支持体表面が十分に平滑に研摩されているこ
ともあって、Cr膜の膜厚が例えば5000λ以上と大
きくなると、膜応力の増大に付着力が抗し切れず、微小
な膜割れを生ずる場合がおる。特に、安価なガラス基板
を支持体とし、表面を研摩して用いた場合には、このよ
うな膜割れが発生しやすいが、このような下地層の膜割
れは、例えば磁気ヘッドとの間隔が200〜300nm
という小さな値を保ちながら回転する磁気ディスクにと
って致命的な欠陥となる。
However, because the surface of the support is polished sufficiently smooth, when the thickness of the Cr film increases, for example, 5000λ or more, the adhesion force cannot withstand the increase in film stress, resulting in minute film cracks. This may occur in some cases. Particularly, such film cracking is likely to occur when using an inexpensive glass substrate as a support with a polished surface. 200-300nm
This is a fatal flaw for magnetic disks that rotate while maintaining a small value.

〔問題点を解決するための手段〕[Means for solving problems]

このような問題点を解決するために、本発明は、非磁性
下地層としてCr膜の他に、当該Cr膜と非磁性支持体
との間に、酸化ジルコニウム(ZrOl)、フッ化マグ
ネシウム(MgF*)、酸化インジウム(InlO,)
、酸化スズ(SnOl)の少なくとも1s類を主成分と
する膜を介在させたものである。
In order to solve these problems, the present invention provides, in addition to a Cr film as a non-magnetic underlayer, zirconium oxide (ZrOl) and magnesium fluoride (MgF) between the Cr film and the non-magnetic support. *), indium oxide (InlO,)
, a film containing at least 1s of tin oxide (SnOl) as a main component is interposed therebetween.

〔作用〕[Effect]

このような膜を介在させることにより、比較的薄いCr
膜で、しかも従来Cr膜単独の下地層を用いた場合には
得られなかったよう表すぐれた磁気特性を示す理由は必
ずしも明らかではないが、上述した膜はいずれも結晶性
の膜でアシ、この存在によってその上に形成されるCr
膜や磁性膜の結晶性が改善されることによると考えられ
る。
By interposing such a film, relatively thin Cr
Although it is not necessarily clear why the film exhibits excellent magnetic properties that could not be obtained when using a conventional Cr film alone as an underlayer, the films mentioned above are all crystalline films and have reeds. Cr formed on it by this presence
This is thought to be due to improved crystallinity of the film and magnetic film.

〔実施例〕〔Example〕

(その1) 図示のように、非磁性支持体としてのソーダライムガラ
ス基板1の上に、第1の非磁性下地層として1000 
XのZ r Q、層2を、電子ビームを用い九真空蒸着
法によって形成し、さらに第2の下地層としてマグネト
ロンスパッタリング法によって1500XのCr膜3を
形成した。次に、このCr膜3の上に、金属薄膜磁性層
として、同じスパッタリング装置を用いて15wL%の
Nlを含むC。
(Part 1) As shown in the figure, on a soda lime glass substrate 1 as a non-magnetic support, a 1000 ml film is applied as a first non-magnetic underlayer.
A Z r Q layer 2 of X was formed by vacuum evaporation using an electron beam, and a Cr film 3 of 1500X was formed as a second underlayer by magnetron sputtering. Next, on this Cr film 3, a metal thin film magnetic layer is formed using the same sputtering apparatus to form a C layer containing 15 wL% of Nl.

−Ni膜4を40OAの厚さに成膜した。さらにその上
に、保護膜としてスパッタリング法により500Xの炭
素薄膜5を形成した。
-Ni film 4 was formed to a thickness of 40OA. Furthermore, a 500X carbon thin film 5 was formed thereon as a protective film by sputtering.

(その2) 第1の実施例において、ZrO,膜の代υに10010
00jl)、膜を同様の方法によって形成した。
(Part 2) In the first embodiment, the ZrO film thickness υ is 10010
00jl), the membrane was formed by a similar method.

(その3) 第1の実施例において、Zr01膜の代りに110OA
のI n* OB膜を同様に形成した。
(Part 3) In the first embodiment, 110OA film was used instead of Zr01 film.
An I n* OB film was similarly formed.

(その4) 第1の実施例において、zrO□膜の代りに1500^
のSnO,膜を同様に形成した。
(Part 4) In the first example, 1500^ was used instead of the zrO□ film.
A SnO film was formed in the same manner.

(その5) 第1の実施例におい電、ZrO,膜の代りに1600^
のITO膜、SnO,を含むI l’l!O,膜をスパ
ッタリング法により形成した。
(Part 5) In the first embodiment, 1600 ^
ITO film containing SnO, I l'l! The O film was formed by sputtering.

以上の各実施例の磁気記録媒体について、保磁力He、
残留磁束密度Brおよび角形比(残留磁束密度Br/飽
和磁束密度B畠)を測定した結果を下の表に示す。
Regarding the magnetic recording media of each of the above examples, the coercive force He,
The results of measuring the residual magnetic flux density Br and squareness ratio (residual magnetic flux density Br/saturation magnetic flux density B) are shown in the table below.

ここで、従来例とは第1の下地層のみを省略し、他は各
実施例と全く同様に形成したものであるが、この表から
明らかなように、各実施例はいずれも従来f11に圧絞
して磁’il己!露体、Ll−て缶りめてすぐれた特性
を示している。すなわち、角形比Br/i1s ri大
きいほど出力電圧が高くまた記録や消去も容易になる。
Here, the conventional example is one in which only the first base layer is omitted, and the other parts are formed exactly the same as in each example, but as is clear from this table, each example is different from the conventional f11. Squeeze and magnetize yourself! It shows particularly excellent characteristics in both the exposure and the Ll-. That is, the larger the squareness ratio Br/i1s ri, the higher the output voltage and the easier recording and erasing.

さらに保磁力Heは、過大であると記録や消去が困難と
なるため大きければ大きいほど良いというもOではない
が、小さいと自己減磁が大きく、また外部磁界によって
記録が消滅する傾向にあシ、従来は上述したように過小
であった。
Furthermore, if the coercive force He is too large, recording and erasing will be difficult, so the larger the better, but if it is small, the self-demagnetization will be large and the recording will tend to be erased by an external magnetic field. , has conventionally been too small as mentioned above.

上述した各実施例において、ガラス基板1は、周知のガ
ラス研摩法によって平均表面粗さが30〜200大とな
るように仕上げたソーダライムガラス基板を用いた。こ
れは、従来一般に用いられている機械加工仕上げのAt
”fiたはAt合金基板に比較して素材そのものが安価
であるとともに、磁性層の腐食を防止するためにN1−
Pメッキ層や陽極酸化A’!O8層を形成するという工
程(その後で研摩法によシ平均表面粗さ200 X程度
に鏡面仕上げされる)を除くことができ、コスト低減に
大きく寄与する利点を有するが、本発明はこれに限定さ
れるものではなく、ソーダライムガラスの他、アルミノ
シリケートガラスなど各種の多成分系ガラスあるいは石
英ガラス等を用いてもよい。もちろん、従来より使用さ
れている上記Alt7’(はkA合金基板、あるいはポ
リエチレンテレフ・タレート基板、シリコン基板等の各
種非磁性支持体を用いることもできる。
In each of the embodiments described above, the glass substrate 1 used was a soda lime glass substrate finished by a well-known glass polishing method to have an average surface roughness of 30 to 200. This is a conventionally commonly used machined finished At
``The material itself is cheaper than Fi or At alloy substrates, and in order to prevent corrosion of the magnetic layer, N1-
P plating layer and anodic oxidation A'! The process of forming the O8 layer (which is then polished to a mirror finish with an average surface roughness of about 200X) can be omitted, which has the advantage of greatly contributing to cost reduction. The material is not limited to soda lime glass, and various multicomponent glasses such as aluminosilicate glass or quartz glass may be used. Of course, various nonmagnetic supports such as the Alt7'(kA alloy substrate), a polyethylene terephthalate substrate, a silicon substrate, etc., which have been used conventionally, may also be used.

また、第1の非磁性下地層としてのZr0y等の膜厚は
、高保磁力を得るためには300に以上であることが望
ましい。上限は特に限定されないが、5000A以上で
は保磁力の増加が飽和するため、実用上は5000X以
下とすることが望ましい。また成膜法は蒸着法に限定さ
れるものではなく、例えばイオンブレーティング法やス
パッタリング法等を利用してもよい。同様にCr膜の形
成方法もスパッタリング法に限定されるものではない。
Further, it is desirable that the film thickness of Zr0y or the like as the first non-magnetic underlayer be 300 mm or more in order to obtain a high coercive force. The upper limit is not particularly limited, but since the increase in coercive force is saturated at 5000A or more, it is practically desirable to set it to 5000X or less. Further, the film forming method is not limited to the vapor deposition method, and for example, an ion blasting method, a sputtering method, or the like may be used. Similarly, the method for forming the Cr film is not limited to the sputtering method.

また、磁性層も上述した実施例に限定されるものではな
く、特にCo−Ni合金の成分比を変えたものやco単
体、Co−N1K F*(”Ptなどを混合した合金、
Co −P tなど他のCo系合金についても同様に良
好な結果が得られる。
Furthermore, the magnetic layer is not limited to the above-mentioned embodiments, and may include one in which the component ratio of Co-Ni alloy is changed, single Co, Co-N1K F* ("alloy containing Pt etc.),
Similar good results can be obtained with other Co-based alloys such as Co-Pt.

さらに保護層としては、炭素薄膜の他にもCr/C複合
層、Sin、層、Cr / S i O@複合層、C〆
C/s t o、複合層、Cr /S > 0!/ C
複合層、5tO1/C複合層等も有効であった。
Furthermore, as a protective layer, in addition to the carbon thin film, Cr/C composite layer, Sin layer, Cr/SiO@composite layer, C〆C/sto, composite layer, Cr/S > 0! /C
Composite layers, 5tO1/C composite layers, etc. were also effective.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば、非磁性支持体と
、この支持体と磁性層との間に下地層として形成するク
ロム膜との間に、酸化ジルコニウム、フッ化マグネシウ
ム、酸化インジウムおよび酸化スズの少なくとも1種類
を主成分とする膜を介在させたことにより、Cr膜を膜
割れ等の生じない薄さに抑え、なおかつ従来Cr膜のみ
を用いた場合には得られなかったすぐれた磁気特性を得
ることができる。
As explained above, according to the present invention, zirconium oxide, magnesium fluoride, indium oxide, and By interposing a film containing at least one type of tin oxide as a main component, the Cr film can be kept thin enough to prevent film cracking, and it can also achieve excellent properties that could not be obtained by conventionally using only a Cr film. Magnetic properties can be obtained.

【図面の簡単な説明】[Brief explanation of drawings]

図は本発明の一実施例を示す断面図である。 1・・・優ソーダライムガラス基板(非磁性支持体)、
2・拳・・Z r O@膜、3・・・・Cr膜、4・・
・・Co−N1膜(磁性層)、5・拳拳−炭素薄膜(保
護膜)。
The figure is a sectional view showing one embodiment of the present invention. 1... Excellent soda lime glass substrate (non-magnetic support),
2. Fist... Z r O @ membrane, 3... Cr film, 4...
...Co-N1 film (magnetic layer), 5. Fist-carbon thin film (protective film).

Claims (1)

【特許請求の範囲】[Claims] 非磁性支持体上に、下地層、磁性層、保護層を順次積層
してなる磁気記録媒体において、下地層は、支持体と接
する側が酸化ジルコニウム、フッ化マグネシウム、酸化
インジウムおよび酸化スズの少なくとも1種類を主成分
とする膜からなりかつ磁性層と接する側がクロム膜から
なることを特徴とする磁気記録媒体。
In a magnetic recording medium formed by sequentially laminating an underlayer, a magnetic layer, and a protective layer on a nonmagnetic support, the underlayer has at least one of zirconium oxide, magnesium fluoride, indium oxide, and tin oxide on the side in contact with the support. 1. A magnetic recording medium characterized in that the main component is a chromium film, and the side in contact with the magnetic layer is a chromium film.
JP6194285A 1985-03-28 1985-03-28 Magnetic recording medium Granted JPS61222021A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6194285A JPS61222021A (en) 1985-03-28 1985-03-28 Magnetic recording medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6194285A JPS61222021A (en) 1985-03-28 1985-03-28 Magnetic recording medium

Publications (2)

Publication Number Publication Date
JPS61222021A true JPS61222021A (en) 1986-10-02
JPH0323967B2 JPH0323967B2 (en) 1991-04-02

Family

ID=13185744

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6194285A Granted JPS61222021A (en) 1985-03-28 1985-03-28 Magnetic recording medium

Country Status (1)

Country Link
JP (1) JPS61222021A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62293511A (en) * 1986-06-12 1987-12-21 Sumitomo Special Metals Co Ltd Magnetic recording medium
JPS63112819A (en) * 1986-10-28 1988-05-17 Nippon Sheet Glass Co Ltd Magnetic recording medium
JPS63175220A (en) * 1987-01-16 1988-07-19 Tdk Corp Magnetic recording medium
JPH03189922A (en) * 1989-10-05 1991-08-19 Internatl Business Mach Corp <Ibm> Magnetic memory medium and method of manufacturing the same
US5413873A (en) * 1991-04-26 1995-05-09 Victor Company Of Japan, Ltd. Magnetic recording medium having a glass or amorphous carbon substrate, vanadium or molybdenum precoat layer, chromium primer layer and cobalt magnetic layer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5634141A (en) * 1979-08-25 1981-04-06 Hitachi Maxell Ltd Magnetic recording medium

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5634141A (en) * 1979-08-25 1981-04-06 Hitachi Maxell Ltd Magnetic recording medium

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62293511A (en) * 1986-06-12 1987-12-21 Sumitomo Special Metals Co Ltd Magnetic recording medium
JPS63112819A (en) * 1986-10-28 1988-05-17 Nippon Sheet Glass Co Ltd Magnetic recording medium
JPS63175220A (en) * 1987-01-16 1988-07-19 Tdk Corp Magnetic recording medium
JPH03189922A (en) * 1989-10-05 1991-08-19 Internatl Business Mach Corp <Ibm> Magnetic memory medium and method of manufacturing the same
JPH0561685B2 (en) * 1989-10-05 1993-09-06 Ibm
US5413873A (en) * 1991-04-26 1995-05-09 Victor Company Of Japan, Ltd. Magnetic recording medium having a glass or amorphous carbon substrate, vanadium or molybdenum precoat layer, chromium primer layer and cobalt magnetic layer

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Publication number Publication date
JPH0323967B2 (en) 1991-04-02

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