JPS61202108A - Bending detector - Google Patents
Bending detectorInfo
- Publication number
- JPS61202108A JPS61202108A JP4527485A JP4527485A JPS61202108A JP S61202108 A JPS61202108 A JP S61202108A JP 4527485 A JP4527485 A JP 4527485A JP 4527485 A JP4527485 A JP 4527485A JP S61202108 A JPS61202108 A JP S61202108A
- Authority
- JP
- Japan
- Prior art keywords
- light
- measured
- emitting diodes
- light emitting
- mounting table
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、メリヤス針等の機械部品が真直かどうかを検
出する曲がり検出装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a bend detection device for detecting whether a mechanical component such as a stockinette needle is straight.
従来、メリヤス針の曲がり検出は、熟練者による目視検
査により行われていた。Conventionally, bending of stockinette needles has been detected by visual inspection by a skilled person.
しかしながら、従来のような目視検査では検査者によっ
て検査基準が異なり、基準値を数量化することが不可能
であるため、部品の品質の不均一が避けられないという
欠点がある。また、検査熟練者の不足や検査時間の短縮
化が困難であることが、被測定物であるメリヤス針等の
低価格化を妨げており、且つ品質の不均一により使用寿
命の向上も難しい現状にある。However, in conventional visual inspection, the inspection standards differ depending on the inspector and it is impossible to quantify the standard value, so there is a drawback that non-uniformity in the quality of parts is inevitable. In addition, the lack of skilled inspection personnel and the difficulty in shortening inspection time are hindering the reduction in prices of stockinette needles, which are the objects to be measured, and it is also difficult to improve the service life due to uneven quality. It is in.
〔問題点を解決するための具体的手段〕本発明は上記の
ような事情に鑑みなされたものであって、メリヤス針な
どの機械部品の曲がりの程度を、数量的に表すことが可
能な曲がり検出装置を提供することを目的とし、平滑な
載置面を有する被測定物載置台を設けると共に、この載
置台の前方に、光軸が平行な複数本の光線を発光する光
源を設け、載置台の後方に、この載置台と被測定物間の
間隙を通過する前記光線の光量を測定し且つこの光量を
数量化する測定部を設けたことを特徴とする曲がり検出
装置を要旨としている。[Specific Means for Solving the Problems] The present invention has been made in view of the above circumstances, and is a method of bending that can quantitatively express the degree of bending of machine parts such as stockinette needles. For the purpose of providing a detection device, an object to be measured is provided with a mounting table having a smooth mounting surface, and a light source that emits a plurality of light beams with parallel optical axes is provided in front of this mounting table. The gist of the present invention is a bending detection device characterized in that a measurement unit is provided at the rear of the mounting table to measure the amount of the light beam passing through the gap between the mounting table and the object to be measured and to quantify the amount of light.
本発明による曲がり検出装置は、平滑な載置面と被検出
物の間に生じる間隙に光軸が平行な複数本の光線を通し
、通過した光量により載置面と被検出物の間の間隙の度
合を検出している。The bending detection device according to the present invention passes a plurality of light beams whose optical axes are parallel to each other through a gap created between a smooth mounting surface and an object to be detected, and determines the gap between the mounting surface and the object depending on the amount of light that has passed through the gap. The degree of
以下、本発明を図示した実施例に基づいて詳細に説明す
る。Hereinafter, the present invention will be described in detail based on illustrated embodiments.
第1図は本発明装置を示す構成図、第2図は検出部の拡
大正面図、第3図は検出部の断面図、第4図は光線の照
射順序を示す表、第5図はCRT上に表示された検出例
を示す。Fig. 1 is a configuration diagram showing the device of the present invention, Fig. 2 is an enlarged front view of the detection section, Fig. 3 is a sectional view of the detection section, Fig. 4 is a table showing the order of irradiation of light beams, and Fig. 5 is a CRT. The detection example shown above is shown.
図において、lはステンレス製の被測定物載置台であっ
て、上面は平滑な載置面となっている。この載置台lの
後部には左右両端に載置したゲージ材2a、 2bの上
に遮蔽ブロック3を載せることによって形成されるゲー
ジ4が設けられている。尚、前記ゲージ4の高さは載置
台1上に置かれる被測定物Pの高さよりも低く形成され
る。In the figure, reference numeral 1 denotes a stainless steel object mounting table, and the upper surface thereof is a smooth mounting surface. A gauge 4 is provided at the rear of the mounting table l, which is formed by placing a shielding block 3 on gauge materials 2a and 2b placed on both left and right ends. Note that the height of the gauge 4 is formed to be lower than the height of the object to be measured P placed on the mounting table 1.
5は載置台1の前方に設けられた光源であって、この光
源5は、等間隔に並設され且つゲージ4に向かって光軸
が平行な光線を照射する複数の発光ダへオ−ドル1.八
Z + A 3’−八nからなる。発光ダイオード^1
〜八〇から発光される光線は、それぞれ第2図に一点鎖
線で示すような領域をカバーするものである。一方、載
置台lの後方には、前記発光ダイオード八、〜Anから
発光される光線の光軸に対応する位置に、フォトトラン
ジスタB+、Bz、Ba〜Bnを配置すると共に、この
フォトトランジスタ81〜Bnが測光した光量を数量変
換することのできるセンシング回路7を装備してなる測
定部6が設けられている。第2図及び第3図に示すよう
に、載置台lと被測定物Pの間には、被測定物Pの曲が
りによって間隙yが生じており、前記発光ダイオード^
1〜^nから発光された光線Xの内この間隙yを通過し
た光線Xのみが前記フォトトランジスタ81〜Bnに測
定されるようになっている。即ち、フォトトランジスタ
B、〜Bnに測定される光量は、発光ダイオードA1〜
Anから発光される光線が照射する位置における、測定
物Pと載置台1の間隙yの高さと比例するものとなって
いる。尚、このとき前記遮蔽ブロック3により、上方か
らの光線は遮蔽されている。Reference numeral 5 denotes a light source provided in front of the mounting table 1, and this light source 5 has an odor to a plurality of light emitting diodes arranged in parallel at equal intervals and emitting light beams whose optical axes are parallel to each other toward the gauge 4. 1. It consists of 8Z + A 3'-8n. light emitting diode ^1
The light rays emitted from 80 to 80 each cover an area as shown by the dashed-dotted line in FIG. On the other hand, behind the mounting table l, phototransistors B+, Bz, Ba to Bn are arranged at positions corresponding to the optical axes of the light beams emitted from the light emitting diodes 8 to An, and the phototransistors 81 to 81 to A measuring section 6 is provided which is equipped with a sensing circuit 7 capable of converting the quantity of light measured by Bn. As shown in FIGS. 2 and 3, a gap y is created between the mounting table l and the object to be measured P due to the bending of the object to be measured, and the light emitting diode ^
Of the light rays X emitted from 1 to ^n, only the light rays X that have passed through this gap y are measured by the phototransistors 81 to Bn. That is, the amount of light measured by the phototransistors B, ~Bn is the same as that of the light emitting diodes A1 ~
It is proportional to the height of the gap y between the measurement object P and the mounting table 1 at the position irradiated with the light beam emitted from An. Incidentally, at this time, the light rays from above are blocked by the shielding block 3.
前記発光ダイオード八、〜Anから照射される光線は光
軸が平行な光線であるが、これらを同時に照射すると発
光ダイオードA1〜Anもしくはフォトトランジスタ8
1〜Bnの指向性の関係上、対応するフォトトランジス
タ以外のフォトトランジスタにも感知される可能性があ
る。したがって、発光ダイオードA、〜Anの発光は時
間差をもって行うことが好ましく、このためにドライバ
回路8が設けられる。このドライバ回路8は、光源5を
構成する発光ダイオードA、〜Anをあらかじめ定めた
発光順序にしたがって発光させる回路である。例えば、
発光ダイオードA璽〜Anを32個で構成した場合には
、これを8個づつのグループに分け、これら8個の発光
ダイオードを第4図に示すように^1.八、l^3.八
s+As+A2+I’l++A4の順で時間差をもって
発光するようにする。The light beams emitted from the light emitting diodes 8 to An have parallel optical axes, but if they are emitted at the same time, the light emitting diodes A1 to An or the phototransistor 8
Due to the directivity of 1 to Bn, there is a possibility that it will be sensed by phototransistors other than the corresponding phototransistor. Therefore, it is preferable that the light emitting diodes A, -An emit light with a time difference, and the driver circuit 8 is provided for this purpose. This driver circuit 8 is a circuit that causes the light emitting diodes A, -An constituting the light source 5 to emit light according to a predetermined light emission order. for example,
When 32 light emitting diodes A to An are constructed, they are divided into groups of 8 and these 8 light emitting diodes are arranged as shown in FIG. Eight, l^3. Light is emitted in the order of 8s+As+A2+I'l++A4 with a time difference.
前記センシング回路7は、フォトトランジスタB、〜B
nが感知した光線をその光量に基づいたアナログ電圧値
に変換し、更にA/D変換してディジタル信号として出
力している他、フォトトランジスタB、−Bnによる測
光を前記発光ダイオード^1〜Anの発光順序に合わせ
て行い、発光してしない発光ダイオードに対応するフォ
トトランジスタは測光を行わないようにしている。The sensing circuit 7 includes phototransistors B, ~B
In addition to converting the light beam detected by n into an analog voltage value based on the amount of light, and further A/D converting it and outputting it as a digital signal, photometry by phototransistors B and -Bn is performed by the light emitting diodes ^1 to An. photometry is performed in accordance with the order of light emission, and photometry is not performed on phototransistors corresponding to light emitting diodes that do not emit light.
前記センシング回路7から出力されたディジタル信号は
マイクロコンピュータ9に取り入れられ、CRTIOの
画面上に第5図に示すような棒グラフとして表示される
。第5図のグラフにおいて、各棒はフォトトランジスタ
B、〜Bnが測定した光量、即ち、発光ダイオードA、
〜An及びフォトトランジスタB、〜Bnに対応する位
置における、被測定物Pとili置台1の間隙の度合を
表している。The digital signal output from the sensing circuit 7 is taken into the microcomputer 9 and displayed on the screen of the CRTIO as a bar graph as shown in FIG. In the graph of FIG. 5, each bar represents the amount of light measured by phototransistors B, ~Bn, i.e., light emitting diodes A,
It represents the degree of the gap between the object to be measured P and the ili mounting table 1 at the positions corresponding to ~An and the phototransistors B and ~Bn.
尚、本発明による曲がり検出装置は上記実施例に限定さ
れず、光源の本数等は必要に応じて変更できるものであ
る。また、発光ダイオードもしくはフォトトランジスタ
等の光源や測定部の指向性が理想的なものであれば、必
ずしも発光や測光を時間差をもって行う必要はない。Note that the bend detection device according to the present invention is not limited to the above embodiment, and the number of light sources, etc. can be changed as necessary. Further, if the light source such as a light emitting diode or phototransistor and the measurement unit have ideal directivity, it is not necessarily necessary to perform light emission and photometry with a time difference.
以上の説明から明らかなように、本発明による曲がり検
出装置によれば、平滑な載置面を設け、この載置面と被
測定物の間に生じる間隙を通過する光量を測定すること
によって被測定物の曲がりを検出しているから、人によ
る目視検査と比べ、検出精度が極めて高く且つ均一的に
なるという効果を奏する。また、光量を測定することに
より、曲がりを検出しているから、曲がりの度合を数量
化することが可能となり、品質の均一化を図ることがこ
とができるという効果も奏する。さらに、熟練者による
目視の測定と比べて検査時間の短縮化を果たすことがで
き、被測定物のコストダウンにも寄与することができる
。As is clear from the above description, according to the bending detection device according to the present invention, a smooth mounting surface is provided and the amount of light passing through the gap created between the mounting surface and the object to be measured is measured. Since the bending of the object to be measured is detected, the detection accuracy is extremely high and uniform compared to human visual inspection. Furthermore, since the bending is detected by measuring the amount of light, it is possible to quantify the degree of bending, and it is also possible to achieve uniform quality. Furthermore, compared to visual measurement by a skilled person, the inspection time can be shortened and the cost of the object to be measured can be reduced.
第1図は本発明装置を示す構成図、第2図は検出部の拡
大正面図、第3図は検出部の断面図、第4図は光線の照
射順序を示す表、第5図はCRT上に表示された検出例
を示す。
1−載 置 台 5−光 源6−測 定
部
第4図
r^
第5図
速球り定腰め位置Fig. 1 is a configuration diagram showing the device of the present invention, Fig. 2 is an enlarged front view of the detection section, Fig. 3 is a sectional view of the detection section, Fig. 4 is a table showing the order of irradiation of light beams, and Fig. 5 is a CRT. The detection example shown above is shown. 1- Mounting stand 5- Light source 6- Measurement part Fig. 4 r^ Fig. 5 Fastball fixed waist position
Claims (3)
共に、この載置台の前方に、光軸が平行な複数本の光線
を発光する光源を設け、載置台の後方に、この載置台と
被測定物間の間隙を通過する前記光線の光量を測定し且
つこの光量を数量化する測定部を設けたことを特徴とす
る曲がり検出装置。(1) A workpiece mounting table with a smooth mounting surface is provided, a light source that emits multiple light beams with parallel optical axes is provided in front of this mounting table, and a A bending detection device comprising a measuring section that measures the amount of the light beam passing through the gap between the mounting table and the object to be measured and quantifies the amount of light.
定物の高さよりも低いゲージを設けたことを特徴とする
特許請求の範囲第1項記載の曲がり検出装置。(2) The bending detection device according to claim 1, characterized in that a gauge lower than the height of the object to be measured on the mounting table is provided between the object to be measured mounting section and the measuring section.
って行うようにしたことを特徴とする特許請求の範囲第
1項及び第2項記載の曲がり検出装置。(3) The bending detection device according to claims 1 and 2, wherein the light emission and measurement of each light beam whose optical axes are parallel are performed with a time difference.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4527485A JPS61202108A (en) | 1985-03-06 | 1985-03-06 | Bending detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4527485A JPS61202108A (en) | 1985-03-06 | 1985-03-06 | Bending detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61202108A true JPS61202108A (en) | 1986-09-06 |
JPH0349362B2 JPH0349362B2 (en) | 1991-07-29 |
Family
ID=12714730
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4527485A Granted JPS61202108A (en) | 1985-03-06 | 1985-03-06 | Bending detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61202108A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010185710A (en) * | 2009-02-10 | 2010-08-26 | Kenek Co Ltd | Optical displacement meter |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5681417A (en) * | 1979-12-06 | 1981-07-03 | Sumitomo Metal Ind Ltd | Inspecting device for shape of columnar body |
-
1985
- 1985-03-06 JP JP4527485A patent/JPS61202108A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5681417A (en) * | 1979-12-06 | 1981-07-03 | Sumitomo Metal Ind Ltd | Inspecting device for shape of columnar body |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010185710A (en) * | 2009-02-10 | 2010-08-26 | Kenek Co Ltd | Optical displacement meter |
Also Published As
Publication number | Publication date |
---|---|
JPH0349362B2 (en) | 1991-07-29 |
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