JPS6080656U - electron beam equipment - Google Patents

electron beam equipment

Info

Publication number
JPS6080656U
JPS6080656U JP17271583U JP17271583U JPS6080656U JP S6080656 U JPS6080656 U JP S6080656U JP 17271583 U JP17271583 U JP 17271583U JP 17271583 U JP17271583 U JP 17271583U JP S6080656 U JPS6080656 U JP S6080656U
Authority
JP
Japan
Prior art keywords
electron
electron beam
lens
excitation
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17271583U
Other languages
Japanese (ja)
Other versions
JPH0228601Y2 (en
Inventor
節雄 則岡
Original Assignee
日本電子株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子株式会社 filed Critical 日本電子株式会社
Priority to JP17271583U priority Critical patent/JPS6080656U/en
Publication of JPS6080656U publication Critical patent/JPS6080656U/en
Application granted granted Critical
Publication of JPH0228601Y2 publication Critical patent/JPH0228601Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Electron Sources, Ion Sources (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はレンズ電流の正逆切換えに伴うヨーク内磁束密
度のヒステリシス特性を示すための図、第2図は本考案
の一実施例を示すための図、第3図は第2図に示した一
実施例装置の各回路よりの出力信号を例示するための図
である。 1:電子銃、2:集束レンズ、3:対物レンズ、4:試
料、5:偏向コイル、6:走査信号発生回路、7:陰極
線管、8:二次電子検出器、9:励磁゛電源、10,1
2:スイッチ回路、11:補助信号発生回路、13:励
磁電流調節回路、14,16:切換信号発生回路、15
,17:オンオフスイッチ。
Figure 1 is a diagram showing the hysteresis characteristics of the magnetic flux density in the yoke due to forward/reverse switching of the lens current, Figure 2 is a diagram showing an embodiment of the present invention, and Figure 3 is shown in Figure 2. FIG. 7 is a diagram illustrating output signals from each circuit of the device according to the embodiment. 1: Electron gun, 2: Focusing lens, 3: Objective lens, 4: Sample, 5: Deflection coil, 6: Scanning signal generation circuit, 7: Cathode ray tube, 8: Secondary electron detector, 9: Excitation power supply, 10,1
2: Switch circuit, 11: Auxiliary signal generation circuit, 13: Excitation current adjustment circuit, 14, 16: Switching signal generation circuit, 15
, 17: On-off switch.

Claims (3)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)電子銃よりの電子線を細く絞って試料に照射する
ための複数段の電子レンズより成るレンズ系と、該レン
ズ系によって絞られた電子線を二次元的に走査するため
の走査手段と、該走査に同期して走査され検出信号の供
給に基づいて試料像を表示するための表示装置と、前記
複数段の電子レンズ間相互の軸を合わせるための手段と
、該軸合わせに際して励磁電源から電子レンズに供給す
る電流の向きを正逆切換えるための極性反転手段とを備
えた装置において、該励磁電源は該対物レンズの焦点を
合わせるために任意の励磁電流を供給するための第1の
電源と1、電子レンズの励磁履歴を同一にするための一
定の励磁電流を発生する補助用の第2の電源とから成り
、前記電子レンズを該第1、第2の電源間で切換接続す
るための手段を具備していることを特徴とする電子線装
置。
(1) A lens system consisting of a plurality of stages of electron lenses to narrow down the electron beam from the electron gun and irradiate the sample, and a scanning means to two-dimensionally scan the electron beam narrowed by the lens system. a display device that scans in synchronization with the scanning and displays a sample image based on the supply of a detection signal; a means for aligning the axes of the plurality of electron lenses; and excitation during the alignment. In the device, the excitation power supply has a polarity reversing means for switching the direction of the current supplied from the power supply to the electron lens, and the excitation power supply has a first polarity reversal means for supplying an arbitrary excitation current to focus the objective lens. and (1) an auxiliary second power source that generates a constant excitation current to make the excitation history of the electronic lens the same, and the electronic lens is switchably connected between the first and second power sources. An electron beam device characterized by comprising means for.
(2)前記極性反転手段による極性の反転に伴なって、
自動的に該電子レンズを該第2の電源に一定時間接続し
た後、該第1の電源に接続するための手段を具備する実
用新案登録請求の範囲第(1)項記載の電子線装置。
(2) Along with the polarity reversal by the polarity reversing means,
The electron beam apparatus according to claim (1) of the utility model registration, comprising means for automatically connecting the electron lens to the second power source for a certain period of time and then connecting it to the first power source.
(3)該極性反転手段を周期的に作動させるための手段
を具備する実用新案登録請求の範囲第(1)項記載の電
子線装置。
(3) The electron beam apparatus according to claim (1), which is provided with means for periodically operating the polarity reversing means.
JP17271583U 1983-11-08 1983-11-08 electron beam equipment Granted JPS6080656U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17271583U JPS6080656U (en) 1983-11-08 1983-11-08 electron beam equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17271583U JPS6080656U (en) 1983-11-08 1983-11-08 electron beam equipment

Publications (2)

Publication Number Publication Date
JPS6080656U true JPS6080656U (en) 1985-06-04
JPH0228601Y2 JPH0228601Y2 (en) 1990-07-31

Family

ID=30376418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17271583U Granted JPS6080656U (en) 1983-11-08 1983-11-08 electron beam equipment

Country Status (1)

Country Link
JP (1) JPS6080656U (en)

Also Published As

Publication number Publication date
JPH0228601Y2 (en) 1990-07-31

Similar Documents

Publication Publication Date Title
US3585382A (en) Stereo-scanning electron microscope
JPS6080656U (en) electron beam equipment
JPH10293552A (en) Automatic convergent circuit for monitor
JPS551186A (en) Electron beam exposure apparatus
JPS633256Y2 (en)
JP3234373B2 (en) Magnetic field type electron lens and electron beam device using the same
JPS5853468B2 (en) scanning electron microscope
JPS5810818B2 (en) electromagnetic lens device
JPS6314810B2 (en)
JPH0227492Y2 (en)
JPH077647B2 (en) electronic microscope
JP3335809B2 (en) electronic microscope
JPS5917496B2 (en) Focusing method and device for scanning electron microscope, etc.
JPS6237123Y2 (en)
JPH0425803Y2 (en)
JPH059808Y2 (en)
JPH0139393Y2 (en)
JPS577058A (en) Focus monitoring method for scan electron microscope
JPS5669760A (en) Scanning electronic microscope
JPS60105055U (en) electronic microscope
JPS61135457U (en)
JPS56130065A (en) Scanning electron microscope
JPS59134366U (en) scanning electron microscope
JPS59138162U (en) scanning electron microscope
JPS6033750U (en) Alignment device for electron microscope