JPS6066049U - C−mos型電界効果トランジスタ - Google Patents

C−mos型電界効果トランジスタ

Info

Publication number
JPS6066049U
JPS6066049U JP1983157615U JP15761583U JPS6066049U JP S6066049 U JPS6066049 U JP S6066049U JP 1983157615 U JP1983157615 U JP 1983157615U JP 15761583 U JP15761583 U JP 15761583U JP S6066049 U JPS6066049 U JP S6066049U
Authority
JP
Japan
Prior art keywords
channel transistor
field effect
effect transistor
gate electrode
mos field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1983157615U
Other languages
English (en)
Inventor
松田 公平
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP1983157615U priority Critical patent/JPS6066049U/ja
Priority to US06/659,789 priority patent/US4617482A/en
Publication of JPS6066049U publication Critical patent/JPS6066049U/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003Modifications for increasing the reliability for protection
    • H03K19/00315Modifications for increasing the reliability for protection in field-effect transistor circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/081Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
    • H03K17/0812Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit
    • H03K17/08122Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【図面の簡単な説明】
第1図は従来の入力保護回路を示す等価回路、第2図は
本考案の一実施例を示す等価回路図である。 1・・・・・・Pチャンネル電界効果トランジスタ、2
・・・・・・Nチャンネル電界効果トランジスタ、3・
・・・・・保護回路、4,41.42・・・・・・保護
抵抗、5゜6、・・・・・・保護ダイオード、7・・・
・・・入力端子。

Claims (1)

    【実用新案登録請求の範囲】
  1. Pチャンネルトラン・ジスタのゲート電極から該Pチャ
    ンネルトランジスタの基板に電流を流す第1のダイオー
    ドと、前記Pチャンネルトランジスタのゲート電極と入
    力端子間に接続された第1の一保護抵抗と、Nチャンネ
    ルトランジスタの基板から該Nチャンネルトランジスタ
    のゲート電極に電流を流す第2のダイオードと、前記N
    チャンネルトランジスタのゲート電極と前記入力端子間
    に接続された第2の保護抵抗とを含むことを特徴とする
    C−MO5型電界効果トランジスタ。
JP1983157615U 1983-10-12 1983-10-12 C−mos型電界効果トランジスタ Pending JPS6066049U (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1983157615U JPS6066049U (ja) 1983-10-12 1983-10-12 C−mos型電界効果トランジスタ
US06/659,789 US4617482A (en) 1983-10-12 1984-10-11 Complementary type MOS field-effect transistor circuit provided with a gate protection structure of small time constant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1983157615U JPS6066049U (ja) 1983-10-12 1983-10-12 C−mos型電界効果トランジスタ

Publications (1)

Publication Number Publication Date
JPS6066049U true JPS6066049U (ja) 1985-05-10

Family

ID=15653597

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1983157615U Pending JPS6066049U (ja) 1983-10-12 1983-10-12 C−mos型電界効果トランジスタ

Country Status (2)

Country Link
US (1) US4617482A (ja)
JP (1) JPS6066049U (ja)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0821632B2 (ja) * 1987-01-10 1996-03-04 三菱電機株式会社 半導体集積回路
US4736271A (en) * 1987-06-23 1988-04-05 Signetics Corporation Protection device utilizing one or more subsurface diodes and associated method of manufacture
US5196913A (en) * 1988-07-11 1993-03-23 Samsung Electronics Co., Ltd. Input protection device for improving of delay time on input stage in semi-conductor devices
US4890143A (en) * 1988-07-28 1989-12-26 General Electric Company Protective clamp for MOS gated devices
US4916572A (en) * 1989-02-27 1990-04-10 Teledyne Industries, Inc. Circuitry for protecting against load voltage transients in solid state relay circuits
US4924344A (en) * 1989-02-27 1990-05-08 Teledyne Industries, Inc. Circuitry for protection against electromotively-induced voltage transients in solid state relay circuits
US4931778A (en) * 1989-02-27 1990-06-05 Teledyne Industries, Inc. Circuitry for indicating the presence of an overload or short circuit in solid state relay circuits
US5032742A (en) * 1989-07-28 1991-07-16 Dallas Semiconductor Corporation ESD circuit for input which exceeds power supplies in normal operation
JPH0734476B2 (ja) * 1989-10-23 1995-04-12 三菱電機株式会社 半導体集積回路
WO1993000739A1 (en) * 1991-06-21 1993-01-07 Citizen Watch Co., Ltd. Capacitive load driving circuit
JP3080830B2 (ja) * 1994-02-28 2000-08-28 株式会社東芝 半導体集積回路
JPH088391A (ja) * 1994-06-17 1996-01-12 Mitsubishi Electric Corp 半導体回路
JP2780661B2 (ja) * 1995-03-04 1998-07-30 日本電気株式会社 半導体装置
US5565367A (en) * 1995-03-24 1996-10-15 Hualon Micro Electronic Corporation Protective device for an integrated circit and manufacturing method thereof
JP2904071B2 (ja) * 1995-10-04 1999-06-14 日本電気株式会社 半導体装置
US5674761A (en) * 1996-05-02 1997-10-07 Etron Technology, Inc. Method of making ESD protection device structure for low supply voltage applications
JPH1196761A (ja) * 1997-09-25 1999-04-09 Oki Micro Design Miyazaki Co Ltd 半導体集積回路装置
US20020060343A1 (en) * 1999-03-19 2002-05-23 Robert J. Gauthier Diffusion resistor/capacitor (drc) non-aligned mosfet structure
TWI280743B (en) * 2002-06-03 2007-05-01 Via Tech Inc Inverter circuit structure
US7528017B2 (en) * 2005-12-07 2009-05-05 Kovio, Inc. Method of manufacturing complementary diodes
US10411006B2 (en) * 2016-05-09 2019-09-10 Infineon Technologies Ag Poly silicon based interface protection
US10854596B2 (en) * 2018-11-29 2020-12-01 Berex, Inc. CMOS RF power limiter and ESD protection circuits
JP2020161974A (ja) * 2019-03-26 2020-10-01 株式会社ダイヘン Pinダイオードの駆動回路及び閾値決定方法
EP3944316A1 (en) * 2020-07-21 2022-01-26 Nexperia B.V. An electrostatic discharge protection semiconductor structure and a method of manufacture

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3967295A (en) * 1975-04-03 1976-06-29 Rca Corporation Input transient protection for integrated circuit element
JPS5737876A (en) * 1980-08-20 1982-03-02 Hitachi Ltd Semiconductor integrated circuit apparatus
JPS57109375A (en) * 1980-12-26 1982-07-07 Fujitsu Ltd Mis type transistor protection circuit

Also Published As

Publication number Publication date
US4617482A (en) 1986-10-14

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