JPS6064272U - semiconductor test jig - Google Patents

semiconductor test jig

Info

Publication number
JPS6064272U
JPS6064272U JP15574683U JP15574683U JPS6064272U JP S6064272 U JPS6064272 U JP S6064272U JP 15574683 U JP15574683 U JP 15574683U JP 15574683 U JP15574683 U JP 15574683U JP S6064272 U JPS6064272 U JP S6064272U
Authority
JP
Japan
Prior art keywords
test jig
semiconductor test
utility
heat sink
attached
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15574683U
Other languages
Japanese (ja)
Inventor
八鍬　範正
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP15574683U priority Critical patent/JPS6064272U/en
Publication of JPS6064272U publication Critical patent/JPS6064272U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は従来の半導体試験治具の外観図、第２図は本考
案の一実施例による半導体試験治具の外観図を示す。 １・・・・・・リード型被試験物、２・・・・・・カソ
ード端子押え板、３・・・・・・アノード端子押え板、
４・・・・・・カソード側放熱用ラジェータ、５・・・
・・・アノード側放熱用ラジェータ。FIG. 1 shows an external view of a conventional semiconductor test jig, and FIG. 2 shows an external view of a semiconductor test jig according to an embodiment of the present invention. 1... Lead type test object, 2... Cathode terminal holding plate, 3... Anode terminal holding plate,
4...Cathode side heat dissipation radiator, 5...
...Radiator for heat dissipation on the anode side.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] リード型半導体素子のリード線接続部に放熱板を取り付
けたことを特徴とする半導体試験治具。A semiconductor test jig characterized in that a heat sink is attached to the lead wire connection portion of a lead type semiconductor element.
JP15574683U 1983-10-07 1983-10-07 semiconductor test jig Pending JPS6064272U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15574683U JPS6064272U (en) 1983-10-07 1983-10-07 semiconductor test jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15574683U JPS6064272U (en) 1983-10-07 1983-10-07 semiconductor test jig

Publications (1)

Publication Number Publication Date
JPS6064272U true JPS6064272U (en) 1985-05-07

Family

ID=30343882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15574683U Pending JPS6064272U (en) 1983-10-07 1983-10-07 semiconductor test jig

Country Status (1)

Country Link
JP (1) JPS6064272U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015531987A (en) * 2013-09-30 2015-11-05 エルジー・ケム・リミテッド Test jig
US9207153B2 (en) 2013-09-30 2015-12-08 Lg Chem, Ltd. Test jig

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015531987A (en) * 2013-09-30 2015-11-05 エルジー・ケム・リミテッド Test jig
US9207153B2 (en) 2013-09-30 2015-12-08 Lg Chem, Ltd. Test jig

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