JPS5970928A - Multi-wavelength spectrophotometer - Google Patents
Multi-wavelength spectrophotometerInfo
- Publication number
- JPS5970928A JPS5970928A JP17975182A JP17975182A JPS5970928A JP S5970928 A JPS5970928 A JP S5970928A JP 17975182 A JP17975182 A JP 17975182A JP 17975182 A JP17975182 A JP 17975182A JP S5970928 A JPS5970928 A JP S5970928A
- Authority
- JP
- Japan
- Prior art keywords
- diffraction grating
- photodiode array
- concave
- normal
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000001681 protective effect Effects 0.000 abstract description 5
- 238000004611 spectroscopical analysis Methods 0.000 abstract description 3
- 238000004458 analytical method Methods 0.000 abstract description 2
- 238000005530 etching Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 241001507928 Aria Species 0.000 description 1
- 235000004494 Sorbus aria Nutrition 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
この発明は、回折格子と７オトダイオードアレイとを備
えた多波長分光光度計に関する。TECHNICAL FIELD OF THE INVENTION This invention relates to a multiwavelength spectrophotometer with a diffraction grating and a seven-otodiode array.
従来、第１図に示すように、多波長分光光度計４は凹面
回折格子２とこｎに対向配置さｎると共に複数の受光素
子を同一平面上に配列してなるフォトダイオードアレイ
１とを備え、入射スリット６を通過して来た白色ビーム
光を凹面回折格子２で分光し、得らｎる単色：）ｔ、１
フオトダイオードに照射するように信成さｎていた。Conventionally, as shown in FIG. 1, a multi-wavelength spectrophotometer 4 includes a concave diffraction grating 2 and a photodiode array 1 disposed opposite thereto, and a photodiode array 1 having a plurality of light receiving elements arranged on the same plane. , the white beam light that has passed through the entrance slit 6 is separated by the concave diffraction grating 2, and the monochromatic light obtained is n:)t,1
Nobunari was trying to irradiate the photodiode.
しかしながら、前記構成の多波長分光光度計には次のよ
うな問題点がある。すなわち、フォトダイオードアレイ
１中の特定の受光素子に照射さｒしるべき単色光の一部
が、その受光素子の前面に配置さｎた透明保護部材の表
面で反射して凹面回折格子２に戻り、そして、回折格子
２で反射した後前記フォトダイオードアレイ１中の他の
受光素子に到達するという、所謂多重反射が起こる。こ
の多重反射は、フォトダイオードアレイ１における迷光
の原因となり、フォトダイオードアレイ１による正確な
分光分析が阻害さ１１ていた。However, the multi-wavelength spectrophotometer having the above configuration has the following problems. That is, a part of the monochromatic light that should be irradiated onto a specific light receiving element in the photodiode array 1 is reflected by the surface of the transparent protective member placed in front of the light receiving element and is reflected onto the concave diffraction grating 2. Then, after being reflected by the diffraction grating 2, the light reaches another light receiving element in the photodiode array 1, which is a so-called multiple reflection. This multiple reflection causes stray light in the photodiode array 1, which obstructs accurate spectral analysis by the photodiode array 111.
この発明は前記事情に鑑みてなさｎたものであり、多重
反射を防止して正確に分光分析することのできる多波長
分光光度計を提供することを目的とするものである。The present invention was made in view of the above circumstances, and an object of the present invention is to provide a multi-wavelength spectrophotometer that can prevent multiple reflections and perform accurate spectroscopic analysis.
前記目的全達成するためのこの発明の概要は、回折格子
と、前記回折格子で分光さｎた単色光を受光する複数の
受光素子を配列したフォトダイオードアレイとを備えた
多波要分ｉ元度計において、回折格子とンオトダイオー
ドアレイと全相対的に傾斜して配置ｉ／ｊしｓ ｒ７ｉ
Ｊ記回折格子と前記フォトダイオードアレイとによる多
重反ｉｔ防止したことを特徴とするものである。The outline of the present invention for achieving all of the above objects is to provide a multi-wave element i-element comprising a diffraction grating and a photodiode array in which a plurality of light-receiving elements are arranged to receive monochromatic light separated by the diffraction grating. In a diode meter, the diffraction grating and the photodiode array are arranged at an angle relative to each other.
The present invention is characterized in that multiple reflections are prevented by the J diffraction grating and the photodiode array.
第２図はこの発明の一実施例を示す説明図である。 FIG. 2 is an explanatory diagram showing an embodiment of the present invention.
同図に示すように、この発明の一実施例である多波長分
光光度ｉｔは、凹状反則面に多数の線条痕全刻設してな
る回折格子１２と前記回折格子１２で分光さ１ｔた単色
′ｙｔ、′ｆ：受光する複数の受光素子を同一平面に配
列したフォトダイオードアレイ１０とを具備し、回折格
子１２の凹面中心Ｏにおける凹面の法？８Ａとフォトダ
イオードアレイ１０の法線Ｂとを所定角度０で交差する
ように前記回折格子１２とフォトダイオードアレイ１０
とを配置して構成さｎる。前記構成においては、ある基
準勝ＣＫ対して回折格子１２の凹面中心Ｏにおける法線
Ａが平行となるように回折格子１２を配置し、次いで前
記法線Ａと法線Ｂとが交差するようにフォトダイオード
アレイ１ｏｆｆ：傾斜させて配置するものである。才た
、前記角度θは、凹面回折格子１２で分光さｔした単色
光が７オトダイオードアレイ１０の透明保護部材の表面
で一部反射したとしても、その一部反射光が前記回折格
子１２の凹面金外１しるように設定さ几る。ｍＩ記角度
θは、回折格子１２０種類、性能により適宜実験的に決
定することができる。As shown in the figure, the multi-wavelength spectrophotometer IT, which is an embodiment of the present invention, uses a diffraction grating 12 formed by engraving a large number of line marks on a concave irregular surface and the diffraction grating 12. Monochromatic 'yt,'f: comprises a photodiode array 10 in which a plurality of light-receiving elements are arranged on the same plane, and the concave center ? 8A and the normal line B of the photodiode array 10 intersect at a predetermined angle of 0.
It is configured by arranging and. In the above configuration, the diffraction grating 12 is arranged so that the normal A at the center O of the concave surface of the diffraction grating 12 is parallel to a certain reference value CK, and then the normal A and the normal B intersect with each other. Photodiode array 1off: Arranged at an angle. The angle θ is such that even if the monochromatic light separated by the concave diffraction grating 12 is partially reflected by the surface of the transparent protective member of the seven-dimensional diode array 10, the partially reflected light is reflected by the diffraction grating 12. It is set so that the concave metal outside is 1. The mI angle θ can be appropriately determined experimentally depending on the 120 types of diffraction gratings and their performance.
以上構成を有−ｉ−る多波長分光光度計は、凹面回折格
子１２で分光さ几た単色光がフォトダイオードアレイ１
０の透明保護部材の表面で一部反射したとしても、その
一部反荊元が前記回折格子１２の凹面に到遅しないので
、多重反射を有効に防止することができ、迷光による不
正確な分ｙＣ分析をしなくて済む。In the multi-wavelength spectrophotometer having the above configuration, monochromatic light separated by a concave diffraction grating 12 is transmitted to a photodiode array 1.
Even if a portion of the light is reflected by the surface of the transparent protective member 12, the source of the reflection does not reach the concave surface of the diffraction grating 12, so multiple reflections can be effectively prevented and inaccurate light caused by stray light can be prevented. There is no need to perform a minute yC analysis.
以上、この発明の一実施例について説明したが。An embodiment of the present invention has been described above.
この発明は前記実施例に限定さｎるものではなく、この
発明の要旨を変更しない範囲内で適宜に変形して実施す
ることができるのはいうまでもない。It goes without saying that this invention is not limited to the embodiments described above, and can be implemented with appropriate modifications within the scope of the gist of the invention.
変形例として、たとえば第６図に示すように、ある基準
線Ｃに対してフォトダイオードアレイ１００法ｍＢが平
行となるように７オトダイオードアレイ１０を配置し、
次いで前記法線Ｂと凹面回折格子１２の凹面中心Ｏにお
ける法ｇＡとが所定角度θで交差するように、凹面回折
格子１２を傾斜させて配置してなる多波長分光ｉ度計が
挙げら几る。As a modification, for example, as shown in FIG. 6, seven photodiode arrays 10 are arranged so that the photodiode array 100 mB is parallel to a certain reference line C,
Next, a multi-wavelength spectrometer is mentioned in which the concave diffraction grating 12 is arranged at an angle so that the normal B and the normal gA at the concave center O of the concave diffraction grating 12 intersect at a predetermined angle θ. Ru.
この発明によると、回折格子で分光さ７″した単色光が
７オトダイオードアレイの受光素子前面に装着さ′ｆ′
した透明保護部材の表面で一部反射゛したとしても、有
効に多重反射を防止して、正確な分光分析可能な多波長
分光光度計全提供することができる。According to this invention, monochromatic light separated by 7" by a diffraction grating is attached to the front surface of a light-receiving element of a 7-otodiode array 'f'
Even if some reflection occurs on the surface of the transparent protective member, multiple reflections can be effectively prevented and a multi-wavelength spectrophotometer capable of accurate spectroscopic analysis can be provided.
ｉ１１図は従来の多波長分光光度計を示す説明図、第２
図はこの発明の一実施例を示す説５明図および第６崗は
この発明の他の実施例を示′１″説明図である。
１０・−フォトダイオードアレイ、 １２・・・回折
格子。Figure i11 is an explanatory diagram showing a conventional multi-wavelength spectrophotometer.
Figure 5 is an explanatory diagram showing one embodiment of the present invention, and Figure 6 is an explanatory diagram showing another embodiment of the invention. 10.-Photodiode array, 12.. Diffraction grating.
Claims (1)
る複数の受光素子を配列したフォトダイオードアレイと
を備えた多波長分光光度計において、回折格子とフォト
ダイオードアレイとを相対的に傾斜して配置し、前記回
折格子と前記フォトダイオードアレイとによる多重反射
を防止したことを特徴とする多波長分光光度計。In a multi-wavelength spectrophotometer comprising a diffraction grating and a photodiode array in which a plurality of light receiving elements are arranged to receive monochromatic light separated by the diffraction grating, the diffraction grating and the photodiode array are relatively tilted. A multi-wavelength spectrophotometer, characterized in that the diffraction grating and the photodiode array are arranged to prevent multiple reflections from occurring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17975182A JPS5970928A (en) | 1982-10-15 | 1982-10-15 | Multi-wavelength spectrophotometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17975182A JPS5970928A (en) | 1982-10-15 | 1982-10-15 | Multi-wavelength spectrophotometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5970928A true JPS5970928A (en) | 1984-04-21 |
Family
ID=16071233
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17975182A Pending JPS5970928A (en) | 1982-10-15 | 1982-10-15 | Multi-wavelength spectrophotometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5970928A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6140520A (en) * | 1984-06-13 | 1986-02-26 | アボツト ラボラトリ−ズ | Spectrophotometer |
| JPS6237727U (en) * | 1985-08-26 | 1987-03-06 | ||
| JP2008051822A (en) * | 2007-10-09 | 2008-03-06 | Toshiba Corp | Chemical analyzer |
| JP2008175311A (en) * | 2007-01-19 | 2008-07-31 | Jtekt Corp | Retainer for rolling bearing |
| JP2008309259A (en) * | 2007-06-15 | 2008-12-25 | Nsk Ltd | Rolling bearing |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5036369A (en) * | 1973-06-19 | 1975-04-05 |
-
1982
- 1982-10-15 JP JP17975182A patent/JPS5970928A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5036369A (en) * | 1973-06-19 | 1975-04-05 |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6140520A (en) * | 1984-06-13 | 1986-02-26 | アボツト ラボラトリ−ズ | Spectrophotometer |
| JPS6237727U (en) * | 1985-08-26 | 1987-03-06 | ||
| JP2008175311A (en) * | 2007-01-19 | 2008-07-31 | Jtekt Corp | Retainer for rolling bearing |
| JP2008309259A (en) * | 2007-06-15 | 2008-12-25 | Nsk Ltd | Rolling bearing |
| JP2008051822A (en) * | 2007-10-09 | 2008-03-06 | Toshiba Corp | Chemical analyzer |
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