JPS5931723B2 - input/output device - Google Patents
input/output deviceInfo
- Publication number
- JPS5931723B2 JPS5931723B2 JP52090452A JP9045277A JPS5931723B2 JP S5931723 B2 JPS5931723 B2 JP S5931723B2 JP 52090452 A JP52090452 A JP 52090452A JP 9045277 A JP9045277 A JP 9045277A JP S5931723 B2 JPS5931723 B2 JP S5931723B2
- Authority
- JP
- Japan
- Prior art keywords
- switch
- state
- output
- phototransistor
- controlled object
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing And Monitoring For Control Systems (AREA)
- Electronic Switches (AREA)
Description
【発明の詳細な説明】
本発明は電力系統や産業用プラント等のプロセス制御を
行なう際に、制御対象と制御装置間の絶縁耐圧をとつた
り、外来雑音を防止する為に設けられるプロセス制御装
置の入出力装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention is a process control device that is installed to maintain insulation voltage between a controlled object and a control device and to prevent external noise when performing process control of power systems, industrial plants, etc. It relates to the input/output device of the device.
従来の入出力装置は第1図に示すように構成されている
。A conventional input/output device is configured as shown in FIG.
即ち、制御対象の状態を示す接点11が閉じていると電
源装置12から発光素子13を経由して電流信号1aが
導通し、そのエネルギーによつて発光素子13は発光し
、特定の波長を発する。この波長を受光した光トランジ
スタ素子514は、導通し、制御対象11の状態が入力
されることになる。このようなインターフェイス回路に
おいては、発光素子13や光トランジスタ素子14が正
常な動作を行なつているかどうかを点検する場合は、1
0制御対象11そのものの動作を行なわなければならな
い。That is, when the contact point 11 indicating the state of the controlled object is closed, a current signal 1a is conducted from the power supply device 12 via the light emitting element 13, and the light emitting element 13 emits light due to the energy and emits a specific wavelength. . The phototransistor element 514 that receives this wavelength becomes conductive, and the state of the controlled object 11 is inputted thereto. In such an interface circuit, when checking whether the light emitting element 13 and the phototransistor element 14 are operating normally, 1.
0 The operation of the controlled object 11 itself must be performed.
ところが電力系統や産業用プラント等のプロセス制御に
おいて、運転状態にあるような実機器を動作させること
は、実際上無理であつた。本発明は、運転状態にあるよ
うな実機器を動作15させることなく制御対象に接続さ
れている発光素子と光トランジスタ素子の間の点検を行
なうことを可能とし、制御対象の状態の如何に拘らず、
制御対象の模擬を行なわせる入出力装置を得ることを目
的としたものである。20以下本発明の一実施例を第2
図を参照して説明する。However, in process control of power systems, industrial plants, etc., it has been practically impossible to operate actual equipment in an operating state. The present invention makes it possible to inspect between a light emitting element and a phototransistor element connected to a controlled object without operating an actual device in operation, regardless of the state of the controlled object. figure,
The purpose is to obtain an input/output device that can simulate a controlled object. A second embodiment of the present invention below 20
This will be explained with reference to the figures.
第2図に示す入出力装置は、制御対象の状態をとり入れ
る為に、電源装置12と発光素子13を介して電流信号
1aを流す閉回路を構成し、電流信号1aの有無により
特定の波長を発する発25光素子13とその波長を受け
て導通非導通動作を行なう光トランジスタ素子14を有
している。更に制御対象11の状態を模擬するスイッチ
15(以下では5−スイッチとよぶ)と、点検を行なう
か否かを指令するスイッチ16(以下ではT−30スイ
ッチとよぶ)の他に、前記Tスイッチが゛゛1”になつ
た時には、5−スイッチの状態をそのまま出力し、Tス
イッチが゛00”になつた時には5−スイッチの状態が
如何になろうとも、その出力が高インピーダンス状態を
保持するスイッチ素子例え35ば3値状態ゲート素子1
7を有している。この3値状態ゲート素子ITの真理値
表を表1に示す。なお、この3値状態ゲート素子17は
すでにTC−5012P(東芝製)、DM8O97(ナ
シヨナルセミコンダクタ製)等として市販されている。
18は外部出力回路であり、前記光トランジスタ素子1
4の電気信号を直にとり出すように構成してもよく、又
第3図のようにバツフア増幅回路19、外部リレー回路
20、電源21および外部出力接点22とで構成しても
よい。The input/output device shown in FIG. 2 constitutes a closed circuit in which a current signal 1a flows through a power supply device 12 and a light emitting element 13 in order to incorporate the state of the controlled object, and a specific wavelength is emitted depending on the presence or absence of the current signal 1a. It has a light emitting element 13 that emits light and a phototransistor element 14 that conducts conduction and non-conduction in response to the wavelength of the light. Furthermore, in addition to a switch 15 (hereinafter referred to as 5-switch) that simulates the state of the controlled object 11 and a switch 16 (hereinafter referred to as T-30 switch) that commands whether or not to perform inspection, the T-switch When the T switch becomes ``1'', the state of the 5-switch is output as is, and when the T switch becomes ``00'', the output maintains a high impedance state regardless of the state of the 5-switch. Switch element Example 35 Three-value state gate element 1
7. Table 1 shows the truth table of this ternary state gate element IT. Note that this three-value state gate element 17 is already commercially available as TC-5012P (manufactured by Toshiba), DM8O97 (manufactured by National Semiconductor), and the like.
18 is an external output circuit, and the phototransistor element 1
It may be constructed so that the electrical signal of No. 4 is directly taken out, or it may be constructed from a buffer amplifier circuit 19, an external relay circuit 20, a power supply 21, and an external output contact 22 as shown in FIG.
次に第2図に示す実施例の作用を説明する。Next, the operation of the embodiment shown in FIG. 2 will be explained.
Tスイツチ16が゛O゛状態(点検を行なわないことを
示す)の時、3値状態ゲート素子17の出力は高インピ
ーダンス状態となり、その出力に結がれている光トラン
ジスタ素子14のベース電位も高インピーダンス状態と
なり、光トランジスタ素子14は、特定の波長の光が発
せられると導通を行ない、発せられなければ非導通とな
る動作を行なうことになる。このような状態においては
制御対象11が閉(又は開)状態であれば電源装置12
から発光素子13を介して電流信号1aが流れる(又は
流れない)為に発光素子13は発光する(又は発光しな
い)。When the T-switch 16 is in the "O" state (indicating that no inspection is to be performed), the output of the ternary state gate element 17 is in a high impedance state, and the base potential of the phototransistor element 14 connected to the output is also low. In a high impedance state, the phototransistor element 14 becomes conductive when light of a specific wavelength is emitted, and becomes non-conductive when light of a specific wavelength is not emitted. In such a state, if the controlled object 11 is in a closed (or open) state, the power supply device 12
Since the current signal 1a flows (or does not flow) through the light emitting element 13, the light emitting element 13 emits light (or does not emit light).
電流信号1aが流れることにより発光素子13が発光し
、特定の波長の光を発すると、その波長をうけた光トラ
ンジスタ素子14は導通状態となる。こうして、制御対
象11の状態は、光トランジスタ素子14の出力として
あられれることになる。When the light emitting element 13 emits light due to the flow of the current signal 1a and emits light of a specific wavelength, the phototransistor element 14 that receives the wavelength becomes conductive. In this way, the state of the controlled object 11 is expressed as the output of the phototransistor element 14.
次にT−スイツチ16が“1”状態(点検を行なうこと
を示す)の時、3値状態ゲート素子17の出力は、S−
スイツチ15の入力状態があられれて光トランジスタ素
子14のベース電位を制御する。S−スイツチ15がT
゛であれば、3値状態一ゲート素子17の出力も“rと
なり光トランジスタ素子14が導通するようになる。こ
うしてあたかも制御対象が6rになつたような動作を行
なわせることができる。次にS−スイツチ15が″0゛
であれば3値状態ゲート素子17の出力も“0゛となり
、光トランジスタ素子14が非導通になる。Next, when the T-switch 16 is in the "1" state (indicating that inspection is to be performed), the output of the ternary state gate element 17 is the S-
The input state of the switch 15 is varied to control the base potential of the phototransistor element 14. S-switch 15 is set to T
If ``, then the output of the three-value state gate element 17 also becomes ``r,'' and the phototransistor element 14 becomes conductive.In this way, the operation can be performed as if the controlled object had become 6r.Next, If the S-switch 15 is "0", the output of the ternary state gate element 17 is also "0", and the phototransistor element 14 becomes non-conductive.
こうしてあたかも制御対象11が“0゛になつた動作を
行なわせることができる。なお、光トランジスタ素子1
4の導通、非導通はトランジスタ素子の出力電圧の有無
あるいは、外部出力接点22の動作によつて確認するこ
とができる。In this way, the controlled object 11 can be made to perform an operation as if it had become "0".
4 can be confirmed by the presence or absence of the output voltage of the transistor element or by the operation of the external output contact 22.
尚、以上の説明は光トランジスタ14のベース回路に接
続する信号は3値状態ゲート17の出力として説明した
が、3値状態が実現出来ればいかなる回路でも良く例え
ばT−スイツチ16が゛1゛状態であれば動作するリレ
ーの接点に置換しても全く同様の効果が得られることは
言う迄もない。In the above explanation, the signal connected to the base circuit of the phototransistor 14 was explained as the output of the three-value state gate 17, but any circuit can be used as long as the three-value state can be realized. For example, the T-switch 16 is in the "1" state. If so, it goes without saying that the same effect can be obtained even if the contacts are replaced with operating relay contacts.
電力系統及び産業用プラント制御等のプロセス制御を行
なう制御装置においては制御対象の状態の監視や、出力
回路において半導体素子を用いる場合が多く、さらに絶
縁耐圧や外来雑音の侵入防止の観点から、光結合素子の
採用が要求されてきている。本発明は、このような制御
対象と制御装置間のインターフエイス回路において、運
転状態にある制御装置にあたかも制御対象の動作があつ
たかの如き現象をおこさせることが可能になり、制御装
置自体の制御操作が点検できると共に、制御対象と制御
装置間のインターフエイス回路として用いられている光
トランジスタ素子の故障診断も可能となる。Control equipment that performs process control such as power system and industrial plant control often uses semiconductor elements for monitoring the status of controlled objects and for output circuits. There is a growing demand for the use of coupling elements. The present invention makes it possible, in such an interface circuit between a controlled object and a control device, to cause a phenomenon in the operating state of the control device to occur as if the controlled object had been operated, thereby improving the control of the control device itself. In addition to checking the operation, it is also possible to diagnose the failure of the phototransistor element used as an interface circuit between the controlled object and the control device.
第1図は従来の制御装置のプロツク図、第2図は本発明
を用いた制御装置のプロツク図、第3図は外部出力回路
の一例を示す図である。
11・・・・・・制御対象の状態を示す接点情報、12
・・・・・・電源装置、13・・・・・・発光素子、1
4・・・・・・光トランジスタ素子、15・・・・・・
制御対象の状態を模擬するスイツチ、16・・・・・・
点検を行なうか否かを指定するスイツチ、17・・・・
・・3値状態ゲート素子。FIG. 1 is a block diagram of a conventional control device, FIG. 2 is a block diagram of a control device using the present invention, and FIG. 3 is a diagram showing an example of an external output circuit. 11...Contact information indicating the state of the controlled object, 12
...Power supply device, 13... Light emitting element, 1
4...Phototransistor element, 15...
A switch that simulates the state of the controlled object, 16...
Switch 17 for specifying whether or not to perform inspection
...Three-state gate element.
Claims (1)
ッチ部が閉状態になると点灯する発光素子と、この発光
素子に対向して設けられベース端子を有する光トランジ
スタ素子と、この光トランジスタ素子の出力信号をとり
出す外部出力回路と、前記制御対象の状態を模擬する模
擬スイッチと、前記光トランジスタ素子に点検を行うか
否かを指令する点検指令スイッチと、前記点検指令スイ
ッチが閉状態の場合、前記模擬スイッチの出力を前記光
トランジスタ素子のベース端子に供給し、前記点検指令
スイッチが開状態の場合、前記模擬スイッチの出力を阻
止して前記光トランジスタにベース信号を供給しないよ
うに構成したスイッチ素子とから成る入出力装置。1. A switch part that responds to the state of a controlled object, a light emitting element that lights up when the switch part is in a closed state, a phototransistor element provided opposite to this light emitting element and having a base terminal, and an output of this phototransistor element. an external output circuit that takes out a signal, a simulating switch that simulates the state of the controlled object, an inspection command switch that instructs whether or not to inspect the phototransistor element, and when the inspection command switch is in a closed state, A switch configured to supply the output of the simulated switch to the base terminal of the phototransistor element, and to block the output of the simulated switch so as not to supply the base signal to the phototransistor when the inspection command switch is in an open state. An input/output device consisting of elements.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52090452A JPS5931723B2 (en) | 1977-07-29 | 1977-07-29 | input/output device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52090452A JPS5931723B2 (en) | 1977-07-29 | 1977-07-29 | input/output device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5427677A JPS5427677A (en) | 1979-03-01 |
JPS5931723B2 true JPS5931723B2 (en) | 1984-08-03 |
Family
ID=13999000
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52090452A Expired JPS5931723B2 (en) | 1977-07-29 | 1977-07-29 | input/output device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5931723B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6412322U (en) * | 1987-07-13 | 1989-01-23 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6090796U (en) * | 1983-11-25 | 1985-06-21 | 松下電工株式会社 | Color rendering lighting system for equipment units |
JPH081762B2 (en) * | 1985-05-07 | 1996-01-10 | 松下電工株式会社 | Color zone lighting system |
CH668872A5 (en) * | 1985-07-05 | 1989-01-31 | Baumer Electric Ag | PROXIMITY SWITCH. |
JP4937725B2 (en) * | 2006-12-18 | 2012-05-23 | 日本テトラパック株式会社 | Packaging container inspection apparatus and packaging container inspection method |
-
1977
- 1977-07-29 JP JP52090452A patent/JPS5931723B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6412322U (en) * | 1987-07-13 | 1989-01-23 |
Also Published As
Publication number | Publication date |
---|---|
JPS5427677A (en) | 1979-03-01 |
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