JPS59232994A - Device for vapor phase crystal growth - Google Patents

Device for vapor phase crystal growth

Info

Publication number
JPS59232994A
JPS59232994A JP10832483A JP10832483A JPS59232994A JP S59232994 A JPS59232994 A JP S59232994A JP 10832483 A JP10832483 A JP 10832483A JP 10832483 A JP10832483 A JP 10832483A JP S59232994 A JPS59232994 A JP S59232994A
Authority
JP
Japan
Prior art keywords
susceptor
vapor phase
support
rotating shaft
si3n4
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10832483A
Other languages
Japanese (ja)
Inventor
Kichizo Komiyama
吉三 小宮山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Machine Co Ltd
Original Assignee
Toshiba Machine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Machine Co Ltd filed Critical Toshiba Machine Co Ltd
Priority to JP10832483A priority Critical patent/JPS59232994A/en
Publication of JPS59232994A publication Critical patent/JPS59232994A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/12Substrate holders or susceptors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To form a susceptor support attached to a revolving shaft in a vapor phase crystal growth device in such a way that said support is highly resistant to corrosion and contamination and withstands repetition of an ordinary temp. and a high temp. by forming said support of a ceramic sintered body consisting of SiC, AlN, etc. CONSTITUTION:A susceptor support 2 which is attached to a revolving shaft 3 of a vapor phase crystal growth device and supports a susceptor 1 is formed of a ceramic sintered body consisting of SiC, AlN and Si3N4 or consisting essentially thereof and added with a sintering auxiliary such as Y2O3 or CeO2, etc. or is formed of a composite ceramic sintered body of Si3N4 and Al2O3. The shaft 3 is preferably formed of Ti or Ti alloy. A susceptor support which can support securely and surely the susceptor 1 is thus obtd.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、ウニ・への表面にSi f(どの薄膜を気相
成長させるだめの装置に係り、特にウェーを載置するサ
セプタをサセプタ支えを介して回転軸に取付けるように
した気相成長装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an apparatus for vapor phase growth of SiF (whatever thin film) on the surface of sea urchins. The present invention relates to a vapor phase growth apparatus that is attached to a rotating shaft via a.

〔従来技術〕[Prior art]

従来、前記のようにサセプタを回転軸に取付ける方式の
気相成長装置は、腐食や汚染の関係から回転軸にはステ
ンレス鋼を用い、さらにサセプタは高温に加熱されるだ
め、腐食や汚染の問題がなく、かつ耐熱性を有する石英
ガラス製のサセプタ支えを前記回転軸の先端に嵌着し、
このサセプタ支tにサセプタを係合させることにより該
サセプタを回転軸に取付けるようにしていた。しかしな
がら、石英ガラスは、強度が低くて割れ易く、さらに研
磨などによる機械加工が容易でないため、物を確実に支
持するような機械構造物として使用するのには不向きで
ある。また、石英ガラスは、熱膨張係数が0.5X10
  とステンレス鋼(316ステンレス鋼)のそれの1
7.5X10  に比較して非常に小さいため、仮りに
常温においてすき間々く係合したとしても運転中の昇温
時には比較的大きなすき間を生じ、サセプタを確実に支
持することができない。このため、サセプタが回転に伴
って振れ、均一な膜厚分布や抵抗分布が得られ難く、再
現性に劣る。特に、サセプタをこれに沿って設けたRF
’コイルにより誘導加熱する方式の装置の場合には、R
’Fコイルとサセプタとの間の間隔が変化するため、サ
セプタの温度分布を均一にすることが難かしくなり、温
度依存性の高い抵抗値がバラツキを生じ易くなり、サセ
プタの外周部は振れによる温度変化が大きいので、結晶
欠陥(スリップ)を生じ易くなる。
Conventionally, in vapor phase growth apparatuses in which the susceptor is attached to the rotating shaft as described above, the rotating shaft is made of stainless steel due to corrosion and contamination concerns, and the susceptor is heated to high temperatures, resulting in corrosion and contamination problems. A susceptor support made of quartz glass that is free of heat and has heat resistance is fitted onto the tip of the rotating shaft,
By engaging the susceptor with this susceptor support t, the susceptor is attached to the rotating shaft. However, quartz glass has low strength, is easily broken, and is not easy to be machined by polishing or the like, so it is not suitable for use as a mechanical structure that reliably supports objects. Also, quartz glass has a coefficient of thermal expansion of 0.5X10
and one of that of stainless steel (316 stainless steel)
Since it is very small compared to 7.5×10 2 , even if they are engaged with a gap at room temperature, a relatively large gap will occur when the temperature rises during operation, making it impossible to support the susceptor reliably. For this reason, the susceptor oscillates as it rotates, making it difficult to obtain a uniform film thickness distribution and resistance distribution, resulting in poor reproducibility. In particular, the RF
'In the case of a device that uses induction heating with a coil, R
'F Because the distance between the coil and the susceptor changes, it becomes difficult to make the temperature distribution of the susceptor uniform, and the resistance value, which is highly temperature dependent, tends to vary, and the outer circumference of the susceptor Since the temperature changes are large, crystal defects (slips) are likely to occur.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、前述したよう寿問題を解決するため、
腐食や汚染r強く、かつ常温と高温との繰返しにも耐え
てサセプタをより強固に確実に支持することのできる気
相成長装置を提供するにある。
The purpose of the present invention is to solve the above-mentioned longevity problem.
It is an object of the present invention to provide a vapor phase growth apparatus that is resistant to corrosion and contamination, and is capable of supporting a susceptor more firmly and reliably by withstanding repeated changes between room temperature and high temperature.

〔発明の構成〕[Structure of the invention]

かかる目的を達成するだめの本発明は、サセプタをサセ
プタ支えを介して回転軸に取付けるようにした気相成長
装置において、前記サセプタ支えを、SiC,Aj!N
、 Si3N4 あるいはこれらを主成分とし[203
tだばCeO2等の焼結助剤を添加してなるセラミック
ス焼結体もしくはS i 3N4とA/z03の複合セ
ラミックス焼結体のうちのいずれか1つの材料によって
形成したものであり、さらに好ましくけサセプタ支えを
前記の材質にすると共に、回転軸をT1 もしくはTi
合金にて形成したものである。
To achieve this object, the present invention provides a vapor phase growth apparatus in which a susceptor is attached to a rotating shaft via a susceptor support, in which the susceptor support is made of SiC, Aj! N
, Si3N4 or with these as main components [203
It is more preferably formed from one of the following: a ceramic sintered body with a sintering aid such as CeO2 added thereto, or a composite ceramic sintered body of Si3N4 and A/z03. The susceptor support is made of the above material, and the rotating shaft is made of T1 or Ti.
It is made of alloy.

〔実施例〕〔Example〕

以下本発明の一実施例を示す第1図について説明する。 FIG. 1 showing one embodiment of the present invention will be described below.

1はサセプタ、2はサセプタ支え、3は回転軸、4はR
F’コイル、5はウェハである。前記サセプタ支え2は
1石英ガラスで々く、焼結助剤としてY 203を0.
5重量チ添加しだ5I3N4(以下単に、513N4と
して説明する)を常圧焼結 5− 法により成形したものである。
1 is the susceptor, 2 is the susceptor support, 3 is the rotating shaft, 4 is R
F' coil, 5 is a wafer. The susceptor support 2 is made of quartz glass and contains 0.00% Y203 as a sintering aid.
5I3N4 (hereinafter simply referred to as 513N4) to which 5% by weight of nitrogen was added was molded by the pressureless sintering method.

このSi3N4は、製品により値が若干具なるが、第1
表に示すような物性を有している。なお、第1表には比
較のため、透明石英ガラスの物性を併記した。
The value of this Si3N4 varies slightly depending on the product, but the first
It has the physical properties shown in the table. Note that, for comparison, Table 1 also lists the physical properties of transparent quartz glass.

表1表 第1表から明らかなようにSi3N4は、石英ガラスに
比較して数倍の機械的強度を有するため、重量や荷重を
受ける機械構造物として十分使用に耐え、かつ焼結によ
って成形されるため、比較的容易に所望の形状に成形で
きると共に、研磨による機械加工が可能であるため、第
1図に示すように、止めねじ6を係合する穴7やキー8
を嵌入する溝9を形成することも可能である。
As is clear from Table 1, Si3N4 has several times the mechanical strength of quartz glass, so it can withstand use as a mechanical structure that bears heavy weight and loads, and can be formed by sintering. Because of this, it can be relatively easily formed into a desired shape, and machining by polishing is possible.As shown in FIG.
It is also possible to form a groove 9 into which the material is inserted.

そこで、回転軸3に対するサセプタ支え2の嵌入精度を
高め、かつ止めねじ6などにより確実に固定することが
でき、サセプタ支え2とサセプタ1との係合精度をも同
様に高め、かつキー8などにより確実に固定することが
できる。
Therefore, it is possible to increase the fitting accuracy of the susceptor support 2 to the rotating shaft 3 and to securely fix it with the set screw 6, etc., and to similarly increase the engagement accuracy between the susceptor support 2 and the susceptor 1, and to It can be fixed more reliably.

まだ、Si3N4の熱膨張係数は、第1表に示したよう
に石英ガラスの約6倍と太きいため、昇温した場合に回
転軸3とサセプタ支え2との間に生ずる隙間も小さく押
えられ、前述したより確実な取付は関係ができることと
相まってサセプタ1の振れを小さく押えることができる
However, as shown in Table 1, the coefficient of thermal expansion of Si3N4 is about six times higher than that of silica glass, so the gap that occurs between the rotating shaft 3 and the susceptor support 2 when the temperature rises can be kept small. In combination with the above-mentioned more reliable attachment and the ability to form a relationship, it is possible to suppress the vibration of the susceptor 1 to a small extent.

さらに才だ、回転軸3をステンレス鋼でなく、T1また
はTi 合金とすれば、これらの熱膨張係数は小さく5
例えばTi 合金(JIS:5T−60)の場合、4.
5 X 1. O−6とSi3N4の熱膨張係数に近い
ため、昇温時の隙間の発生を非常に小さく押えることが
できる。
Even better, if the rotating shaft 3 is made of T1 or Ti alloy instead of stainless steel, the coefficient of thermal expansion of these materials will be smaller than 5.
For example, in the case of Ti alloy (JIS: 5T-60), 4.
5 X 1. Since the coefficient of thermal expansion is close to that of O-6 and Si3N4, the occurrence of gaps during temperature rise can be kept very small.

第2図は本発明の他の実施例を示すもので、サセプタ支
え2の同図において下端外周にTi  まだはTi 合
金製のスリーブ10を焼ばめしたものでちる。SI3N
4は機械的強度が高いだめこのようなことが可能であり
、この焼ばめによる締め代を気相成長のだめの昇温時に
も両者の間に隙間が生じない値にしておけば5両者の間
は常に確実に固定され、かつ回転軸3をT1寸たはTi
合金製とすることによりスリーブ10と回転軸3との間
の隙間の発生を押え、より確定にサセプタ支え2を回転
軸3に保持することができる。なお、第2図においては
、スリーブ10と回転軸3を該回転軸3の回転により締
る方向のねじ11にて固定するようにしたものである。
FIG. 2 shows another embodiment of the present invention, in which a sleeve 10 made of Ti or Ti alloy is shrink-fitted to the outer periphery of the lower end of the susceptor support 2 in the same figure. SI3N
4 is possible due to its high mechanical strength, and if the interference caused by shrinkage fit is set to a value that does not create a gap between the two even when the temperature of the vapor growth chamber is increased, 5 can be achieved. The space between the two is always securely fixed, and the rotating shaft 3 is
By making it made of alloy, it is possible to suppress the generation of a gap between the sleeve 10 and the rotating shaft 3, and to more securely hold the susceptor support 2 on the rotating shaft 3. In FIG. 2, the sleeve 10 and the rotating shaft 3 are fixed with a screw 11 that is tightened by the rotation of the rotating shaft 3.

前述した実施例は、サセプタ支え2にSI3N4を主成
分とし焼結助剤としてY2O3を添加したセラミックス
焼結体を用いた例を示したが、焼結助剤としてはCeO
2など他のものでもよく、また焼結助剤を用いなくても
よい。寸たSI3N40代りにSiC,A/N の単独
捷たはこれらに前記のような焼結助剤を添加したものや
、さらにはSi3N4とA/?203の複合セラミック
ス焼結体を用いても同様の効果が得られる。
In the above embodiment, the susceptor support 2 is made of a ceramic sintered body mainly composed of SI3N4 and Y2O3 added as a sintering aid.
Other materials such as No. 2 may be used, and the sintering aid may not be used. Instead of SI3N40, SiC and A/N can be used alone or with the above-mentioned sintering aid added, or even Si3N4 and A/N can be used. Similar effects can be obtained by using a composite ceramic sintered body of No. 203.

〔発明の効果〕〔Effect of the invention〕

以上述べたように本発明によれば、十分々機械的強度を
もってサセプタを回転軸に対して取付けることができ、
破損事故をほとんど皆無にできると共に、気相成長時に
もサセプタの振れの発生を押えることができ、このため
膜厚分布や抵抗分布をより均一にできる。さらに回転軸
、サセプタ支えならびにサセプタの各間をキー、ピン、
なじなどにより確実に固定できるため、サセプタの回転
を確実に制御することが可能になり、サセプタ上へ適宜
な間隔で配列されるウニ・・の自動装填や。
As described above, according to the present invention, the susceptor can be attached to the rotating shaft with sufficient mechanical strength,
Not only can breakage accidents be almost completely eliminated, but also the occurrence of vibration of the susceptor can be suppressed during vapor phase growth, thereby making the film thickness distribution and resistance distribution more uniform. In addition, keys, pins,
Since the susceptor can be securely fixed by screwing, etc., it is possible to reliably control the rotation of the susceptor, allowing automatic loading of sea urchins arranged at appropriate intervals onto the susceptor.

該サセプタからのウニ・・の取出しが可能になるなどの
効果が得られる。また、サセプタ支えを前述したよう彦
セラミックス焼結体にしても腐食や汚染の問題はなく、
耐熱性および熱衝撃の点でも優れた効果が得られる。
Effects such as being able to take out sea urchins from the susceptor can be obtained. Furthermore, even if the susceptor support is made of Hiko ceramics sintered body as mentioned above, there will be no problems of corrosion or contamination.
Excellent effects can also be obtained in terms of heat resistance and thermal shock.

9−9-

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による気相成長装置の一実施例を示す要
部断面図、第2図は本発明の他の実施例を示す要部拡大
断面図である。 ■・・・サセプタ、  2・・サセプタ支え。 3・回転軸、  4・・・R1?’コイル、  5・・
・ウェハ。 6・・・止めねじ、  7・穴、  8・・・キー、9
・・・キー溝、  10・スリーブ、  11・・ねじ
。 出願人 東芝機械株式会社  10−
FIG. 1 is a sectional view of a main part showing one embodiment of a vapor phase growth apparatus according to the present invention, and FIG. 2 is an enlarged sectional view of a main part showing another embodiment of the invention. ■...Susceptor, 2...Susceptor support. 3. Rotating axis, 4...R1? 'Coil, 5...
・Wafer. 6... Set screw, 7. Hole, 8... Key, 9
・・・Keyway, 10・Sleeve, 11・Screw. Applicant: Toshiba Machine Co., Ltd. 10-

Claims (1)

【特許請求の範囲】 1、サセプタをサセプタ支えを介して回転軸に取付ける
ようにした気相成長装置において、前記サセプタ支えを
、S i C,A/N、 S i 3N4 あるいはこ
れらを主成分としY2O3tたはCe0z等の焼結助剤
を添加してなるセラミックス焼結体モジくはSi3N4
とAlO3の複合セラミックス焼結体のうちのいずれか
1つの材料によって形成したことを特徴とする気相成長
装置。 2、サセプタをサセプタ支えを介して回転軸に取付ける
ようにした気相成長装置において、前記サセプタ支えを
、SiC,A4N、 Si3N4あるいはこれらを主成
分としy2o3またはCeO2等の焼結助剤を添加して
なるセラミックス焼結体もしくはSi3N4  とAA
203  の複合セラミックス焼結体のうちのいずれか
1つの材料によって形成すると共に、回転軸をTi  
もしくはTi合金によって形成することを特徴とする気
相成長装置。 3、回転軸に嵌入する部分のサセプタ支え外周に、Ti
  もしくはT1合金製のスリーブが焼ばめされ、この
スリーブが前記回転軸の穴に係合するように構成されて
いる特許請求の範囲第2項記載の気相成長装置。
[Claims] 1. In a vapor phase growth apparatus in which a susceptor is attached to a rotating shaft via a susceptor support, the susceptor support is made of S i C, A/N, S i 3N4, or mainly composed of these. Ceramic sintered body module or Si3N4 made by adding a sintering aid such as Y2O3t or Ce0z
1. A vapor phase growth apparatus characterized in that it is formed of any one of the following materials: 2. In a vapor phase growth apparatus in which a susceptor is attached to a rotating shaft via a susceptor support, the susceptor support is made of SiC, A4N, Si3N4, or a sintering agent containing these as main components and adding a sintering aid such as y2o3 or CeO2. ceramic sintered body or Si3N4 and AA
203 composite ceramic sintered bodies, and the rotating shaft is made of Ti.
Alternatively, a vapor phase growth apparatus characterized in that it is formed of a Ti alloy. 3. Ti is applied to the susceptor support outer periphery of the part that fits into the rotating shaft.
Alternatively, the vapor phase growth apparatus according to claim 2, wherein a sleeve made of T1 alloy is shrink-fitted and this sleeve is configured to engage with the hole of the rotating shaft.
JP10832483A 1983-06-16 1983-06-16 Device for vapor phase crystal growth Pending JPS59232994A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10832483A JPS59232994A (en) 1983-06-16 1983-06-16 Device for vapor phase crystal growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10832483A JPS59232994A (en) 1983-06-16 1983-06-16 Device for vapor phase crystal growth

Publications (1)

Publication Number Publication Date
JPS59232994A true JPS59232994A (en) 1984-12-27

Family

ID=14481814

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10832483A Pending JPS59232994A (en) 1983-06-16 1983-06-16 Device for vapor phase crystal growth

Country Status (1)

Country Link
JP (1) JPS59232994A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS636833A (en) * 1986-06-26 1988-01-12 Toshiba Ceramics Co Ltd Vapor growth apparatus
JPS63140085A (en) * 1986-11-29 1988-06-11 Kyocera Corp Film forming device
US5306895A (en) * 1991-03-26 1994-04-26 Ngk Insulators, Ltd. Corrosion-resistant member for chemical apparatus using halogen series corrosive gas
JPH10189490A (en) * 1996-09-23 1998-07-21 Applied Materials Inc High temperature resistor type heater
US6645303B2 (en) * 1996-11-14 2003-11-11 Applied Materials, Inc. Heater/lift assembly for high temperature processing chamber
US6878211B2 (en) * 2001-03-30 2005-04-12 Ngk Insulators, Ltd. Supporting structure for a ceramic susceptor
JP2015512565A (en) * 2012-03-20 2015-04-27 ビーコ・インストゥルメンツ・インコーポレイテッド Wafer carrier with key
USD744967S1 (en) 2012-03-20 2015-12-08 Veeco Instruments Inc. Spindle key
USD748591S1 (en) 2012-03-20 2016-02-02 Veeco Instruments Inc. Keyed spindle

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS636833A (en) * 1986-06-26 1988-01-12 Toshiba Ceramics Co Ltd Vapor growth apparatus
JPS63140085A (en) * 1986-11-29 1988-06-11 Kyocera Corp Film forming device
US5306895A (en) * 1991-03-26 1994-04-26 Ngk Insulators, Ltd. Corrosion-resistant member for chemical apparatus using halogen series corrosive gas
EP1120817A2 (en) * 1991-03-26 2001-08-01 Ngk Insulators, Ltd. Corrosion-resistant member
EP1120817A3 (en) * 1991-03-26 2002-01-30 Ngk Insulators, Ltd. Corrosion-resistant member
JPH10189490A (en) * 1996-09-23 1998-07-21 Applied Materials Inc High temperature resistor type heater
US6645303B2 (en) * 1996-11-14 2003-11-11 Applied Materials, Inc. Heater/lift assembly for high temperature processing chamber
US6878211B2 (en) * 2001-03-30 2005-04-12 Ngk Insulators, Ltd. Supporting structure for a ceramic susceptor
JP2015512565A (en) * 2012-03-20 2015-04-27 ビーコ・インストゥルメンツ・インコーポレイテッド Wafer carrier with key
USD744967S1 (en) 2012-03-20 2015-12-08 Veeco Instruments Inc. Spindle key
JP2016015492A (en) * 2012-03-20 2016-01-28 ビーコ・インストゥルメンツ・インコーポレイテッド Wafer carrier with key
USD748591S1 (en) 2012-03-20 2016-02-02 Veeco Instruments Inc. Keyed spindle
US9816184B2 (en) 2012-03-20 2017-11-14 Veeco Instruments Inc. Keyed wafer carrier

Similar Documents

Publication Publication Date Title
US7582166B2 (en) Holder for supporting wafers during semiconductor manufacture
JPS6169116A (en) Susceptor for continuous cvd coating on silicon wafer
JPS59232994A (en) Device for vapor phase crystal growth
ES8606836A1 (en) Oxidation prohibitive coatings for carbonaceous articles.
JPH1045461A (en) Corrosion resistant member
US20110041618A1 (en) Elastic ceramic body and pressure sensor with an elastic ceramic body
JPH04321814A (en) Coupled body of metallic body and ceramic body
US4717693A (en) Process for producing beta silicon nitride fibers
JPH0758040A (en) Susceptor for phase growth apparatus
CN208618006U (en) A kind of silicon carbide monocrystal growth device
CN100390927C (en) Wafer carrier having improved processing characteristics
JP3545866B2 (en) Wafer holding device
JPH0268922A (en) Susceptor for vapor growth
JPH0487178A (en) Heating device for semiconductor wafer
JPS5777100A (en) Crucible for growing single crystal
KR102153288B1 (en) Support roller, method for molding glass plate, method for manufacturing glass plate, and device for manufacturing glass plate
JPH09262734A (en) Wafer holding device
JPS6119117A (en) Continuous cvd coating treatment method for silicon wafer
JPH0477365A (en) Ceramic material for semiconductor and its manufacture
JPH0570267A (en) X ray reflecting mirror and its manufacture
JPH04345019A (en) Semiconductor-processing member
JPH0245913A (en) Semiconductor manufacturing device
JPH04358068A (en) Member coated with sic by cvd
JPS61251528A (en) Mold for forming glass lens and production thereof
JP2004115289A (en) Manufacturing process of ingot for optical fiber preform and hanging member used in the process