JPS58145128A - Formation of photo resist stencil - Google Patents

Formation of photo resist stencil

Info

Publication number
JPS58145128A
JPS58145128A JP2711882A JP2711882A JPS58145128A JP S58145128 A JPS58145128 A JP S58145128A JP 2711882 A JP2711882 A JP 2711882A JP 2711882 A JP2711882 A JP 2711882A JP S58145128 A JPS58145128 A JP S58145128A
Authority
JP
Japan
Prior art keywords
layer
exposed
photo resist
resist layer
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2711882A
Other languages
Japanese (ja)
Inventor
Hiroyuki Abe
浩之 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2711882A priority Critical patent/JPS58145128A/en
Publication of JPS58145128A publication Critical patent/JPS58145128A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting

Abstract

PURPOSE:To prevent deterioration of the resist pattern by a method wherein a two-layer structural photo resist layer is exposed using a mask, the second layer is developed, and the exposed surface of the first layer and the surface of the surviving second layer are etched in gas plasma containing at least oxygen molecules. CONSTITUTION:When the surface of the photo resist layer is exposed to plasma of molecules containing fluorine, the surface layer 23 whose solvent resistant property is strengthened is formed on the surface. The two-layer structural photo resist layer is exposed using a mask, and when it is dipt in a developer to develope the second layer, the surface of the first layer is exposed leaving the unexposed part. When it is etched gas plasma having the anisotropic etching effect, the resist layer is removed according to oxygen ions, while because etching advances only in the direction perpendicular to the wafer surface, and does not advance in the lateral direction, the pattern transcribed to the second photo resist layer from the photo mask survives as it is. The first resist layer is developed and is saturated with an etching liquid, and the stencil having the mushroom-shape cross-section can be obtained.

Description

【発明の詳細な説明】 このJ+; ’9」はノヨセフ77呆槓回蹟寺のり7 
1 ;jノバ′ターニングにオリ用サイー1イ)フ2;
 ト1/シベ1・メ・ノ・・ンルυ目β1戊万γ去(こ
ト1丁6 ’b (/,] ”C#)へ。
[Detailed description of the invention] This J+; '9' is Noyoseph 77
1 ;j Nova' Turning for ori 1 a) Fu 2;
To 1/Shibe 1 Me no... Nru υ eyes β 1 戊Manγleft (Koto 1 Cho 6 'b (/,] ``C#).

リソ1・オフ?人と口、・:+5 1 Ig.目(,ボ
づ.J: −.) i+、11ノ「1川桶造かゝゝき(
υこ″型5,−シPノ41・l’ノ/、ト (一口11
’Xl(aJ)  ’A −r 7 ,  ノレ ( 
r&きイIり U月ノljイ1凸1脊こ、 414 /
l Cり7LI11jリd I 2 , I 3 4i
−批4I.L/ ( m l 1ンl(1)Cl 、”
7)(+’てス7ッン,,合,ij’+ Iyk ’り
。フ,1・レノスl−1青イ1ンrri・父R1レ51
゛.ε一川い−C (j(r l1!llt l−.ノ
< 6 1県iL小5r/t71111QI11 1 
:1企1jj ’Aし,゛(  、  Iソ「:?イ(
/)バ ’%−7  −、l:’ i−1”リ− イ〕
/(−III1ノリ%i イE 1,’,7 /:,)
   (jf,41 +、lieノ)ノハノくであ句。
Liso 1 off? People and mouth: +5 1 Ig. Eyes (, Bozu. J: -.) i+, 11 No. 1 Kawa Okezo Kaゝゝki (
υko'' type 5, -shiPノ41・l'ノ/,to (bite 11
'Xl(aJ) 'A −r 7, nore (
r&kii Iri U moon no lj i 1 convex 1 spine, 414 /
l Cri7LI11jlid I 2, I 3 4i
-Critique 4I. L/(ml1nl(1)Cl,"
7) (+'tes7nn,, go, ij'+ Iyk'ri. Fu, 1. Renos l-1 blue I1 in ri. Father R1 Le 51
゛. εIchikawai-C (j(r l1!llt l-.ノ< 6 1 prefecture iL elementary school 5r/t71111QI11 1
:1程1jj 'Aし、゛(、Iso「:?イ(
/) Ba'%-7-, l:'i-1"li-i]
/(-III1 Nori%i IE 1,',7 /:,)
(jf, 41 +, lieノ) Nohano Kude haiku.

ショセノ ノン’+!:4:jlEノ11・[1{り1
ノ,シ刀Iゾl−1セス((二,13いでfJ1γ(芋
11■一土1曾U月プ客jイ1青吊14fJプジFr 
ilJ lノ& iこ又i専1+;+I曽 ]  2(
Z IHf i.r< 轡i1# llf’r IZ 
ハf LILI −’I ’ <》 、1:4; l 
Igl(a)iJスア/ノノレυ』ノrI大バノメーη
νいJ , w+. ,Δ舎小−cl− 1)’−、A
−J−ノンルノj!”. S+lS CQ巾紹’ f;
J Ii 曾Ill :fiU}形イ人イ1;ノ〉ジ冫
Jlし 、  wi.  i;i クイ1イhm ・1
館釦冫j O,+ J、畦目〕 5−^j1.゛入Eし
、又Δ(コτ轡ム鍵層12,130乃ノーνJI1のi
++易1屍く雇λχ151る。リフ1・47法、符にジ
ョセノノンw A’R 回uheU》バター二7クに用
いり41,ク〕リソ1・Ayr大MJ.;いCは、ス7
−ノ/ノレC/J L1v一人Ill曹S,ひ8しのL
矛FtJ,ム’j i.ll CO中四+4 (/.1
いづ”イ1舒も1同叫jよく、形!戊′りく)必endpa
ge:1 安/0あ<)。
Shoseno non'+! :4:jlEノ11・[1{ri1
No, Shi sword I Zo l-1 Seth ((2,13 in fJ1γ (Imo 11
ilJ lノ&i komata isen 1+;+Iso ] 2(
Z IHf i. r<轡i1#llf'r IZ
HAf LILI -'I'<》,1:4; l
Igl(a) iJ Sua/Nonore υ''NorI big banome η
νiJ, w+. ,Δsha-cl-1)'-,A
-J-Nonrunoj! ”. S+lS CQ width introduction'f;
J Ii 曾Ill :fiU}形I人I1;ノ〉ㆫ冫Jlし、wi. i;i kui1iihm ・1
Tatebutsuji O, + J, ridge] 5-^j1.゛Enter E, and Δ(com τ 轡com key layer 12,130 no νJI1 i
++Easy to hire 1 corpse λχ151. Riff 1, 47th method, josenonone w A'R times uheU》Used for butter 27k 41, ku] Riso 1, Ayr large MJ. ;C is S7
-ノ/Nore C/J L1v Alone Ill So S, His8 Shino L
FtJ, Mu'j i. ll CO in 4+4 (/.1
Izu'i 1 and 1 and 1 and 1 shout j Well, shape!
ge:1 cheap/0a<).

11E米、こいよう4CスTノソル(・得妃りV)に(
」、弔−11・岩と冫Xζ)ボン!?1127Aトレソ
ス1・を?W川i ・\イ1ノノし・弔−1曽衣而を弗
累をざむ力・子U)カス〕ノフXマi l’Uんは四フ
ノfヒ戻糸(2F4カスブフカス中1(一棒し、弔−7
.1曽とl了6ホン型ソ,4− 1−レユ/ヘトを1j
<イIJ  一\イ午ノクして、二1曽仲1ノdフォト
レ7ノストノ冑沓ノV成すΦ工栓と、該二肋信危フ4ト
L/ :/ス1・1曽倉マスク蕗ブLし、弟二j曽を現
1駅し、4;  j曽衣1f{1俯1戎系ゾラスマ甲(
こl’Q’′l,,/ % ’444一層を現14シす
る上程よリ7.’ff ’..)フォ1・レンス1・ス
フ”ノンルυJ )pp成方rb.が川いレ)イLy.
=oこ(4,1方法(こ才)いー(瞥;g..lri’
4カスノ′フXマ(こよっ′(−処理さイL1こ弔−1
冑ソA1・レ/X1・表間の耐1′F強化1曽Cこよっ
て弔一層と・AN−二1曽υ〕フォl゛レンス1゛U)
冫昆台か1力止さイL % 一,4,−−j曾レソスl
” 与Jl駅hイ0月才ろー+〜一の珠.X隻がバざイ
′ICいる。一万この+I+t ?勺二υ虫fこj冒(
・まr紋系グフズマ甲にIIψしーC1ボ去)4,、必
女ん)tfrf:)。じJ{゛4カス処理時間及ひ印加
【冠カイP」・IJ刈1しで、耐′11独1に厄゛Uノ
頬反を篩2・′)ζ)と、混什防止及ひ弔一Iv7 1
呆,1隻がノし乍(こf,fさイ′L句が、 こζし倉
1狗ミ去1−もfこめ(こ(ま酸系ゾラスマ中Cこ長時
間1壓す必汝かあり、こイ′lがfこy)、毛lL像さ
イ1,、バクーン化さイLζこ弟二l曽フ,#1・レソ
スト層も等方的(こ1函云さイ′ム、フノトマスクーヒ
0)バター7より11ミ1血Qこ転写さイLたレジスト
パターンが劣化ずぺ》という欠点かあっfこ。
11E rice, Koiyo 4C T nosol (・Tokuhiri V) (
”, Condolence-11・Iwa to Me Xζ) Bon! ? 1127A Tresos 1.? W river i \I 1 no no shi / condolence - 1 so clothes and the power to disturb the accumulation / child U) scum] nofu Condolences and condolences-7
.. 1st and 6th type so, 4- 1-reyu/heto 1j
<IJ 1 \ In the morning, 21 Sonaka 1 d Photore 7 Nost no Katsu no V made Φ plug, and the 2 ribs are safe 4 to L/ :/S 1.1 Sokura mask Fubuki L, his younger brother Nijso is currently 1 station, 4;
This is the 14th step of the 444th layer.7. 'ff'. .. ) For 1, Lens 1, Suf” Nonru υJ) pp Narikata rb.gakawai Le) I Ly.
=oko(4,1 method(kosai)ii(gl..lri')
4 Casno'fu
Armor A1・Re/X1・Resistance 1′F between the front 1′F reinforced 1′C Therefore, one layer of condolence・AN-21Soυ゛Forence 1゛U)
Stop it with one force L% 1,4,--j Soresosl
” Yo Jl station h i 0 month siro + ~ one pearl.
・Marmon-type Gufusuma Kō IIψshi C1 Bo left) 4,, must have) tfrf:). With the same J{4 dregs processing time and application [Kan Kai P] and IJ cutting 1, it is resistant to 11% and 1%, with sieve 2・')ζ), and prevents contamination. Condolence Iv7 1
Sorry, there is one bottle left. Yes, this is the case), the image of the hair is 1,, the Bakunization is Lζ, the second layer is isotropic, and the Lesost layer is also isotropic (this is the case) The drawback is that the resist pattern does not deteriorate due to the transfer.

この兄明の目的(J1上h己の欠点を除人せしめたフィ
1・レシスj・スアンンルQ刀ト成方法を提供1−ろ串
]こあ6o この′J1;明1こよイLば弔一/tlとGζ)ボジ型
ノ,(ト1/ソペ1・を朝イ11・ベイ+7グし、弟一
層を弗素を341′分子の刀スノ゛ラズマ1こ曝し、弟
二層と11: <)小シ型ノオ1・レソストヲ菫布・ヘ
イ4−ングし−C二層悄造ノ,+1・レソス1゛増を形
成711−Φ」一程と、該二II12構逍フォトレシス
ト層をマスク露光し弟二層を現像すう工程と、蕗出した
第−1一六聞及び践存1−6弔二層衣而を少ノ,「クと
も酸素分子を言むカスの、異カ性エソナノクタノ来のあ
るプラズマ中でエッナ7グTる工相と、弔一層を睨1域
)一る工栓をSむ争を待畝と−!Jるフォトレンストス
デ/シルのノレ成万法h11j}らイ1,る。
The purpose of this brother Ming (J1 upper h to eliminate his own shortcomings and provide a method for forming a sword) 6 o This 'J1; 1 / tl and G : <) Forming a small type No. 1, Resosto, Sumire cloth, Hay 4-Ning -C double layer, +1, Resos 1゛ increase 711-Φ''1, and the 2 II 12 structure photoresist layer. The process of exposing the second layer with a mask and developing the second layer, and the process of exposing the second layer to the second layer, and the second layer of the first layer and the second layer, are slightly different. In the plasma where the sex Esonan Kutano comes, the construction minister who is in the middle of the plasma, and the construction minister who stares at the condolence layer, waits for the battle to Send the first construction plug -! law h11j}rai1,ru.

1ノドこ(/Nl5明に′−)いて1〆1■を用いて旺
泊11(こ説明”c)−4)。弔2図+.tこの兄明の
・夷施1夕0てあ命ノ.1・し・,/ストくフ−ノンル
の形1戊万法(Q7’ロセスt二1況明復ク)7こぎN
′)θ月・イ1間である。
1 nodoko (/Nl5 Ming ni'-) and 1〆1■ is used to make Oho 11 (this explanation "c) -4). Funeral 2 figure +.t This brother Akira's Yish 1 evening 0 Life No. 1, Shi..., / Strike Funonle's Form 1 Bomanho (Q7'Roses t21 situation Meifuku) 7 Kogi N
') It is between θ month and i1.

,ノ+N4./ 21−J二Cこ例L−1曽とI沫く〕
ポシカシフ,lトL/ソス1・22少悸41i・・\イ
4−ングし、こイ1を弗素を含む)j−−1−カゾラス
マ(41のブフズマ)中番こ録1−と、衣1111に向
lm剤性の強化さ11,γこ衣161層2:3が形成さ
イtる。(弟2図(aJ )。この上Cこ弟二層と41
″るポソ型フォ1・レシスト24を塗布へイキ/クTる
(弟2図(bJ )この二層楕遺フォトレソスト層をマ
スク命光し、弟二層に対′N−る現暉欣中に浸せば、未
途゛各元IIS分を残し゜C,弔一層衣1朗が露出する
(弟2図(CD。ついで、蕗出した弟−1一衣面即ち耐
性強化表{1旧曽23及び残存1−る弟二層レジスト衣
而を少なくとも峡累分千ケ含むガスの、異方性エノナン
ク効果のあるカスプラズマ、レllんば半面平板畦極間
番こ発生させた紳醒系プラズマ中でエッナンクすΦ0異
方11エツナ/グプロセス{こおいて+’ls酸累イオ
ノCこよっC+/ジスト1曽は昧去されーCいくか、除
去(Jウェーハ而(こ垂直な方向1このみノ焦付する。
, ノ+N4. / 21-J2C Example L-1 So and I]
Posikashif, lto L/Sosu 1.22 Shoyu 41i... \I 4-ng, including fluorine) A 2:3 layer of γ coat 161 is formed in 1111 to enhance lm-tropic properties. (Little brother 2 figure (aJ). This is the second layer of C and 41
Apply the photoresist 24 of the photoresist type 24. If you soak it in, the unexplored parts of each original IIS will be left behind, and the funeral layer 1 will be exposed. 23 and the remaining two-layer resist coating of gas containing at least 1,000 volumes of gas, a gas plasma with an anisotropic enonanck effect, a half-flat, ridge-pole interpolation system. In the plasma, the Φ0 anisotropic 11 etsuna/g process {here +'ls acid accumulation iono C+/dist 1 is removed - C or removed (J wafer (this perpendicular direction 1 I'm focused on this.

弟2図(d) fこおけ心点線によって示さイ′1,6
都分かこのプロセスCこおいて1尿去さイ1,たソオ1
・レジスト部分で汐)る。この』易会エンナンクは横方
向Cこ進付しffい0)で、フォトマスクより第二υ)
ノAトレシスト層に転写さイLたバク一ン(まそのま蒙
、残存する。
Younger brother figure 2 (d)
The process C of the city is 1 urine is removed 1, it is 1
・It sways in the resist area. This ``encounter'' has a lateral direction of 0), and the second υ) from the photomask.
The traces transferred to the trace layer remain.

表[川の1110注Ii!lt化層の1ボ去さイ1,た
弟一υ)フォトレノストI¥!Iを机泳’J− 1’L
ば、第2図(e) iこ示″りよつに、基板而が露出■
る。一)いて通常の1Fイ1・工,ナンク[[程、即ぢ
請−I曽のフλ1・レンストと弟二層のフ,I1・レジ
ス1・の未蕗元都分に対ダ−る的解連度rl,r2の比
r +/12かl以上でめζ)ような工,ナンク液に浸
潤せしy)る,1一札船こより弔21図(fJ lこ冫
]くさイー1,るよつなきのこ型の1り[面を有1−6
ステンンルが侍らイ1,ク)。
Table [River 1110 Note Ii! 1 of the LT layer left 1, my younger brother 1) Photorenost I ¥! Table swimming I'J-1'L
As shown in Figure 2(e), the substrate is exposed.
Ru. 1) Normal 1F I1 Engineering, Nanku Ratio rl, r2 of R + / 12 or more is recommended. 1, Mushroom-shaped 1 [with sides 1-6]
Stennur was a samurai (I1, K).

弔− ,弟二のフメトレシストの柚類及び映厚、弟− 
.弟二のゾラスマの橿々、サイドエンナノクの1こめの
工,チノク欣4f’汀、侍《)べきノオトレジス1・ス
テンンルの1史用目l′9(こ比、しC1形状バフメー
タ0》大きさ及び鞘展、プロセスに石ける耐性寺endpa
ge:2 につき、1夕[期の性能を調fこすように、選択す6必
巽がある。−レリとして、弟一,弟二のフォトレソスト
として商品名AZ1370,AZ2415,弟−のプラ
ズマとして純四フ,化炭累ガスプラズマ,第二のプラズ
マとして純取累プラズマ、サイ1・゛エンナングのため
のエツナンク液として商品名AZ2401を適当な量の
水で稀釈したも0)を用いく)事714できる。また弟
一〇)フォ1・レジス1・として用い6面品名AZl3
70に対して柑いりれ6商品名AZDeve−1ope
rを適当7.1′墓の水で袖釈して得られ/:)机f象
紗もrs/r2>lrlる采件をみたすのでサイドエ,
チンダ液として用い6事ができる。COJ場合は弟一層
の埃1駅にひきつつき、同一の液(こよってザイト′エ
ッチを行イつせる事ができる。
Condolences - , younger brother, Yuzu and Eiatsu, younger brother -
.. My younger brother Zoramasma's relatives, Side Ennanok's 1st work, Chinokukin 4f', Samurai《) Nootregis 1 Stennru's 1st history l'9 (this ratio, ShiC1 shape buff meter 0》large) Sheath and sheath exhibition, process-resistant temple endpa
For each ge:2, there are 6 necessary functions to choose from to adjust the performance of the period. - As Reli, younger brother 1 and younger brother 2's photoresist product name AZ1370, AZ2415, younger brother's plasma as pure 4F, carbonized gas plasma, second plasma as pure tori accumulation plasma, Sai 1. AZ2401 (trade name) diluted with an appropriate amount of water can be used as Etnanck's liquid. Also used as younger brother 10) Fo 1, Regis 1, 6-sided product name AZl3
70 to 6 kanjiri product name AZDeve-1ope
It can be obtained by dissecting r with appropriate 7.1' grave water/:) Since the machine f elephant also satisfies the condition rs/r2>lrl, side e,
It can be used as chinda liquid for 6 purposes. In the case of COJ, it is possible to stick to one layer of dust and etch the same liquid (thus, the same liquid).

以上述べたようlここの発明をこまって提供されるフォ
トレジストスアンシルの形成方欣におい゛C(ま、耐性
冑化膿の除去が、異方性エンチング効果のあるr波素分
子を′バむガスプラズマによってなさH−Lるため、l
スクよQ}転写された、弟二のフォ1・レジストのパタ
ーンQノ劣化の恐れがない。従って、弟一層フォ1・レ
ジスト表面に形成1−’ 6耐性強化増を、レジストの
混合防止、現1s!時の弟一層レシスト層保護を光全な
らしめるべく、充分強度の踵いものとしても、パターン
の形状劣化という擬性を払う事なく谷易に除々する事が
できる。リフトオフ床Cこ用いらr+. =フォ1・レ
ジストステンシルQ)形成lこ用いられて、ての効果は
大であΦ0
As mentioned above, in the method of forming the photoresist ancil provided by the present invention, the removal of the resistant anti-fouling impairs the r-wave element molecules that have an anisotropic etching effect. Since H-L is produced by gas plasma, l
There is no risk of deterioration of the transferred pattern Q of the photo 1 resist of younger brother 2. Therefore, the younger brother is formed on the surface of the resist 1-' 6 to increase resistance, prevent mixing of the resist, and the current 1s! In order to fully protect the resist layer, even if it is sufficiently strong, it can be easily removed without causing any deterioration in the shape of the pattern. Lift-off floor C this r+. = Formation of photo resist stencil Q)

【図面の簡単な説明】[Brief explanation of the drawing]

ill図Ca) , (bJ , CC)はフォ1・レ
シストステノソルの形状パラメータ及ひリフ1・A−フ
ffitこよ6バクーニング/a:説明する1こめの図
而である。図において,llはフォトレジスト、12.
13は博暎層、14は開孔都を示To 弔2図Ca)−(fJ Gまこ(/j発明Q戸一実施ν
りであるフメトレジストスアンシルの形成ブ【コセスを
祝明するfこめの凶向である。 図において21i;l茫板、22,241Cホシ型ンメ
1・レジスト、23は耐性強化ざ(ムた衣而鳩を示T0
1(浦LA  弁理士内原  晋 endpage:3
Figures Ca) and (bJ, CC) are the first diagrams to explain the shape parameters of the photoresist stenosol and the shape parameters of the photoresist stenosol. In the figure, ll is photoresist, 12.
13 indicates the Boae layer, and 14 indicates the open hole capital.
The formation of the Fumetresist Ancil, which is the most important, is the atrocities of the F-common celebrating the Cocess. In the figure, 21i; 1 plate, 22, 241C star type resist, 23 indicates resistance-enhancing treatment.
1 (Ura LA patent attorney Susumu Uchiharaendpage:3

Claims (1)

【特許請求の範囲】[Claims] ・5{も−ryと7,Xりホシ八Vフオト1冫ジストを
j7,i41j・・\イキノク踵弟一層を弗素を・貧打
分子のカスヅフズマ(こ厖、シ、弟二1冑と1,jるホ
ジ型ノ詞ト1/ソストを+ノ’5− 41i・−\イA
〜ンクしで二1曽イ拘j肖ノオトL一ノベト1−を形成
丁《)上程と、訊一層何逍ノ21−レ/ス1゛11Jク
l−マスク蕗yCシ弔二j曽を現11ヂベ)工111と
、蕗出した弔−盾衣聞及び残存する弟王智衣1『1を少
l,「<とも故系分子を冨むカス(t〕、異方1土エノ
サノク幼未(・′)あ<′.)ヅフスマ中でエツナノク
づる工4呈と、弔一虐そ現像1−る」二佃を宮(閂↓俯
符似と′y−4,フ,− 1・レソス:〜スア・シル(
/ l 形1& 方’11 o
・5 {also -ry and 7, jruhoji type noun ト1/sost wo +ノ'5- 41i・-\iA
~In order to form a novel 1 in the 21st edition of the book, I have written a novel 1. The present 11th generation) Engineering 111, and the mourning that came out - Dun Yiwen and the remaining younger brother Wang Chiyi 1 '1 is a little l, '< is also a scum (t) rich in elements of the deceased system, anisotropic 1 earthenosanok. Yomi(・')a<'.) In the middle of the tsufusuma, Etsunanokuzuruko 4 presentations, and the development of the funeral 1-ru.・Resos: ~Sua Shiru (
/ l Shape 1 & Shape '11 o
JP2711882A 1982-02-22 1982-02-22 Formation of photo resist stencil Pending JPS58145128A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2711882A JPS58145128A (en) 1982-02-22 1982-02-22 Formation of photo resist stencil

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2711882A JPS58145128A (en) 1982-02-22 1982-02-22 Formation of photo resist stencil

Publications (1)

Publication Number Publication Date
JPS58145128A true JPS58145128A (en) 1983-08-29

Family

ID=12212143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2711882A Pending JPS58145128A (en) 1982-02-22 1982-02-22 Formation of photo resist stencil

Country Status (1)

Country Link
JP (1) JPS58145128A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5643729A (en) * 1979-09-18 1981-04-22 Matsushita Electric Ind Co Ltd Formation of fine pattern
JPS5691434A (en) * 1979-12-26 1981-07-24 Fujitsu Ltd Method for forming pattern of deposited film by lift-off method
JPH0239090A (en) * 1988-07-28 1990-02-08 Canon Inc Multicolor image display

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5643729A (en) * 1979-09-18 1981-04-22 Matsushita Electric Ind Co Ltd Formation of fine pattern
JPS5691434A (en) * 1979-12-26 1981-07-24 Fujitsu Ltd Method for forming pattern of deposited film by lift-off method
JPH0239090A (en) * 1988-07-28 1990-02-08 Canon Inc Multicolor image display

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