JPS58112907U - X-ray film thickness device - Google Patents
X-ray film thickness deviceInfo
- Publication number
- JPS58112907U JPS58112907U JP1041682U JP1041682U JPS58112907U JP S58112907 U JPS58112907 U JP S58112907U JP 1041682 U JP1041682 U JP 1041682U JP 1041682 U JP1041682 U JP 1041682U JP S58112907 U JPS58112907 U JP S58112907U
- Authority
- JP
- Japan
- Prior art keywords
- film thickness
- sample
- fluorescent plate
- ray
- ray film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は軸合せ用具図でaは上面図、bは正面図、第2
図はこの考案による螢光X線装置の構成図である。
1・・・・・・螢光板、2・・・・・・螢光板台、3・
・・・・・X線管、4・・・・・・フリメータ、5・・
・・・・光学スコープ。Figure 1 is a diagram of the alignment tool, where a is a top view, b is a front view, and
The figure is a configuration diagram of a fluorescent X-ray apparatus according to this invention. 1... Fluorescent plate, 2... Fluorescent plate stand, 3.
...X-ray tube, 4...Furimeter, 5...
...optical scope.
Claims (1)
より試料の膜厚を測定する装置において螢光板を斜めに
傾いた状態に保持する螢光板台上に、斜めに係いた状態
で垂直上方より見て多重のある決まった間隔をもった同
心円同心円中心を通る相互に等角度をもった2本の十字
線が描かれている螢光板を前記螢光板台上に装置した軸
合せ用具を備え、この軸合せ用具で、試料の測定点を決
める光学スコープの光軸とX線管よりのX線軸を一致せ
しめるようにしたことを特徴とするX線膜厚装置。In a device that measures the film thickness of a sample by irradiating the sample with X-rays and detecting the fluorescent X-rays generated, the fluorescent plate is held at an angle. A fluorescent plate on which two cross lines are drawn at equal angles to each other passing through the centers of multiple concentric circles with a fixed interval when viewed from vertically upward is arranged on the fluorescent plate stand. 1. An X-ray film thickness apparatus comprising a tool, and the alignment tool aligns the optical axis of an optical scope for determining a measurement point on a sample with the X-ray axis from an X-ray tube.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1041682U JPS58112907U (en) | 1982-01-28 | 1982-01-28 | X-ray film thickness device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1041682U JPS58112907U (en) | 1982-01-28 | 1982-01-28 | X-ray film thickness device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58112907U true JPS58112907U (en) | 1983-08-02 |
Family
ID=30023065
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1041682U Pending JPS58112907U (en) | 1982-01-28 | 1982-01-28 | X-ray film thickness device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58112907U (en) |
-
1982
- 1982-01-28 JP JP1041682U patent/JPS58112907U/en active Pending
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