JPS5793251A - Device for detecting flaw by eddy current - Google Patents

Device for detecting flaw by eddy current

Info

Publication number
JPS5793251A
JPS5793251A JP55169929A JP16992980A JPS5793251A JP S5793251 A JPS5793251 A JP S5793251A JP 55169929 A JP55169929 A JP 55169929A JP 16992980 A JP16992980 A JP 16992980A JP S5793251 A JPS5793251 A JP S5793251A
Authority
JP
Japan
Prior art keywords
output
phase
analog
signal
sent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55169929A
Other languages
Japanese (ja)
Other versions
JPS6241342B2 (en
Inventor
Shoji Hayashibe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HARA DENSHI SOKKI KK
HARA DENSHI SOTSUKI KK
Eddio Corp
Original Assignee
HARA DENSHI SOKKI KK
HARA DENSHI SOTSUKI KK
Eddio Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HARA DENSHI SOKKI KK, HARA DENSHI SOTSUKI KK, Eddio Corp filed Critical HARA DENSHI SOKKI KK
Priority to JP55169929A priority Critical patent/JPS5793251A/en
Publication of JPS5793251A publication Critical patent/JPS5793251A/en
Publication of JPS6241342B2 publication Critical patent/JPS6241342B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To make it possible to measure the depth of a minute defect, by dif- ferentiating a vector signal generated when a pair of detecting coils pass the center of the defect and inputting output thereof to a specified computing circuit. CONSTITUTION:The detecting coils 3a and 3b are arranged on the adjacent symmetrical positions with respect to a sweeping axis, and constitute a bridge to- gether with resistors 4a and 4b. The unbalanced output from the bridge circuit is sent to phase detectors 6 and 6b through an amplifier 6 and phase-detected, with the output signals from a phase shifter and a 90 deg. phase shifter circuit 8 as references. Output signals X and Y from the phase detectors 6 and 6b are differentiated by differentiating devices 11a and 11b, and signal x1 and y1 are obtained. Said signal y1 is sent to a halfwave rectifier 16 through an analog gate 13 which is closed when the output of x1 is generated. The positive part y2 of y1 is taken out and the product of y2 and coefficient K is computed by a multiplication coefficient setting device 18. Thereafter, the computation of the expression of relation (I) is processed in an analog subtractor 19 and an analog divider 20, and an output Vo is obtained through the halfwave rectifier.
JP55169929A 1980-12-02 1980-12-02 Device for detecting flaw by eddy current Granted JPS5793251A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55169929A JPS5793251A (en) 1980-12-02 1980-12-02 Device for detecting flaw by eddy current

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55169929A JPS5793251A (en) 1980-12-02 1980-12-02 Device for detecting flaw by eddy current

Publications (2)

Publication Number Publication Date
JPS5793251A true JPS5793251A (en) 1982-06-10
JPS6241342B2 JPS6241342B2 (en) 1987-09-02

Family

ID=15895547

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55169929A Granted JPS5793251A (en) 1980-12-02 1980-12-02 Device for detecting flaw by eddy current

Country Status (1)

Country Link
JP (1) JPS5793251A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166858A (en) * 1983-03-14 1984-09-20 Tokushu Toryo Kk Eddy current flaw detecting method of pipe using interpolating coil
JPS59166859A (en) * 1983-03-14 1984-09-20 Tokushu Toryo Kk Eddy current flaw detector for pipe provided with interpolating coil
JP2006208312A (en) * 2005-01-31 2006-08-10 Jfe Steel Kk Method and device for measuring internal defect
JP2011127922A (en) * 2009-12-15 2011-06-30 Sumitomo Metal Ind Ltd Method of eddy current flaw inspection, and gap forming member used for the same

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01185166A (en) * 1988-01-13 1989-07-24 Tokyo Electric Co Ltd Inverter apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166858A (en) * 1983-03-14 1984-09-20 Tokushu Toryo Kk Eddy current flaw detecting method of pipe using interpolating coil
JPS59166859A (en) * 1983-03-14 1984-09-20 Tokushu Toryo Kk Eddy current flaw detector for pipe provided with interpolating coil
JPH0378579B2 (en) * 1983-03-14 1991-12-16 Marktec Corp
JP2006208312A (en) * 2005-01-31 2006-08-10 Jfe Steel Kk Method and device for measuring internal defect
JP2011127922A (en) * 2009-12-15 2011-06-30 Sumitomo Metal Ind Ltd Method of eddy current flaw inspection, and gap forming member used for the same

Also Published As

Publication number Publication date
JPS6241342B2 (en) 1987-09-02

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