JPS5785235A - Sampling stand - Google Patents
Sampling standInfo
- Publication number
- JPS5785235A JPS5785235A JP55162340A JP16234080A JPS5785235A JP S5785235 A JPS5785235 A JP S5785235A JP 55162340 A JP55162340 A JP 55162340A JP 16234080 A JP16234080 A JP 16234080A JP S5785235 A JPS5785235 A JP S5785235A
- Authority
- JP
- Japan
- Prior art keywords
- loading surface
- hole
- wafer
- sample loading
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25B—TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
- B25B11/00—Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
- B25B11/005—Vacuum work holders
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE:To surely support a sample by providing a sample loading surface with a spiral groove surrounding a center and extending toward the circumference in a sampling stand supporting a platy sample on the sample loading surface by vacuum adsorption. CONSTITUTION:A throgh hole 2 is provided at the central section of a round sampling stand and the whole surface of a sample loading surface 10 is grinded to serve as a reference plane for reforming a wafer. A spiral groove 9 is formed by extending to the circumference section from around the through hole 2 on the sample loading surface 10. Furthermore, an adsorption hole 4 is formed at the place close to the through hole 2 of the spiral groove 9. In this case, when a wafer which is smaller than the sample loading surface 10 is held by adsprotion, leakage will occur from the groove locating outside of the wafer. However, the wafer can positively be held as the conductance of the groove up to the adsorption hole 4 can sufficiently be maintained at low value.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55162340A JPS5785235A (en) | 1980-11-18 | 1980-11-18 | Sampling stand |
US06/499,024 US4448404A (en) | 1980-11-18 | 1983-06-02 | Device for holding a sheet-like sample |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55162340A JPS5785235A (en) | 1980-11-18 | 1980-11-18 | Sampling stand |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5785235A true JPS5785235A (en) | 1982-05-27 |
Family
ID=15752689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55162340A Pending JPS5785235A (en) | 1980-11-18 | 1980-11-18 | Sampling stand |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5785235A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5230741A (en) * | 1990-07-16 | 1993-07-27 | Novellus Systems, Inc. | Gas-based backside protection during substrate processing |
US5238499A (en) * | 1990-07-16 | 1993-08-24 | Novellus Systems, Inc. | Gas-based substrate protection during processing |
JPH05251544A (en) * | 1992-03-05 | 1993-09-28 | Fujitsu Ltd | Conveyor |
US5578532A (en) * | 1990-07-16 | 1996-11-26 | Novellus Systems, Inc. | Wafer surface protection in a gas deposition process |
US5620525A (en) * | 1990-07-16 | 1997-04-15 | Novellus Systems, Inc. | Apparatus for supporting a substrate and introducing gas flow doximate to an edge of the substrate |
US5843233A (en) * | 1990-07-16 | 1998-12-01 | Novellus Systems, Inc. | Exclusion guard and gas-based substrate protection for chemical vapor deposition apparatus |
JP2015005778A (en) * | 2009-04-22 | 2015-01-08 | エーファウ・グループ・ゲーエムベーハー | Workpiece holding fixture for holding semiconductor substrate |
CN104616953A (en) * | 2015-02-02 | 2015-05-13 | 武汉新芯集成电路制造有限公司 | Bearing device and preparation method thereof |
CN106881532A (en) * | 2015-12-10 | 2017-06-23 | 武汉楚天工业激光设备有限公司 | Negative pressure absorption type potsherd cutting clamper and control method |
-
1980
- 1980-11-18 JP JP55162340A patent/JPS5785235A/en active Pending
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5230741A (en) * | 1990-07-16 | 1993-07-27 | Novellus Systems, Inc. | Gas-based backside protection during substrate processing |
US5238499A (en) * | 1990-07-16 | 1993-08-24 | Novellus Systems, Inc. | Gas-based substrate protection during processing |
US5578532A (en) * | 1990-07-16 | 1996-11-26 | Novellus Systems, Inc. | Wafer surface protection in a gas deposition process |
US5620525A (en) * | 1990-07-16 | 1997-04-15 | Novellus Systems, Inc. | Apparatus for supporting a substrate and introducing gas flow doximate to an edge of the substrate |
US5843233A (en) * | 1990-07-16 | 1998-12-01 | Novellus Systems, Inc. | Exclusion guard and gas-based substrate protection for chemical vapor deposition apparatus |
US5882417A (en) * | 1990-07-16 | 1999-03-16 | Novellus Systems, Inc. | Apparatus for preventing deposition on frontside peripheral region and edge of wafer in chemical vapor deposition apparatus |
US5925411A (en) * | 1990-07-16 | 1999-07-20 | Siliconix Incorporated | Gas-based substrate deposition protection |
JPH05251544A (en) * | 1992-03-05 | 1993-09-28 | Fujitsu Ltd | Conveyor |
JP2015005778A (en) * | 2009-04-22 | 2015-01-08 | エーファウ・グループ・ゲーエムベーハー | Workpiece holding fixture for holding semiconductor substrate |
CN104616953A (en) * | 2015-02-02 | 2015-05-13 | 武汉新芯集成电路制造有限公司 | Bearing device and preparation method thereof |
CN106881532A (en) * | 2015-12-10 | 2017-06-23 | 武汉楚天工业激光设备有限公司 | Negative pressure absorption type potsherd cutting clamper and control method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5785235A (en) | Sampling stand | |
USD256053S (en) | Specimen device | |
ES525930A0 (en) | IMPROVEMENTS IN A DEVICE TO HOLD ARTICLES OF A GENERAL CYLINDRICAL FORM | |
ES452562A1 (en) | Multiple ball element wafer breaking apparatus | |
JPS5219227A (en) | Full wave rectifier | |
JPS52126801A (en) | Device for mounting automative wheel | |
JPS5332114A (en) | Quantitative determination of antigen and antibody | |
GB943123A (en) | Method and apparatus for electrolytic polishing and anodic etching of metallographic specimens | |
JPS5271732A (en) | Valve device | |
JPS6429729A (en) | Defective parts detector | |
JPS5313045A (en) | Air bearing and vacuum adsorption device | |
JPS529366A (en) | Sample equipment for electron microscopes, etc | |
JPS5516455A (en) | Wafer holder for slicing | |
JPS57128042A (en) | Inspecting method for semiconductor device | |
JPS5552021A (en) | Supporting device of contact lens | |
JPS52150683A (en) | Testing method for pin-hole | |
JPS5712348A (en) | Prevention system for chuck slide of reverse hand tester | |
JPS5343468A (en) | Test sample holder with sealed-up chamber used for electronic microscope, etc. | |
JPS5670634A (en) | Rotatable coating method | |
JPS5487203A (en) | Air bearing device | |
JPS55151331A (en) | Method and apparatus for diffusing impurity in semiconductor | |
JPS552829A (en) | Connecting process between valve body and spindle in globe valve and others | |
SU575717A1 (en) | Device for inspecting moist samples with aid of raster electron microscope | |
JPS52156791A (en) | Adsorbent | |
JPS5548549A (en) | Centering holder for round shape object |