JPS5783058A - Charge accumulation type semiconductor device and manufacture thereof - Google Patents
Charge accumulation type semiconductor device and manufacture thereofInfo
- Publication number
- JPS5783058A JPS5783058A JP55157893A JP15789380A JPS5783058A JP S5783058 A JPS5783058 A JP S5783058A JP 55157893 A JP55157893 A JP 55157893A JP 15789380 A JP15789380 A JP 15789380A JP S5783058 A JPS5783058 A JP S5783058A
- Authority
- JP
- Japan
- Prior art keywords
- region
- defectless
- substrate
- deep
- regions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009825 accumulation Methods 0.000 title abstract 3
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 3
- 238000010438 heat treatment Methods 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract 1
- 239000011248 coating agent Substances 0.000 abstract 1
- 238000000576 coating method Methods 0.000 abstract 1
- 239000013078 crystal Substances 0.000 abstract 1
- 230000007547 defect Effects 0.000 abstract 1
- 238000002955 isolation Methods 0.000 abstract 1
- 230000001590 oxidative effect Effects 0.000 abstract 1
- 229910052760 oxygen Inorganic materials 0.000 abstract 1
- 239000001301 oxygen Substances 0.000 abstract 1
- 239000007787 solid Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/762—Charge transfer devices
- H01L29/765—Charge-coupled devices
- H01L29/768—Charge-coupled devices with field effect produced by an insulated gate
Abstract
PURPOSE:To reduce the noise due to flowing-in of unnecessary carrier in a solid image device and the like by a method wherein a defectless regions having different depth are provided on the substrate surface, on the inside of which a high density faulty region was formed, and a charge accumulation type element is formed in a deep defectless region. CONSTITUTION:A heat-treatment (600-900 deg.C) is performed on a P type substrate 11 in a non-oxidizing atmosphere, and after crystal defect generating nuclei containing oxygen are formed all over the above substrate, oxide films 12 and 12' are provided in such a manner that the films will be thinned off in the element region, and defectless regions 13 and 13' are formed on the surface by performing a heat-treatment at 900- 1,000 deg.C. The region 13' which is 20-40mum deep is surrounded by a P<+> isolation layer 16, and after an accumulation electrode 18, a gate electrode 19 and a transfer electrode 20 have been provided through the intermediary of an oxide film, the whole surface is covered by an oxide film 17, and an image pickup device is obtained by coating a shielding film 21 having an aperture on the above. Through these procedures, the carrier (electron) generated by the incidented beam of light on the circumference 23 of the shielding film 21 can be dissipated in the high density faulty region 15, and the noise generated due to unnecessary charge can also be reduced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55157893A JPS5783058A (en) | 1980-11-10 | 1980-11-10 | Charge accumulation type semiconductor device and manufacture thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55157893A JPS5783058A (en) | 1980-11-10 | 1980-11-10 | Charge accumulation type semiconductor device and manufacture thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5783058A true JPS5783058A (en) | 1982-05-24 |
Family
ID=15659714
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55157893A Pending JPS5783058A (en) | 1980-11-10 | 1980-11-10 | Charge accumulation type semiconductor device and manufacture thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5783058A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62156858A (en) * | 1985-12-28 | 1987-07-11 | Matsushita Electronics Corp | Solid-state image pickup device |
-
1980
- 1980-11-10 JP JP55157893A patent/JPS5783058A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62156858A (en) * | 1985-12-28 | 1987-07-11 | Matsushita Electronics Corp | Solid-state image pickup device |
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